RU2518859C2 - Система обнаружения для динамического зонда - Google Patents
Система обнаружения для динамического зонда Download PDFInfo
- Publication number
- RU2518859C2 RU2518859C2 RU2011128378/28A RU2011128378A RU2518859C2 RU 2518859 C2 RU2518859 C2 RU 2518859C2 RU 2011128378/28 A RU2011128378/28 A RU 2011128378/28A RU 2011128378 A RU2011128378 A RU 2011128378A RU 2518859 C2 RU2518859 C2 RU 2518859C2
- Authority
- RU
- Russia
- Prior art keywords
- probe
- detection system
- sample
- height
- signal
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 381
- 238000001514 detection method Methods 0.000 title claims abstract description 60
- 230000010355 oscillation Effects 0.000 claims abstract description 61
- 238000005259 measurement Methods 0.000 claims abstract description 36
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- 230000003993 interaction Effects 0.000 claims description 26
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- 230000000694 effects Effects 0.000 abstract description 6
- 230000008713 feedback mechanism Effects 0.000 abstract 1
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- 230000000875 corresponding effect Effects 0.000 description 5
- 238000013480 data collection Methods 0.000 description 5
- 238000012876 topography Methods 0.000 description 5
- 238000012937 correction Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000004630 atomic force microscopy Methods 0.000 description 3
- 238000001914 filtration Methods 0.000 description 3
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- 239000000284 extract Substances 0.000 description 2
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- 238000000386 microscopy Methods 0.000 description 2
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- 239000004065 semiconductor Substances 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 239000000654 additive Substances 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q20/00—Monitoring the movement or position of the probe
- G01Q20/02—Monitoring the movement or position of the probe by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/06—Circuits or algorithms therefor
- G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/32—AC mode
- G01Q60/34—Tapping mode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0822603.7 | 2008-12-11 | ||
| GB0822603A GB0822603D0 (en) | 2008-12-11 | 2008-12-11 | Dynamic probe detection system |
| GB0906987.3 | 2009-04-23 | ||
| GB0906987A GB0906987D0 (en) | 2009-04-23 | 2009-04-23 | Dynamic probe detection system |
| PCT/GB2009/051701 WO2010067129A1 (en) | 2008-12-11 | 2009-12-11 | Dynamic probe detection system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| RU2011128378A RU2011128378A (ru) | 2013-01-20 |
| RU2518859C2 true RU2518859C2 (ru) | 2014-06-10 |
Family
ID=41611181
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2011128378/28A RU2518859C2 (ru) | 2008-12-11 | 2009-12-11 | Система обнаружения для динамического зонда |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US8479310B2 (enExample) |
| EP (1) | EP2374011B1 (enExample) |
| JP (1) | JP5654477B2 (enExample) |
| KR (1) | KR101569960B1 (enExample) |
| CN (1) | CN102272610B (enExample) |
| CA (1) | CA2746147A1 (enExample) |
| IL (1) | IL213461A0 (enExample) |
| RU (1) | RU2518859C2 (enExample) |
| SG (1) | SG171994A1 (enExample) |
