US20070146871A1 - Microscope and sample observation method - Google Patents
Microscope and sample observation method Download PDFInfo
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- US20070146871A1 US20070146871A1 US11/711,638 US71163807A US2007146871A1 US 20070146871 A1 US20070146871 A1 US 20070146871A1 US 71163807 A US71163807 A US 71163807A US 2007146871 A1 US2007146871 A1 US 2007146871A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/02—Objectives
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/368—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements details of associated display arrangements, e.g. mounting of LCD monitor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0342—Solid sample being immersed, e.g. equiindex fluid
Definitions
- FIG. 5 and FIG. 6 show just an example of the configurations, but it is also possible to adopt a variety of configurations and inspection methods except for those.
- the apparatus may be constructed as a device observation apparatus without the inspection part 16 .
- the image acquisition part 1 may also be excluded if not necessary, e.g., where the operator directly observes the image.
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- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Multimedia (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Lenses (AREA)
- Microscoopes, Condenser (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
For a semiconductor device S as a sample of an observed object, there are provided an image acquisition part 1 for carrying out observation of the semiconductor device S, and an optical system 2 comprising an objective lens 20. A solid immersion lens (SIL) 3 for magnifying an image of the semiconductor device S is arranged movable between an insertion position where the solid immersion lens includes an optical axis from the semiconductor device S to the objective lens 20 and is in close contact with a surface of the semiconductor device S, and a standby position off the optical axis. Then an image containing reflected light from SIL 3 is acquired with the SIL 3 at the insertion position, and the insertion position of SIL 3 is adjusted by SIL driver 30, with reference to the image. This realizes a semiconductor inspection apparatus (microscope) capable of readily performing observation of the sample necessary for an analysis of microstructure of a semiconductor device or the like, and a semiconductor inspection method (sample observation method) therewith.
Description
- 1. Field of the Invention
- The present invention relates to a microscope used for observing a sample such as a semiconductor device, and a sample observation method therewith.
- 2. Related Background Art
- Inspection of semiconductors is implemented using a method of observing a semiconductor device as a sample with a microscope or the like and thereby performing an analysis of failure in a semiconductor device, evaluation of reliability thereof, and so on. The known semiconductor inspection apparatus include an emission microscope, an IR-OBIRCH device, and so on (cf. Japanese Patent Application Laid-Open No. H7-190946 and Japanese Patent Publication No. H7-18806). In recent years, however, the semiconductor devices as inspected objects are being miniaturized more and more, and it is becoming hard for the conventional inspection apparatus using visible light or infrared light, to analyze the microstructure, because of restrictions from the diffraction limit in the optical system.
- For this reason, in a case where the microstructure of a semiconductor device is analyzed to detect an abnormal portion in a circuit pattern such as transistors and interconnections formed in the semiconductor device, an abnormality-existing range is first narrowed down to some extent by an inspection apparatus using visible light or infrared light. Then the narrowed-down range is further observed by a method with an observation apparatus such as an electron microscope with higher resolution to detect an abnormal portion in the semiconductor device.
- The method of performing the observation in high resolution with the electron microscope after the inspection with light as described above has a problem that the inspection of semiconductor device requires a great deal of effort and time, for example, because of complicated preparation and installation of the semiconductor device as an inspected object.
- On the other hand, a solid immersion lens (SIL) is known as a lens for enlarging an image of an observed object. The SIL is a lens of hemispherical shape, or of hyperhemispherical shape called a Weierstrass sphere. When this SIL is placed in contact with the surface of the observed object, it can increase the numerical aperture NA and magnification and implement observation in high spatial resolution. However, the SIL is a compact lens element about 1 mm in size. For this reason, inspection with the SIL has not been put to practical use yet in the field of the inspection of semiconductor devices, in view of its difficulties in handling, observation control, and so on. This is also the case in observation of samples except for the semiconductor devices.
- The present invention has been accomplished in order to solve the above problem, and an object of the invention is to provide a microscope capable of readily carrying out observation of a sample necessary for an analysis of microstructure of a semiconductor device and the like, and a sample observation method therewith.
- In order to achieve the above object, a microscope according to the present invention is a microscope for observing a sample, comprising: (1) an optical system comprising an objective lens to which light from the sample is incident, and adapted to guide an image of the sample; (3) a solid immersion lens arranged movable between an insertion position including an optical axis from the sample to the objective lens, and a standby position off the optical axis; (4) solid immersion lens driving means for driving the solid immersion lens between the insertion position and the standby position and for adjusting the insertion position of the solid immersion lens relative to the objective lens;,and (5) instructing means for issuing an instruction to adjust the insertion position of the solid immersion lens, with reference to an image containing reflected light from the solid immersion lens.
- A sample observation method according to the present invention is a sample observation method of observing a sample, comprising: (a) a first image acquisition step of acquiring an observation image of a sample through an optical system comprising an objective lens to which light from the sample is incident; (b) an observation setting step of setting an observation location in the sample from the observation image; (c) a lens insertion step of moving a solid immersion lens from a standby position off an optical axis from the sample to the objective lens, to an insertion position including the optical axis; (d) a position adjustment step of acquiring an image containing reflected light from the solid immersion lens and adjusting the insertion position of the solid immersion lens relative to the objective lens, with reference to the image; and (e) a second image acquisition step of acquiring an observation image of the sample enlarged by the solid immersion lens, through the solid immersion lens and the optical system.
- In the microscope and sample observation method as described above, the microscope is constructed to be able to acquire both the observation image in the normal state without the solid immersion lens between the sample such as a semiconductor device as an observed object, and the objective lens, and the enlarged observation image in the inserted state of the solid immersion lens. Then the image containing the reflected light from the solid immersion lens is acquired in the inserted state of the solid immersion lens, and the position of the solid immersion lens is adjusted with reference to the image.
