JP2015129912A - 画素のアレイ及び周辺回路を含むフラットパネルディスプレイをテストする方法、及びそのシステム - Google Patents

画素のアレイ及び周辺回路を含むフラットパネルディスプレイをテストする方法、及びそのシステム Download PDF

Info

Publication number
JP2015129912A
JP2015129912A JP2014206250A JP2014206250A JP2015129912A JP 2015129912 A JP2015129912 A JP 2015129912A JP 2014206250 A JP2014206250 A JP 2014206250A JP 2014206250 A JP2014206250 A JP 2014206250A JP 2015129912 A JP2015129912 A JP 2015129912A
Authority
JP
Japan
Prior art keywords
voltage
peripheral circuit
circuit
igd
panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2014206250A
Other languages
English (en)
Japanese (ja)
Inventor
ヒー リー チャン
Chang Hee Lee
ヒー リー チャン
リー ジェイムズ
Lee James
リー ジェイムズ
ジン キム サン
Sang Jin Kim
ジン キム サン
リー ジョンゴ
Lee Jongho
リー ジョンゴ
ショーン カサディ マイケル
Sean Cassady Michael
ショーン カサディ マイケル
モキチェブ ニコライ
Mokichev Nickolay
モキチェブ ニコライ
グエン ケント
Nguyen Kent
グエン ケント
トエト ダニエル
Toet Daniel
トエト ダニエル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Photon Dynamics Inc
Original Assignee
Photon Dynamics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photon Dynamics Inc filed Critical Photon Dynamics Inc
Publication of JP2015129912A publication Critical patent/JP2015129912A/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Liquid Crystal (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Power Engineering (AREA)
  • Multimedia (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2014206250A 2013-10-09 2014-10-07 画素のアレイ及び周辺回路を含むフラットパネルディスプレイをテストする方法、及びそのシステム Pending JP2015129912A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361888731P 2013-10-09 2013-10-09
US61/888731 2013-10-09

Publications (1)

Publication Number Publication Date
JP2015129912A true JP2015129912A (ja) 2015-07-16

Family

ID=53035359

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014206250A Pending JP2015129912A (ja) 2013-10-09 2014-10-07 画素のアレイ及び周辺回路を含むフラットパネルディスプレイをテストする方法、及びそのシステム

Country Status (4)

Country Link
JP (1) JP2015129912A (ko)
KR (1) KR102250763B1 (ko)
CN (1) CN104732901B (ko)
TW (1) TW201528235A (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7062449B2 (ja) * 2018-01-23 2022-05-06 株式会社ディスコ 被加工物の切削方法
KR20200051418A (ko) 2018-11-05 2020-05-13 안영진 화장품 병
CN110161729B (zh) * 2019-05-17 2021-08-03 深圳市华星光电半导体显示技术有限公司 显示面板测试方法及系统
KR102632426B1 (ko) * 2019-06-05 2024-01-31 어플라이드 머티어리얼스, 인코포레이티드 기판 상의 결함을 식별하기 위한 방법, 및 기판 상의 결함 있는 드라이버 회로를 식별하기 위한 장치
CN114512077B (zh) * 2020-10-23 2023-12-05 西安诺瓦星云科技股份有限公司 接收卡输出的驱动时序检测方法、装置及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5391985A (en) * 1992-03-06 1995-02-21 Photon Dynamics, Inc. Method and apparatus for measuring high speed logic states using voltage imaging with burst clocking
US6678404B1 (en) * 2000-10-31 2004-01-13 Shih-Jong J. Lee Automatic referencing for computer vision applications
JP3468755B2 (ja) * 2001-03-05 2003-11-17 石川島播磨重工業株式会社 液晶駆動基板の検査装置
US7714589B2 (en) * 2005-11-15 2010-05-11 Photon Dynamics, Inc. Array test using the shorting bar and high frequency clock signal for the inspection of TFT-LCD with integrated driver IC
JP4646035B2 (ja) * 2006-04-07 2011-03-09 株式会社 日立ディスプレイズ ラビング角度測定装置、及び液晶表示装置並びに光学フィルムの製造方法

Also Published As

Publication number Publication date
TW201528235A (zh) 2015-07-16
KR102250763B1 (ko) 2021-05-12
CN104732901A (zh) 2015-06-24
KR20150042134A (ko) 2015-04-20
CN104732901B (zh) 2019-05-10

Similar Documents

Publication Publication Date Title
KR102250763B1 (ko) 플랫 패널 장치의 주변 회로에 대한 직접적인 테스팅
KR102472765B1 (ko) 셀 접촉 프로빙 패드를 사용한 평판 패널 디스플레이의 전기적 검사 시스템 및 그 방법
JP6100246B2 (ja) 全原画像を使用した欠陥検出システムおよび方法
JP6257192B2 (ja) アレイ基板およびその検査方法ならびに液晶表示装置
US20060192752A1 (en) Inspection method semiconductor device and display device
CN107680523B (zh) 阵列基板十字线缺陷的检测方法
JP5034382B2 (ja) Ｔｆｔアレイの検査方法及びｔｆｔアレイ検査装置
JP4831525B2 (ja) Ｔｆｔアレイの検査方法及びｔｆｔアレイ検査装置
US20150097592A1 (en) Direct testing for peripheral circuits in flat panel devices
WO2011070663A1 (ja) Ｔｆｔ基板検査装置およびｔｆｔ基板検査方法
JP5007925B2 (ja) Ｔｆｔアレイ検査における電子線走査方法
JP4853705B2 (ja) Ｔｆｔアレイの検査方法及びｔｆｔアレイ検査装置
JP3963983B2 (ja) Ｔｆｔ基板の検査方法、検査装置および検査装置の制御方法
KR20010087833A (ko) 평판표시소자의 전기적 검사 장치 및 그 방법
JP2012078127A (ja) Ｔｆｔアレイ検査装置およびｔｆｔアレイ検査方法
US11092639B2 (en) Display device and inspection method of display device
JP5466393B2 (ja) Ｔｆｔアレイの検査方法及びｔｆｔアレイの検査装置
JP5408540B2 (ja) Ｔｆｔアレイの検査方法及びｔｆｔアレイ検査装置
JP2002040075A (ja) アクティブマトリクス基板検査装置及びアクティブマトリクス基板の検査方法
CN112327527A (zh) 定位线路异常位置的装置及方法
KR20020046018A (ko) 액정표시소자의 단락위치검출방법
JP5423664B2 (ja) Ｔｆｔアレイ検査装置
Freeman et al. 25.2: Invited Paper: Implications of Super High Resolution to Array Testing
JP2014009965A (ja) 配線欠陥検査装置、配線欠陥検査方法、及び半導体基板の製造方法
JP2011017710A (ja) アレイ基板の検査方法及び検査装置