CN105866029B - 光学分析仪 - Google Patents

光学分析仪 Download PDF

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Publication number
CN105866029B
CN105866029B CN201610079436.3A CN201610079436A CN105866029B CN 105866029 B CN105866029 B CN 105866029B CN 201610079436 A CN201610079436 A CN 201610079436A CN 105866029 B CN105866029 B CN 105866029B
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China
Prior art keywords
light
optical
photodetector
sample
amount
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CN201610079436.3A
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English (en)
Chinese (zh)
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CN105866029A (zh
Inventor
长井悠佑
小川佳祐
渡边真人
神宫句实子
藤原理悟
山崎智之
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Shimadzu Corp
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Shimadzu Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/10—Controlling the intensity of the light
    • H05B45/12—Controlling the intensity of the light using optical feedback
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106—General arrangement of respective parts
    • G01N2021/0112—Apparatus in one mechanical, optical or electronic block
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0621—Supply
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0638—Refractive parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0692—Regulated sources; stabilised supply
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0695—Supply to maintain constant beam intensity

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201610079436.3A 2015-02-09 2016-02-04 光学分析仪 Active CN105866029B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015023173A JP6500474B2 (ja) 2015-02-09 2015-02-09 光学分析装置
JP2015-023173 2015-02-09

Publications (2)

Publication Number Publication Date
CN105866029A CN105866029A (zh) 2016-08-17
CN105866029B true CN105866029B (zh) 2018-12-07

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ID=56567296

Family Applications (1)

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CN201610079436.3A Active CN105866029B (zh) 2015-02-09 2016-02-04 光学分析仪

Country Status (3)

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US (1) US9877368B2 (enExample)
JP (1) JP6500474B2 (enExample)
CN (1) CN105866029B (enExample)

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* Cited by examiner, † Cited by third party
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JP6500474B2 (ja) * 2015-02-09 2019-04-17 株式会社島津製作所 光学分析装置
CN106251750A (zh) * 2016-10-08 2016-12-21 铜仁学院 一种开放式光电效应实验仪及其操作方法
US10768160B2 (en) * 2017-01-12 2020-09-08 Regents Of The University Of Minnesota Artificial gut simulator and method
US10041914B1 (en) * 2017-06-02 2018-08-07 Shimadzu Corporation Degassing device
WO2021221665A1 (en) 2020-04-30 2021-11-04 Promega Corporation Laser illumination techniques for capillary electrophoresis
TWI815724B (zh) * 2021-11-18 2023-09-11 新加坡商兆晶生物科技股份有限公司（新加坡） 光學分析系統及其光學分析儀
CN117120815A (zh) 2021-11-18 2023-11-24 大连兆晶生物科技有限公司 光学分析系统及其光学分析仪
CN117825297A (zh) * 2022-09-29 2024-04-05 深圳迈瑞生物医疗电子股份有限公司 一种样本分析仪及其控制方法

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CN103091071A (zh) * 2010-11-02 2013-05-08 微软公司 对照明系统的配置改变的检测

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US5589935A (en) * 1995-05-25 1996-12-31 Honeywell, Inc. Turbidity sensor with the capability of regulating the intensity of a light source
US5659414A (en) * 1995-06-20 1997-08-19 Xerox Corporation Means for controlling the power output of laser diodes in a ROS system
KR100209608B1 (ko) * 1995-09-15 1999-07-15 구자홍 광 출력검지 장치
JP3548309B2 (ja) * 1996-01-09 2004-07-28 キヤノン株式会社 フォトセンサ
US6256283B1 (en) * 1996-10-01 2001-07-03 Matsushita Electric Industrial Co., Ltd. Optical pickup having a common light beam path for passing either of a plurality of kinds of light beams
JP2001343563A (ja) * 2000-03-31 2001-12-14 Oki Electric Ind Co Ltd モニタ光取出し用光学装置
US7015446B2 (en) * 2001-02-21 2006-03-21 Citizen Watch Co., Ltd. Light source for an optical apparatus in which the amount of light emission is controlled at a constant level
US6527460B2 (en) * 2001-06-27 2003-03-04 International Business Machines Corporation Light emitter control system
US7045752B2 (en) * 2003-06-30 2006-05-16 Intel Corporation Illuminated and non-illuminated photodiodes for monitoring and controlling AC and DC components of a laser beam
US7473879B2 (en) * 2003-12-19 2009-01-06 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. LED illumination system having an intensity monitoring system
JP4844031B2 (ja) * 2005-07-20 2011-12-21 富士ゼロックス株式会社 発光モジュール
JP2007093249A (ja) * 2005-09-27 2007-04-12 Yokogawa Electric Corp 光量計測装置および光量計測方法
WO2007130669A2 (en) * 2006-05-07 2007-11-15 Zu Jianping Lily Optical ball lens light scattering apparatus and method for use thereof
JP5134862B2 (ja) * 2007-05-16 2013-01-30 株式会社日立ハイテクノロジーズ 分析装置
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JP6500474B2 (ja) * 2015-02-09 2019-04-17 株式会社島津製作所 光学分析装置
JP6595204B2 (ja) * 2015-04-24 2019-10-23 株式会社島津製作所 光学分析装置

Patent Citations (2)

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US6303916B1 (en) * 1998-12-24 2001-10-16 Mitutoyo Corporation Systems and methods for generating reproducible illumination
CN103091071A (zh) * 2010-11-02 2013-05-08 微软公司 对照明系统的配置改变的检测

Also Published As

Publication number Publication date
JP2016145770A (ja) 2016-08-12
US20160234904A1 (en) 2016-08-11
CN105866029A (zh) 2016-08-17
JP6500474B2 (ja) 2019-04-17
US9877368B2 (en) 2018-01-23

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