- This configuration permits us to observe the sample in high resolution through the solid immersion lens. By performing the alignment utilizing the observation image in the inserted state of the solid immersion lens, it becomes feasible to efficiently handle the solid immersion lens, in the application to the observation of the sample. The above realizes the microscope capable of readily performing the observation of microstructure of the sample or the like, and the sample observation method therewith. Here the microscope may be configured so that image acquiring means for acquiring an image of the sample is provided with the optical system for guiding the image of the sample.
- The above microscope can be applied to a semiconductor inspection apparatus for acquiring an image of a semiconductor device and detecting an abnormal portion thereof, the semiconductor inspection apparatus comprising: image acquiring means for acquiring an image of the semiconductor device as an inspected object; an optical system comprising an objective lens to which light from the semiconductor device is incident, and adapted for guiding the image of the semiconductor device to the image acquiring means; a solid immersion lens arranged movable between an insertion position including an optical axis from the semiconductor device to the objective lens, and a standby position off the optical axis; solid immersion lens driving means for driving the solid immersion lens between the insertion position and the standby position and for adjusting the insertion position of the solid immersion lens relative to the objective lens; and instructing means for issuing an instruction to adjust the insertion position of the solid immersion lens, with reference to the image containing reflected light from the solid immersion lens, which is acquired by the image acquiring means.
- The aforementioned sample observation method can be applied to a semiconductor inspection method of acquiring an image of a semiconductor device and detecting an abnormal portion thereof, the semiconductor inspection method comprising: a first image acquisition step of acquiring an observation image of the semiconductor device as an inspected object, through an optical system comprising an objective lens to which light from the semiconductor device is incident; an inspection setting step of setting an inspection location in the semiconductor device from the observation image; a lens insertion step of moving a solid immersion lens from a standby position off an optical axis from the semiconductor device to the objective lens, to an insertion position including the optical axis; a position adjustment step of acquiring an image containing reflected light from the solid immersion lens and adjusting the insertion position of the solid immersion lens relative to the objective lens; with reference to the image; and a second image acquisition step of acquiring an observation image of the semiconductor device enlarged by the solid immersion lens, through the solid immersion lens and the optical system.
- In the semiconductor inspection apparatus and inspection method described above, the inspection apparatus is configured so as to be able to acquire both the observation image in the normal state without the solid immersion lens between the semiconductor device as an observed object and the objective lens, and the enlarged observation image in the inserted state of the solid immersion lens. Then the image containing the reflected light from the solid immersion lens is acquired in the inserted state of the solid immersion lens, and the position of the solid immersion lens is adjusted with reference to the image.
- This configuration permits us to observe the semiconductor device in high resolution through the solid immersion lens. By performing the alignment utilizing the observation image in the inserted state of the solid immersion lens, it becomes feasible to efficiently handle the solid immersion lens, in the application to the inspection of the semiconductor device. The above realizes the semiconductor inspection apparatus capable of readily performing the inspection of the semiconductor device such as the analysis of microstructure, and the inspection method therewith.
- In the above microscope, preferably, the instructing means issues the instruction to adjust the insertion position of the solid immersion lens so that a position of a center of gravity of a reflected light image coincides with an observation location in the sample, with reference to the image containing the reflected light from the solid immersion lens. Similarly, in the sample observation method, preferably, the position adjustment step is to adjust the insertion position of the solid immersion lens so that a position of a center of gravity of a reflected light image coincides with the observation location in the sample, with reference to the image containing the reflected light from the solid immersion lens. This permits us to surely perform the alignment utilizing the observation image in the inserted state of the solid immersion lens. The observation location in the sample is an inspection location in the semiconductor device in the semiconductor inspection apparatus and inspection method.
- The microscope may also be configured so that the instructing means issues an instruction to adjust a distance between the objective lens and the sample, along with the adjustment of the insertion position of the solid immersion lens. Similarly, the sample observation method may comprise a distance adjustment step of adjusting a distance between the objective lens and the sample. This permits us to acquire the enlarged observation image of the sample such as the semiconductor device, as an excellent image through the optical system comprising the objective lens, and through the solid immersion lens.
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FIG. 1 is a block diagram schematically showing a configuration of an embodiment of the semiconductor inspection apparatus. -
FIG. 2A andFIG. 2B are illustrations showing (A) a solid immersion lens of hemispherical shape and (B) a solid immersion lens of hyperhemispherical shape, respectively. -
FIG. 3 is a flowchart showing a semiconductor inspection method using the semiconductor inspection apparatus shown inFIG. 1 . -
FIG. 4 is a photograph showing an image acquired in an inserted state of a solid immersion lens. -
FIG. 5 is a configuration diagram showing another embodiment of the semiconductor inspection apparatus. -
FIG. 6 is a configuration diagram showing a side view of the semiconductor inspection apparatus shown inFIG. 5 . -
FIG. 7A andFIG. 7B are illustrations showing examples of reflected light patterns in a reflected light image acquired with the solid immersion lens. -
FIG. 8A andFIG. 8B are illustrations showing examples of reflected light patterns in a reflected light image acquired with the solid immersion lens. -
FIG. 9A andFIG. 9B are illustrations showing examples of reflected light patterns in a reflected light image acquired with the solid immersion lens. - Preferred embodiments of the microscope and the sample observation method according to the present invention will be described below in detail with reference to the drawings. In the description of drawings the same elements will be denoted by the same reference symbols, without redundant description. It is also noted that dimensional ratios in the drawings do not always agree with those in the description.
- First, a basic configuration of a semiconductor inspection apparatus being a microscope according to the present invention will be described.
