JP2015190833A - 回路装置、温度検出装置、電子機器及び温度検出方法 - Google Patents

回路装置、温度検出装置、電子機器及び温度検出方法 Download PDF

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Publication number
JP2015190833A
JP2015190833A JP2014067764A JP2014067764A JP2015190833A JP 2015190833 A JP2015190833 A JP 2015190833A JP 2014067764 A JP2014067764 A JP 2014067764A JP 2014067764 A JP2014067764 A JP 2014067764A JP 2015190833 A JP2015190833 A JP 2015190833A
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Japan
Prior art keywords
temperature
value
detection
thermopile
electromotive voltage
Prior art date
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JP2014067764A
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English (en)
Japanese (ja)
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JP2015190833A5 (enExample
Inventor
大西　幸太
Kota Onishi
幸太 大西
伝 日向
Tsutae Hiuga
伝 日向
幸成 柴田
Yukinari Shibata
幸成 柴田
ちひろ 福本
Chihiro Fukumoto
ちひろ 福本
直樹 西垣
Naoki Nishigaki
直樹 西垣
浩二 川口
Koji Kawaguchi
浩二 川口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
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Seiko Epson Corp
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Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2014067764A priority Critical patent/JP2015190833A/ja
Priority to US14/665,253 priority patent/US9915568B2/en
Priority to CN201510141711.5A priority patent/CN104949760A/zh
Publication of JP2015190833A publication Critical patent/JP2015190833A/ja
Publication of JP2015190833A5 publication Critical patent/JP2015190833A5/ja
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
    • G01K7/14—Arrangements for modifying the output characteristic, e.g. linearising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/04—Casings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G01J5/14—Electrical features thereof
    • G01J5/16—Arrangements with respect to the cold junction; Compensating influence of ambient temperature or other variables

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
JP2014067764A 2014-03-28 2014-03-28 回路装置、温度検出装置、電子機器及び温度検出方法 Withdrawn JP2015190833A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2014067764A JP2015190833A (ja) 2014-03-28 2014-03-28 回路装置、温度検出装置、電子機器及び温度検出方法
US14/665,253 US9915568B2 (en) 2014-03-28 2015-03-23 Circuit device, temperature detection device, electronic device, and temperature detection method
CN201510141711.5A CN104949760A (zh) 2014-03-28 2015-03-27 电路装置、温度检测装置、电子设备以及温度检测方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014067764A JP2015190833A (ja) 2014-03-28 2014-03-28 回路装置、温度検出装置、電子機器及び温度検出方法

Publications (2)

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JP2015190833A true JP2015190833A (ja) 2015-11-02
JP2015190833A5 JP2015190833A5 (enExample) 2017-04-20

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JP2014067764A Withdrawn JP2015190833A (ja) 2014-03-28 2014-03-28 回路装置、温度検出装置、電子機器及び温度検出方法

Country Status (3)

Country Link
US (1) US9915568B2 (enExample)
JP (1) JP2015190833A (enExample)
CN (1) CN104949760A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020196466A1 (ja) * 2019-03-28 2020-10-01 パナソニックＩｐマネジメント株式会社 加湿装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113701900A (zh) * 2020-05-22 2021-11-26 众智光电科技股份有限公司 红外线温度感测器
JP2022106602A (ja) * 2021-01-07 2022-07-20 株式会社ジャパンディスプレイ 温度検出装置、温度検出システム、表示装置及びヘッドアップディスプレイ

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666639A (ja) * 1992-08-20 1994-03-11 Toyota Central Res & Dev Lab Inc 赤外線温度計
JPH06123655A (ja) * 1992-10-09 1994-05-06 Hirose Electric Co Ltd 体温計
JP2001349787A (ja) * 2000-06-06 2001-12-21 Seiko Epson Corp 赤外線検出素子および測温計
US20070183475A1 (en) * 2006-02-03 2007-08-09 Hutcherson David R Methods and systems for determining temperature of an object
JP2007198745A (ja) * 2006-01-23 2007-08-09 Seiko Npc Corp 温度検出装置及び温度検出方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0862047A (ja) 1994-08-23 1996-03-08 Casio Comput Co Ltd 温度測定装置
KR100314438B1 (ko) * 1998-10-31 2002-04-24 구자홍 써모파일센서를이용한온도측정회로
JP3733846B2 (ja) 2000-08-04 2006-01-11 セイコーエプソン株式会社 補正システムの制御方法、測温計および補正装置
JP2002228523A (ja) 2001-02-05 2002-08-14 Nippon Ceramic Co Ltd 非接触型温度検出器の温度算出方法
US7375723B2 (en) 2003-06-10 2008-05-20 Samsung Electronics Co., Ltd. Display device and method of compensating primary image data to increase a response speed of the display
JP2005057480A (ja) 2003-08-04 2005-03-03 Shimada Phys & Chem Ind Co Ltd 歪み補償増幅装置
JP4247742B2 (ja) 2004-05-31 2009-04-02 横河電機株式会社 波長測定方法およびこれを用いた分光装置
JP4508754B2 (ja) 2004-07-14 2010-07-21 三菱電機株式会社 画像表示装置および画像表示方法
JP5625797B2 (ja) 2010-11-19 2014-11-19 日本電気株式会社 温度補正回路、復調回路、通信装置、温度補正方法、および、復調方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666639A (ja) * 1992-08-20 1994-03-11 Toyota Central Res & Dev Lab Inc 赤外線温度計
JPH06123655A (ja) * 1992-10-09 1994-05-06 Hirose Electric Co Ltd 体温計
JP2001349787A (ja) * 2000-06-06 2001-12-21 Seiko Epson Corp 赤外線検出素子および測温計
JP2007198745A (ja) * 2006-01-23 2007-08-09 Seiko Npc Corp 温度検出装置及び温度検出方法
US20070183475A1 (en) * 2006-02-03 2007-08-09 Hutcherson David R Methods and systems for determining temperature of an object
JP2007206079A (ja) * 2006-02-03 2007-08-16 Ge Infrastructure Sensing Inc 物体の温度を決定するための方法およびシステム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020196466A1 (ja) * 2019-03-28 2020-10-01 パナソニックＩｐマネジメント株式会社 加湿装置

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Publication number Publication date
CN104949760A (zh) 2015-09-30
US20150276499A1 (en) 2015-10-01
US9915568B2 (en) 2018-03-13

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