SG10201802896WA - Polishing apparatus and polishing method - Google Patents
Polishing apparatus and polishing methodInfo
- Publication number
- SG10201802896WA SG10201802896WA SG10201802896WA SG10201802896WA SG10201802896WA SG 10201802896W A SG10201802896W A SG 10201802896WA SG 10201802896W A SG10201802896W A SG 10201802896WA SG 10201802896W A SG10201802896W A SG 10201802896WA SG 10201802896W A SG10201802896W A SG 10201802896WA
- Authority
- SG
- Singapore
- Prior art keywords
- polishing
- polished
- temperature
- liquid
- pad
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/015—Temperature control
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
- B24B37/107—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/14—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the temperature during grinding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/02—Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/12—Devices for exhausting mist of oil or coolant; Devices for collecting or recovering materials resulting from grinding or polishing, e.g. of precious metals, precious stones, diamonds or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Disintegrating Or Milling (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
Abstract
POLISHING APPARATUS AND POLISHING METHOD Provided is a polishing apparatus and polishing method which can preferably adjust a temperature of a surface of a polishing pad. A polishing apparatus includes: a polishing table configured to be rotatable, and to support the polishing pad; a substrate configured to hold an object to be polished, and to press the object to be polished against the polishing pad; a polishing liquid supplying portion configured to supply a polishing liquid to a polishing surface; a polishing liquid removing portion configured to remove the polishing liquid from the polishing surface; and a temperature adjuster configured to adjust a temperature of the polishing surface. In a rotating direction of the polishing table, the polishing liquid supplying portion, a polishing region where the object to be polished is pressed against the polishing surface by the substrate, the polishing liquid removing portion, and the temperature adjuster are disposed in this order. Selected Drawings: Fig. 2
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017078060A JP6923342B2 (en) | 2017-04-11 | 2017-04-11 | Polishing equipment and polishing method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201802896WA true SG10201802896WA (en) | 2018-11-29 |
Family
ID=63710618
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201802896WA SG10201802896WA (en) | 2017-04-11 | 2018-04-06 | Polishing apparatus and polishing method |
Country Status (5)
Country | Link |
---|---|
US (2) | US11007621B2 (en) |
JP (2) | JP6923342B2 (en) |
KR (2) | KR102545500B1 (en) |
SG (1) | SG10201802896WA (en) |
TW (1) | TWI771404B (en) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102591901B1 (en) * | 2017-10-31 | 2023-10-20 | 가부시키가이샤 에바라 세이사꾸쇼 | Heat exchanger for regulating temperature of polishing surface of polishing pad, polishing apparatus having such heat exchanger, polishing method for substrate using such heat exchanger, and computer-readable storage medium storing a program for regulating temperature of polishing surface of polishing pad |
JP6975078B2 (en) * | 2018-03-15 | 2021-12-01 | キオクシア株式会社 | Semiconductor manufacturing equipment and methods for manufacturing semiconductor equipment |
US11305397B2 (en) * | 2018-06-18 | 2022-04-19 | Seagate Technology Llc | Lapping system that includes a lapping plate temperature control system, and related methods |
CN109159020B (en) * | 2018-10-26 | 2021-05-11 | 长江存储科技有限责任公司 | Grinding device |
EP3887093A4 (en) * | 2018-11-27 | 2022-08-17 | 3M Innovative Properties Company | Polishing pads and systems and methods of making and using the same |
JP7152279B2 (en) * | 2018-11-30 | 2022-10-12 | 株式会社荏原製作所 | Polishing equipment |
TWI771668B (en) * | 2019-04-18 | 2022-07-21 | 美商應用材料股份有限公司 | Temperature-based in-situ edge assymetry correction during cmp |
US11897079B2 (en) * | 2019-08-13 | 2024-02-13 | Applied Materials, Inc. | Low-temperature metal CMP for minimizing dishing and corrosion, and improving pad asperity |
JP7397617B2 (en) * | 2019-10-16 | 2023-12-13 | 株式会社荏原製作所 | polishing equipment |
TWI826280B (en) | 2019-11-22 | 2023-12-11 | 美商應用材料股份有限公司 | Wafer edge asymmetry correction using groove in polishing pad |
US11298798B2 (en) * | 2020-02-14 | 2022-04-12 | Nanya Technology Corporation | Polishing delivery apparatus |
CN112792711B (en) * | 2020-12-31 | 2022-05-17 | 武汉风帆电化科技股份有限公司 | Crystal silicon wafer alkali polishing device and polishing process |
CN113510600B (en) * | 2021-09-09 | 2021-11-30 | 南通兴胜灯具制造有限公司 | Mirror polishing device for lamp manufacturing |
CN114833725B (en) * | 2022-05-18 | 2023-04-07 | 北京晶亦精微科技股份有限公司 | Grinding fluid supply device and grinding machine |
Family Cites Families (33)
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US5127196A (en) * | 1990-03-01 | 1992-07-07 | Intel Corporation | Apparatus for planarizing a dielectric formed over a semiconductor substrate |
