JP2014102867A - 半導体記憶装置及びその制御方法 - Google Patents
半導体記憶装置及びその制御方法 Download PDFInfo
- Publication number
- JP2014102867A JP2014102867A JP2012254702A JP2012254702A JP2014102867A JP 2014102867 A JP2014102867 A JP 2014102867A JP 2012254702 A JP2012254702 A JP 2012254702A JP 2012254702 A JP2012254702 A JP 2012254702A JP 2014102867 A JP2014102867 A JP 2014102867A
- Authority
- JP
- Japan
- Prior art keywords
- chip
- data
- nand
- signal
- odt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1668—Details of memory controller
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/36—Handling requests for interconnection or transfer for access to common bus or bus system
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4063—Device-to-bus coupling
- G06F13/4068—Electrical coupling
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
- G11C14/0009—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a DRAM cell
- G11C14/0018—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a DRAM cell whereby the nonvolatile element is an EEPROM element, e.g. a floating gate or metal-nitride-oxide-silicon [MNOS] transistor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/022—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
- G11C7/1084—Data input buffers, e.g. comprising level conversion circuits, circuits for adapting load
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0407—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0409—Online test
Abstract
【課題】パッケージにピンを増加させることなく、ODTを制御することが可能な半導体記憶装置及びその制御方法を提供する。
【解決手段】複数の半導体チップ11_0〜12_7は、同一の信号伝送通路上に接続され、個別のチップイネーブル信号により個別に制御され、活性化された状態で各半導体チップにおける信号伝送通路を特定の電位に設定する終端回路をそれぞれ備えている。制御部は、複数の半導体チップの1つを選択してデータを入力又は出力するとき、第1の命令信号と前記チップイネーブル信号とに基づき、非選択の半導体チップ内に設けられた終端回路を活性化する。
【選択図】図2
Description
図2において、NANDフラッシュメモリ11、12は、それぞれ例えば8個のNANDチップにより構成されている。NANDフラッシュメモリ11は、NANDチップ11_0、11_1〜11_7を含んでいる。チップイネーブル信号/CE0_0〜/CE3_0は、一対のNANDチップ(11_0、11_1)(11_2、11_3)〜(11_6、11_7)にそれぞれ供給される。一対のNANDチップ11_0、11_1〜11_6、11_7のそれぞれは、チップイネーブル信号/CE0_0〜/CE3_0とチップアドレスにより、一対のNANDチップのうちの一方が選択される。
電圧発生回路30は、制御部22の指示に従って書き込み電圧、読み出し電圧、消去電圧等を生成し、これらの電圧をメモリセルアレイ23、ロウデコーダ25、センスアンプ26に供給する。
データ入力は、NANDフラッシュメモリへのプログラム動作時に行われる。このため、書き込みコマンドと書き込みアドレスが入力され、その後、非選択NANDチップが指定され、ODT回路35がイネーブルとされる。非選択NANDチップは、チップイネーブル信号とチップアドレスにより選択される。複数の非選択NANDチップのODT回路35をイネーブルとするためには、上記選択動作が複数回繰り返される。
次に、NANDフラッシュメモリからデータを出力する場合におけるODTの設定動作について説明する。
ODT回路35を構成する終端抵抗35bの抵抗値は、デフォルトがODT非設定である。このため、ODT機能を使用する前に抵抗値が設定されるが、この抵抗値の設定は本機能を使用する前に実行されればよく、例えば電源投入時に実行される。
Claims (5)
- 同一の信号伝送通路上に接続され、個別のチップイネーブル信号により個別に制御される複数の半導体チップであって、活性化された状態で各半導体チップにおける前記信号伝送通路を特定の電位に設定する終端回路をそれぞれ備えた複数の半導体チップと、
前記複数の半導体チップの1つを選択してデータを入力又は出力するとき、第1の命令信号と前記チップイネーブル信号とに基づき、非選択の前記半導体チップ内に設けられた前記終端回路を活性化する制御部と
を具備することを特徴とする半導体記憶装置。 - 前記制御部は、第2の命令信号に基づき、活性化した前記終端回路を非活性化することを特徴とする請求項1記載の半導体記憶装置。
- 前記終端回路は、終端抵抗を含み、前記制御部は、第3の命令信号に基づき、前記終端抵抗の抵抗値を設定することを特徴とする請求項1記載の半導体記憶装置。
- 同一の信号伝送通路上に接続された複数の半導体チップの1つを選択してデータを入力又は出力するとき、
前記複数の半導体チップのうち、非選択の半導体チップに第1の命令信号とチップイネーブル信号を供給して前記非選択の半導体チップに設けられた終端回路を活性化し、非選択の半導体チップの信号伝送通路を特定の電位に設定することを特徴とする半導体記憶装置の制御方法。 - 第2の命令信号に基づき、前記活性化した終端回路を非活性化することを特徴とする請求項4記載の半導体記憶装置の制御方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012254702A JP2014102867A (ja) | 2012-11-20 | 2012-11-20 | 半導体記憶装置及びその制御方法 |