FIG. 1 is a block diagram schematically showing a configuration of an embodiment of the semiconductor inspection apparatus according to the present invention. The present apparatus is an inspection device adapted for a semiconductor device S, for example, in which a circuit pattern consisting of transistors, interconnections, etc. is formed, as a sample of an observed object (inspected object), and is configured to acquire an image of the semiconductor device S and detect an abnormal portion thereof. Here the microscope and sample observation method according to the present invention are applicable to any cases of general observation of the sample, but the present invention will be described below mainly about the semiconductor inspection apparatus and inspection method as an application example thereof. - The semiconductor inspection apparatus in the present embodiment is comprised of an observation part A for observation of the semiconductor device S, a control part B for control of operations of respective portions in the observation part A, and an analysis part C for processing, instructions, etc. necessary for the inspection of the semiconductor device S. The semiconductor device S as a sample of an inspected object by the present inspection apparatus, i.e., an observed object by the microscope is mounted on a
stage 18 in the observation part A. - The observation part A has an
image acquisition part 1 housed in a black box (not shown), anoptical system 2, and a solid immersion lens (SIL) 3. Theimage acquisition part 1 is, for example, a means comprised of a photodetector, an image pickup device, or the like and adapted to acquire an image of the semiconductor device S. Theoptical system 2 for guiding an image of light from the semiconductor device S to theimage acquisition part 1 is disposed between theimage acquisition part 1, and the semiconductor device S mounted on thestage 18. - The
optical system 2 is provided with anobjective lens 20 at a predetermined position opposite to the semiconductor device S, to which the light from the semiconductor device S is incident. Light, for example, emerging from or reflected from the semiconductor device S is incident to theobjective lens 20 and travels through theoptical system 2 including theobjective lens 20, to theimage acquisition part 1. Then theimage acquisition part 1 acquires the image of the semiconductor device S to be used in inspection. - The
image acquisition part 1 and theoptical system 2 are integrally constructed in a state in which their optical axes are coincident with each other. AnXYZ stage 15 is provided for theseimage acquisition part 1 andoptical system 2. This is a configuration capable of achieving alignment and focusing for the semiconductor device S, by optionally moving theimage acquisition part 1 and theoptical system 2 in the X, Y directions (horizontal directions), and in the Z directions (vertical directions). The alignment and focusing for the semiconductor device S may also be achieved by driving thestage 18 carrying the semiconductor device S. - An
inspection part 16 is provided for the semiconductor device S as an, inspected object. In the inspection of semiconductor device S, theinspection part 16 performs control of a state of the semiconductor device S and others according to need. There are different methods of controlling the state of the semiconductor device S by theinspection part 16, depending upon specific inspection methods applied to the semiconductor device S; for example, applicable methods include a method of supplying a voltage to a predetermined portion of a circuit pattern formed in the semiconductor device S, a method of irradiating a laser beam as a probe beam to the semiconductor device S, and so on. - In the present embodiment,
SIL 3 is further disposed in this observation part A.FIGS. 2A and 2B are illustrations showing examples of structure and usage of the solid immersion lens (SIL). TheSIL 3 is a lens of hemispherical shape, or of hyperhemispherical shape called a Weierstrass sphere, and is placed in close contact with a surface of the semiconductor device S as an observed object, as shown inFIGS. 2A and 2B . Let us suppose here that the radius ofSIL 3 is R and the refractive index thereof n. - The lens shape of
such SIL 3 is determined according to conditions for nullifying aberration. In the SIL of hemispherical shape, as shown inFIG. 2A , the focal point is at the center of the sphere. In this case, the numerical aperture NA and magnification both increase by n-fold. On the other hand, in the case of the SIL of hyperhemispherical shape, as shown inFIG. 2B , the focal point is located at a position R/n below the center of the sphere. In this case, the numerical aperture NA and magnification both increase by n2-fold. Conceivably, theSIL 3 may also be used under conditions other than those shown inFIGS. 2A and 2B , according to a specific observation condition or the like for the semiconductor device S, e.g., such a condition that the focal point is located at a position between the center of the sphere and the position R/n below the center of the sphere. - In the semiconductor inspection apparatus shown in
FIG. 1 , theSIL 3 is arranged movable relative to theimage acquisition part 1 andoptical system 2 and relative to the semiconductor device S mounted on thestage 18. Specifically, theSIL 3 is arranged to be movable between an insertion position at which the SIL. 3 is placed so as to include the optical axis from the semiconductor device S to theobjective lens 20 and be kept in contact with the semiconductor device S, and a position off the optical axis (a standby position). At the insertion position, theSIL 3 is placed in a state that the plane or convex lower surface of the lens is in close contact with the semiconductor device S. Specific examples of the SIL include such known lenses as plano-convex lenses and bi-convex lenses (e.g., reference should be made to Japanese Patent Application Laid-Open No. H5-157701 and U.S. Pat. No. 6,594,086). - A solid immersion lens driver (SIL driver) 30 is provided for the
SIL 3. TheSIL driver 30 is a driving means for driving theSIL 3 to move it between the aforementioned insertion position and standby position. TheSIL driver 30 finely moves the location ofSIL 3 to adjust the insertion position ofSIL 3 relative to theobjective lens 20 of theoptical system 2. InFIG. 1 , theSIL 3 is illustrated in a state in which it is placed at the insertion position between theobjective lens 20 and the semiconductor device S. - For the observation part A for carrying out the observation and others for inspection of the semiconductor device S, there are provided the control part B and analysis part C.
