JP2011501446A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2011501446A5 JP2011501446A5 JP2010530296A JP2010530296A JP2011501446A5 JP 2011501446 A5 JP2011501446 A5 JP 2011501446A5 JP 2010530296 A JP2010530296 A JP 2010530296A JP 2010530296 A JP2010530296 A JP 2010530296A JP 2011501446 A5 JP2011501446 A5 JP 2011501446A5
- Authority
- JP
- Japan
- Prior art keywords
- field
- optical system
- image
- imaging optical
- imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 claims 55
- 230000003287 optical effect Effects 0.000 claims 46
- 210000001747 pupil Anatomy 0.000 claims 19
- 238000000034 method Methods 0.000 claims 11
- 238000005286 illumination Methods 0.000 claims 3
- 238000012876 topography Methods 0.000 claims 3
- 238000001393 microlithography Methods 0.000 claims 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US98285007P | 2007-10-26 | 2007-10-26 | |
| US60/982,850 | 2007-10-26 | ||
| DE102007051669.1 | 2007-10-26 | ||
| DE102007051669A DE102007051669A1 (de) | 2007-10-26 | 2007-10-26 | Abbildende Optik, Projektionsbelichtungsanlage für die Mikrolithographie mit einer derartigen abbildenden Optik sowie Verfahren zur Herstellung eines mikrostrukturierten Bauteils mit einer derartigen Projektionsbelichtungsanlage |
| PCT/EP2008/008336 WO2009052925A1 (en) | 2007-10-26 | 2008-10-02 | Imaging optical system, projection exposure installation for micro-lithography comprising an imaging optical system of this type, and method for producing a microstructured component with a projection exposure installation of this type |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011501446A JP2011501446A (ja) | 2011-01-06 |
| JP2011501446A5 true JP2011501446A5 (OSRAM) | 2011-10-27 |
| JP5431345B2 JP5431345B2 (ja) | 2014-03-05 |
Family
ID=40490317
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010530296A Expired - Fee Related JP5431345B2 (ja) | 2007-10-26 | 2008-10-02 | 結像光学系、この種の結像光学系を含むマイクロリソグラフィのための投影露光装置、及びこの種の投影露光装置を用いて微細構造構成要素を生成する方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8558991B2 (OSRAM) |
| JP (1) | JP5431345B2 (OSRAM) |
| KR (1) | KR101542268B1 (OSRAM) |
| CN (2) | CN102354045B (OSRAM) |
| DE (1) | DE102007051669A1 (OSRAM) |
| TW (1) | TWI443474B (OSRAM) |
| WO (1) | WO2009052925A1 (OSRAM) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090303454A1 (en) | 2008-06-10 | 2009-12-10 | Nikon Corporation | Exposure apparatus with a scanning illumination beam |
| EP2598931B1 (en) | 2010-07-30 | 2020-12-02 | Carl Zeiss SMT GmbH | Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type |
| DE102010043498A1 (de) | 2010-11-05 | 2012-05-10 | Carl Zeiss Smt Gmbh | Projektionsobjektiv einer für EUV ausgelegten mikrolithographischen Projektionsbelichtungsanlage, sowie Verfahren zum optischen Justieren eines Projektionsobjektives |
| DE102011076752A1 (de) * | 2011-05-31 | 2012-12-06 | Carl Zeiss Smt Gmbh | Abbildende Optik |
| EP2579100A3 (en) | 2011-10-03 | 2017-12-06 | ASML Holding N.V. | Inspection apparatus, lithographic apparatus, and device manufacturing method |