US14/023,009 US9431078B2 (en) | 2012-11-20 | 2013-09-10 | Semiconductor storage device and control method thereof |
US15/215,672 US9659652B2 (en) | 2012-11-20 | 2016-07-21 | Semiconductor storage device and control method thereof |
US15/489,806 US9977752B2 (en) | 2012-11-20 | 2017-04-18 | Semiconductor storage device and control method thereof |
US15/959,354 US10089257B2 (en) | 2012-11-20 | 2018-04-23 | Semiconductor storage device and control method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012254702A JP2014102867A (ja) | 2012-11-20 | 2012-11-20 | 半導体記憶装置及びその制御方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2014102867A true JP2014102867A (ja) | 2014-06-05 |
Family
ID=50727811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012254702A Pending JP2014102867A (ja) | 2012-11-20 | 2012-11-20 | 半導体記憶装置及びその制御方法 |
Country Status (2)
Country | Link |
---|---|
US (4) | US9431078B2 (ja) |
JP (1) | JP2014102867A (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017084432A (ja) * | 2015-10-29 | 2017-05-18 | 株式会社東芝 | 不揮発性半導体記憶装置及びメモリシステム |
US10289482B2 (en) | 2015-08-28 | 2019-05-14 | Toshiba Memory Corporation | Memory device that updates parameters transmitted to a host based on operational settings |
JP2019135681A (ja) * | 2019-03-28 | 2019-08-15 | 東芝メモリ株式会社 | 不揮発性半導体記憶装置及びメモリシステム |
US11295794B2 (en) | 2018-09-13 | 2022-04-05 | Kioxia Corporation | Memory system, control method, and non-transitory computer readable medium |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102628533B1 (ko) * | 2016-08-16 | 2024-01-25 | 에스케이하이닉스 주식회사 | 반도체장치 및 반도체시스템 |
US10621116B2 (en) * | 2017-06-08 | 2020-04-14 | Western Digital Technologies, Inc. | Non-volatile storage device with adaptive data bus inversion |
JP6847797B2 (ja) * | 2017-09-21 | 2021-03-24 | キオクシア株式会社 | 半導体記憶装置 |
KR102553266B1 (ko) * | 2017-11-03 | 2023-07-07 | 삼성전자 주식회사 | 온-다이-터미네이션 회로를 포함하는 메모리 장치 |
US11003386B2 (en) | 2017-11-22 | 2021-05-11 | Micron Technology, Inc. | Methods for on-die memory termination and memory devices and systems employing the same |
JP2019204565A (ja) * | 2018-05-22 | 2019-11-28 | 東芝メモリ株式会社 | 半導体記憶装置及びメモリシステム |
TWI702611B (zh) * | 2018-12-06 | 2020-08-21 | 旺宏電子股份有限公司 | 記憶體電路 |
US11513976B2 (en) * | 2020-03-31 | 2022-11-29 | Western Digital Technologies, Inc. | Advanced CE encoding for bus multiplexer grid for SSD |
US11200190B2 (en) * | 2020-04-21 | 2021-12-14 | Innogrit Technologies Co., Ltd. | Command based on-die termination for high-speed NAND interface |
JP2021190150A (ja) * | 2020-06-02 | 2021-12-13 | キオクシア株式会社 | メモリシステム及びメモリコントローラ |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003007963A (ja) * | 2001-06-20 | 2003-01-10 | Hitachi Ltd | 半導体記憶装置および製造方法 |
US20040098528A1 (en) * | 2002-11-20 | 2004-05-20 | Micron Technology, Inc. | Active termination control though on module register |
US20060106951A1 (en) * | 2004-11-18 | 2006-05-18 | Bains Kuljit S | Command controlling different operations in different chips |
JP2008077779A (ja) * | 2006-09-22 | 2008-04-03 | Toshiba Corp | 半導体記憶装置 |