- The control part B has an
observation controller 51, astage controller 52, and anSIL controller 53. Theobservation controller 51 controls operations of theimage acquisition part 1 andinspection part 16, thereby controlling execution of observation of the semiconductor device S carried out in the observation part A, setting of observation conditions, and so on. - The
stage controller 52 controls the operation ofXYZ stage 15, thereby controlling setting of the observation location in the semiconductor device S by theimage acquisition part 1 andoptical system 2 as an inspection location in the present inspection apparatus, or alignment thereof, focusing, and so on. TheSIL controller 53 controls the operation ofSIL driver 30, thereby controlling movement of theSIL 3 between the insertion position and the standby position, or adjustment of the insertion position ofSIL 3, or the like. - The analysis part C has an
image analyzer 61 and aninstructor 62. Theimage analyzer 61 performs a required analysis process and others for the image acquired by theimage acquisition part 1. Theinstructor 62 gives necessary instructions as to execution of inspection of the semiconductor device S in the observation part A through the control part B, with reference to input contents from an operator, analysis contents by theimage analyzer 61, and so on. - Particularly, in the present embodiment, the analysis part C performs necessary processing and instructions about the observation and inspection of the semiconductor device, S with the
SIL 3, corresponding to the configuration wherein theSIL 3 andSIL driver 30 are placed in the observation part A. - Namely, where the
SIL 3 is interposed between theobjective lens 20 and the semiconductor device S as a sample, theimage acquisition part 1 in the observation part A acquires an image containing reflected light from theSIL 3 in a state in which theSIL 3 is located at the insertion position. In the analysis part C, theimage analyzer 61 performs a predetermined analysis, e.g., an operation of determining a position of a center of gravity of a reflected light image in the image containing the reflected light from theSIL 3, which was acquired by theimage acquisition part 1. Then theinstructor 62 instructs theSIL controller 53 to adjust the insertion position of theSIL 3 so that the position of the center of gravity of the reflected light image coincides with the inspection location (observation location) in the semiconductor device S, with reference to the image containing the reflected light from theSIL 3, which was analyzed by theimage analyzer 61. - A semiconductor inspection method as a sample observation method according to the present invention will be described.
FIG. 3 is a flowchart showing the semiconductor inspection method using the semiconductor inspection apparatus shown inFIG. 1 . - First, the semiconductor device S as an inspected object is observed in a state in which the
SIL 3 is located at the standby position off the optical axis. At this step, theimage acquisition part 1 acquires a pattern image of a circuit pattern being an observation image of the semiconductor device S, through theoptical system 2 including the objective lens 20 (step S101). Theinspection part 16 controls the state of the semiconductor device S to a predetermined state and an abnormality observation image for detection of an abnormal portion in the semiconductor device S is acquired (S102, first image acquisition step). - The next step is to check whether there is an abnormal portion in the semiconductor device S, using the pattern image and abnormality observation image acquired in the
image acquisition part 1. If there is an abnormal portion, a position thereof is detected, and the abnormal portion detected is set as an inspection location by the semiconductor inspection apparatus. The inspection location set herein is an observation location in observation of the sample with the microscope (S103, inspection setting step and observation setting step). Then the position of theimage acquisition part 1 andoptical system 2 is set by theXYZ stage 15 so that the inspection location (observation location) thus set is located at the center of the image acquired by theimage acquisition part 1. - Subsequently, setting of the
SIL 3 is carried out relative to the inspection location of the semiconductor device S (S104). First, theSIL 3 at the standby position off the optical axis is driven by theSIL driver 30 to move theSIL 3 to the insertion position including the optical axis from the semiconductor device S to the objective lens 20 (S105, lens insertion step). - After the
SIL 3 is interposed between the semiconductor device S and theobjective lens 20, the insertion position of theSIL 3 is adjusted (S106, position adjustment step). First, an image containing reflected light from theSIL 3 is acquired by theimage acquisition part 1. The adjustment of the insertion position of theSIL 3 is carried out using reflected light from the apex of the surface of theSIL 3 in a reflected light image included in this image, as a guide. -
FIG. 4 is a photograph showing an image acquired by theimage acquisition part 1 in a state in which theSIL 3 is inserted between the semiconductor device S and theobjective lens 20. A bright portion in the center of this photograph corresponds to the reflected light from the apex of the surface of theSIL 3. Theimage analyzer 61 performs an analysis of the image containing such reflected light from theSIL 3, automatically or based on an instruction from an operator, to determine the position of the center of gravity of the reflected light image. Then theinstructor 62 instructs theSIL 3 andSIL driver 30 through theSIL controller 53 to adjust the insertion position of theSIL 3 so that the position of the center of gravity of the reflected light image acquired by theimage analyzer 61 coincides with the inspection location in the semiconductor device S. In accordance therewith, theSIL 3 is positioned relative to the semiconductor device S andobjective lens 20. - Furthermore, along with the adjustment of the insertion position of the
SIL 3 described above, theinstructor 62 also instructs theXYZ stage 15 through thestage controller 52 to adjust the distance between the semiconductor device S placed in close contact with theSIL 3, and theobjective lens 20 of the optical system 2 (S107, distance adjustment step). This achieves focusing in the inserted state of theSIL 3. Then theimage acquisition part 1 acquires an enlarged observation image of the semiconductor device S through theSIL 3 placed on the semiconductor device S and through theoptical system 2 including the objective lens 20 (S108, second image acquisition step). - The effects of the semiconductor inspection apparatus and semiconductor inspection method in the present embodiment will be described below.
