JP2015116656A5 - - Google Patents
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- Publication number
- JP2015116656A5 JP2015116656A5 JP2014093840A JP2014093840A JP2015116656A5 JP 2015116656 A5 JP2015116656 A5 JP 2015116656A5 JP 2014093840 A JP2014093840 A JP 2014093840A JP 2014093840 A JP2014093840 A JP 2014093840A JP 2015116656 A5 JP2015116656 A5 JP 2015116656A5
- Authority
- JP
- Japan
- Prior art keywords
- pad
- pressing portion
- polishing
- width
- retainer ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims description 78
- 239000000758 substrate Substances 0.000 claims description 69
- 230000002093 peripheral effect Effects 0.000 claims description 22
- 230000003014 reinforcing effect Effects 0.000 claims description 11
- 239000007788 liquid Substances 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 3
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014093840A JP6403981B2 (ja) | 2013-11-13 | 2014-04-30 | 基板保持装置、研磨装置、研磨方法、およびリテーナリング |
| SG10201407353UA SG10201407353UA (en) | 2013-11-13 | 2014-11-07 | Substrate holder, polishing apparatus, polishing method, and retaining ring |
| US14/537,809 US9815171B2 (en) | 2013-11-13 | 2014-11-10 | Substrate holder, polishing apparatus, polishing method, and retaining ring |
| KR1020140155293A KR20150055566A (ko) | 2013-11-13 | 2014-11-10 | 기판 보유 지지 장치, 연마 장치, 연마 방법 및 리테이너 링 |
| TW103138997A TWI614091B (zh) | 2013-11-13 | 2014-11-11 | 基板保持裝置、研磨裝置、研磨方法、及扣環 |
| CN201410640498.8A CN104625948B (zh) | 2013-11-13 | 2014-11-13 | 基板保持装置、研磨装置、研磨方法及保持环 |
| KR1020180104398A KR102208160B1 (ko) | 2013-11-13 | 2018-09-03 | 기판 보유 지지 장치, 연마 장치, 연마 방법 및 리테이너 링 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013235210 | 2013-11-13 | ||
| JP2013235210 | 2013-11-13 | ||
| JP2014093840A JP6403981B2 (ja) | 2013-11-13 | 2014-04-30 | 基板保持装置、研磨装置、研磨方法、およびリテーナリング |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015116656A JP2015116656A (ja) | 2015-06-25 |
| JP2015116656A5 true JP2015116656A5 (enExample) | 2017-12-14 |
| JP6403981B2 JP6403981B2 (ja) | 2018-10-10 |
Family
ID=53044185
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014093840A Active JP6403981B2 (ja) | 2013-11-13 | 2014-04-30 | 基板保持装置、研磨装置、研磨方法、およびリテーナリング |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9815171B2 (enExample) |
| JP (1) | JP6403981B2 (enExample) |
| KR (2) | KR20150055566A (enExample) |
| CN (1) | CN104625948B (enExample) |
| SG (1) | SG10201407353UA (enExample) |
| TW (1) | TWI614091B (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016155188A (ja) * | 2015-02-24 | 2016-09-01 | 株式会社荏原製作所 | リテーナリング、基板保持装置、研磨装置およびリテーナリングのメンテナンス方法 |
| US10293454B2 (en) * | 2015-06-11 | 2019-05-21 | Toshiba Memory Corporation | Polishing head, polishing apparatus and polishing method |
| TWD179095S (zh) | 2015-08-25 | 2016-10-21 | 荏原製作所股份有限公司 | 基板保持環 |