| WO (1) | WO2010067129A1 (enExample) |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101569960B1 (ko) * | 2008-12-11 | 2015-11-27 | 인피니트시마 리미티드 | 다이나믹 탐침 검출 시스템 |
| US20120047610A1 (en) * | 2010-04-09 | 2012-02-23 | Boise State University | Cantilever-based optical interface force microscope |
| CA2825038A1 (en) * | 2011-01-31 | 2012-08-09 | Infinitesima Limited | Adaptive mode scanning probe microscope |
| WO2013116553A1 (en) * | 2012-01-31 | 2013-08-08 | University Of Utah Research Foundation | Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy |
| GB201218350D0 (en) | 2012-10-12 | 2012-11-28 | Infinitesima Ltd | Multiple probe actuation |
| GB201215546D0 (en) | 2012-08-31 | 2012-10-17 | Infinitesima Ltd | Multiple probe detection and actuation |
| US8646110B1 (en) * | 2012-11-27 | 2014-02-04 | Xiaoji Xu | Method to obtain absorption spectra from near-field infrared scattering using homodyne detection |
| US10254306B2 (en) | 2012-11-29 | 2019-04-09 | Infinitesima Limited | Probe calibration or measurement routine |
| GB201313064D0 (en) * | 2013-07-22 | 2013-09-04 | Infinitesima Ltd | Probe Microscope |
| US9885691B1 (en) | 2013-10-08 | 2018-02-06 | Nanometronix LLC | Nanoindenter ultrasonic probe tip and force control |
| JP6269153B2 (ja) * | 2014-02-24 | 2018-01-31 | 株式会社リコー | 電位検出装置、及び画像形成装置 |
| EP2913681A1 (en) | 2014-02-28 | 2015-09-02 | Infinitesima Limited | Probe system with multiple actuation locations |
| EP2913682A1 (en) | 2014-02-28 | 2015-09-02 | Infinitesima Limited | Probe actuation system with feedback controller |
| BR102015010352B1 (pt) * | 2015-05-07 | 2021-05-04 | Instituto Nacional De Metrologia, Qualidade E Tecnologia - Inmetro | dispositivo metálico para miscroscopia e espectroscopia óptica de campo próximo e método de fabricação do mesmo |
| JP6769593B2 (ja) | 2015-06-12 | 2020-10-14 | インフィニテシマ リミテッド | 走査型プローブシステム |
| WO2017006436A1 (ja) * | 2015-07-07 | 2017-01-12 | オリンパス株式会社 | 原子間力顕微鏡およびその制御方法 |
| CN105241908A (zh) * | 2015-08-28 | 2016-01-13 | 广州市本原纳米仪器有限公司 | 一种改进的扫描探针显微镜扫描方法 |
| US9625331B2 (en) | 2015-09-10 | 2017-04-18 | International Business Machines Corporation | Surface force apparatus based on a spherical lens |
| CN105841658A (zh) * | 2016-05-12 | 2016-08-10 | 四川大学 | 一种探针式轮廓仪形貌测量动态误差的控制方法 |
| JP6936964B2 (ja) * | 2016-08-26 | 2021-09-22 | 大日本印刷株式会社 | 走査型プローブ顕微鏡 |
| US10373799B2 (en) * | 2016-08-31 | 2019-08-06 | Fei Company | Probe landing detection |
| GB201705613D0 (en) | 2017-04-07 | 2017-05-24 | Infinitesima Ltd | Scanning probe system |
| EP3727694B1 (en) * | 2017-12-19 | 2023-07-19 | Siemens Healthcare Diagnostics, Inc. | Probe apparatus, assemblies, and methods for aspirating and dispensing liquids |
| CN109975727B (zh) * | 2019-03-04 | 2020-03-27 | 中国科学技术大学 | 纳米级磁共振扫描成像设备以及方法 |
| EP3722817B1 (en) * | 2019-04-12 | 2022-05-11 | attocube systems AG | Active bimodal afm operation for measurements of optical interaction |
| US12091313B2 (en) | 2019-08-26 | 2024-09-17 | The Research Foundation For The State University Of New York | Electrodynamically levitated actuator |
| JP7340761B2 (ja) * | 2019-10-28 | 2023-09-08 | パナソニックIpマネジメント株式会社 | 測定用プローブ |
| CN110763873B (zh) * | 2019-11-18 | 2021-04-13 | 中国科学院沈阳自动化研究所 | 基于原子力显微镜技术的峰值力轻敲与扭转共振复合方法 |
| CN111044803A (zh) * | 2019-12-12 | 2020-04-21 | 佛山市卓膜科技有限公司 | 一种压电材料的压电系数测量方法 |
| CN113125808A (zh) * | 2020-01-10 | 2021-07-16 | 精浚科技股份有限公司 | 聚焦式原子力显微镜 |