- The semiconductor inspection apparatus shown in
FIG. 1 and the semiconductor inspection method shown inFIG. 3 employ the configuration capable of acquiring both the observation image in the normal state without theSIL 3 between the semiconductor device S of the observed object and theobjective lens 20 and the enlarged observation image in-the inserted state of theSIL 3 by theimage acquisition part 1. Then the image containing the reflected light from theSIL 3 is acquired in the inserted state of theSIL 3, and the position of theSIL 3 is adjusted with reference to the image. - This configuration permits one to observe the semiconductor device S as a sample in high resolution through the
SIL 3. By performing the alignment utilizing the observation image in the inserted state of theSIL 3, it becomes feasible to efficiently handle theSIL 3, in the application to the inspection of the semiconductor device S (observation of the sample). The above realizes the semiconductor inspection apparatus capable of readily performing the inspection of the semiconductor device S such as the analysis of microstructure or the like, and the inspection method therewith. By the microscope of the above structure and the sample observation method, it becomes feasible to readily perform the observation of the microstructure of the sample or the like. - For the alignment of the
SIL 3 using the image containing the reflected light from theSIL 3, specifically, it is preferable to determine the position of the center of gravity of the reflected light image from theSIL 3 and adjust the insertion position of theSIL 3 so that the position of the center of gravity coincides with the inspection location in the semiconductor device S, i.e., with the observation location in the sample, as described above. This enables the alignment ofSIL 3 to be achieved with certainty. Possibly, the alignment is achieved by any other alignment method than the above method. For example, the insertion position of theSIL 3 may be adjusted so that the position of the center of gravity of the reflected light image from theSIL 3 coincides with the position of the center of gravity of the inspection location in the semiconductor device S. - Where the inspection of the semiconductor device S is carried out using the
SIL 3, it is preferable to locate the inspection location of the semiconductor device S at the center of the image acquired by theimage acquisition part 1. This can achieve effective use of the pupil of theobjective lens 20 in the observation of the semiconductor device S. Namely, where theSIL 3 is used, the pupil of theobjective lens 20 is used only in part, and locations of usage vary according to angles of view. Therefore, the utilization efficiency of light becomes maximum when theSIL 3 is positioned on the optical axis of theobjective lens 20. This placement of theSIL 3 can decrease shading occurring in theSIL 3. - In the semiconductor inspection apparatus shown in
FIG. 1 , theXYZ stage 15 is provided for theimage acquisition part 1 and theoptical system 2, in order to achieve the alignment and focusing of theimage acquisition part 1 andoptical system 2 relative to the semiconductor device S. Another possible XYZ stage of this type is an XYZ stage for thestage 18 carrying the semiconductor device S. It is also possible to further provide a 9 stage arranged movable in the angular direction. -
FIG. 5 is a configuration diagram showing another embodiment of the semiconductor inspection apparatus according to the present invention.FIG. 6 is a configuration diagram showing a side view of the semiconductor inspection apparatus shown inFIG. 5 . The present embodiment is an example showing a specific configuration of the semiconductor inspection apparatus shown inFIG. 1 . InFIG. 6 , the analysis part C and others are omitted from the illustration. - The semiconductor inspection apparatus in the present embodiment is provided with an observation part A, a control part B, and an analysis part C. A semiconductor device S as an inspected object is mounted on a
stage 18 provided in the observation part A. Furthermore, in the present embodiment, the apparatus is equipped with atest fixture 19 for applying an electric signal necessary for inspection or the like to the semiconductor device S. The semiconductor device S is placed, for example, with its back side facing theobjective lens 20. - The observation part A has a high-
sensitivity camera 10 set in a black box (not shown), a laser scan optic (LSM: Laser Scanning Microscope)unit 12,optical systems XYZ stage 15, anSIL 3, and anSIL driver 30. - Among these components, the
camera 10 andLSM unit 12 correspond to theimage acquisition part 1 in the configuration shown inFIG. 1 . Theoptical systems optical system 2. Anobjective lens 20 is located on the semiconductor device S side of theoptical systems FIGS. 5 and 6 , a plurality ofobjective lenses 20 having their respective magnifications different from each other are arranged to be switchable from one to another. Thetest fixture 19 corresponds to theinspection part 16. TheLSM unit 12 also has the function of theinspection part 16 in addition to the function of theimage acquisition part 1. - The
optical system 22 is a camera optical system for guiding light from the semiconductor device S incident through theobjective lens 20, to thecamera 10. The cameraoptical system 22 has animaging lens 22 a for focusing an image magnified at a predetermined magnification by anobjective lens 20, on a light receiving surface inside thecamera 10. Abeam splitter 24 a of theoptical system 24 is interposed betweenobjective lens 20 andimaging lens 22 a. The high-sensitivity camera 10 can be, for example, a cooled CCD camera or the like. - In this configuration, the light from the semiconductor device S is guided through the optical system including the
objective lens 20 and the cameraoptical system 22 to thecamera 10. Then thecamera 10 picks up an image such as a pattern image of the semiconductor device S. In another configuration, the camera can also picks up an emission image of the semiconductor device S. In this case, light emitted from the semiconductor device S in a voltage applied state by thetest fixture 19 is guided through the optical system to thecamera 10. Then thecamera 10 picks up the emission image of the semiconductor device S to be used as an abnormality observation image. Specific examples of the emission from the semiconductor device S include one due to an abnormal portion based on a defect of the semiconductor device, transient emission with switching operation of a transistor in the semiconductor device, and so on. Furthermore, the acquired image may be an exothermic image based on a defect of device. - The
LSM unit 12 has a laser beam introductionoptical fiber 12 a for irradiating an infrared laser beam, acollimator lens 12 b for collimating the laser beam irradiated from theoptical fiber 12 a, into a parallel beam, abeam splitter 12 e for reflecting the laser beam collimated into the parallel beam by thelens 12 b, and anXY scanner 12 f for moving the laser beam reflected by thebeam splitter 12 e, in the XY directions to emit the laser beam toward the semiconductor device S. - The
