JP2014140032A - 加熱及び冷却可能な吸引部材を有するボンディングヘッド - Google Patents
加熱及び冷却可能な吸引部材を有するボンディングヘッド Download PDFInfo
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- JP2014140032A JP2014140032A JP2014002309A JP2014002309A JP2014140032A JP 2014140032 A JP2014140032 A JP 2014140032A JP 2014002309 A JP2014002309 A JP 2014002309A JP 2014002309 A JP2014002309 A JP 2014002309A JP 2014140032 A JP2014140032 A JP 2014140032A
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- suction member
- bonding head
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- 238000001816 cooling Methods 0.000 title claims abstract description 39
- 238000010438 heat treatment Methods 0.000 title claims abstract description 24
- 239000004065 semiconductor Substances 0.000 claims abstract description 19
- 239000002826 coolant Substances 0.000 claims abstract description 8
- 229910010293 ceramic material Inorganic materials 0.000 claims description 4
- 238000007599 discharging Methods 0.000 claims description 2
- 239000000758 substrate Substances 0.000 abstract description 7
- 238000012544 monitoring process Methods 0.000 abstract description 2
- 230000005540 biological transmission Effects 0.000 abstract 1
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/91—Measuring or controlling the joining process by measuring or controlling the temperature, the heat or the thermal flux
- B29C66/912—Measuring or controlling the joining process by measuring or controlling the temperature, the heat or the thermal flux by measuring the temperature, the heat or the thermal flux
- B29C66/9121—Measuring or controlling the joining process by measuring or controlling the temperature, the heat or the thermal flux by measuring the temperature, the heat or the thermal flux by measuring the temperature
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B30—PRESSES
- B30B—PRESSES IN GENERAL
- B30B15/00—Details of, or accessories for, presses; Auxiliary measures in connection with pressing
- B30B15/06—Platens or press rams
- B30B15/062—Press plates
- B30B15/064—Press plates with heating or cooling means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B30—PRESSES
- B30B—PRESSES IN GENERAL
- B30B15/00—Details of, or accessories for, presses; Auxiliary measures in connection with pressing
- B30B15/34—Heating or cooling presses or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/75252—Means for applying energy, e.g. heating means in the upper part of the bonding apparatus, e.g. in the bonding head
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/7528—Resistance welding electrodes, i.e. for ohmic heating
- H01L2224/75282—Resistance welding electrodes, i.e. for ohmic heating in the upper part of the bonding apparatus, e.g. in the bonding head
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/755—Cooling means
- H01L2224/75502—Cooling means in the upper part of the bonding apparatus, e.g. in the bonding head
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/757—Means for aligning
- H01L2224/75743—Suction holding means
- H01L2224/75745—Suction holding means in the upper part of the bonding apparatus, e.g. in the bonding head
