KR20120039547A - 샘플 위치 및 배향의 동적 결정 및 동적 위치 전환을 위한 장치 및 방법 - Google Patents

샘플 위치 및 배향의 동적 결정 및 동적 위치 전환을 위한 장치 및 방법 Download PDF

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KR20120039547A
KR20120039547A KR20117030283A KR20117030283A KR20120039547A KR 20120039547 A KR20120039547 A KR 20120039547A KR 20117030283 A KR20117030283 A KR 20117030283A KR 20117030283 A KR20117030283 A KR 20117030283A KR 20120039547 A KR20120039547 A KR 20120039547A
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radiation
sample
reflected
target sample
target
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English (en)
Korean (ko)
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알렉시 와이. 샤로노브
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바이오나노 제노믹스, 인크.
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/244—Devices for focusing using image analysis techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Focusing (AREA)
KR20117030283A 2009-05-19 2010-05-18 샘플 위치 및 배향의 동적 결정 및 동적 위치 전환을 위한 장치 및 방법 Withdrawn KR20120039547A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17949809P 2009-05-19 2009-05-19
US61/179,498 2009-05-19

Publications (1)

Publication Number Publication Date
KR20120039547A true KR20120039547A (ko) 2012-04-25

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KR20117030283A Withdrawn KR20120039547A (ko) 2009-05-19 2010-05-18 샘플 위치 및 배향의 동적 결정 및 동적 위치 전환을 위한 장치 및 방법

Country Status (9)

Country Link
US (1) US20120097835A1 (enExample)
EP (2) EP2433087B1 (enExample)
JP (2) JP2012527651A (enExample)
KR (1) KR20120039547A (enExample)
CN (1) CN102648389B (enExample)
AU (1) AU2010249729A1 (enExample)
CA (1) CA2762684A1 (enExample)
SG (1) SG176579A1 (enExample)
WO (1) WO2010135323A1 (enExample)

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KR20150068436A (ko) * 2012-10-18 2015-06-19 칼 짜이스 엑스-레이 마이크로스코피, 인크. 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템
KR20200019906A (ko) * 2018-01-12 2020-02-25 일루미나, 인코포레이티드 실시간 컨트롤러 스위칭
WO2023191143A1 (ko) * 2022-03-28 2023-10-05 주식회사 제이엘메디랩스 광학현미경을 위한 자동 초점 장치 및 자동 초점 유지 방법