| DE102012206153A1 (de) | 2012-04-16 | 2013-10-17 | Carl Zeiss Smt Gmbh | Optisches System einer mikrolithographischen Projektionsbelichtungsanlage |
| US9448343B2 (en) * | 2013-03-15 | 2016-09-20 | Kla-Tencor Corporation | Segmented mirror apparatus for imaging and method of using the same |
| JP6976851B2 (ja) | 2014-09-08 | 2021-12-08 | イー・ギア・エルエルシー | グリッドに結合された実時間適応分散間欠電力 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3787035T2 (de) * | 1986-03-12 | 1994-03-10 | Matsushita Electric Ind Co Ltd | Optisches Projektionssystem für Präzisionskopien. |
| JP2890882B2 (ja) | 1990-04-06 | 1999-05-17 | キヤノン株式会社 | 位置付け方法、半導体デバイスの製造方法及びそれを用いた投影露光装置 |
| US6631036B2 (en) | 1996-09-26 | 2003-10-07 | Carl-Zeiss-Stiftung | Catadioptric objective |
| TW448487B (en) * | 1997-11-22 | 2001-08-01 | Nippon Kogaku Kk | Exposure apparatus, exposure method and manufacturing method of device |
| WO1999049366A1 (en) * | 1998-03-20 | 1999-09-30 | Nikon Corporation | Photomask and projection exposure system |
| JPH1184249A (ja) * | 1998-07-10 | 1999-03-26 | Nikon Corp | 露光装置、及び該装置を用いた露光方法 |
| DE19846928A1 (de) * | 1998-10-12 | 2000-04-13 | Zeiss Carl Fa | Abbildungssystem mit einem Zylinderlinsenarray |
| JP2000284494A (ja) * | 1999-03-31 | 2000-10-13 | Seiko Epson Corp | 露光装置 |
| US6600608B1 (en) | 1999-11-05 | 2003-07-29 | Carl-Zeiss-Stiftung | Catadioptric objective comprising two intermediate images |
| US6611316B2 (en) * | 2001-02-27 | 2003-08-26 | Asml Holding N.V. | Method and system for dual reticle image exposure |
| DE50208750D1 (de) * | 2001-08-01 | 2007-01-04 | Zeiss Carl Smt Ag | Reflektives Projektionsobjektiv für EUV-Photolithographie |
| JP2004107011A (ja) * | 2002-09-18 | 2004-04-08 | Asmo Co Ltd | 給紙装置 |
| JP2004252363A (ja) * | 2003-02-21 | 2004-09-09 | Canon Inc | 反射型投影光学系 |
| JP4314054B2 (ja) | 2003-04-15 | 2009-08-12 | キヤノン株式会社 | 露光装置及びデバイスの製造方法 |
| JP2005166897A (ja) * | 2003-12-02 | 2005-06-23 | Canon Inc | 露光装置 |
| CN102207608B (zh) * | 2004-01-14 | 2013-01-02 | 卡尔蔡司Smt有限责任公司 | 反射折射投影物镜 |
| JP2005345582A (ja) * | 2004-06-01 | 2005-12-15 | Dainippon Screen Mfg Co Ltd | 投影光学系およびパターン描画装置 |
| US20060082905A1 (en) * | 2004-10-14 | 2006-04-20 | Shafer David R | Catadioptric projection objective with an in-line, single-axis configuration |
| DE102005030839A1 (de) * | 2005-07-01 | 2007-01-11 | Carl Zeiss Smt Ag | Projektionsbelichtungsanlage mit einer Mehrzahl von Projektionsobjektiven |
| US7612892B2 (en) | 2005-10-06 | 2009-11-03 | Nikon Corporation | Imaging optical system configured with through the lens optics for producing control information |
| US7782442B2 (en) | 2005-12-06 | 2010-08-24 | Nikon Corporation | Exposure apparatus, exposure method, projection optical system and device producing method |
| KR20080088579A (ko) | 2005-12-28 | 2008-10-02 | 가부시키가이샤 니콘 | 노광 장치 및 노광 방법, 디바이스 제조 방법 |
| JP2007201457A (ja) * | 2005-12-28 | 2007-08-09 | Nikon Corp | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2007206319A (ja) * | 2006-02-01 | 2007-08-16 | Nikon Corp | 反射屈折光学系、露光装置及びマイクロデバイスの製造方法 |
