JP2018072267A5 - - Google Patents
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- JP2018072267A5 JP2018072267A5 JP2016215545A JP2016215545A JP2018072267A5 JP 2018072267 A5 JP2018072267 A5 JP 2018072267A5 JP 2016215545 A JP2016215545 A JP 2016215545A JP 2016215545 A JP2016215545 A JP 2016215545A JP 2018072267 A5 JP2018072267 A5 JP 2018072267A5
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- 238000003384 imaging method Methods 0.000 claims 10
- 239000000284 extract Substances 0.000 claims 5
- 238000005259 measurement Methods 0.000 claims 5
- 239000000523 sample Substances 0.000 claims 2
- 238000000034 method Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016215545A JP6797638B2 (ja) | 2016-11-02 | 2016-11-02 | 画像測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016215545A JP6797638B2 (ja) | 2016-11-02 | 2016-11-02 | 画像測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018072267A JP2018072267A (ja) | 2018-05-10 |
| JP2018072267A5 true JP2018072267A5 (enExample) | 2019-10-24 |
| JP6797638B2 JP6797638B2 (ja) | 2020-12-09 |
Family
ID=62115242
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016215545A Expired - Fee Related JP6797638B2 (ja) | 2016-11-02 | 2016-11-02 | 画像測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP6797638B2 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019199663A (ja) * | 2018-05-16 | 2019-11-21 | Juki株式会社 | 検査装置 |
| JP7296186B2 (ja) * | 2019-05-31 | 2023-06-22 | 株式会社ミツトヨ | 形状測定システムおよびその制御方法 |
| DE112021002777T5 (de) | 2020-05-14 | 2023-02-23 | Tokyo Seimitsu Co., Ltd. | Formmessvorrichtung und Verfahren zum Steuern von dieser |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE29823884U1 (de) * | 1997-06-12 | 2000-02-24 | Werth Messtechnik GmbH, 35394 Gießen | Koordinatenmessgerät zur Messung von Strukturen eines Objekts |
| JP4132308B2 (ja) * | 1998-11-20 | 2008-08-13 | 株式会社キーエンス | 形状測定器 |
| JP2003148942A (ja) * | 2001-11-16 | 2003-05-21 | Tokyo Seimitsu Co Ltd | スタイラス先端子検査装置 |
| CN1329711C (zh) * | 2005-09-14 | 2007-08-01 | 哈尔滨工业大学 | 基于双光纤耦合的微小内腔体尺寸测量装置与方法 |
| DE102006001531A1 (de) * | 2005-09-20 | 2007-03-22 | Werth Messtechnik Gmbh | Verfahren und Anordnung zur Messung von Strukturen eines Objekts |
| JP5101955B2 (ja) * | 2006-09-20 | 2012-12-19 | 株式会社ミツトヨ | 形状測定方法及び形状測定装置 |
| JP5545691B2 (ja) * | 2008-04-14 | 2014-07-09 | 株式会社ミツトヨ | 形状測定方法及び形状測定装置 |
| JP6147998B2 (ja) * | 2012-12-03 | 2017-06-14 | 株式会社ミツトヨ | 表面性状測定装置、表面性状測定方法およびプログラム |
| JP2015219169A (ja) * | 2014-05-20 | 2015-12-07 | リョーエイ株式会社 | 真円度測定用プローブ、真円度測定装置、及び真円度測定方法 |
| JP2016085057A (ja) * | 2014-10-23 | 2016-05-19 | 株式会社キーエンス | 座標測定装置 |
-
2016
- 2016-11-02 JP JP2016215545A patent/JP6797638B2/ja not_active Expired - Fee Related
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