JP2012511715A5 - - Google Patents

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Publication number
JP2012511715A5
JP2012511715A5 JP2011540217A JP2011540217A JP2012511715A5 JP 2012511715 A5 JP2012511715 A5 JP 2012511715A5 JP 2011540217 A JP2011540217 A JP 2011540217A JP 2011540217 A JP2011540217 A JP 2011540217A JP 2012511715 A5 JP2012511715 A5 JP 2012511715A5
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JP
Japan
Prior art keywords
probe
detection system
microscope
sample
signal
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JP2011540217A
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English (en)
Japanese (ja)
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JP2012511715A (ja
JP5654477B2 (ja
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Priority claimed from GB0822603A external-priority patent/GB0822603D0/en
Priority claimed from GB0906987A external-priority patent/GB0906987D0/en
Application filed filed Critical
Priority claimed from PCT/GB2009/051701 external-priority patent/WO2010067129A1/en
Publication of JP2012511715A publication Critical patent/JP2012511715A/ja
Publication of JP2012511715A5 publication Critical patent/JP2012511715A5/ja
Application granted granted Critical
Publication of JP5654477B2 publication Critical patent/JP5654477B2/ja
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JP2011540217A 2008-12-11 2009-12-11 動的なプローブ検出システム Active JP5654477B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB0822603.7 2008-12-11
GB0822603A GB0822603D0 (en) 2008-12-11 2008-12-11 Dynamic probe detection system
GB0906987.3 2009-04-23
GB0906987A GB0906987D0 (en) 2009-04-23 2009-04-23 Dynamic probe detection system
PCT/GB2009/051701 WO2010067129A1 (en) 2008-12-11 2009-12-11 Dynamic probe detection system

Publications (3)

Publication Number Publication Date
JP2012511715A JP2012511715A (ja) 2012-05-24
JP2012511715A5 true JP2012511715A5 (enExample) 2013-01-17
JP5654477B2 JP5654477B2 (ja) 2015-01-14

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Family Applications (1)

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JP2011540217A Active JP5654477B2 (ja) 2008-12-11 2009-12-11 動的なプローブ検出システム

Country Status (10)

Country Link
US (1) US8479310B2 (enExample)
EP (1) EP2374011B1 (enExample)
JP (1) JP5654477B2 (enExample)
KR (1) KR101569960B1 (enExample)
CN (1) CN102272610B (enExample)
CA (1) CA2746147A1 (enExample)
IL (1) IL213461A0 (enExample)
RU (1) RU2518859C2 (enExample)
SG (1) SG171994A1 (enExample)
WO (1) WO2010067129A1 (enExample)

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CN111044803A (zh) * 2019-12-12 2020-04-21 佛山市卓膜科技有限公司 一种压电材料的压电系数测量方法
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