KR101569960B1 - 다이나믹 탐침 검출 시스템 - Google Patents

다이나믹 탐침 검출 시스템 Download PDF

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Publication number
KR101569960B1
KR101569960B1 KR1020117016009A KR20117016009A KR101569960B1 KR 101569960 B1 KR101569960 B1 KR 101569960B1 KR 1020117016009 A KR1020117016009 A KR 1020117016009A KR 20117016009 A KR20117016009 A KR 20117016009A KR 101569960 B1 KR101569960 B1 KR 101569960B1
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South Korea
Prior art keywords
probe
height
sample
detection system
signal
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KR1020117016009A
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Korean (ko)
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KR20110104018A (ko
Inventor
앤드류 험프리스
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인피니트시마 리미티드
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Priority claimed from GB0822603A external-priority patent/GB0822603D0/en
Priority claimed from GB0906987A external-priority patent/GB0906987D0/en
Application filed by 인피니트시마 리미티드 filed Critical 인피니트시마 리미티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G01Q60/34—Tapping mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020117016009A 2008-12-11 2009-12-11 다이나믹 탐침 검출 시스템 Active KR101569960B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB0822603.7 2008-12-11
GB0822603A GB0822603D0 (en) 2008-12-11 2008-12-11 Dynamic probe detection system
GB0906987.3 2009-04-23
GB0906987A GB0906987D0 (en) 2009-04-23 2009-04-23 Dynamic probe detection system

Publications (2)

Publication Number Publication Date
KR20110104018A KR20110104018A (ko) 2011-09-21
KR101569960B1 true KR101569960B1 (ko) 2015-11-27

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KR1020117016009A Active KR101569960B1 (ko) 2008-12-11 2009-12-11 다이나믹 탐침 검출 시스템

Country Status (10)

Country Link
US (1) US8479310B2 (enExample)
EP (1) EP2374011B1 (enExample)
JP (1) JP5654477B2 (enExample)
KR (1) KR101569960B1 (enExample)
CN (1) CN102272610B (enExample)
CA (1) CA2746147A1 (enExample)
IL (1) IL213461A0 (enExample)
RU (1) RU2518859C2 (enExample)
SG (1) SG171994A1 (enExample)
WO (1) WO2010067129A1 (enExample)

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CN105241908A (zh) * 2015-08-28 2016-01-13 广州市本原纳米仪器有限公司 一种改进的扫描探针显微镜扫描方法
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CN111044803A (zh) * 2019-12-12 2020-04-21 佛山市卓膜科技有限公司 一种压电材料的压电系数测量方法
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CN115616008B (zh) * 2021-07-13 2023-12-15 同方威视技术股份有限公司 臂架、移动式辐射探测设备、验收系统和安检方法
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Also Published As

Publication number Publication date
US20110247106A1 (en) 2011-10-06
KR20110104018A (ko) 2011-09-21
JP2012511715A (ja) 2012-05-24
WO2010067129A1 (en) 2010-06-17
EP2374011B1 (en) 2018-11-21
RU2518859C2 (ru) 2014-06-10
RU2011128378A (ru) 2013-01-20
JP5654477B2 (ja) 2015-01-14
IL213461A0 (en) 2011-07-31
SG171994A1 (en) 2011-07-28
CA2746147A1 (en) 2010-06-17
CN102272610A (zh) 2011-12-07
EP2374011A1 (en) 2011-10-12
CN102272610B (zh) 2015-02-25
US8479310B2 (en) 2013-07-02

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