US20090115450A1 (en) * | 2007-11-02 | 2009-05-07 | Hynix Semiconductor Inc. | Circuit and method for controlling termination impedance |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5727005A (en) * | 1994-08-31 | 1998-03-10 | Le; Chinh H. | Integrated circuit microprocessor with programmable memory access interface types |
EP1306849B1 (en) | 2001-10-19 | 2008-02-27 | Samsung Electronics Co., Ltd. | Devices and methods for controlling active termination resistors in a memory system |
US7290109B2 (en) * | 2002-01-09 | 2007-10-30 | Renesas Technology Corp. | Memory system and memory card |
US9171585B2 (en) * | 2005-06-24 | 2015-10-27 | Google Inc. | Configurable memory circuit system and method |
US7259585B2 (en) | 2005-09-28 | 2007-08-21 | International Business Machines Corporation | Selective on-die termination for improved power management and thermal distribution |
US7528626B2 (en) | 2006-06-30 | 2009-05-05 | Hynix Semiconductor Inc. | Semiconductor memory device with ZQ calibration circuit |
JP4159587B2 (ja) | 2006-08-29 | 2008-10-01 | エルピーダメモリ株式会社 | 半導体装置の出力回路及びこれを備える半導体装置 |
JP4996277B2 (ja) * | 2007-02-09 | 2012-08-08 | 株式会社東芝 | 半導体記憶システム |
JP2009252322A (ja) | 2008-04-09 | 2009-10-29 | Nec Electronics Corp | 半導体メモリ装置 |
TWI375961B (en) * | 2008-05-15 | 2012-11-01 | Phison Electronics Corp | Multi non-volatile memory chip packetaged storage system and controller and access method thereof |
JP2010219751A (ja) | 2009-03-16 | 2010-09-30 | Elpida Memory Inc | 半導体装置 |
JP2011135436A (ja) | 2009-12-25 | 2011-07-07 | Elpida Memory Inc | 半導体装置 |
KR101841622B1 (ko) * | 2010-11-04 | 2018-05-04 | 삼성전자주식회사 | 온-다이 터미네이션 회로를 가지는 불휘발성 메모리 장치 및 그것의 제어 방법 |
US9164679B2 (en) * | 2011-04-06 | 2015-10-20 | Patents1, Llc | System, method and computer program product for multi-thread operation involving first memory of a first memory class and second memory of a second memory class |
US8687451B2 (en) * | 2011-07-26 | 2014-04-01 | Inphi Corporation | Power management in semiconductor memory system |
-
2012
- 2012-11-20 JP JP2012254702A patent/JP2014102867A/ja active Pending
-
2013
- 2013-09-10 US US14/023,009 patent/US9431078B2/en active Active
-
2016
- 2016-07-21 US US15/215,672 patent/US9659652B2/en active Active
-
2017
- 2017-04-18 US US15/489,806 patent/US9977752B2/en active Active
-
2018
- 2018-04-23 US US15/959,354 patent/US10089257B2/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003007963A (ja) * | 2001-06-20 | 2003-01-10 | Hitachi Ltd | 半導体記憶装置および製造方法 |
US20040098528A1 (en) * | 2002-11-20 | 2004-05-20 | Micron Technology, Inc. | Active termination control though on module register |
JP2006516059A (ja) * | 2002-11-20 | 2006-06-15 | マイクロン・テクノロジー・インコーポレーテッド | モジュール・レジスタを介する能動終端の制御 |
US20060106951A1 (en) * | 2004-11-18 | 2006-05-18 | Bains Kuljit S | Command controlling different operations in different chips |
JP2008521158A (ja) * | 2004-11-18 | 2008-06-19 | インテル コーポレイション | 異なるチップにおける異なる処理を制御するコマンド |
JP2008077779A (ja) * | 2006-09-22 | 2008-04-03 | Toshiba Corp | 半導体記憶装置 |
US20090115450A1 (en) * | 2007-11-02 | 2009-05-07 | Hynix Semiconductor Inc. | Circuit and method for controlling termination impedance |