| US11519935B2 (en) | 2020-08-18 | 2022-12-06 | Oxford Instruments Asylum Research, Inc. | Atomic force microscope |
| CN112964198A (zh) * | 2021-04-12 | 2021-06-15 | 天津大学 | 基于自动聚焦原理的曲面样品母线轮廓测量系统及方法 |
| CN115616008B (zh) * | 2021-07-13 | 2023-12-15 | 同方威视技术股份有限公司 | 臂架、移动式辐射探测设备、验收系统和安检方法 |
| US11835546B1 (en) | 2021-08-04 | 2023-12-05 | Nanometronix LLC | Characterization of nanoindented and scratch induced accoustic events |
| US11346857B1 (en) | 2021-08-04 | 2022-05-31 | Nanometronix LLC | Characterization of nanoindentation induced acoustic events |
| US20240426869A1 (en) | 2021-10-07 | 2024-12-26 | Infinitesima Limited | Method and apparatus for scanning a sample with a probe |
| EP4339624A1 (en) | 2022-09-15 | 2024-03-20 | Infinitesima Limited | Image data segmentation |
| GB202304777D0 (en) | 2023-03-31 | 2023-05-17 | Infinitesima Ltd | Machine-learning based methods of probe microscopy |
| CN119534951A (zh) * | 2023-08-29 | 2025-02-28 | 麦峤里(上海)半导体科技有限责任公司 | 探针压力的调整方法、探针式测量仪及探针压力调整装置 |
| EP4553505A1 (en) | 2023-11-09 | 2025-05-14 | Infinitesima Limited | Scanning probe microscope |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002350319A (ja) * | 2001-03-21 | 2002-12-04 | Seiko Instruments Inc | 走査型プローブ顕微鏡 |
| EP1804050A2 (en) * | 2001-06-19 | 2007-07-04 | Japan Science and Technology Agency | Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
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| JP5122775B2 (ja) | 2006-08-23 | 2013-01-16 | 株式会社ミツトヨ | 測定装置 |
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| KR101569960B1 (ko) * | 2008-12-11 | 2015-11-27 | 인피니트시마 리미티드 | 다이나믹 탐침 검출 시스템 |
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-
2009
- 2009-12-11 KR KR1020117016009A patent/KR101569960B1/ko active Active
- 2009-12-11 JP JP2011540217A patent/JP5654477B2/ja active Active
- 2009-12-11 WO PCT/GB2009/051701 patent/WO2010067129A1/en not_active Ceased
- 2009-12-11 RU RU2011128378/28A patent/RU2518859C2/ru not_active IP Right Cessation
- 2009-12-11 US US13/133,339 patent/US8479310B2/en active Active
- 2009-12-11 SG SG2011041282A patent/SG171994A1/en unknown
- 2009-12-11 CN CN200980154318.2A patent/CN102272610B/zh active Active
- 2009-12-11 CA CA2746147A patent/CA2746147A1/en not_active Abandoned
- 2009-12-11 EP EP09796422.5A patent/EP2374011B1/en active Active
-
2011
- 2011-06-09 IL IL213461A patent/IL213461A0/en unknown
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002350319A (ja) * | 2001-03-21 | 2002-12-04 | Seiko Instruments Inc | 走査型プローブ顕微鏡 |
| EP1804050A2 (en) * | 2001-06-19 | 2007-07-04 | Japan Science and Technology Agency | Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
Also Published As
| Publication number | Publication date |
|---|---|
| US20110247106A1 (en) | 2011-10-06 |
| KR20110104018A (ko) | 2011-09-21 |
| JP2012511715A (ja) | 2012-05-24 |
| WO2010067129A1 (en) | 2010-06-17 |
| EP2374011B1 (en) | 2018-11-21 |
| RU2011128378A (ru) | 2013-01-20 |
| JP5654477B2 (ja) | 2015-01-14 |
| IL213461A0 (en) | 2011-07-31 |
| SG171994A1 (en) | 2011-07-28 |
| CA2746147A1 (en) | 2010-06-17 |
| CN102272610A (zh) | 2011-12-07 |
| EP2374011A1 (en) | 2011-10-12 |
| KR101569960B1 (ko) | 2015-11-27 |
| CN102272610B (zh) | 2015-02-25 |
| US8479310B2 (en) | 2013-07-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | The patent is invalid due to non-payment of fees |
Effective date: 20151212 |