NL2003342A1 - Deeltjesstraaltoestel met ringvormige belichtingsapertuur. - Google Patents
Deeltjesstraaltoestel met ringvormige belichtingsapertuur.Info
- Publication number
- NL2003342A1 NL2003342A1 NL2003342A NL2003342A NL2003342A1 NL 2003342 A1 NL2003342 A1 NL 2003342A1 NL 2003342 A NL2003342 A NL 2003342A NL 2003342 A NL2003342 A NL 2003342A NL 2003342 A1 NL2003342 A1 NL 2003342A1
- Authority
- NL
- Netherlands
- Prior art keywords
- ring
- particle beam
- beam device
- shaped aperture
- aperture
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/2614—Holography or phase contrast, phase related imaging in general, e.g. phase plates
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102008037698 | 2008-08-14 | ||
DE102008037698A DE102008037698B4 (de) | 2008-08-14 | 2008-08-14 | Elektronenmikroskop mit ringförmiger Beleuchtungsapertur |
Publications (2)
Publication Number | Publication Date |
---|---|
NL2003342A1 true NL2003342A1 (nl) | 2010-02-16 |
NL2003342C2 NL2003342C2 (nl) | 2011-11-01 |
Family
ID=41347756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL2003342A NL2003342C2 (nl) | 2008-08-14 | 2009-08-11 | Deeltjesstraaltoestel met ringvormige belichtingsapertuur. |
Country Status (3)
Country | Link |
---|---|
US (1) | US8299442B2 (nl) |
DE (1) | DE102008037698B4 (nl) |
NL (1) | NL2003342C2 (nl) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007007923A1 (de) * | 2007-02-14 | 2008-08-21 | Carl Zeiss Nts Gmbh | Phasenschiebendes Element und Teilchenstrahlgerät mit phasenschiebenden Element |
EP2400522A1 (en) * | 2010-06-24 | 2011-12-28 | Fei Company | Blocking member for use in the diffraction plane of a TEM |
EP2485239A1 (en) | 2011-02-07 | 2012-08-08 | FEI Company | Method for centering an optical element in a TEM comprising a contrast enhancing element |
JP5669636B2 (ja) * | 2011-03-15 | 2015-02-12 | キヤノン株式会社 | 荷電粒子線レンズおよびそれを用いた露光装置 |
JP5745957B2 (ja) | 2011-07-01 | 2015-07-08 | 株式会社日立ハイテクノロジーズ | 位相板、および電子顕微鏡 |
JP5970213B2 (ja) * | 2012-03-19 | 2016-08-17 | 株式会社ニューフレアテクノロジー | マルチ荷電粒子ビーム描画装置及びマルチ荷電粒子ビーム描画方法 |
EP2887381B1 (en) * | 2013-12-18 | 2016-09-21 | Fei Company | Method of investigating the wavefront of a charged-particle beam |
EP3175473B1 (en) * | 2014-07-30 | 2020-04-15 | Forschungszentrum Jülich GmbH | Tunable ampere phase plate for charged particle imaging systems |
FR3073956B1 (fr) * | 2017-11-22 | 2019-12-27 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Methode d'acquisition d'hologrammes par holographie electronique hors axe optique en mode precession |
JP7193694B2 (ja) * | 2018-07-26 | 2022-12-21 | 国立研究開発法人理化学研究所 | 電子顕微鏡およびそれを用いた試料観察方法 |
JP6995103B2 (ja) * | 2019-11-15 | 2022-01-14 | 日本電子株式会社 | 透過電子顕微鏡および透過電子顕微鏡の制御方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5814815A (en) | 1995-12-27 | 1998-09-29 | Hitachi, Ltd. | Phase-contrast electron microscope and phase plate therefor |
DE10200645A1 (de) * | 2002-01-10 | 2003-07-24 | Leo Elektronenmikroskopie Gmbh | Elektronenmikroskop mit ringförmiger Beleuchtungsapertur |
WO2006017252A1 (en) * | 2004-07-12 | 2006-02-16 | The Regents Of The University Of California | Electron microscope phase enhancement |
DE102006011615A1 (de) * | 2006-03-14 | 2007-09-20 | Carl Zeiss Nts Gmbh | Phasenkontrast-Elektronenmikroskop |
DE102007007923A1 (de) | 2007-02-14 | 2008-08-21 | Carl Zeiss Nts Gmbh | Phasenschiebendes Element und Teilchenstrahlgerät mit phasenschiebenden Element |
-
2008
- 2008-08-14 DE DE102008037698A patent/DE102008037698B4/de not_active Expired - Fee Related
-
2009
- 2009-08-11 NL NL2003342A patent/NL2003342C2/nl not_active IP Right Cessation
- 2009-08-13 US US12/461,481 patent/US8299442B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US8299442B2 (en) | 2012-10-30 |
DE102008037698B4 (de) | 2012-08-16 |
DE102008037698A1 (de) | 2010-02-18 |
US20100038537A1 (en) | 2010-02-18 |
NL2003342C2 (nl) | 2011-11-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AD1A | A request for search or an international type search has been filed | ||
MM | Lapsed because of non-payment of the annual fee |
Effective date: 20190901 |