JP2011525238A5 - - Google Patents

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Publication number
JP2011525238A5
JP2011525238A5 JP2011513102A JP2011513102A JP2011525238A5 JP 2011525238 A5 JP2011525238 A5 JP 2011525238A5 JP 2011513102 A JP2011513102 A JP 2011513102A JP 2011513102 A JP2011513102 A JP 2011513102A JP 2011525238 A5 JP2011525238 A5 JP 2011525238A5
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JP
Japan
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trench
radiation detector
barrier material
pixel
array
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JP2011513102A
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English (en)
Japanese (ja)
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JP5580300B2 (ja
JP2011525238A (ja
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Priority claimed from PCT/IB2009/052442 external-priority patent/WO2010004453A2/en
Publication of JP2011525238A publication Critical patent/JP2011525238A/ja
Publication of JP2011525238A5 publication Critical patent/JP2011525238A5/ja
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Publication of JP5580300B2 publication Critical patent/JP5580300B2/ja
Expired - Fee Related legal-status Critical Current
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JP2011513102A 2008-06-16 2009-06-09 放射線検出器、放射線検出器を製造する方法、ｘ線検出器及び撮像システム Expired - Fee Related JP5580300B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP08158304.9 2008-06-16
EP08158304 2008-06-16
PCT/IB2009/052442 WO2010004453A2 (en) 2008-06-16 2009-06-09 Radiation detector and a method of manufacturing a radiation detector

Publications (3)

Publication Number Publication Date
JP2011525238A JP2011525238A (ja) 2011-09-15
JP2011525238A5 true JP2011525238A5 (https=) 2012-07-26
JP5580300B2 JP5580300B2 (ja) 2014-08-27

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Family Applications (1)

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JP2011513102A Expired - Fee Related JP5580300B2 (ja) 2008-06-16 2009-06-09 放射線検出器、放射線検出器を製造する方法、ｘ線検出器及び撮像システム

Country Status (6)

Country Link
US (1) US8564084B2 (https=)
EP (1) EP2291680B1 (https=)
JP (1) JP5580300B2 (https=)
CN (2) CN102066976A (https=)
RU (1) RU2493573C2 (https=)
WO (1) WO2010004453A2 (https=)

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US11169286B2 (en) 2018-06-18 2021-11-09 Redlen Technologies, Inc. Methods of calibrating semiconductor radiation detectors using K-edge filters
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