US5607718A (en) * | 1993-03-26 | 1997-03-04 | Kabushiki Kaisha Toshiba | Polishing method and polishing apparatus |
JP3240247B2 (en) * | 1995-04-25 | 2001-12-17 | 株式会社東芝 | Semiconductor device manufacturing method and polishing apparatus |
US5664990A (en) * | 1996-07-29 | 1997-09-09 | Integrated Process Equipment Corp. | Slurry recycling in CMP apparatus |
JP3672685B2 (en) * | 1996-11-29 | 2005-07-20 | 松下電器産業株式会社 | Polishing method and polishing apparatus |
US6028006A (en) * | 1997-08-01 | 2000-02-22 | Texas Instruments Incorporated | Method for maintaining the buffer capacity of siliceous chemical-mechanical silicon polishing slurries |
US5957750A (en) * | 1997-12-18 | 1999-09-28 | Micron Technology, Inc. | Method and apparatus for controlling a temperature of a polishing pad used in planarizing substrates |
JP2001053039A (en) * | 1999-08-05 | 2001-02-23 | Okamoto Machine Tool Works Ltd | Method and device for detecting polishing end point of wafer |
US20010055940A1 (en) | 2000-06-15 | 2001-12-27 | Leland Swanson | Control of CMP removal rate uniformity by selective control of slurry temperature |
US6896586B2 (en) * | 2002-03-29 | 2005-05-24 | Lam Research Corporation | Method and apparatus for heating polishing pad |
US6953750B1 (en) * | 2002-09-30 | 2005-10-11 | Lam Research Corporation | Methods and systems for controlling belt surface temperature and slurry temperature in linear chemical mechanical planarization |
JP2005271151A (en) | 2004-03-25 | 2005-10-06 | Toshiba Corp | Polishing apparatus and polishing method |
JP2006088292A (en) | 2004-09-27 | 2006-04-06 | Toshiba Corp | Polishing device, polishing method, and manufacturing method for semiconductor device |
JP4787063B2 (en) * | 2005-12-09 | 2011-10-05 | 株式会社荏原製作所 | Polishing apparatus and polishing method |
JP5080769B2 (en) | 2006-09-15 | 2012-11-21 | 株式会社東京精密 | Polishing method and polishing apparatus |
JP4943800B2 (en) * | 2006-10-06 | 2012-05-30 | ニッタ・ハース株式会社 | Polishing status monitor system |
JP4902433B2 (en) * | 2007-06-13 | 2012-03-21 | 株式会社荏原製作所 | Polishing surface heating and cooling device for polishing equipment |
US8172641B2 (en) * | 2008-07-17 | 2012-05-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | CMP by controlling polish temperature |
JP2010183037A (en) * | 2009-02-09 | 2010-08-19 | Toshiba Corp | Semiconductor manufacturing apparatus |
JP2011079076A (en) * | 2009-10-05 | 2011-04-21 | Toshiba Corp | Polishing device and polishing method |
JP5547472B2 (en) * | 2009-12-28 | 2014-07-16 | 株式会社荏原製作所 | Substrate polishing apparatus, substrate polishing method, and polishing pad surface temperature control apparatus for substrate polishing apparatus |
JP5628067B2 (en) * | 2011-02-25 | 2014-11-19 | 株式会社荏原製作所 | Polishing apparatus provided with temperature adjustment mechanism of polishing pad |
TWI548483B (en) * | 2011-07-19 | 2016-09-11 | 荏原製作所股份有限公司 | Polishing device and method |
JP5775797B2 (en) * | 2011-11-09 | 2015-09-09 | 株式会社荏原製作所 | Polishing apparatus and method |
JP6007553B2 (en) * | 2012-04-06 | 2016-10-12 | 信越半導体株式会社 | Wafer polishing method |
JP6139188B2 (en) * | 2013-03-12 | 2017-05-31 | 株式会社荏原製作所 | Polishing apparatus and polishing method |
JP6161999B2 (en) * | 2013-08-27 | 2017-07-12 | 株式会社荏原製作所 | Polishing method and polishing apparatus |
JP6340205B2 (en) * | 2014-02-20 | 2018-06-06 | 株式会社荏原製作所 | Polishing pad conditioning method and apparatus |
WO2016057075A1 (en) * | 2014-10-09 | 2016-04-14 | Applied Materials, Inc. | Chemical mechanical polishing pad with internal channels |
TWI547348B (en) * | 2015-08-31 | 2016-09-01 | 力晶科技股份有限公司 | Chemical mechanical polishing apparatus and method |
US10058975B2 (en) * | 2016-02-12 | 2018-08-28 | Applied Materials, Inc. | In-situ temperature control during chemical mechanical polishing with a condensed gas |
US20170355059A1 (en) * | 2016-06-14 | 2017-12-14 | Confluense Llc | Slurry Slip Stream Controller For CMP System |
TW202402454A (en) * | 2018-06-27 | 2024-01-16 | 美商應用材料股份有限公司 | Chemical mechanical polishing apparatus and method of chemical mechanical polishing |
-
2017
- 2017-04-11 JP JP2017078060A patent/JP6923342B2/en active Active
-
2018
- 2018-03-12 KR KR1020180028428A patent/KR102545500B1/en active IP Right Grant
- 2018-04-06 SG SG10201802896WA patent/SG10201802896WA/en unknown
- 2018-04-10 US US15/950,070 patent/US11007621B2/en active Active
- 2018-04-10 TW TW107112280A patent/TWI771404B/en active
-
2021
- 2021-04-16 US US17/233,115 patent/US11612983B2/en active Active
- 2021-07-28 JP JP2021123228A patent/JP7176059B2/en active Active
-
2023
- 2023-06-15 KR KR1020230076553A patent/KR20230098505A/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR20180114834A (en) | 2018-10-19 |
KR20230098505A (en) | 2023-07-04 |
JP6923342B2 (en) | 2021-08-18 |
JP7176059B2 (en) | 2022-11-21 |
KR102545500B1 (en) | 2023-06-21 |
TW201836764A (en) | 2018-10-16 |
JP2018176339A (en) | 2018-11-15 |
US20180290263A1 (en) | 2018-10-11 |
TW202233354A (en) | 2022-09-01 |
US11007621B2 (en) | 2021-05-18 |
US11612983B2 (en) | 2023-03-28 |
TWI771404B (en) | 2022-07-21 |
US20210229240A1 (en) | 2021-07-29 |
JP2021181154A (en) | 2021-11-25 |
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