JP2009118479A (ja) * | 2007-11-02 | 2009-05-28 | Hynix Semiconductor Inc | オンダイターミネーションの制御回路およびその制御方法 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10289482B2 (en) | 2015-08-28 | 2019-05-14 | Toshiba Memory Corporation | Memory device that updates parameters transmitted to a host based on operational settings |
JP2017084432A (ja) * | 2015-10-29 | 2017-05-18 | 株式会社東芝 | 不揮発性半導体記憶装置及びメモリシステム |
USRE49783E1 (en) | 2015-10-29 | 2024-01-02 | Kioxia Corporation | Nonvolatile semiconductor memory device and memory system having termination circuit with variable resistor |
US11295794B2 (en) | 2018-09-13 | 2022-04-05 | Kioxia Corporation | Memory system, control method, and non-transitory computer readable medium |
JP2019135681A (ja) * | 2019-03-28 | 2019-08-15 | 東芝メモリ株式会社 | 不揮発性半導体記憶装置及びメモリシステム |
Also Published As
Publication number | Publication date |
---|---|
US10089257B2 (en) | 2018-10-02 |
US9431078B2 (en) | 2016-08-30 |
US20170220493A1 (en) | 2017-08-03 |
US9977752B2 (en) | 2018-05-22 |
US20140140152A1 (en) | 2014-05-22 |
US9659652B2 (en) | 2017-05-23 |
US20160329099A1 (en) | 2016-11-10 |
US20180239721A1 (en) | 2018-08-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10089257B2 (en) | Semiconductor storage device and control method thereof | |
KR102184260B1 (ko) | 반도체 기억장치 및 이를 위한 연속 판독 방법 | |
KR102149768B1 (ko) | 불휘발성 메모리 시스템 | |
US10916276B2 (en) | Nonvolatile memory and memory system | |
KR102291639B1 (ko) | 레디 비지 신호를 출력하는 반도체 메모리 장치 및 그것을 포함하는 메모리 시스템 | |
US11416426B2 (en) | Memory device and method of operating the same | |
US20140173173A1 (en) | Method, device, and system including configurable bit-per-cell capability | |
US10629248B2 (en) | Semiconductor devices configured to store bank addresses and generate bank group addresses | |
JP2015094997A (ja) | メモリシステムおよびメモリシステムのアセンブリ方法 | |
US11133054B2 (en) | Semiconductor devices performing for column operation | |
US20210312974A1 (en) | Semiconductor devices | |
US11127441B1 (en) | Semiconductor storage device | |
KR100866624B1 (ko) | 둘 이상의 비휘발성 메모리 장치들을 제어하는 방법 및 그장치 | |
CN114077390A (zh) | 储存装置及其操作方法 | |
JP2014187162A (ja) | 半導体装置とそのトリミング方法 | |
KR20210012825A (ko) | 저장 장치 및 그 동작 방법 | |
US9036429B2 (en) | Nonvolatile memory device and operating method thereof | |
US11436152B2 (en) | Data transmission circuit for preventing a node from floating and method of operating the same | |
CN113741602B (zh) | 校准电路和该校准电路的操作方法 | |
US9728234B1 (en) | Operating method of semiconductor memory device | |
US10510429B2 (en) | Memory device performing test on memory cell array and method of operating the same | |
JP2021039804A (ja) | メモリシステム | |
US11669393B2 (en) | Memory device for swapping data and operating method thereof | |
CN113450843B (zh) | 电路布局结构与存储器存储装置 | |
US11769535B2 (en) | Semiconductor memory device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150205 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20151216 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20160112 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20160311 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20160830 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20170228 |