USD769200S1 - Elastic membrane for semiconductor wafer polishing apparatus - Google Patents

Elastic membrane for semiconductor wafer polishing apparatus Download PDF

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Publication number
USD769200S1
USD769200S1 US29/472,346 US201329472346F USD769200S US D769200 S1 USD769200 S1 US D769200S1 US 201329472346 F US201329472346 F US 201329472346F US D769200 S USD769200 S US D769200S
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United States
Prior art keywords
semiconductor wafer
polishing apparatus
elastic membrane
wafer polishing
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/472,346
Inventor
Makoto Fukushima
Hozumi Yasuda
Keisuke Namiki
Osamu Nabeya
Shingo Togashi
Satoru Yamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JPD2013-10678F external-priority patent/JP1521701S/ja
Priority claimed from JPD2013-10677F external-priority patent/JP1521451S/ja
Priority claimed from JPD2013-10675F external-priority patent/JP1495082S/ja
Priority claimed from JPD2013-10673F external-priority patent/JP1495738S/ja
Priority claimed from JPD2013-10672F external-priority patent/JP1494713S/ja
Priority claimed from JPD2013-10676F external-priority patent/JP1495739S/ja
Priority claimed from JPD2013-10674F external-priority patent/JP1495081S/ja
Application filed by Ebara Corp filed Critical Ebara Corp
Assigned to EBARA CORPORATION reassignment EBARA CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NABEYA, OSAMU, NAMIKI, KEISUKE, FUKUSHIMA, MAKOTO, TOGASHI, SHINGO, YAMAKI, SATORU, YASUDA, HOZUMI
Priority to US29/489,477 priority Critical patent/USD770990S1/en
Priority to US29/580,339 priority patent/USD813180S1/en
Application granted granted Critical
Publication of USD769200S1 publication Critical patent/USD769200S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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FIG. 1 is a top perspective view a first embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 2 is a bottom perspective view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a side view thereof, with the apparatus being radially symmetrical about a vertical axis;
FIG. 6 is a cross sectional view taken along section line 6-6 in FIG. 3;
FIG. 7 is an enlarged portion view taken along line 7-7 in FIG. 6;
FIG. 8 is a top perspective view a second embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 9 is a bottom perspective view thereof;
FIG. 10 is a top plan view thereof;
FIG. 11 is a bottom plan view thereof;
FIG. 12 is a side view thereof, with the apparatus being radially symmetrical about a vertical axis;
FIG. 13 is a cross sectional view taken along section line 13-13 in FIG. 10;
FIG. 14 is an enlarged portion view taken along line 14-14 in FIG. 13;
FIG. 15 is a top perspective view a third embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 16 is a bottom perspective view thereof;
FIG. 17 is a top plan view thereof;
FIG. 18 is a bottom plan view thereof;
FIG. 19 is a side view thereof, the apparatus being radially symmetrical about a vertical axis;
FIG. 20 is a cross sectional view taken along section line 20-20 in FIG. 17;
FIG. 21 is an enlarged portion view taken along line 21-21 in FIG. 20;
FIG. 22 is a top perspective view a fourth embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 23 is a bottom perspective view thereof;
FIG. 24 is a top plan view thereof;
FIG. 25 is a bottom plan view thereof;
FIG. 26 is a side view thereof, the apparatus being radially symmetrical about a vertical axis;
FIG. 27 is a cross sectional view taken along line 27-27 in FIG. 24; and,
FIG. 28 is an enlarged portion view taken along line 28-28 in FIG. 27.
The broken lines shown in the drawings represent portions of the elastic membrane for semiconductor wafer polishing apparatus that form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an elastic membrane for semiconductor wafer polishing apparatus, as shown and described.
US29/472,346 2013-05-15 2013-11-12 Elastic membrane for semiconductor wafer polishing apparatus Active USD769200S1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US29/489,477 USD770990S1 (en) 2013-05-15 2014-04-30 Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339 USD813180S1 (en) 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus

Applications Claiming Priority (14)