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Wire Bonding (AREA)
- Die Bonding (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
【解決手段】半導体チップを基板に実装するボンディングヘッド(1)が、ボンディングヘッド本体(2)、及び単一片から形成される吸引部材(3)を備える。吸引部材(3)の加熱、冷却及び温度の監視(21)に必要な素子が全て吸引部材(3)に一体化されており、それによって、加熱素子(20)も冷却素子(12)も、熱伝達を妨げる表面によって半導体チップ(11)から分離されない。ボンディングヘッド本体(2)は、吸引部材(3)に電力及び冷却媒体を供給するのに必要な素子しか含まない。
【選択図】図1
Description
本出願人は、2013年1月21日に出願されたスイス特許出願第245/13号からの優先権を主張し、この出願の開示は参照により本明細書に援用される。
Claims (5)
- ボンディングヘッド(1)であって、
ボンディングヘッド本体(2)、及び
焼結セラミック材料の単一片からなるとともに互いに反対側にある底面(4)及び上面(5)を有する平坦な吸引部材(3)
を備え、
前記吸引部材(3)では:
前記底面(4)には少なくとも1つの凹部(9)が形成されており、
1つ又は複数の冷却流路(12)が前記上面(5)の下に設けられており、該冷却流路は入口(13)及び出口(14)を有し、
電気抵抗加熱(20)が前記冷却流路(12)の下又は上に配置されており、
温度センサー(21)が一体化されており、前記電気抵抗加熱(20)は第1の接触領域(23)に接続されており、該温度センサー(21)は第2の接触領域(24)に接続されており;
前記ボンディングヘッド本体(2)の底面(6)又は前記吸引部材(3)の前記上面(5)は1つ又は複数の凹部(7)を有し、前記ボンディングヘッド本体(2)は、前記1つ又は複数の凹部(7)に開口しているとともに前記吸引部材(3)を吸引するための真空を供給することができる1つ又は複数の第1の流路(8)を有し、
前記ボンディングヘッド本体(2)及び前記吸引部材(3)は、該吸引部材(3)の前記底面(4)の前記少なくとも1つの凹部(9)に開口しているとともに半導体チップ(11)を吸引するための真空を供給することができる少なくとも1つの第2の流路(10)を有し;
前記ボンディングヘッド本体(2)は、前記冷却流路(12)の前記入口(13)と連通接続している1つ又は複数の第3の流路(18)、及び前記冷却流路(12)の前記出口(14)と連通接続している1つ又は複数の第4の流路(19)を有し、
接触素子(25)が前記ボンディングヘッド本体(2)に取り付けられており、該接触素子は、前記吸引部材(3)が吸引されると前記第1の接触領域(23)又は前記第2の接触領域(24)に接触し、それによって、前記吸引部材(3)は、前記電気抵抗加熱(20)によって加熱することができ、冷却媒体を前記第3の流路(単数又は複数)(18)を通して供給するとともに前記冷却媒体を前記第4の流路(単数又は複数)(19)を通して排出することによって冷却することができ、また、前記温度センサー(21)によって測定された温度を制御ユニットに送信することができる、ボンディングヘッド。 - 前記第4の流路(単数又は複数)(19)は、前記吸引部材(3)の前記底面(4)に対して斜めに配置される方向に延び、周囲環境に開口しており、それによって、前記第4の流路(単数又は複数)(19)の出口開口は、前記吸引部材(3)の前記底面(4)から、該第4の流路(単数又は複数)(19)の入口開口よりも更に離れている、請求項1に記載のボンディングヘッド。
- 前記冷却流路(12)、前記第3の流路(単数又は複数)(18)及び前記第4の流路(単数又は複数)(19)は閉回路に属する、請求項1に記載のボンディングヘッド。
- 前記冷却流路(12)は、前記吸引部材(3)の前記上面(5)に平行に延びる単一の平面に配置されている、請求項1〜3のいずれか一項に記載のボンディングヘッド。
- 前記接触素子(25)は、前記ボンディングヘッド本体(2)に弾性的に実装されている、請求項1〜4のいずれか一項に記載のボンディングヘッド。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH00245/13 | 2013-01-21 | ||
CH00245/13A CH707480B1 (de) | 2013-01-21 | 2013-01-21 | Bondkopf mit einem heiz- und kühlbaren Saugorgan. |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014140032A true JP2014140032A (ja) | 2014-07-31 |
JP6350932B2 JP6350932B2 (ja) | 2018-07-04 |
Family
ID=51191130
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014002309A Active JP6350932B2 (ja) | 2013-01-21 | 2014-01-09 | 加熱及び冷却可能な吸引部材を有するボンディングヘッド |
Country Status (8)
Country | Link |
---|---|
US (1) | US8925608B2 (ja) |
JP (1) | JP6350932B2 (ja) |
KR (1) | KR102228798B1 (ja) |
CN (1) | CN103943520B (ja) |
CH (1) | CH707480B1 (ja) |
MY (1) | MY162252A (ja) |
SG (1) | SG2013096326A (ja) |
TW (1) | TWI582881B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104767124A (zh) * | 2015-04-20 | 2015-07-08 | 济南伟桐环保科技有限公司 | 负离子发射头装置、发生器和成型工艺 |
KR20200136777A (ko) * | 2019-05-28 | 2020-12-08 | 주식회사 다우에프에이 | 자기유변 탄성체를 구비하는 열압착 본딩 장치의 헤드 마운트 |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9282650B2 (en) * | 2013-12-18 | 2016-03-08 | Intel Corporation | Thermal compression bonding process cooling manifold |