LSM unit 12 also has acondenser lens 12 d for condensing light having been injected through theXY scanner 12 f from the semiconductor device S side and having passed through thebeam splitter 12 e, and a detectionoptical fiber 12 c for detecting the light condensed by thecondenser lens 12 d. - The
optical system 24 is an LSM unit optical system for guiding light between the semiconductor device S andobjective lens 20 and, theXY scanner 12 f of theLSM unit 12. The LSM unitoptical system 24 has abeam splitter 24 a for reflecting part of light having been injected from the semiconductor device S through theobjective lens 20, amirror 24 b for changing the optical path of the light reflected by thebeam splitter 24 a, to the optical path toward theLSM unit 12, and alens 24 c for condensing the light reflected by themirror 24 b. - In this configuration, the infrared laser beam emitted from a laser light source (not shown) and guided through the laser beam introduction
optical fiber 12 a travels via thelens 12 b,beam splitter 12 e,XY scanner 12 f,optical system 24, andobjective lens 20 onto the semiconductor device S and then enters the interior of the semiconductor device S. - Reflectively scattered light from the semiconductor device S with incidence of the incident light reflects a circuit pattern provided in the semiconductor device S. The reflected light from the semiconductor device S travels through the optical path opposite to the incident light to reach the
beam splitter 12 e, and then passes through thebeam splitter 12 e. The light through thebeam splitter 12 e then travels through thelens 12 d to enter the detectionoptical fiber 12 c, and is detected by a photodetector coupled to the detectionoptical fiber 12 c. - The intensity of the light detected through the detection
optical fiber 12 c by the photodetector is the intensity reflecting the circuit pattern provided in the semiconductor device S, as described above. Accordingly, while the infrared laser beam scans the semiconductor device S on the X-Y plane by theXY scanner 12 f, a sharp image of the circuit pattern in the semiconductor device S or the like can be picked up. - The observation part A is further provided with the
SIL 3. TheSIL 3 is arranged movable between the aforementioned insertion position and standby position, relative to the high-sensitivity camera 10,LSM unit 12,optical systems objective lens 20 and relative to the semiconductor device S mounted on thestage 18. TheSIL driver 30 is provided for theSIL 3. TheSIL driver 30 is comprised of a lens manipulator having aholder 31 supporting theSIL 3, and is an XYZ driving mechanism for moving theSIL 3 in the X, Y, and Z directions. - The control part B and analysis part C are provided for the observation part A for carrying out the observation and others for inspection of the semiconductor device S.
- The control part B has a
camera controller 51 a, anLSM controller 51 b, anOBIRCH controller 51 c, astage controller 52, and anSIL controller 53. Among these, thestage controller 52 andSIL controller 53 are as those described withFIG. 1 . Thecamera controller 51 a,LSM controller 51 b, andOBIRCH controller 51 c correspond to theobservation controller 51 in the configuration shown inFIG. 1 . - The
camera controller 51 a and theLSM controller 51 b control the operations of the high-sensitivity camera 10 and theLSM unit 12, respectively, thereby controlling the acquisition of an image of semiconductor device S carried out in the observation part A. The OBIRCH controller Sic is provided for acquiring an OBIRCH (Optical Beam Induced Resistance Change) image used in inspection of the semiconductor device S, and extracts an electric current change in the semiconductor device S appearing during a scan with the laser beam. - The analysis part C has an
image analyzer 61 and aninstructor 62, and is constructed, for example, of a computer or the like. Image information from thecamera controller 51 a and from theLSM controller 51 b is entered through an image capture board provided in the computer of analysis part C. Theimage analyzer 61 andinstructor 62 are as those described withFIG. 1 . The image, data, etc. acquired or analyzed by the analysis part C is displayed on thedisplay device 63 coupled to the analysis part C as occasion may demand. - A semiconductor inspection method using the semiconductor inspection apparatus shown in
FIGS. 5 and 6 will be schematically described below with reference to the flowchart ofFIG. 3 . - First, in the normal state in which the
SIL 3 is located at the standby position, the semiconductor device S is scanned by theLSM unit 12 to acquire a pattern image of the semiconductor device S (step S101). The next step is to acquire an abnormality observation image used in detection of an abnormal portion in the semiconductor device S (step S102). Specific examples of this abnormality observation image include an OBIRCH image acquired by theOBIRCH controller 51 c, an emission image acquired by thecamera 10, and so on. These pattern image and abnormality observation image are superimposed on each other, are displayed on thedisplay device 63, etc. as occasion may demand. - The next step is to check an abnormal portion in the semiconductor device S by use of the acquired image and define a detected abnormal portion as an inspection location (S103) and to set the
XYZ stage 15 and others so that the inspection location is positioned at the center of the image. Subsequent steps are to carry out the insertion, position adjustment, and distance adjustment of theSIL 3 relative to the inspection location of the semiconductor device S (S104, S105-S107). - Then such an enlarged image as an enlarged pattern image, OBIRCH image, or emission image is acquired through the
SIL 3 disposed on the semiconductor device S, and through theobjective lens 20 and others (S108). Superposition of the images, the display thereof on thedisplay device 63, etc. are carried out as occasion may demand. In acquisition of an emission image, the stage and others are properly moved so as to match the amount of chromatic aberration caused by theSIL 3, and the magnification is adjusted by software to implement superposition of images. - The image containing the reflected light from the
SIL 3 in the example shown inFIG. 4 will be further described in more detail with reference toFIGS. 7A-9B . Various reflected light patterns as shown in these figures can be contemplated as to the reflected light image acquired for theSIL 3. InFIGS. 7A-9B , incident light to theSIL 3 is indicated by solid lines, and reflected light by dashed lines. InFIGS. 7A and 9B , lines extending toward the center of sphere of theSIL 3 are indicated-by dotted lines. Where the optical paths of the incident light and reflected light to and from theSIL 3 are laid over each other, they are illustrated with a shift, for description's sake. -
