JP2014216182A5 - - Google Patents
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- Publication number
- JP2014216182A5 JP2014216182A5 JP2013092484A JP2013092484A JP2014216182A5 JP 2014216182 A5 JP2014216182 A5 JP 2014216182A5 JP 2013092484 A JP2013092484 A JP 2013092484A JP 2013092484 A JP2013092484 A JP 2013092484A JP 2014216182 A5 JP2014216182 A5 JP 2014216182A5
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- electrode
- electron gun
- electron
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 claims 30
- 230000001133 acceleration Effects 0.000 claims 18
- 230000005684 electric field Effects 0.000 claims 2
- 238000010894 electron beam technology Methods 0.000 claims 2
- 238000000605 extraction Methods 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 239000011163 secondary particle Substances 0.000 claims 1
- 230000001629 suppression Effects 0.000 claims 1
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013092484A JP6340165B2 (ja) | 2013-04-25 | 2013-04-25 | 電子銃、荷電粒子銃およびそれらを用いた荷電粒子線装置 |
| PCT/JP2014/060575 WO2014175087A1 (ja) | 2013-04-25 | 2014-04-14 | 電子銃、荷電粒子銃およびそれらを用いた荷電粒子線装置 |
| CN201480023185.6A CN105144336B (zh) | 2013-04-25 | 2014-04-14 | 电子枪、带电粒子枪及利用该电子枪、带电粒子枪的带电粒子束装置 |
| US14/787,263 US9570268B2 (en) | 2013-04-25 | 2014-04-14 | Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun |
| DE112014002139.3T DE112014002139B4 (de) | 2013-04-25 | 2014-04-14 | Elektronenkanone, Ladungsteilchenkanone und Ladungsteilchenstrahlvorrichtung unter Verwendung der Elektronenkanone und der Ladungsteilchenkanone |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013092484A JP6340165B2 (ja) | 2013-04-25 | 2013-04-25 | 電子銃、荷電粒子銃およびそれらを用いた荷電粒子線装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014216182A JP2014216182A (ja) | 2014-11-17 |
| JP2014216182A5 true JP2014216182A5 (enExample) | 2016-04-28 |
| JP6340165B2 JP6340165B2 (ja) | 2018-06-06 |
Family
ID=51791666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013092484A Active JP6340165B2 (ja) | 2013-04-25 | 2013-04-25 | 電子銃、荷電粒子銃およびそれらを用いた荷電粒子線装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9570268B2 (enExample) |
| JP (1) | JP6340165B2 (enExample) |
| CN (1) | CN105144336B (enExample) |
| DE (1) | DE112014002139B4 (enExample) |
| WO (1) | WO2014175087A1 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9805909B1 (en) * | 2016-09-20 | 2017-10-31 | Applied Materials Israel Ltd. | Method for detecting voids in interconnects and an inspection system |
| DE102016015829B4 (de) | 2016-12-16 | 2025-02-20 | Ketek Gmbh | Vorrichtung zur Erzeugung eines Quellenstroms von Ladungsträgern mittels Feldemission und Verfahren zur Stabilisierung eines mittels eines Feldemissionselements emittierten Quellenstroms von Ladungsträgern |
| DE102016124673B3 (de) | 2016-12-16 | 2018-05-30 | Ketek Gmbh | Vorrichtung zur Erzeugung eines Quellenstroms von Ladungsträgern mittels Feldemission und Verfahren zur Stabilisierung eines mittels eines Feldemissionselements emittierten Quellenstroms von Ladungsträgern |
| US9934933B1 (en) * | 2017-01-19 | 2018-04-03 | Kla-Tencor Corporation | Extractor electrode for electron source |
| JP2019003863A (ja) * | 2017-06-16 | 2019-01-10 | 株式会社島津製作所 | 電子ビーム装置、ならびに、これを備えるx線発生装置および走査電子顕微鏡 |