| JP6392193B2 (ja) * | 2015-10-14 | 2018-09-19 | 株式会社荏原製作所 | 基板保持装置および基板研磨装置ならびに基板保持装置の製造方法 |
| US10510563B2 (en) * | 2016-04-15 | 2019-12-17 | Taiwan Semiconductor Manufacturing Company Ltd. | Wafer carrier assembly |
| US10322492B2 (en) | 2016-07-25 | 2019-06-18 | Applied Materials, Inc. | Retaining ring for CMP |
| KR102872854B1 (ko) | 2018-03-13 | 2025-10-16 | 어플라이드 머티어리얼스, 인코포레이티드 | 화학적 기계적 폴리셔의 소모성 부품 모니터링 |
| TWI639486B (zh) * | 2018-05-31 | 2018-11-01 | 國立清華大學 | 全向整合式調節裝置 |
| JP7287761B2 (ja) | 2018-07-31 | 2023-06-06 | 株式会社荏原製作所 | 球面軸受の軸受半径決定方法 |
| JP6446590B1 (ja) * | 2018-08-09 | 2018-12-26 | 国立大学法人 東京大学 | 局所研磨加工方法、および局所研磨加工装置、並びに該局所研磨加工装置を用いた修正研磨加工装置 |
| KR102725357B1 (ko) * | 2020-10-20 | 2024-11-06 | 주식회사 케이씨텍 | 리테이너링 및 이를 포함하는 기판 연마 장치 |
| JP6927617B1 (ja) * | 2020-11-19 | 2021-09-01 | 不二越機械工業株式会社 | ワーク研磨装置およびトップリング用樹脂マット体 |
| TWI826051B (zh) * | 2022-10-19 | 2023-12-11 | 力晶積成電子製造股份有限公司 | 化學機械研磨裝置及研磨方法 |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5795215A (en) | 1995-06-09 | 1998-08-18 | Applied Materials, Inc. | Method and apparatus for using a retaining ring to control the edge effect |
| US5681215A (en) * | 1995-10-27 | 1997-10-28 | Applied Materials, Inc. | Carrier head design for a chemical mechanical polishing apparatus |
| US5762544A (en) * | 1995-10-27 | 1998-06-09 | Applied Materials, Inc. | Carrier head design for a chemical mechanical polishing apparatus |
| EP0870576A3 (en) * | 1997-04-08 | 2000-10-11 | Ebara Corporation | Polishing Apparatus |
| JP3724911B2 (ja) | 1997-04-08 | 2005-12-07 | 株式会社荏原製作所 | ポリッシング装置 |
| US5885135A (en) * | 1997-04-23 | 1999-03-23 | International Business Machines Corporation | CMP wafer carrier for preferential polishing of a wafer |
| US6110025A (en) * | 1997-05-07 | 2000-08-29 | Obsidian, Inc. | Containment ring for substrate carrier apparatus |
| TW434095B (en) * | 1997-08-11 | 2001-05-16 | Tokyo Seimitsu Co Ltd | Wafer polishing apparatus |
| US6116992A (en) * | 1997-12-30 | 2000-09-12 | Applied Materials, Inc. | Substrate retaining ring |
| EP0992322A4 (en) * | 1998-04-06 | 2006-09-27 | Ebara Corp | GRINDING DEVICE |
| US6436228B1 (en) * | 1998-05-15 | 2002-08-20 | Applied Materials, Inc. | Substrate retainer |
| US6390904B1 (en) * | 1998-05-21 | 2002-05-21 | Applied Materials, Inc. | Retainers and non-abrasive liners used in chemical mechanical polishing |
| JP2000233363A (ja) * | 1999-02-16 | 2000-08-29 | Ebara Corp | ポリッシング装置及び方法 |
| TW399007B (en) * | 1999-03-04 | 2000-07-21 | Vanguard Int Semiconduct Corp | Floating ring of the chemical mechanical polishing head |
| US6113468A (en) * | 1999-04-06 | 2000-09-05 | Speedfam-Ipec Corporation | Wafer planarization carrier having floating pad load ring |
| JP3068086B1 (ja) * | 1999-05-07 | 2000-07-24 | 株式会社東京精密 | ウェ―ハ研磨装置 |
| JP2002018709A (ja) * | 2000-07-05 | 2002-01-22 | Tokyo Seimitsu Co Ltd | ウェーハ研磨装置 |
