JP2012195095A5 - - Google Patents

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Publication number
JP2012195095A5
JP2012195095A5 JP2011056810A JP2011056810A JP2012195095A5 JP 2012195095 A5 JP2012195095 A5 JP 2012195095A5 JP 2011056810 A JP2011056810 A JP 2011056810A JP 2011056810 A JP2011056810 A JP 2011056810A JP 2012195095 A5 JP2012195095 A5 JP 2012195095A5
Authority
JP
Japan
Prior art keywords
conductive substrate
hole
substrate
forming
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2011056810A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012195095A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2011056810A priority Critical patent/JP2012195095A/ja
Priority claimed from JP2011056810A external-priority patent/JP2012195095A/ja
Priority to TW101108449A priority patent/TWI455168B/zh
Priority to PCT/JP2012/001771 priority patent/WO2012124318A1/en
Priority to US14/005,037 priority patent/US20140190006A1/en
Publication of JP2012195095A publication Critical patent/JP2012195095A/ja
Publication of JP2012195095A5 publication Critical patent/JP2012195095A5/ja
Ceased legal-status Critical Current

Links

JP2011056810A 2011-03-15 2011-03-15 荷電粒子線レンズの製造方法 Ceased JP2012195095A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2011056810A JP2012195095A (ja) 2011-03-15 2011-03-15 荷電粒子線レンズの製造方法
TW101108449A TWI455168B (zh) 2011-03-15 2012-03-13 製造帶電粒子束透鏡的方法
PCT/JP2012/001771 WO2012124318A1 (en) 2011-03-15 2012-03-14 Method for manufacturing charged particle beam lens
US14/005,037 US20140190006A1 (en) 2011-03-15 2012-03-14 Method for manufacturing charged particle beam lens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011056810A JP2012195095A (ja) 2011-03-15 2011-03-15 荷電粒子線レンズの製造方法

Publications (2)

Publication Number Publication Date
JP2012195095A JP2012195095A (ja) 2012-10-11
JP2012195095A5 true JP2012195095A5 (enExample) 2014-05-01

Family

ID=45932472

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011056810A Ceased JP2012195095A (ja) 2011-03-15 2011-03-15 荷電粒子線レンズの製造方法

Country Status (4)

Country Link
US (1) US20140190006A1 (enExample)
JP (1) JP2012195095A (enExample)
TW (1) TWI455168B (enExample)
WO (1) WO2012124318A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9341936B2 (en) 2008-09-01 2016-05-17 D2S, Inc. Method and system for forming a pattern on a reticle using charged particle beam lithography
US8719739B2 (en) 2011-09-19 2014-05-06 D2S, Inc. Method and system for forming patterns using charged particle beam lithography
US9343267B2 (en) 2012-04-18 2016-05-17 D2S, Inc. Method and system for dimensional uniformity using charged particle beam lithography
JP2013239667A (ja) * 2012-05-17 2013-11-28 Canon Inc 荷電粒子線静電レンズにおける電極とその製造方法、荷電粒子線静電レンズ、及び荷電粒子線露光装置
JP6499898B2 (ja) * 2014-05-14 2019-04-10 株式会社ニューフレアテクノロジー 検査方法、テンプレート基板およびフォーカスオフセット方法
CN106997076A (zh) * 2016-01-25 2017-08-01 中国科学院苏州纳米技术与纳米仿生研究所 一种夹具及其制造方法
US12260583B2 (en) * 2021-02-09 2025-03-25 Fei Company 3D fiducial for precision 3D NAND channel tilt/shift analysis
JP7536826B2 (ja) * 2021-07-12 2024-08-20 キヤノン株式会社 基板、および基板の製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4200794A (en) * 1978-11-08 1980-04-29 Control Data Corporation Micro lens array and micro deflector assembly for fly's eye electron beam tubes using silicon components and techniques of fabrication and assembly
US4902898A (en) 1988-04-26 1990-02-20 Microelectronics Center Of North Carolina Wand optics column and associated array wand and charged particle source
JPH0562611A (ja) * 1991-09-05 1993-03-12 Hitachi Ltd 電子銃用板状電極を備えた陰極線管
JP3763446B2 (ja) * 1999-10-18 2006-04-05 キヤノン株式会社 静電レンズ、電子ビーム描画装置、荷電ビーム応用装置、および、デバイス製造方法
JP2001284230A (ja) * 2000-03-31 2001-10-12 Canon Inc 電子光学系アレイ、これを用いた荷電粒子線露光装置ならびにデバイス製造方法
JP4947841B2 (ja) * 2000-03-31 2012-06-06 キヤノン株式会社 荷電粒子線露光装置
JP4585661B2 (ja) * 2000-03-31 2010-11-24 キヤノン株式会社 電子光学系アレイ、荷電粒子線露光装置およびデバイス製造方法
US7151271B2 (en) * 2003-10-08 2006-12-19 Taiwan Semiconductor Manufacturing Co., Ltd. System and method for passing high energy particles through a mask
JP5293517B2 (ja) 2009-09-10 2013-09-18 株式会社リコー 画像処理装置、カラー画像形成装置、画像処理方法、画像処理プログラム及び記録媒体

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