Application Number Priority Date Filing Date Title
JPD2013-10676F JP1495739S (en) 2013-05-15 2013-05-15
JP2013-10676 2013-05-15
JP2013-10672 2013-05-15
JPD2013-10672F JP1494713S (en) 2013-05-15 2013-05-15
JP2013-10677 2013-05-15
JP2013-10678 2013-05-15
JPD2013-10673F JP1495738S (en) 2013-05-15 2013-05-15
JP2013-10675 2013-05-15
JPD2013-10674F JP1495081S (en) 2013-05-15 2013-05-15
JPD2013-10678F JP1521701S (en) 2013-05-15 2013-05-15
JPD2013-10677F JP1521451S (en) 2013-05-15 2013-05-15
JP2013-10674 2013-05-15
JPD2013-10675F JP1495082S (en) 2013-05-15 2013-05-15
JP2013-10673 2013-05-15

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US29/489,477 Continuation-In-Part USD770990S1 (en) 2013-05-15 2014-04-30 Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339 Division USD813180S1 (en) 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus

Publications (1)

Publication Number Publication Date
USD769200S1 true USD769200S1 (en) 2016-10-18

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US29/472,346 Active USD769200S1 (en) 2013-05-15 2013-11-12 Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339 Active USD813180S1 (en) 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus

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US29/580,339 Active USD813180S1 (en) 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus

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Cited By (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD797067S1 (en) * 2015-04-21 2017-09-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD798248S1 (en) * 2015-06-18 2017-09-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD799646S1 (en) * 2016-08-30 2017-10-10 Asm Ip Holding B.V. Heater block
USD801942S1 (en) * 2015-04-16 2017-11-07 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD808349S1 (en) * 2013-05-15 2018-01-23 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD813180S1 (en) * 2013-05-15 2018-03-20 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD836572S1 (en) * 2016-09-30 2018-12-25 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD839224S1 (en) 2016-12-12 2019-01-29 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD851613S1 (en) 2017-10-05 2019-06-18 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD859331S1 (en) * 2017-03-31 2019-09-10 Ebara Corporation Vacuum contact pad
USD859332S1 (en) 2017-06-29 2019-09-10 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD868124S1 (en) 2017-12-11 2019-11-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD877101S1 (en) 2018-03-09 2020-03-03 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD908645S1 (en) 2019-08-26 2021-01-26 Applied Materials, Inc. Sputtering target for a physical vapor deposition chamber
USD918161S1 (en) * 2017-12-19 2021-05-04 Ebara Corporation Elastic membrane
USD918848S1 (en) * 2019-07-18 2021-05-11 Kokusai Electric Corporation Retainer of ceiling heater for semiconductor fabrication apparatus
US11179823B2 (en) 2016-10-28 2021-11-23 Ebara Corporation Substrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
USD937329S1 (en) 2020-03-23 2021-11-30 Applied Materials, Inc. Sputter target for a physical vapor deposition chamber
USD940765S1 (en) 2020-12-02 2022-01-11 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD947802S1 (en) * 2020-05-20 2022-04-05 Applied Materials, Inc. Replaceable substrate carrier interfacing film
USD954567S1 (en) * 2019-06-25 2022-06-14 Ebara Corporation Measurement jig
USD962184S1 (en) * 2019-07-11 2022-08-30 Kokusai Electric Corporation Retainer plate of top heater for wafer processing furnace
USD962183S1 (en) * 2019-07-11 2022-08-30 Kokusai Electric Corporation Retainer plate of top heater for wafer processing furnace
USD981969S1 (en) * 2020-12-18 2023-03-28 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD989012S1 (en) * 2020-09-17 2023-06-13 Ebara Corporation Elastic membrane
USD1006768S1 (en) * 2021-01-07 2023-12-05 Solaero Technologies Corp. Semiconductor wafer for mosaic solar cell fabrication
USD1007449S1 (en) 2021-05-07 2023-12-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
US11958163B2 (en) 2016-10-28 2024-04-16 Ebara Corporation Substrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane

