JP6997757B2 - 電子顕微鏡法 - Google Patents

電子顕微鏡法 Download PDF

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Publication number
JP6997757B2
JP6997757B2 JP2019503570A JP2019503570A JP6997757B2 JP 6997757 B2 JP6997757 B2 JP 6997757B2 JP 2019503570 A JP2019503570 A JP 2019503570A JP 2019503570 A JP2019503570 A JP 2019503570A JP 6997757 B2 JP6997757 B2 JP 6997757B2
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Japan
Prior art keywords
sample
fluid
support
sample support
gas
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JP2019503570A
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English (en)
Japanese (ja)
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JP2019528435A5 (enExample
JP2019528435A (ja
Inventor
メインデルト ヒューゴ レイマース
ラファエル フェルナンデス－レイロ
ヨシュア ファーマン
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United Kingdom Research and Innovation
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United Kingdom Research and Innovation
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Publication of JP2019528435A5 publication Critical patent/JP2019528435A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
    • G01N1/31—Apparatus therefor
    • G01N1/312—Apparatus therefor for samples mounted on planar substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
    • B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
    • B01L3/508—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above
    • B01L3/5085—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above for multiple samples, e.g. microtitration plates
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00—Heating or cooling apparatus; Heat insulating devices
    • B01L7/50—Cryostats
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L9/00—Supporting devices; Holding devices
    • B01L9/52—Supports specially adapted for flat sample carriers, e.g. for plates, slides, chips
    • B01L9/523—Supports specially adapted for flat sample carriers, e.g. for plates, slides, chips for multisample carriers, e.g. used for microtitration plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/04—Preparation or injection of sample to be analysed
    • G01N30/06—Preparation
    • G01N30/12—Preparation by evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/023—Means for mechanically adjusting components not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00—Additional constructional details
    • B01L2300/18—Means for temperature control
    • B01L2300/1894—Cooling means; Cryo cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/002—Cooling arrangements

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Clinical Laboratory Science (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Hematology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2019503570A 2016-07-29 2017-07-28 電子顕微鏡法 Active JP6997757B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1613173.2A GB201613173D0 (en) 2016-07-29 2016-07-29 Electron microscopy
GB1613173.2 2016-07-29
PCT/EP2017/069240 WO2018020036A1 (en) 2016-07-29 2017-07-28 Electron microscopy

Publications (3)

Publication Number Publication Date
JP2019528435A JP2019528435A (ja) 2019-10-10
JP2019528435A5 JP2019528435A5 (enExample) 2020-09-03
JP6997757B2 true JP6997757B2 (ja) 2022-02-04

Family

ID=56936668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019503570A Active JP6997757B2 (ja) 2016-07-29 2017-07-28 電子顕微鏡法

Country Status (10)

Country Link
US (1) US11067486B2 (enExample)
EP (1) EP3491360B1 (enExample)
JP (1) JP6997757B2 (enExample)
CN (1) CN109891208A (enExample)
AU (1) AU2017302126B2 (enExample)
CA (1) CA3032234C (enExample)
DK (1) DK3491360T3 (enExample)
ES (1) ES3026360T3 (enExample)
GB (1) GB201613173D0 (enExample)
WO (1) WO2018020036A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3647763B1 (en) 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device
CN111389478B (zh) * 2020-03-23 2023-07-25 西安医学院 一种组织切片的实验处理装置及其使用方法
GB2593491A (en) * 2020-03-24 2021-09-29 Res & Innovation Uk Electron microscopy support
EP4109069A1 (en) 2021-06-25 2022-12-28 FEI Company Blotting material with profiled region, method of manufacturing same, and uses thereof
NL2033291B1 (en) 2022-10-12 2024-04-26 Academisch Ziekenhuis Leiden Device and Method for Cryogenic Electron Microscopy Sample Preparation

