JP2012527651A - 試料の空間位置の動的決定および動的再配置の装置および方法 - Google Patents

試料の空間位置の動的決定および動的再配置の装置および方法 Download PDF

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JP2012527651A
JP2012527651A JP2012511961A JP2012511961A JP2012527651A JP 2012527651 A JP2012527651 A JP 2012527651A JP 2012511961 A JP2012511961 A JP 2012511961A JP 2012511961 A JP2012511961 A JP 2012511961A JP 2012527651 A JP2012527651 A JP 2012527651A
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sample
radiation
reflected
target sample
detector
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JP2012527651A5 (enExample
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シャロノフ、アレクシー、ワイ．
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バイオナノ ジェノミックス、インク．
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=42712355&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2012527651(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
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Publication of JP2012527651A publication Critical patent/JP2012527651A/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/244—Devices for focusing using image analysis techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Focusing (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2012511961A 2009-05-19 2010-05-18 試料の空間位置の動的決定および動的再配置の装置および方法 Pending JP2012527651A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US17949809P 2009-05-19 2009-05-19
US61/179,498 2009-05-19
PCT/US2010/035253 WO2010135323A1 (en) 2009-05-19 2010-05-18 Devices and methods for dynamic determination of sample spatial orientation and dynamic repositioning

Related Child Applications (1)

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JP2014169962A Division JP2015028637A (ja) 2009-05-19 2014-08-23 試料の空間位置の動的決定および動的再配置の装置および方法

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JP2012527651A true JP2012527651A (ja) 2012-11-08
JP2012527651A5 JP2012527651A5 (enExample) 2013-07-11

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JP2012511961A Pending JP2012527651A (ja) 2009-05-19 2010-05-18 試料の空間位置の動的決定および動的再配置の装置および方法
JP2014169962A Pending JP2015028637A (ja) 2009-05-19 2014-08-23 試料の空間位置の動的決定および動的再配置の装置および方法

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US (1) US20120097835A1 (enExample)
EP (2) EP2433087B1 (enExample)
JP (2) JP2012527651A (enExample)
KR (1) KR20120039547A (enExample)
CN (1) CN102648389B (enExample)
AU (1) AU2010249729A1 (enExample)
CA (1) CA2762684A1 (enExample)
SG (1) SG176579A1 (enExample)
WO (1) WO2010135323A1 (enExample)

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KR102003202B1 (ko) * 2012-10-18 2019-07-24 칼 짜이스 엑스-레이 마이크로스코피, 인크. 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템
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CN106029909B (zh) 2014-02-18 2021-02-02 生物纳米基因公司 测定核酸结构信息的改进方法
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CN107189940A (zh) * 2017-05-19 2017-09-22 上海理工大学 基于激光的自动化快速复温装置
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Publication number Publication date
SG176579A1 (en) 2012-01-30
EP2433087A1 (en) 2012-03-28
EP2433087B1 (en) 2015-01-21
JP2015028637A (ja) 2015-02-12
KR20120039547A (ko) 2012-04-25
CN102648389B (zh) 2015-04-29
CN102648389A (zh) 2012-08-22
AU2010249729A1 (en) 2011-12-15
WO2010135323A1 (en) 2010-11-25
US20120097835A1 (en) 2012-04-26
CA2762684A1 (en) 2010-11-25
EP2881701A1 (en) 2015-06-10

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