IL213461A0 - Dynamic probe detection system - Google Patents

Dynamic probe detection system

Info

Publication number
IL213461A0
IL213461A0 IL213461A IL21346111A IL213461A0 IL 213461 A0 IL213461 A0 IL 213461A0 IL 213461 A IL213461 A IL 213461A IL 21346111 A IL21346111 A IL 21346111A IL 213461 A0 IL213461 A0 IL 213461A0
Authority
IL
Israel
Prior art keywords
detection system
probe detection
dynamic probe
dynamic
probe
Prior art date
Application number
IL213461A
Other languages
English (en)
Original Assignee
Infinitesima Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0822603A external-priority patent/GB0822603D0/en
Priority claimed from GB0906987A external-priority patent/GB0906987D0/en
Application filed by Infinitesima Ltd filed Critical Infinitesima Ltd
Publication of IL213461A0 publication Critical patent/IL213461A0/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G01Q60/34—Tapping mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IL213461A 2008-12-11 2011-06-09 Dynamic probe detection system IL213461A0 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0822603A GB0822603D0 (en) 2008-12-11 2008-12-11 Dynamic probe detection system
GB0906987A GB0906987D0 (en) 2009-04-23 2009-04-23 Dynamic probe detection system
PCT/GB2009/051701 WO2010067129A1 (en) 2008-12-11 2009-12-11 Dynamic probe detection system

Publications (1)

Publication Number Publication Date
IL213461A0 true IL213461A0 (en) 2011-07-31

Family

ID=41611181

Family Applications (1)

Application Number Title Priority Date Filing Date
IL213461A IL213461A0 (en) 2008-12-11 2011-06-09 Dynamic probe detection system

Country Status (10)

Country Link
US (1) US8479310B2 (enExample)
EP (1) EP2374011B1 (enExample)
JP (1) JP5654477B2 (enExample)
KR (1) KR101569960B1 (enExample)
CN (1) CN102272610B (enExample)
CA (1) CA2746147A1 (enExample)
IL (1) IL213461A0 (enExample)
RU (1) RU2518859C2 (enExample)
SG (1) SG171994A1 (enExample)
WO (1) WO2010067129A1 (enExample)

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CN109975727B (zh) * 2019-03-04 2020-03-27 中国科学技术大学 纳米级磁共振扫描成像设备以及方法
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JP7340761B2 (ja) * 2019-10-28 2023-09-08 パナソニックＩｐマネジメント株式会社 測定用プローブ
CN110763873B (zh) * 2019-11-18 2021-04-13 中国科学院沈阳自动化研究所 基于原子力显微镜技术的峰值力轻敲与扭转共振复合方法
CN111044803A (zh) * 2019-12-12 2020-04-21 佛山市卓膜科技有限公司 一种压电材料的压电系数测量方法
CN113125808A (zh) * 2020-01-10 2021-07-16 精浚科技股份有限公司 聚焦式原子力显微镜
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CN112964198A (zh) * 2021-04-12 2021-06-15 天津大学 基于自动聚焦原理的曲面样品母线轮廓测量系统及方法
CN115616008B (zh) * 2021-07-13 2023-12-15 同方威视技术股份有限公司 臂架、移动式辐射探测设备、验收系统和安检方法
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Also Published As

Publication number Publication date
US20110247106A1 (en) 2011-10-06
KR20110104018A (ko) 2011-09-21
JP2012511715A (ja) 2012-05-24
WO2010067129A1 (en) 2010-06-17
EP2374011B1 (en) 2018-11-21
RU2518859C2 (ru) 2014-06-10
RU2011128378A (ru) 2013-01-20
JP5654477B2 (ja) 2015-01-14
SG171994A1 (en) 2011-07-28
CA2746147A1 (en) 2010-06-17
CN102272610A (zh) 2011-12-07
EP2374011A1 (en) 2011-10-12
KR101569960B1 (ko) 2015-11-27
CN102272610B (zh) 2015-02-25
US8479310B2 (en) 2013-07-02

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