JP2016145770A5 - - Google Patents
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- Publication number
- JP2016145770A5 JP2016145770A5 JP2015023173A JP2015023173A JP2016145770A5 JP 2016145770 A5 JP2016145770 A5 JP 2016145770A5 JP 2015023173 A JP2015023173 A JP 2015023173A JP 2015023173 A JP2015023173 A JP 2015023173A JP 2016145770 A5 JP2016145770 A5 JP 2016145770A5
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical
- sample
- photodetector
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 18
- 239000004065 semiconductor Substances 0.000 claims 2
- 238000001514 detection method Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015023173A JP6500474B2 (ja) | 2015-02-09 | 2015-02-09 | 光学分析装置 |
| US15/015,810 US9877368B2 (en) | 2015-02-09 | 2016-02-04 | Optical analyzer |
| CN201610079436.3A CN105866029B (zh) | 2015-02-09 | 2016-02-04 | 光学分析仪 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015023173A JP6500474B2 (ja) | 2015-02-09 | 2015-02-09 | 光学分析装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016145770A JP2016145770A (ja) | 2016-08-12 |
| JP2016145770A5 true JP2016145770A5 (enExample) | 2017-09-21 |
| JP6500474B2 JP6500474B2 (ja) | 2019-04-17 |
Family
ID=56567296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015023173A Active JP6500474B2 (ja) | 2015-02-09 | 2015-02-09 | 光学分析装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9877368B2 (enExample) |
| JP (1) | JP6500474B2 (enExample) |
| CN (1) | CN105866029B (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6500474B2 (ja) * | 2015-02-09 | 2019-04-17 | 株式会社島津製作所 | 光学分析装置 |
| CN106251750A (zh) * | 2016-10-08 | 2016-12-21 | 铜仁学院 | 一种开放式光电效应实验仪及其操作方法 |
| US10768160B2 (en) * | 2017-01-12 | 2020-09-08 | Regents Of The University Of Minnesota | Artificial gut simulator and method |
| US10041914B1 (en) * | 2017-06-02 | 2018-08-07 | Shimadzu Corporation | Degassing device |
| EP4143543A1 (en) | 2020-04-30 | 2023-03-08 | Promega Corporation | Laser illumination techniques for capillary electrophoresis |
| WO2023089545A1 (zh) | 2021-11-18 | 2023-05-25 | 大连兆晶生物科技有限公司 | 光学分析系统及其光学分析仪 |
| TWI815724B (zh) * | 2021-11-18 | 2023-09-11 | 新加坡商兆晶生物科技股份有限公司(新加坡) | 光學分析系統及其光學分析儀 |
| CN117825297A (zh) * | 2022-09-29 | 2024-04-05 | 深圳迈瑞生物医疗电子股份有限公司 | 一种样本分析仪及其控制方法 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5037199A (en) * | 1989-02-22 | 1991-08-06 | Linear Instruments Corporation | Ball lens micro-cell |
| EP0472963A3 (en) * | 1990-08-27 | 1992-07-08 | Sumitomo Electric Industries, Limited | Light emitting diode for photosensor and photosensor using such light emitting diode |
| US5250797A (en) * | 1990-10-05 | 1993-10-05 | Canon Kabushiki Kaisha | Exposure method and apparatus for controlling light pulse emission using determined exposure quantities and control parameters |
| US5589935A (en) * | 1995-05-25 | 1996-12-31 | Honeywell, Inc. | Turbidity sensor with the capability of regulating the intensity of a light source |
| US5659414A (en) * | 1995-06-20 | 1997-08-19 | Xerox Corporation | Means for controlling the power output of laser diodes in a ROS system |
| KR100209608B1 (ko) * | 1995-09-15 | 1999-07-15 | 구자홍 | 광 출력검지 장치 |
| JP3548309B2 (ja) * | 1996-01-09 | 2004-07-28 | キヤノン株式会社 | フォトセンサ |
| US6266314B1 (en) * | 1996-10-01 | 2001-07-24 | Matsushita Electric Industrial Co., Ltd. | Optical pickup device |
| US6303916B1 (en) * | 1998-12-24 | 2001-10-16 | Mitutoyo Corporation | Systems and methods for generating reproducible illumination |
| JP2001343563A (ja) * | 2000-03-31 | 2001-12-14 | Oki Electric Ind Co Ltd | モニタ光取出し用光学装置 |
| WO2002067051A1 (en) * | 2001-02-21 | 2002-08-29 | Citizen Watch Co., Ltd. | Light source for optical devices |
| US6527460B2 (en) * | 2001-06-27 | 2003-03-04 | International Business Machines Corporation | Light emitter control system |
| US7045752B2 (en) * | 2003-06-30 | 2006-05-16 | Intel Corporation | Illuminated and non-illuminated photodiodes for monitoring and controlling AC and DC components of a laser beam |
| US7473879B2 (en) * | 2003-12-19 | 2009-01-06 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | LED illumination system having an intensity monitoring system |
| JP4844031B2 (ja) * | 2005-07-20 | 2011-12-21 | 富士ゼロックス株式会社 | 発光モジュール |
| JP2007093249A (ja) * | 2005-09-27 | 2007-04-12 | Yokogawa Electric Corp | 光量計測装置および光量計測方法 |
| US20080018894A1 (en) * | 2006-05-07 | 2008-01-24 | Zu Jianping Lily | Optical ball lens light scattering apparatus and method for use thereof |
| JP5134862B2 (ja) * | 2007-05-16 | 2013-01-30 | 株式会社日立ハイテクノロジーズ | 分析装置 |
| DE102009048710B4 (de) * | 2009-10-08 | 2020-04-02 | Leica Microsystems Cms Gmbh | Lasersystem für ein Mikroskop und Verfahren zum Betreiben eines Lasersystems für ein Mikroskop |
| JP2011237384A (ja) * | 2010-05-13 | 2011-11-24 | Hitachi High-Technologies Corp | 分析用光学系及びその光学系を用いた分析装置 |
| US8592739B2 (en) * | 2010-11-02 | 2013-11-26 | Microsoft Corporation | Detection of configuration changes of an optical element in an illumination system |
| TW201405189A (zh) * | 2012-07-24 | 2014-02-01 | Hon Hai Prec Ind Co Ltd | 光學耦合透鏡以及光學通訊模組 |
| US9304280B2 (en) * | 2013-03-14 | 2016-04-05 | The Regents Of The University Of Michigan | Compact lens system and array |
| US9618450B2 (en) * | 2013-09-27 | 2017-04-11 | Ecolab USA, Inc. | Multi-channel fluorometric sensor and method of using same |
| US9605999B2 (en) * | 2013-11-15 | 2017-03-28 | Marko Bosiljevac | Light sources with highly stable output intensity |
| JP6413759B2 (ja) * | 2014-12-25 | 2018-10-31 | 株式会社島津製作所 | 光学分析装置 |
| JP6500474B2 (ja) * | 2015-02-09 | 2019-04-17 | 株式会社島津製作所 | 光学分析装置 |
| JP6595204B2 (ja) * | 2015-04-24 | 2019-10-23 | 株式会社島津製作所 | 光学分析装置 |
-
2015
- 2015-02-09 JP JP2015023173A patent/JP6500474B2/ja active Active
-
2016
- 2016-02-04 US US15/015,810 patent/US9877368B2/en active Active
- 2016-02-04 CN CN201610079436.3A patent/CN105866029B/zh active Active
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