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US12054771B2 (en) 2014-02-18 2024-08-06 Bionano Genomics, Inc. Methods of determining nucleic acid structural information
CN107076964B (zh) * 2014-08-06 2020-01-03 赛洛米克斯股份有限公司 基于图像的激光自动聚焦系统
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US9921399B2 (en) 2015-03-31 2018-03-20 General Electric Company System and method for continuous, asynchronous autofocus of optical instruments
JP6590366B2 (ja) * 2015-09-25 2019-10-16 オリンパス株式会社 顕微鏡装置、オートフォーカス装置、及び、オートフォーカス方法
CN108474732B (zh) * 2016-01-07 2022-04-15 阿科玛股份有限公司 测量高速移动的弯曲物体上沉积涂层厚度的不依赖于物体位置的方法
DE102016212019A1 (de) 2016-07-01 2018-01-04 Carl Zeiss Microscopy Gmbh Neigungsmessung und -korrektur des Deckglases im Strahlengang eines Mikroskops
CN106324795B (zh) * 2016-09-29 2018-10-16 电子科技大学 一种检测仪显微镜多视野自动快速对焦方法
US11385180B2 (en) 2017-03-03 2022-07-12 Witec Wissenschaftliche Instrumente Und Technologie Gmbh Method and device for imaging a specimen surface
NL2018857B1 (en) 2017-05-05 2018-11-09 Illumina Inc Systems and methods for improved focus tracking using a light source configuration
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US10416430B2 (en) * 2017-05-10 2019-09-17 Applejack 199 L.P. Focusing of optical devices
CN107189940A (zh) * 2017-05-19 2017-09-22 上海理工大学 基于激光的自动化快速复温装置
CN108020163B (zh) * 2017-12-26 2020-01-31 中国科学技术大学 一种显微追踪微粒三维位移的装置
EP3614192A1 (en) * 2018-08-20 2020-02-26 Till GmbH Microscope device
JP7651453B2 (ja) 2018-09-10 2025-03-26 フリューダイム カナダ インコーポレイテッド オートフォーカスサンプルイメージング装置及び方法
DE102018131427B4 (de) 2018-12-07 2021-04-29 Leica Microsystems Cms Gmbh Verfahren zur automatischen Positionsermittlung auf einer Probenanordnung und entsprechendes Mikroskop, Computerprogramm und Computerprogrammprodukt
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US11086118B2 (en) 2019-04-29 2021-08-10 Molecular Devices, Llc Self-calibrating and directional focusing systems and methods for infinity corrected microscopes
WO2020227698A1 (en) * 2019-05-08 2020-11-12 Apollo Medical Optics, Ltd Optical system and detection method therof
DE102019113975B4 (de) * 2019-05-24 2023-10-19 Abberior Instruments Gmbh Verfahren und Vorrichtung zum Überwachen des Fokuszustands eines Mikroskops sowie Mikroskop
CN110260783B (zh) * 2019-07-10 2020-11-10 中国工程物理研究院机械制造工艺研究所 一种干涉显微镜自动对焦装置及方法
CN112113501A (zh) * 2020-10-12 2020-12-22 中国科学院生物物理研究所 一种基于干涉测量的单分子轴向定位装置及其工作方法
CN112987292B (zh) * 2021-04-15 2021-08-10 中国人民解放军国防科技大学 基于点阵光斑质心偏差信息的计算机辅助装调方法及装置
EP4092462A1 (en) 2021-05-18 2022-11-23 Leica Instruments (Singapore) Pte. Ltd. Laser assisted autofocus
CN115854891A (zh) * 2021-09-26 2023-03-28 深圳中科飞测科技股份有限公司 一种检测方法、检测系统及计算机可读存储介质
CN115876077A (zh) * 2021-09-26 2023-03-31 深圳中科飞测科技股份有限公司 一种检测方法、检测系统及计算机可读存储介质
CN114414589A (zh) * 2022-02-23 2022-04-29 湖北九峰山实验室 一种用于芯片缺陷检测的系统
CN114647058B (zh) * 2022-05-18 2022-09-06 合肥金星智控科技股份有限公司 焦点调整方法、焦点调整装置、libs检测系统和存储介质
CN115717859B (zh) * 2022-11-16 2023-09-29 南京博视医疗科技有限公司 一种点扫描光学系统激光标定方法及其装置
CN116540395A (zh) * 2023-04-28 2023-08-04 广东粤港澳大湾区黄埔材料研究院 一种可锁定成像焦面的激发模组、显微镜及显微成像系统
WO2025072986A1 (de) * 2023-10-04 2025-04-10 Akrima Gmbh Anbaugerät für ein mikroskop
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KR20150068436A (ko) * 2012-10-18 2015-06-19 칼 짜이스 엑스-레이 마이크로스코피, 인크. 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템
KR20200019906A (ko) * 2018-01-12 2020-02-25 일루미나, 인코포레이티드 실시간 컨트롤러 스위칭
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Also Published As

Publication number Publication date
US20120097835A1 (en) 2012-04-26
CN102648389A (zh) 2012-08-22
EP2433087A1 (en) 2012-03-28
CA2762684A1 (en) 2010-11-25
JP2015028637A (ja) 2015-02-12
WO2010135323A1 (en) 2010-11-25
JP2012527651A (ja) 2012-11-08
AU2010249729A1 (en) 2011-12-15
EP2433087B1 (en) 2015-01-21
SG176579A1 (en) 2012-01-30
CN102648389B (zh) 2015-04-29
EP2881701A1 (en) 2015-06-10

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