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007163447A (ja) 2005-12-09 2007-06-28 Lee Bing Huan 電子顕微鏡用の超薄液体制御板
JP2008267889A (ja) 2007-04-18 2008-11-06 Jeol Ltd 電子顕微鏡用試料ホルダおよび観察方法ならびに電子顕微鏡用試料作製装置
WO2010004275A2 (en) 2008-07-08 2010-01-14 Silson Limited Sample holder
JP2014056785A (ja) 2012-09-14 2014-03-27 Hitachi High-Technologies Corp 荷電粒子線装置及び試料観察方法
JP2015068832A (ja) 2013-09-30 2015-04-13 エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ 荷電粒子顕微鏡用の極低温試料の調製

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59109840A (ja) 1982-12-16 1984-06-25 Hitachi Koki Co Ltd 走査形電子顕微鏡用生物試料の前処理方法
US7112790B1 (en) * 2003-08-13 2006-09-26 Cypress Semiconductor Corp. Method to prepare TEM samples
WO2009065585A2 (en) * 2007-11-20 2009-05-28 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Ultra-rapid freezing device and method
GB0724736D0 (en) * 2007-12-19 2008-01-30 Oxford Nanolabs Ltd Formation of layers of amphiphilic molecules
JP2010054272A (ja) 2008-08-27 2010-03-11 National Institute Of Advanced Industrial Science & Technology スピン偏極走査電子顕微鏡
AT507079B1 (de) * 2009-01-22 2010-02-15 Leica Mikrosysteme Gmbh Vorrichtung und verfahren zum präparieren von proben
JP5550262B2 (ja) * 2009-05-29 2014-07-16 キヤノン株式会社 試料観察システム及び試料観察方法
US9312095B2 (en) * 2010-03-24 2016-04-12 Brown University Method and system for automating sample preparation for microfluidic cryo TEM
GB201118282D0 (en) 2011-10-21 2011-12-07 Cancer Rec Tech Ltd Sample slide preparation method and device
JP6239246B2 (ja) * 2013-03-13 2017-11-29 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
CA2919961C (en) * 2013-08-13 2023-10-10 Medical Research Council Electron microscopy sample support comprising porous metal foil
GB201318463D0 (en) * 2013-08-13 2013-12-04 Medical Res Council Graphene Modification
CA2932803C (en) 2013-12-13 2020-09-08 Ventana Medical Systems, Inc. Thermal management in the context of automated histological processing of biological specimens and associated technology
GB2537579A (en) 2014-11-07 2016-10-26 Linkam Scient Instr Ltd Microscopic sample preparation
EP4215898A1 (en) * 2015-04-20 2023-07-26 Ventana Medical Systems, Inc. Inkjet deposition of reagents for histological samples
DK3260839T3 (da) * 2016-06-22 2021-04-19 Univ Maastricht Fremgangsmåde til forberedelse af prøver til billeddannelses- eller diffraktionseksperimenter under kyrogene betingelser
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007163447A (ja) 2005-12-09 2007-06-28 Lee Bing Huan 電子顕微鏡用の超薄液体制御板
JP2008267889A (ja) 2007-04-18 2008-11-06 Jeol Ltd 電子顕微鏡用試料ホルダおよび観察方法ならびに電子顕微鏡用試料作製装置
WO2010004275A2 (en) 2008-07-08 2010-01-14 Silson Limited Sample holder
JP2014056785A (ja) 2012-09-14 2014-03-27 Hitachi High-Technologies Corp 荷電粒子線装置及び試料観察方法
JP2015068832A (ja) 2013-09-30 2015-04-13 エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ 荷電粒子顕微鏡用の極低温試料の調製

Also Published As

Publication number Publication date
AU2017302126A1 (en) 2019-02-07
US11067486B2 (en) 2021-07-20
EP3491360B1 (en) 2025-03-19
GB201613173D0 (en) 2016-09-14
ES3026360T3 (en) 2025-06-11
EP3491360A1 (en) 2019-06-05
AU2017302126B2 (en) 2022-07-07
CN109891208A (zh) 2019-06-14
WO2018020036A1 (en) 2018-02-01
JP2019528435A (ja) 2019-10-10
CA3032234A1 (en) 2018-02-01
DK3491360T3 (da) 2025-06-10
US20190170618A1 (en) 2019-06-06
CA3032234C (en) 2024-02-13

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