JP2014526067A5 - - Google Patents

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Publication number
JP2014526067A5
JP2014526067A5 JP2014526351A JP2014526351A JP2014526067A5 JP 2014526067 A5 JP2014526067 A5 JP 2014526067A5 JP 2014526351 A JP2014526351 A JP 2014526351A JP 2014526351 A JP2014526351 A JP 2014526351A JP 2014526067 A5 JP2014526067 A5 JP 2014526067A5
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Japan
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optical
wafer
spacer
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different
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JP2014526351A
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Japanese (ja)
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JP2014526067A (ja
JP6223975B2 (ja
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Priority claimed from PCT/CH2012/000200 external-priority patent/WO2013026174A2/en
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JP2014526351A 2011-08-25 2012-08-24 光学装置の、特にコンピュテーショナルカメラ用モジュールのウェハレベルの製作 Active JP6223975B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161527355P 2011-08-25 2011-08-25
US61/527,355 2011-08-25
PCT/CH2012/000200 WO2013026174A2 (en) 2011-08-25 2012-08-24 Wafer-level fabrication of optical devices. in particular of modules for computational cameras

Publications (3)

Publication Number Publication Date
JP2014526067A JP2014526067A (ja) 2014-10-02
JP2014526067A5 true JP2014526067A5 (enExample) 2015-10-15
JP6223975B2 JP6223975B2 (ja) 2017-11-01

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Family Applications (2)

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JP2014526351A Active JP6223975B2 (ja) 2011-08-25 2012-08-24 光学装置の、特にコンピュテーショナルカメラ用モジュールのウェハレベルの製作
JP2014526352A Active JP6282225B2 (ja) 2011-08-25 2012-08-24 前方焦点距離訂正を有する光学装置のウェハレベルの製作

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JP2014526352A Active JP6282225B2 (ja) 2011-08-25 2012-08-24 前方焦点距離訂正を有する光学装置のウェハレベルの製作

Country Status (8)

Country Link
US (2) US20140307081A1 (enExample)
EP (2) EP2748854B1 (enExample)
JP (2) JP6223975B2 (enExample)
KR (2) KR101966480B1 (enExample)
CN (2) CN103890949B (enExample)
SG (4) SG2014008718A (enExample)
TW (3) TWI620310B (enExample)
WO (2) WO2013026175A1 (enExample)

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US9711552B2 (en) * 2014-08-19 2017-07-18 Heptagon Micro Optics Pte. Ltd. Optoelectronic modules having a silicon substrate, and fabrication methods for such modules
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US20160307881A1 (en) * 2015-04-20 2016-10-20 Advanced Semiconductor Engineering, Inc. Optical sensor module and method for manufacturing the same
WO2016182152A1 (ko) * 2015-05-12 2016-11-17 삼성전자 주식회사 샘플값 보상을 위한 영상 부호화 방법과 그 장치, 및 샘플값 보상을 위한 영상 복호화 방법과 그 장치
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US10475830B2 (en) 2015-08-06 2019-11-12 Ams Sensors Singapore Pte. Ltd. Optical modules including customizable spacers for focal length adjustment and/or reduction of tilt, and fabrication of the optical modules
DE102015215833A1 (de) 2015-08-19 2017-02-23 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Multiaperturabbildungsvorrichtung mit Optiksubstrat
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DE102016200285A1 (de) * 2016-01-13 2017-07-13 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Multiaperturabbildungsvorrichtung, Abbildungssystem und Verfahren zum Erfassen eines Objektbereichs
CN108941932A (zh) * 2017-05-23 2018-12-07 东莞东阳光科研发有限公司 人工晶体制备方法
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WO2021153629A1 (ja) 2020-01-30 2021-08-05 古河電気工業株式会社 光モジュールおよび光学装置
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