MX2019009157A - Dispositivo de inspeccion y sistema de fundicion. - Google Patents

Dispositivo de inspeccion y sistema de fundicion.

Info

Publication number
MX2019009157A
MX2019009157A MX2019009157A MX2019009157A MX2019009157A MX 2019009157 A MX2019009157 A MX 2019009157A MX 2019009157 A MX2019009157 A MX 2019009157A MX 2019009157 A MX2019009157 A MX 2019009157A MX 2019009157 A MX2019009157 A MX 2019009157A
Authority
MX
Mexico
Prior art keywords
light
image
irradiated
inspection
irradiation pattern
Prior art date
Application number
MX2019009157A
Other languages
English (en)
Inventor
Ota Kazuhiro
Iwasaki Junichi
Seki Tsutomu
Ichino Yoshimitsu
SONOHARA Takeshi
Kawakami Ryuichi
Aoki Tatsuya
Original Assignee
Sintokogio Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sintokogio Ltd filed Critical Sintokogio Ltd
Publication of MX2019009157A publication Critical patent/MX2019009157A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B22—CASTING; POWDER METALLURGY
    • B22C—FOUNDRY MOULDING
    • B22C19/00—Components or accessories for moulding machines
    • B22C19/04—Controlling devices specially designed for moulding machines
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B22—CASTING; POWDER METALLURGY
    • B22C—FOUNDRY MOULDING
    • B22C9/00—Moulds or cores; Moulding processes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B22—CASTING; POWDER METALLURGY
    • B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D37/00—Controlling or regulating the pouring of molten metal from a casting melt-holding vessel
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B22—CASTING; POWDER METALLURGY
    • B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D47/00—Casting plants
    • B22D47/02—Casting plants for both moulding and casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8809—Adjustment for highlighting flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Abstract

Un dispositivo de inspección es un dispositivo que inspecciona la apariencia de un objetivo, que incluye: un dispositivo de imágenes configurado para generar imágenes del objetivo desde una primera dirección; una unidad de iluminación configurada para aplicar luz al objetivo en un primer patrón de iluminación en el cual la luz se aplica al objetivo desde una primera posición y en un segundo patrón de iluminación en el cual la luz se aplica al objetivo desde una segunda posición diferente a la primera posición; y un controlador configurado para adquirir una primera imagen de inspección al provocar que el dispositivo de imágenes genere una imagen del objetivo al cual se aplica la luz en el primer patrón de iluminación, el controlador estando configurado para adquirir una segunda imagen de inspección al provocar que el dispositivo de imágenes genere una imagen del objetivo al cual se aplica la luz en el segundo patrón de iluminación, el controlador estando configurado para inspeccionar una apariencia del objetivo con base en la primera imagen de inspección, la segunda imagen de inspección, y una imagen de referencia proporcionada de antemano. La primera posición y la segunda posición se superponen entre sí cuando se ven desde la primera dirección.
MX2019009157A 2017-05-26 2018-05-10 Dispositivo de inspeccion y sistema de fundicion. MX2019009157A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017104685 2017-05-26
PCT/JP2018/018190 WO2018216495A1 (ja) 2017-05-26 2018-05-10 検査装置及び鋳造システム

Publications (1)

Publication Number Publication Date
MX2019009157A true MX2019009157A (es) 2019-10-07

Family

ID=64395528

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2019009157A MX2019009157A (es) 2017-05-26 2018-05-10 Dispositivo de inspeccion y sistema de fundicion.

Country Status (8)

Country Link
US (1) US11158041B2 (es)
EP (1) EP3546927A4 (es)
JP (1) JPWO2018216495A1 (es)
KR (1) KR20200012838A (es)
CN (1) CN110678740A (es)
MX (1) MX2019009157A (es)
TW (1) TW201901142A (es)
WO (1) WO2018216495A1 (es)

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US11810286B2 (en) 2020-03-30 2023-11-07 Sintokogio, Ltd. Display control device and storage medium
CN113466236A (zh) 2020-03-30 2021-10-01 新东工业株式会社 检查结果显示装置及记录介质
JP7363638B2 (ja) 2020-03-30 2023-10-18 新東工業株式会社 表示制御装置及び制御プログラム
JP7338534B2 (ja) * 2020-03-30 2023-09-05 新東工業株式会社 表示制御装置及び制御プログラム
US11301980B2 (en) * 2020-04-21 2022-04-12 GM Global Technology Operations LLC System and method to evaluate the integrity of spot welds
JP7270842B2 (ja) * 2020-04-28 2023-05-10 三菱電機株式会社 外観検査装置および外観検査方法
JP2022102666A (ja) * 2020-12-25 2022-07-07 新東工業株式会社 検査装置、検査方法、機械学習装置、及び機械学習方法
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Also Published As

Publication number Publication date
EP3546927A1 (en) 2019-10-02
US20200234419A1 (en) 2020-07-23
CN110678740A (zh) 2020-01-10
EP3546927A4 (en) 2020-09-09
TW201901142A (zh) 2019-01-01
US11158041B2 (en) 2021-10-26
WO2018216495A1 (ja) 2018-11-29
KR20200012838A (ko) 2020-02-05
JPWO2018216495A1 (ja) 2020-03-26

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