US10192847B2 (en) * | 2014-06-12 | 2019-01-29 | Asm Technology Singapore Pte Ltd | Rapid cooling system for a bond head heater |
US10500661B2 (en) * | 2015-11-06 | 2019-12-10 | Toyota Motor Engineering & Manufacturing North America, Inc. | Methods and apparatuses for high temperature bonding controlled processing and bonded substrates formed therefrom |
TWI673805B (zh) * | 2017-01-30 | 2019-10-01 | 日商新川股份有限公司 | 安裝裝置以及安裝系統 |
KR102439617B1 (ko) * | 2017-06-27 | 2022-09-05 | 주식회사 미코세라믹스 | 본딩 헤드 및 이를 갖는 본딩 장치 |
US10700038B2 (en) * | 2017-08-25 | 2020-06-30 | Micron Technology, Inc. | Methods and systems for inhibiting bonding materials from contaminating a semiconductor processing tool |
CN107696575A (zh) * | 2017-10-18 | 2018-02-16 | 浙江西维亚进出口有限公司 | 具有降温结构的压件装置 |
KR102454462B1 (ko) * | 2017-11-09 | 2022-10-14 | 주식회사 미코세라믹스 | 척 플레이트, 상기 척 플레이트를 갖는 척 구조물 및 척 구조물을 갖는 본딩 장치 |
CH714351A1 (de) * | 2017-11-17 | 2019-05-31 | Besi Switzerland Ag | Bondkopf für die Montage von Bauelementen. |
FR3073763B1 (fr) | 2017-11-17 | 2021-05-14 | Besi Switzerland Ag | Tete de soudage pour monter des composants et microsoudeuse de puce avec une telle tete de soudage |
US10312126B1 (en) | 2017-12-04 | 2019-06-04 | Micron Technology, Inc. | TCB bond tip design to mitigate top die warpage and solder stretching issue |
US11626381B2 (en) * | 2019-09-27 | 2023-04-11 | Samsung Electronics Co., Ltd. | Bonding head including a thermal compensator, die bonding apparatus including the same and method of manufacturing semiconductor package using the same |
TWI834007B (zh) * | 2019-11-19 | 2024-03-01 | 日商新川股份有限公司 | 半導體裝置的製造裝置及製造方法 |
KR102604789B1 (ko) * | 2020-11-30 | 2023-11-21 | 세메스 주식회사 | 히터 조립체 및 이를 포함하는 본딩 헤드 |
KR102498914B1 (ko) * | 2020-12-08 | 2023-02-13 | 주식회사 미코세라믹스 | 본딩 헤드 및 이를 갖는 본딩 장치 |
US11652080B2 (en) * | 2021-05-27 | 2023-05-16 | Intel Corporation | Thermal compression bonder nozzle with vacuum relief features |
TWI790118B (zh) * | 2022-02-10 | 2023-01-11 | 友達光電股份有限公司 | 接合設備 |
CN115172231B (zh) * | 2022-09-08 | 2022-11-25 | 西北电子装备技术研究所(中国电子科技集团公司第二研究所) | 一种带有气氛保护的快速升降温共晶加热台 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000091387A (ja) * | 1998-09-10 | 2000-03-31 | Matsushita Electric Ind Co Ltd | 熱圧着装置および熱圧着方法 |
JP2004031885A (ja) * | 2002-04-30 | 2004-01-29 | Toray Eng Co Ltd | ボンディング方法およびその装置 |
JP2005347621A (ja) * | 2004-06-04 | 2005-12-15 | Matsushita Electric Ind Co Ltd | 電子部品実装ツール |
JP2005347303A (ja) * | 2004-05-31 | 2005-12-15 | Canon Inc | 熱圧着装置 |
JP2007220769A (ja) * | 2006-02-15 | 2007-08-30 | Matsushita Electric Ind Co Ltd | 半導体部品の熱圧着装置 |
JP2008218533A (ja) * | 2007-03-01 | 2008-09-18 | Matsushita Electric Ind Co Ltd | 部品吸着ヘッド及び部品吸着ツール保持方法 |
JP2009147068A (ja) * | 2007-12-13 | 2009-07-02 | Oki Semiconductor Co Ltd | 半導体装置の製造方法及び製造装置 |
JP2012015255A (ja) * | 2010-06-30 | 2012-01-19 | Shinkawa Ltd | 電子部品実装装置及び電子部品実装方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6544379B2 (en) * | 1993-09-16 | 2003-04-08 | Hitachi, Ltd. | Method of holding substrate and substrate holding system |
TW277139B (ja) * | 1993-09-16 | 1996-06-01 | Hitachi Seisakusyo Kk | |