FIG. 7A shows a reflected light pattern in which light incident normally to the sphericaltop surface 3 a ofSIL 3 is reflected on thetop surface 3 a. In this case, the light is focused at one point, so that alignment is easy. Therefore, the alignment can be implemented with high accuracy.FIG. 7B shows a reflected light pattern in which light is reflected at a focal position (center position) on thebottom surface 3 b ofSIL 3. This is a state of observing thebottom surface 3 b ofSIL 3. In this case, shading appears significant, and thus the alignment can be implemented by matching a maximum-luminance portion with the center. -
FIG. 8A shows a reflected light pattern in which light is reflected at the focal position (apex position) of thetop surface 3 a ofSIL 3. This is a state of observing thetop surface 3 a ofSIL 3. In this case, shading appears significant, and thus the alignment can be implemented by matching a maximum-luminance portion with the center.FIG. 8B shows a reflected light pattern in which light incident normally to the planarbottom surface 3 b ofSIL 3 is reflected on thebottom surface 3 b. In this case, the light is focused at one point, so that alignment is easy. Therefore, the alignment can be implemented with high accuracy. -
FIG. 9A shows a reflected light pattern in which light is reflected on thebottom surface 3 b ofSIL 3, at the focal position (apex position) of thetop surface 3 a, and on thebottom surface 3 b. This is a state of observing thetop surface 3 a of theSIL 3 from the back side. In this case, shading appears significant, and the alignment can be implemented by matching a maximum-luminance portion with the center.FIG. 9B shows a reflected light pattern in which light incident normally to thetop surface 3 a from the back side via thebottom surface 3 b ofSIL 3 is reflected on thetop surface 3 a and is then emitted via thebottom surface 3 b. In this case, the light is focused at one point, so that alignment is easy. Therefore, the alignment can be implemented with high accuracy. - The microscopes and sample observation methods according to the present invention are not limited to the above-described embodiments and configuration examples, but can be modified in various ways. For example, as to the specific configurations of the
image acquisition part 1,optical system 2,inspection part 16, etc. in the above-stated semiconductor inspection apparatus and as to the specific inspection methods and others for inspection of the semiconductor device S,FIG. 5 andFIG. 6 show just an example of the configurations, but it is also possible to adopt a variety of configurations and inspection methods except for those. Where only the observation is carried out for various devices such as semiconductor devices, the apparatus may be constructed as a device observation apparatus without theinspection part 16. Theimage acquisition part 1 may also be excluded if not necessary, e.g., where the operator directly observes the image. - Concerning the structure and usage of the SIL,
FIGS. 2A and 2B show the state in which the focal point is on the top surface of the semiconductor device S, but in the case of back side observation or the like, the SIL is used so that the focal point is on the back side of the semiconductor device S or at a predetermined position inside the semiconductor device S. - The above embodiments described the semiconductor inspection apparatus and semiconductor inspection methods for an observed object of the semiconductor device, but the present invention can also be applied to cases for samples other than the semiconductor devices, as a microscope and a sample observation method used for observation of a sample. This makes it feasible to readily carry out the observation of microstructure of the sample or the like, in the observation of the sample.
- For example, the above-described embodiments used the semiconductor device as a sample of an observed object, and in general, where a variety of devices such as semiconductor devices, are used as samples, target devices are not limited to only those using a semiconductor substrate, but may be any observed objects like an integrated circuit using a substrate of glass, a plastic material, or the like, such as a polysilicon thin-film transistor or the like. For example, in the case of a liquid crystal device, the device is fabricated on a glass substrate; in the case of an organic EL device, the device is fabricated on a plastic substrate. Further common samples include bio-related samples using a slide, and others, in addition to the various devices such as the aforementioned semiconductor devices and liquid crystal devices.
- The microscopes and sample observation methods according to the present invention, as detailed above, can be applied as microscopes and sample observation methods capable of readily performing the observation of the sample necessary for the analysis of microstructure of the semiconductor device or the like. Namely, the microscope is configured so as to be able to acquire both the observation image in the state without the solid immersion lens between the sample such as the semiconductor device as an observed object, and the objective lens and the enlarged observation image in the inserted state of the solid immersion lens, and is also configured to acquire the image containing the reflected light from the solid immersion lens in the inserted state of the solid immersion lens and adjust the position of the solid immersion lens with reference to the image, whereby it is feasible to perform the observation of the sample in high resolution through the solid immersion lens.
- By carrying out the alignment utilizing the observation image in the inserted state of the solid immersion lens, it becomes feasible to efficiently handle the solid immersion lens, in the application to the observation of the sample, for example, such as the inspection of the semiconductor device. The above realizes the microscope capable of readily performing the observation of microstructure of the sample or the like, and the sample observation method therewith. When these microscope and sample observation method are applied to the semiconductor inspection apparatus and inspection method, it is feasible to realize the semiconductor inspection apparatus capable of readily performing the inspection of a semiconductor device such as the analysis of microstructure, and the inspection method therewith.
Claims (15)
1-6. (canceled)
7. A sample observation method of observing a sample, comprising:
a configuring step of configuring a solid immersion lens so that it reflects light in a direction towards an optical system;
a position adjustment step of acquiring an image containing light that has been reflected by the solid immersion lens through the optical system to which light from a sample is incident, and adjusting a position of the solid immersion lens relative to the optical system, with reference to the image; and
an image acquisition step of acquiring an observation image of the sample enlarged by the solid immersion lens, through the solid immersion lens and the optical system.
8. The sample observation method according to claim 7 , wherein the position adjustment step is to adjust the position of the solid immersion lens so that a position of a center of gravity of a reflected light image is positioned on an optical axis of the optical system, with reference to the image containing the reflected light from the solid immersion lens.