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US20010029158A1 (en) * 1998-07-30 2001-10-11 Yoshitaka Sasaki Polishing apparatus and polishing method, and method of manufacturing semiconductor device and method of manufacturing thin film magnetic head
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US20090111362A1 (en) * 2007-10-29 2009-04-30 Ebara Corporation Polishing Apparatus
US20090247057A1 (en) * 2005-09-14 2009-10-01 Ebara Corporation Polishing platen and polishing apparatus
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USD633452S1 (en) 2009-08-27 2011-03-01 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD634719S1 (en) 2009-08-27 2011-03-22 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD649126S1 (en) * 2008-10-20 2011-11-22 Ebara Corporation Vacuum contact pad
USD684551S1 (en) * 2011-07-07 2013-06-18 Phuong Van Nguyen Wafer polishing pad holder
US8469776B2 (en) * 2006-11-22 2013-06-25 Applied Materials, Inc. Flexible membrane for carrier head
USD686175S1 (en) * 2012-03-20 2013-07-16 Veeco Instruments Inc. Wafer carrier having pockets
USD686582S1 (en) * 2012-03-20 2013-07-23 Veeco Instruments Inc. Wafer carrier having pockets
USD687790S1 (en) * 2012-03-20 2013-08-13 Veeco Instruments Inc. Keyed wafer carrier
USD687791S1 (en) * 2012-03-20 2013-08-13 Veeco Instruments Inc. Multi-keyed wafer carrier
US20130316628A1 (en) * 2012-05-23 2013-11-28 Samsung Electronics Co., Ltd. Flexible membranes for a polishing head
USD711330S1 (en) 2010-12-28 2014-08-19 Ebara Corporation Elastic membrane for semiconductor wafer polishing
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US20050035514A1 (en) * 2003-08-11 2005-02-17 Supercritical Systems, Inc. Vacuum chuck apparatus and method for holding a wafer during high pressure processing
US7033252B2 (en) * 2004-03-05 2006-04-25 Strasbaugh Wafer carrier with pressurized membrane and retaining ring actuator
KR100753302B1 (en) * 2004-03-25 2007-08-29 이비덴 가부시키가이샤 Vacuum chuck, suction board, polishing device, and method for manufacturing of semiconductor wafer
USD769200S1 (en) * 2013-05-15 2016-10-18 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD770990S1 (en) * 2013-05-15 2016-11-08 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD797067S1 (en) * 2015-04-21 2017-09-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD798248S1 (en) * 2015-06-18 2017-09-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target

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Publication number Priority date Publication date Assignee Title
US20010029158A1 (en) * 1998-07-30 2001-10-11 Yoshitaka Sasaki Polishing apparatus and polishing method, and method of manufacturing semiconductor device and method of manufacturing thin film magnetic head
US6659850B2 (en) * 2000-03-31 2003-12-09 Speedfam-Ipec Corporation Work piece carrier with adjustable pressure zones and barriers and a method of planarizing a work piece
US7357699B2 (en) * 2003-02-10 2008-04-15 Ebara Corporation Substrate holding apparatus and polishing apparatus
US20040175951A1 (en) * 2003-03-07 2004-09-09 Applied Materials, Inc. Substrate carrier with a textured membrane
US20090068935A1 (en) * 2003-10-17 2009-03-12 Hiroomi Torii Polishing apparatus
US20080070479A1 (en) * 2004-11-01 2008-03-20 Ebara Corporation Polishing Apparatus
US20090247057A1 (en) * 2005-09-14 2009-10-01 Ebara Corporation Polishing platen and polishing apparatus
US7402098B2 (en) * 2006-10-27 2008-07-22 Novellus Systems, Inc. Carrier head for workpiece planarization/polishing
US8469776B2 (en) * 2006-11-22 2013-06-25 Applied Materials, Inc. Flexible membrane for carrier head
US20090068934A1 (en) * 2007-09-04 2009-03-12 Samsung Electronics Co., Ltd. Wafer polishing carrier apparatus and chemical mechanical polishing equipment using the same
US20090111362A1 (en) * 2007-10-29 2009-04-30 Ebara Corporation Polishing Apparatus
USD649126S1 (en) * 2008-10-20 2011-11-22 Ebara Corporation Vacuum contact pad
USD616390S1 (en) * 2009-03-06 2010-05-25 Tokyo Electron Limited Quartz cover for manufacturing semiconductor wafers
USD633452S1 (en) 2009-08-27 2011-03-01 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD634719S1 (en) 2009-08-27 2011-03-22 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
CN301348233S (en) 2009-08-27 2010-09-15 株式会社荏原制作所 Elastic film for semiconductor wafer polishing device
USD711330S1 (en) 2010-12-28 2014-08-19 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD729753S1 (en) 2010-12-28 2015-05-19 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD684551S1 (en) * 2011-07-07 2013-06-18 Phuong Van Nguyen Wafer polishing pad holder
US8859070B2 (en) * 2011-11-30 2014-10-14 Ebara Corporation Elastic membrane
USD686175S1 (en) * 2012-03-20 2013-07-16 Veeco Instruments Inc. Wafer carrier having pockets
USD686582S1 (en) * 2012-03-20 2013-07-23 Veeco Instruments Inc. Wafer carrier having pockets
USD687790S1 (en) * 2012-03-20 2013-08-13 Veeco Instruments Inc. Keyed wafer carrier
USD687791S1 (en) * 2012-03-20 2013-08-13 Veeco Instruments Inc. Multi-keyed wafer carrier
US20130316628A1 (en) * 2012-05-23 2013-11-28 Samsung Electronics Co., Ltd. Flexible membranes for a polishing head