| US6419567B1 (en) * | 2000-08-14 | 2002-07-16 | Semiconductor 300 Gmbh & Co. Kg | Retaining ring for chemical-mechanical polishing (CMP) head, polishing apparatus, slurry cycle system, and method |
| JP2003197580A (ja) * | 2001-12-21 | 2003-07-11 | Fujikoshi Mach Corp | ウェーハ研磨装置 |
| US6916226B2 (en) * | 2002-05-28 | 2005-07-12 | Ebara Technologies, Inc. | Chemical mechanical polishing apparatus having a stepped retaining ring and method for use thereof |
| JP2005034959A (ja) * | 2003-07-16 | 2005-02-10 | Ebara Corp | 研磨装置及びリテーナリング |
| KR101252751B1 (ko) | 2003-11-13 | 2013-04-09 | 어플라이드 머티어리얼스, 인코포레이티드 | 성형 표면을 갖는 유지 링 |
| TWI280177B (en) | 2004-02-02 | 2007-05-01 | Powerchip Semiconductor Corp | Dummy process of chemical mechanical polishing process and polishing pad conditioning method |
| US7029375B2 (en) * | 2004-08-31 | 2006-04-18 | Tech Semiconductor Pte. Ltd. | Retaining ring structure for edge control during chemical-mechanical polishing |
| US7094133B2 (en) * | 2004-11-10 | 2006-08-22 | Kabushiki Kaisha Toshiba | Retainer and wafer polishing apparatus |
| US7326105B2 (en) * | 2005-08-31 | 2008-02-05 | Micron Technology, Inc. | Retaining rings, and associated planarizing apparatuses, and related methods for planarizing micro-device workpieces |
| JP4814677B2 (ja) | 2006-03-31 | 2011-11-16 | 株式会社荏原製作所 | 基板保持装置および研磨装置 |
| JP2008023603A (ja) * | 2006-07-18 | 2008-02-07 | Nippon Seimitsu Denshi Co Ltd | 2層構造のリテーナリング |
| US7789736B2 (en) * | 2006-10-13 | 2010-09-07 | Applied Materials, Inc. | Stepped retaining ring |
| JP4534165B2 (ja) * | 2006-12-18 | 2010-09-01 | エルピーダメモリ株式会社 | 半導体装置の製造装置及び、半導体装置の製造方法 |
| US8033895B2 (en) * | 2007-07-19 | 2011-10-11 | Applied Materials, Inc. | Retaining ring with shaped profile |
| JP5199691B2 (ja) | 2008-02-13 | 2013-05-15 | 株式会社荏原製作所 | 研磨装置 |
| US20100120335A1 (en) * | 2008-11-07 | 2010-05-13 | Novellus Systems, Inc. | Partial Contact Wafer Retaining Ring Apparatus |
| US8721391B2 (en) * | 2010-08-06 | 2014-05-13 | Applied Materials, Inc. | Carrier head with narrow inner ring and wide outer ring |
| US20130102152A1 (en) * | 2011-10-20 | 2013-04-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor manufacturing apparatus and method of manufacturing semiconductor device |
| JP5922965B2 (ja) * | 2012-03-29 | 2016-05-24 | 株式会社荏原製作所 | 基板保持装置、研磨装置、および研磨方法 |
-
2014
- 2014-04-30 JP JP2014093840A patent/JP6403981B2/ja active Active
- 2014-11-07 SG SG10201407353UA patent/SG10201407353UA/en unknown
- 2014-11-10 US US14/537,809 patent/US9815171B2/en active Active
- 2014-11-10 KR KR1020140155293A patent/KR20150055566A/ko not_active Ceased
- 2014-11-11 TW TW103138997A patent/TWI614091B/zh active
- 2014-11-13 CN CN201410640498.8A patent/CN104625948B/zh active Active
-
2018
- 2018-09-03 KR KR1020180104398A patent/KR102208160B1/ko active Active
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