| CN107768218A (zh) * | 2017-09-15 | 2018-03-06 | 华中科技大学 | 一种低能强流栅控电子枪 |
| JP6943701B2 (ja) * | 2017-09-15 | 2021-10-06 | 日本電子株式会社 | 冷陰極電界放出型電子銃の調整方法 |
| JP7029933B2 (ja) * | 2017-11-02 | 2022-03-04 | 日本電子株式会社 | 電子顕微鏡および電子顕微鏡の制御方法 |
| CN108554632B (zh) * | 2018-01-08 | 2020-09-29 | 合肥工业大学 | 一种利用电荷施加法对样品颗粒进行静电收集的装置 |
| US10573481B1 (en) * | 2018-11-28 | 2020-02-25 | Nuflare Technology, Inc. | Electron guns for electron beam tools |
| WO2020235003A1 (ja) * | 2019-05-21 | 2020-11-26 | 株式会社日立ハイテク | 電子銃および電子銃を備えた荷電粒子線装置 |
| CN110416043B (zh) * | 2019-07-15 | 2021-08-27 | 中国电子科技集团公司第三十八研究所 | 一种用于电子源系统的真空结构 |
| US12266500B2 (en) * | 2019-12-13 | 2025-04-01 | Hitachi High-Tech Corporation | Charged particle gun and charged particle beam device |
| DE112020006608B4 (de) * | 2020-04-07 | 2025-04-17 | Hitachi High-Tech Corporation | Ladungsteilchenkanone, ladungsteilchenstrahlsystem und arretierungsmutter |
| WO2023201580A1 (zh) * | 2022-04-20 | 2023-10-26 | 华为技术有限公司 | 电源系统、电子光学镜组和扫描电子显微镜 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5531986B2 (enExample) * | 1973-01-19 | 1980-08-22 | ||
| JPS5431784B2 (enExample) | 1973-05-31 | 1979-10-09 | ||
| JPS5431784A (en) * | 1977-08-15 | 1979-03-08 | Tdk Corp | Magnetism detecting element |
| JPS57180059A (en) * | 1981-04-17 | 1982-11-05 | Perkin Elmer Corp | Field discharge type electron gun for improving converging stability |
| JPS58146344U (ja) * | 1982-03-26 | 1983-10-01 | 日本電子株式会社 | 荷電粒子源 |
| JPS63175323A (ja) * | 1987-01-16 | 1988-07-19 | Jeol Ltd | 電界放射型電子銃 |
| JPH01187749A (ja) * | 1988-01-21 | 1989-07-27 | Jeol Ltd | フィールド・エミッション電子銃 |
| JPH071681B2 (ja) * | 1990-04-19 | 1995-01-11 | 株式会社日立製作所 | 荷電粒子線装置 |
| JP2818014B2 (ja) * | 1990-07-04 | 1998-10-30 | 日本電子株式会社 | 電界放射形電子銃 |
| US6288401B1 (en) * | 1999-07-30 | 2001-09-11 | Etec Systems, Inc. | Electrostatic alignment of a charged particle beam |
| JP4538441B2 (ja) * | 2003-09-10 | 2010-09-08 | 株式会社日立ハイテクノロジーズ | 電子線応用装置 |
| JP2005085666A (ja) * | 2003-09-10 | 2005-03-31 | Hitachi Displays Ltd | フィールドエミッション表示装置 |
| JP4371215B2 (ja) * | 2004-02-23 | 2009-11-25 | 株式会社日立製作所 | 荷電粒子ビーム輸送装置及びこれを備えた線形加速器システム |
| JP2006324119A (ja) * | 2005-05-19 | 2006-11-30 | Hitachi Ltd | 電子銃 |
| JP2007087676A (ja) * | 2005-09-21 | 2007-04-05 | Hitachi High-Technologies Corp | 電界放出型電子銃およびそれを用いた電子ビーム装置 |
| WO2007055154A1 (ja) * | 2005-11-08 | 2007-05-18 | Advantest Corporation | 電子銃、電子ビーム露光装置及び露光方法 |
| JP5386229B2 (ja) * | 2009-05-22 | 2014-01-15 | 株式会社日立ハイテクノロジーズ | 電子銃 |
| EP2264738B1 (en) * | 2009-06-18 | 2017-12-06 | Carl Zeiss NTS Ltd. | Electron gun used in a particle beam device |
| CN102668013B (zh) * | 2009-11-26 | 2015-05-27 | 株式会社日立高新技术 | 扫描电子显微镜 |
| JP5290238B2 (ja) * | 2010-05-21 | 2013-09-18 | 株式会社日立ハイテクノロジーズ | 電子顕微鏡 |
| JP5687157B2 (ja) * | 2011-08-22 | 2015-03-18 | 株式会社日立ハイテクノロジーズ | 電子銃、電界放出電子銃、荷電粒子線装置および透過型電子顕微鏡 |
-
2013
- 2013-04-25 JP JP2013092484A patent/JP6340165B2/ja active Active
-
2014
- 2014-04-14 WO PCT/JP2014/060575 patent/WO2014175087A1/ja not_active Ceased
- 2014-04-14 CN CN201480023185.6A patent/CN105144336B/zh active Active
- 2014-04-14 US US14/787,263 patent/US9570268B2/en active Active
- 2014-04-14 DE DE112014002139.3T patent/DE112014002139B4/de active Active
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