Cited By (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD808349S1 (en) * 2013-05-15 2018-01-23 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD813180S1 (en) * 2013-05-15 2018-03-20 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD837755S1 (en) * 2015-04-16 2019-01-08 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD801942S1 (en) * 2015-04-16 2017-11-07 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD825504S1 (en) 2015-04-21 2018-08-14 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD797067S1 (en) * 2015-04-21 2017-09-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD798248S1 (en) * 2015-06-18 2017-09-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD825505S1 (en) * 2015-06-18 2018-08-14 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD799646S1 (en) * 2016-08-30 2017-10-10 Asm Ip Holding B.V. Heater block
USD869409S1 (en) 2016-09-30 2019-12-10 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD836572S1 (en) * 2016-09-30 2018-12-25 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
US11179823B2 (en) 2016-10-28 2021-11-23 Ebara Corporation Substrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
US11958163B2 (en) 2016-10-28 2024-04-16 Ebara Corporation Substrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
USD839224S1 (en) 2016-12-12 2019-01-29 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD913977S1 (en) 2016-12-12 2021-03-23 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD859331S1 (en) * 2017-03-31 2019-09-10 Ebara Corporation Vacuum contact pad
USD859332S1 (en) 2017-06-29 2019-09-10 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD851613S1 (en) 2017-10-05 2019-06-18 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD894137S1 (en) 2017-10-05 2020-08-25 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD868124S1 (en) 2017-12-11 2019-11-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD946638S1 (en) 2017-12-11 2022-03-22 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD918161S1 (en) * 2017-12-19 2021-05-04 Ebara Corporation Elastic membrane
USD902165S1 (en) 2018-03-09 2020-11-17 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD877101S1 (en) 2018-03-09 2020-03-03 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD954567S1 (en) * 2019-06-25 2022-06-14 Ebara Corporation Measurement jig
USD962184S1 (en) * 2019-07-11 2022-08-30 Kokusai Electric Corporation Retainer plate of top heater for wafer processing furnace
USD962183S1 (en) * 2019-07-11 2022-08-30 Kokusai Electric Corporation Retainer plate of top heater for wafer processing furnace
USD918848S1 (en) * 2019-07-18 2021-05-11 Kokusai Electric Corporation Retainer of ceiling heater for semiconductor fabrication apparatus
USD908645S1 (en) 2019-08-26 2021-01-26 Applied Materials, Inc. Sputtering target for a physical vapor deposition chamber
USD937329S1 (en) 2020-03-23 2021-11-30 Applied Materials, Inc. Sputter target for a physical vapor deposition chamber
USD970566S1 (en) 2020-03-23 2022-11-22 Applied Materials, Inc. Sputter target for a physical vapor deposition chamber
USD947802S1 (en) * 2020-05-20 2022-04-05 Applied Materials, Inc. Replaceable substrate carrier interfacing film
USD989012S1 (en) * 2020-09-17 2023-06-13 Ebara Corporation Elastic membrane
USD1021832S1 (en) * 2020-09-17 2024-04-09 Ebara Corporation Elastic membrane
USD966357S1 (en) 2020-12-02 2022-10-11 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD940765S1 (en) 2020-12-02 2022-01-11 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD981969S1 (en) * 2020-12-18 2023-03-28 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD1006768S1 (en) * 2021-01-07 2023-12-05 Solaero Technologies Corp. Semiconductor wafer for mosaic solar cell fabrication
USD1007449S1 (en) 2021-05-07 2023-12-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target

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