JP3255064B2 (ja) * | 1997-01-22 | 2002-02-12 | 松下電器産業株式会社 | ワークの熱圧着装置 |
JP3454154B2 (ja) * | 1998-06-26 | 2003-10-06 | 松下電器産業株式会社 | ワークの熱圧着装置および熱圧着方法 |
US6821381B1 (en) | 1999-03-16 | 2004-11-23 | Toray Engineering Co., Ltd. | Tool for thermo-compression-bonding chips, and chip packaging device having the same |
JP3801966B2 (ja) * | 2002-07-31 | 2006-07-26 | 京セラ株式会社 | 加熱装置 |
US7544251B2 (en) * | 2004-10-07 | 2009-06-09 | Applied Materials, Inc. | Method and apparatus for controlling temperature of a substrate |
KR100993079B1 (ko) * | 2005-10-12 | 2010-11-08 | 가부시키가이샤 무라타 세이사쿠쇼 | 접합장치 |
JP4631796B2 (ja) * | 2006-05-22 | 2011-02-16 | パナソニック株式会社 | 電子部品の熱圧着装置 |
JP4958655B2 (ja) * | 2007-06-27 | 2012-06-20 | 新光電気工業株式会社 | 電子部品実装装置および電子装置の製造方法 |
KR101114180B1 (ko) * | 2009-07-14 | 2012-02-22 | (주)창조엔지니어링 | 평탄도 유지 장치 |
JP2013026268A (ja) * | 2011-07-15 | 2013-02-04 | Hitachi High-Tech Instruments Co Ltd | 2軸駆動機構及びダイボンダ |
-
2013
- 2013-01-21 CH CH00245/13A patent/CH707480B1/de not_active IP Right Cessation
- 2013-12-27 SG SG2013096326A patent/SG2013096326A/en unknown
- 2013-12-27 TW TW102148591A patent/TWI582881B/zh active
-
2014
- 2014-01-09 JP JP2014002309A patent/JP6350932B2/ja active Active
- 2014-01-16 MY MYPI2014700117A patent/MY162252A/en unknown
- 2014-01-17 US US14/158,747 patent/US8925608B2/en active Active
- 2014-01-20 KR KR1020140006635A patent/KR102228798B1/ko active IP Right Grant
- 2014-01-21 CN CN201410027342.2A patent/CN103943520B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000091387A (ja) * | 1998-09-10 | 2000-03-31 | Matsushita Electric Ind Co Ltd | 熱圧着装置および熱圧着方法 |
JP2004031885A (ja) * | 2002-04-30 | 2004-01-29 | Toray Eng Co Ltd | ボンディング方法およびその装置 |
JP2005347303A (ja) * | 2004-05-31 | 2005-12-15 | Canon Inc | 熱圧着装置 |
JP2005347621A (ja) * | 2004-06-04 | 2005-12-15 | Matsushita Electric Ind Co Ltd | 電子部品実装ツール |
JP2007220769A (ja) * | 2006-02-15 | 2007-08-30 | Matsushita Electric Ind Co Ltd | 半導体部品の熱圧着装置 |
JP2008218533A (ja) * | 2007-03-01 | 2008-09-18 | Matsushita Electric Ind Co Ltd | 部品吸着ヘッド及び部品吸着ツール保持方法 |
JP2009147068A (ja) * | 2007-12-13 | 2009-07-02 | Oki Semiconductor Co Ltd | 半導体装置の製造方法及び製造装置 |
JP2012015255A (ja) * | 2010-06-30 | 2012-01-19 | Shinkawa Ltd | 電子部品実装装置及び電子部品実装方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104767124A (zh) * | 2015-04-20 | 2015-07-08 | 济南伟桐环保科技有限公司 | 负离子发射头装置、发生器和成型工艺 |
KR20200136777A (ko) * | 2019-05-28 | 2020-12-08 | 주식회사 다우에프에이 | 자기유변 탄성체를 구비하는 열압착 본딩 장치의 헤드 마운트 |
KR102205035B1 (ko) | 2019-05-28 | 2021-01-19 | 주식회사 다우에프에이 | 자기유변 탄성체를 구비하는 열압착 본딩 장치의 헤드 마운트 |
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TWI582881B (zh) | 2017-05-11 |
TW201436080A (zh) | 2014-09-16 |
MY162252A (en) | 2017-05-31 |
US20140202636A1 (en) | 2014-07-24 |
KR102228798B1 (ko) | 2021-03-17 |
CN103943520B (zh) | 2017-11-17 |
US8925608B2 (en) | 2015-01-06 |
CH707480B1 (de) | 2016-08-31 |
CH707480A1 (de) | 2014-07-31 |
KR20140094458A (ko) | 2014-07-30 |
JP6350932B2 (ja) | 2018-07-04 |
CN103943520A (zh) | 2014-07-23 |
SG2013096326A (en) | 2014-08-28 |
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