9. The sample observation method according to claim 7 , comprising a distance adjustment step of adjusting a distance between the optical system and the sample.
10. The sample observation method according to claim 7 , wherein the position adjustment step is to acquire the image containing only light that has been reflected by the solid immersion lens, and not containing light that has been reflected by the sample.
11. The sample observation method according to claim 7 , wherein, in the position adjustment step, the position of the solid immersion lens is adjusted in a plane perpendicular to an optical axis of the optical system.
12. A sample observation method of observing a sample, comprising:
a configuring step of configuring a solid immersion lens so that it reflects light in a direction towards an optical system;
a position adjustment step of acquiring an image containing light that has been reflected by the top surface of the solid immersion lens through the optical system to which light from a sample is incident, and adjusting a position of the solid immersion lens relative to the optical system, with reference to the image; and
an image acquisition step of acquiring an observation image of the sample enlarged by the solid immersion lens, through the solid immersion lens and the optical system.
13. The sample observation method according to claim 12 , wherein the position adjustment step is to adjust the position of the solid immersion lens so that a position of a center of gravity of a reflected light image is positioned on an optical axis of the optical system, with reference to the image containing the reflected light from the top surface of the solid immersion lens.
14. The sample observation method according to claim 12 , comprising a distance adjustment step of adjusting a distance between the optical system and the sample.
15. The sample observation method according to claim 12 , wherein, in the position adjustment step, the position of the solid immersion lens is adjusted in a plane perpendicular to an optical axis of the optical system.
16. A semiconductor observation method of observing a semiconductor device, comprising:
a configuring step of configuring a solid immersion lens so that it reflects light in a direction towards an optical system;
a position adjustment step of acquiring an image containing light that has been reflected by the solid immersion lens through the optical system to which light from a semiconductor device is incident, and adjusting a position of the solid immersion lens relative to the optical system, with reference to the image; and
an image acquisition step of acquiring an observation image of the semiconductor device enlarged by the solid immersion lens, through the solid immersion lens and the optical system.
17. The semiconductor observation method according to claim 16 , wherein the position adjustment step is to adjust the position of the solid immersion lens so that a position of a center of gravity of a reflected light image is positioned on an optical axis of the optical system, with reference to the image containing the reflected light from the solid immersion lens.
18. The semiconductor observation method according to claim 16 , comprising a distance adjustment step of adjusting a distance between the optical system and the semiconductor device.
19. The semiconductor observation method according to claim 16 , wherein the position adjustment step is to acquire the image containing only light that has been reflected by the solid immersion lens, and not containing light that has been reflected by the semiconductor device.
20. The semiconductor observation method according to claim 16 , wherein, in the position adjustment step, the position of the solid immersion lens is adjusted in a plane perpendicular to an optical axis of the optical system.
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US20070183057A1 (en) * | 2003-03-20 | 2007-08-09 | Hamamatsu Photonics K.K. | Solid immersion lens and microscope |
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- 2004-03-19 US US10/804,195 patent/US7221502B2/en not_active Expired - Lifetime
- 2004-03-19 EP EP04721990A patent/EP1607786B1/en not_active Expired - Lifetime
- 2004-03-19 WO PCT/JP2004/003740 patent/WO2004083930A1/en active Application Filing
- 2004-03-19 CN CNB2004800075568A patent/CN100529831C/en not_active Expired - Fee Related
- 2004-03-19 CN CNB2004800075572A patent/CN100535700C/en not_active Expired - Lifetime
-
2005
- 2005-09-07 KR KR1020057016717A patent/KR101074560B1/en not_active IP Right Cessation
-
2007
- 2007-02-28 US US11/711,638 patent/US20070146871A1/en not_active Abandoned
Patent Citations (4)
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US2809554A (en) * | 1954-07-16 | 1957-10-15 | Zeiss Carl | Microscope objective with low magnification for epi-microscopes |
US4497550A (en) * | 1979-04-23 | 1985-02-05 | Kabushiki Kaisha Medos Kenkyusho | Device for preventing the observing objective lens window of an endoscope from collecting moisture |
US4634234A (en) * | 1983-05-02 | 1987-01-06 | Jenoptik Jena G.M.B.H. | Front lens group for immersion microscope objective in BD versions of high aperture |
US20010050896A1 (en) * | 1998-05-29 | 2001-12-13 | Terastor Corporation, A Delaware Corporation | Beam focusing in near-field optical recording and reading |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070183057A1 (en) * | 2003-03-20 | 2007-08-09 | Hamamatsu Photonics K.K. | Solid immersion lens and microscope |
US7423816B2 (en) | 2003-03-20 | 2008-09-09 | Hamamatsu Photonics K.K. | Solid immersion lens and microscope |
Also Published As
Publication number | Publication date |
---|---|
CN100345021C (en) | 2007-10-24 |
JP4567594B2 (en) | 2010-10-20 |
JPWO2004083930A1 (en) | 2006-06-22 |
US20040240051A1 (en) | 2004-12-02 |
CN1761903A (en) | 2006-04-19 |
US7221502B2 (en) | 2007-05-22 |
CN100535700C (en) | 2009-09-02 |
KR101074560B1 (en) | 2011-10-17 |
CN1761901A (en) | 2006-04-19 |
EP1607786A4 (en) | 2011-05-04 |
WO2004083930A1 (en) | 2004-09-30 |
EP1607786A1 (en) | 2005-12-21 |
EP1607786B1 (en) | 2012-09-05 |
CN1761902A (en) | 2006-04-19 |
CN100529831C (en) | 2009-08-19 |
KR20050107502A (en) | 2005-11-11 |
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Legal Events
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STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |