JP2012078333A5 - - Google Patents

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Publication number
JP2012078333A5
JP2012078333A5 JP2010235051A JP2010235051A JP2012078333A5 JP 2012078333 A5 JP2012078333 A5 JP 2012078333A5 JP 2010235051 A JP2010235051 A JP 2010235051A JP 2010235051 A JP2010235051 A JP 2010235051A JP 2012078333 A5 JP2012078333 A5 JP 2012078333A5
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JP
Japan
Prior art keywords
pseudo
test apparatus
sunlight irradiation
light source
optical axis
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Application number
JP2010235051A
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English (en)
Japanese (ja)
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JP2012078333A (ja
JP5725437B2 (ja
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Priority to JP2010235051A priority Critical patent/JP5725437B2/ja
Priority claimed from JP2010235051A external-priority patent/JP5725437B2/ja
Publication of JP2012078333A publication Critical patent/JP2012078333A/ja
Publication of JP2012078333A5 publication Critical patent/JP2012078333A5/ja
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Publication of JP5725437B2 publication Critical patent/JP5725437B2/ja
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JP2010235051A 2010-09-07 2010-10-20 環境試験装置 Active JP5725437B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010235051A JP5725437B2 (ja) 2010-09-07 2010-10-20 環境試験装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010199713 2010-09-07
JP2010199713 2010-09-07
JP2010235051A JP5725437B2 (ja) 2010-09-07 2010-10-20 環境試験装置

Publications (3)

Publication Number Publication Date
JP2012078333A JP2012078333A (ja) 2012-04-19
JP2012078333A5 true JP2012078333A5 (ru) 2013-06-27
JP5725437B2 JP5725437B2 (ja) 2015-05-27

Family

ID=46238724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010235051A Active JP5725437B2 (ja) 2010-09-07 2010-10-20 環境試験装置

Country Status (1)

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JP (1) JP5725437B2 (ru)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6051294B2 (ja) * 2012-04-27 2016-12-27 イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニーＥ．Ｉ．Ｄｕ Ｐｏｎｔ Ｄｅ Ｎｅｍｏｕｒｓ Ａｎｄ Ｃｏｍｐａｎｙ 光保護材料を決定するためのデバイス
KR200473947Y1 (ko) 2012-09-21 2014-08-12 주식회사 티엔이테크 태양전지 특성측정용 등기구 모듈
KR101871200B1 (ko) * 2016-02-22 2018-06-27 주식회사 맥사이언스 플라즈마 램프를 이용한 솔라 시뮬레이터 장치
CN108036250A (zh) * 2017-12-26 2018-05-15 天津航天瑞莱科技有限公司 一种列车的光照环境模拟装置
KR102021704B1 (ko) * 2018-10-19 2019-09-11 한국표준과학연구원 고층기상환경 모사 기술을 이용한 라디오존데 온습도 교정장치 및 방법
CN112986116A (zh) * 2021-02-02 2021-06-18 江西省佰盈体育科技有限公司 一种耐黄变试验机
CN113315468A (zh) * 2021-07-09 2021-08-27 周德善 一种光伏组件的耐受性能测试系统及测试工艺
CN113640203B (zh) * 2021-09-17 2023-11-24 中北大学 一种多参数复杂极端环境模拟装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5824840A (ja) * 1981-08-07 1983-02-14 Sumitomo Metal Ind Ltd 複合腐食試験装置
JPS6173056A (ja) * 1984-09-18 1986-04-15 Toyota Central Res & Dev Lab Inc 耐候性試験機
JPS62297744A (ja) * 1986-06-17 1987-12-24 Dainippon Plastics Co Ltd 耐候性試験機
JPH07117475B2 (ja) * 1990-07-25 1995-12-18 松下電器産業株式会社 光源ユニット用照明特性評価装置
JP2957917B2 (ja) * 1995-01-20 1999-10-06 スガ試験機株式会社 光加速分光劣化試験装置
CN1247986C (zh) * 2001-06-29 2006-03-29 株式会社长野科学机械制作所 光稳定性试验装置
JP2004273870A (ja) * 2003-03-11 2004-09-30 Canon Inc 積層型光電変換素子の測定方法および装置
JP3098792U (ja) * 2003-06-25 2004-03-11 山下電装株式会社 擬似太陽光照射装置
JP2008032549A (ja) * 2006-07-28 2008-02-14 Eko Instruments Trading Co Ltd 光学調整装置、光源装置、太陽電池の特性計測システム
JP5035055B2 (ja) * 2008-03-19 2012-09-26 ウシオ電機株式会社 光源装置

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