| WO2007094407A1 (ja) * | 2006-02-16 | 2007-08-23 | Nikon Corporation | 露光装置、露光方法及びデバイス製造方法 |
| KR20080102192A (ko) * | 2006-02-16 | 2008-11-24 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
| EP1993121A4 (en) * | 2006-03-03 | 2011-12-07 | Nikon Corp | EXPOSURE DEVICE AND COMPONENT MANUFACTURING METHOD |
| CN101379593A (zh) * | 2006-04-14 | 2009-03-04 | 株式会社尼康 | 曝光装置、元件制造方法以及曝光方法 |
| DE102006022958A1 (de) * | 2006-05-11 | 2007-11-22 | Carl Zeiss Smt Ag | Projektionsbelichtungsanlage, Projektionsbelichtungsverfahren und Verwendung eines Projektionsobjektivs |
| KR100772701B1 (ko) | 2006-09-28 | 2007-11-02 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 |
-
2007
- 2007-10-26 DE DE102007051669A patent/DE102007051669A1/de not_active Ceased
-
2008
- 2008-10-02 WO PCT/EP2008/008336 patent/WO2009052925A1/en not_active Ceased
- 2008-10-02 CN CN201110371663.0A patent/CN102354045B/zh not_active Expired - Fee Related
- 2008-10-02 KR KR1020107009120A patent/KR101542268B1/ko not_active Expired - Fee Related
- 2008-10-02 JP JP2010530296A patent/JP5431345B2/ja not_active Expired - Fee Related
- 2008-10-02 CN CN200880113386XA patent/CN101836151B/zh not_active Expired - Fee Related
- 2008-10-24 TW TW097140946A patent/TWI443474B/zh not_active IP Right Cessation
-
2010
- 2010-04-12 US US12/758,530 patent/US8558991B2/en not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2011501446A5 (OSRAM) | ||
| JP6132499B2 (ja) | 検査装置、リソグラフィ装置、およびデバイス製造方法 | |
| TWI257532B (en) | Device manufacturing method and computer programs | |
| TWI542938B (zh) | 成像光學系統與包含此類型成像光學系統之用於微影的投影曝光裝置 | |
| KR101809343B1 (ko) | 마이크로리소그래픽 장치 | |
| JP2004525527A5 (OSRAM) | ||
| US9360778B2 (en) | System and method for lithography patterning | |
| TW200944968A (en) | Method and lithographic apparatus for measuring and acquiring height data relating to a substrate surface | |
| CN108107685B (zh) | 曝光装置、曝光方法、器件制造方法及评价方法 | |
| JP2014534643A5 (OSRAM) | ||
| JP5431345B2 (ja) | 結像光学系、この種の結像光学系を含むマイクロリソグラフィのための投影露光装置、及びこの種の投影露光装置を用いて微細構造構成要素を生成する方法 | |
| US10345547B2 (en) | Method for producing a lens for a lithography apparatus, and measurement system | |
| JP2011014660A (ja) | 偏光状態の計測装置、露光装置及びデバイス製造方法 | |
| CN101609266A (zh) | 一种光刻机投影物镜波像差的现场测量装置 | |
| US20190302622A1 (en) | Lithography system, simulation apparatus, and pattern forming method | |
| US20090280418A1 (en) | Exposure apparatus, correction method, and device manufacturing method | |
| JP6244462B2 (ja) | リソグラフィ方法およびリソグラフィ装置 | |
| TW200528932A (en) | Lithographic apparatus and device manufacturing method | |
| JP2016503186A (ja) | マイクロリソグラフィ投影露光装置の光学系 | |
| JP5650272B2 (ja) | リソグラフィ方法および装置 | |
| JP2018521319A (ja) | 位置測定システム及びリソグラフィ装置 | |
| CN102193338A (zh) | 用扩展光源的光刻机投影物镜波像差现场测量装置及方法 | |
| WO2012060099A1 (ja) | 光源調整方法、露光方法、デバイス製造方法、照明光学系、及び露光装置 | |
| TWI503634B (zh) | Exposure apparatus, exposure management system, and exposure method | |
| JP3632264B2 (ja) | X線投影露光装置 |