JP2011204812A - 複数温度領域分割制御構造体 - Google Patents
複数温度領域分割制御構造体 Download PDFInfo
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- JP2011204812A JP2011204812A JP2010069083A JP2010069083A JP2011204812A JP 2011204812 A JP2011204812 A JP 2011204812A JP 2010069083 A JP2010069083 A JP 2010069083A JP 2010069083 A JP2010069083 A JP 2010069083A JP 2011204812 A JP2011204812 A JP 2011204812A
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- CYKMNKXPYXUVPR-UHFFFAOYSA-N [C].[Ti] Chemical compound [C].[Ti] CYKMNKXPYXUVPR-UHFFFAOYSA-N 0.000 claims description 3
- UQZIWOQVLUASCR-UHFFFAOYSA-N alumane;titanium Chemical compound [AlH3].[Ti] UQZIWOQVLUASCR-UHFFFAOYSA-N 0.000 claims description 3
- CREMABGTGYGIQB-UHFFFAOYSA-N carbon carbon Chemical compound C.C CREMABGTGYGIQB-UHFFFAOYSA-N 0.000 claims description 3
- 239000011203 carbon fibre reinforced carbon Substances 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims description 3
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- 230000000149 penetrating effect Effects 0.000 description 3
- 238000001020 plasma etching Methods 0.000 description 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 3
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- 229910021397 glassy carbon Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
- H01J37/32165—Plural frequencies
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
- H01J37/32724—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/10—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor
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- Plasma & Fusion (AREA)
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- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
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- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Drying Of Semiconductors (AREA)
- Surface Heating Bodies (AREA)
Abstract
【解決手段】表面温度がそれぞれ異なる温度に制御されるセンターエリア51及びエッジエリア52と、その間に配置され、センターエリア51とエッジエリア52の配列方向に沿った熱伝導率が、配列方向に交差する方向における熱伝導率よりも小さく、水平方向の熱伝導に対して、例えば断熱材として機能し、且つ垂直方向の熱伝導に対して、例えば熱伝導材として機能する傾斜材56を配置する。
【選択図】図6
Description
40 複数温度領域分割制御構造体
41 第1の温度領域
42 第2の温度領域
43、53 第1の媒体流路
44、54 第2の媒体流路
45 構造体本体
51 センターエリア
52 エッジエリア
55サセプタ本体
56、66、76、86 傾斜材(熱伝導異方性材料層)
75 デポジットシールド
85 上部電極板
Claims (9)
- 表面温度がそれぞれ異なる温度に制御される2つ以上の領域と、
前記2つ以上の領域相互間に配置された熱伝導異方性材料層と、を有し、
前記熱伝導異方性材料層は、前記2つ以上の領域の配列方向に沿った熱伝導率が、前記2つ以上の領域の配列方向に交差する方向における熱伝導率よりも小さいことを特徴とする複数温度領域分割制御構造体。 - 前記熱伝導異方性材料層は、前記2つ以上の領域の配列方向に沿った熱伝導と配列方向に交差する方向における熱伝導との相対的な関係において、前記2つ以上の領域の配列方向に沿った熱伝導に対しては断熱層として機能し、前記2つ以上の領域の配列方向に交差する方向における熱伝導に対しては熱伝導層として機能することを特徴とする請求項1記載の複数温度領域分割制御構造体。
- 前記熱伝導異方性材料層における前記2つ以上の領域の配列方向に沿った熱伝導率に対する前記2つ以上の領域の配列方向に交差する方向における熱伝導率の比が7以上であることを特徴とする請求項1又は2記載の複数温度領域分割制御構造体。
- 前記熱伝導異方性材料層は、チタン−カーボン、アルミニウム−カーボンファイバ、チタン−アルミニウム及びガラス状カーボン−カーボンから選択される複合材からなることを特徴とする請求項1乃至3のいずれか1項に記載の複数温領域分割制御構造体。
- 前記2つ以上の領域は、熱伝導等方性材料で形成されていることを特徴とする請求項1乃至4のいずれか1項に記載の複数温度領域分割制御構造体。
- 前記複数温度領域分割制御構造体は、前記2つ以上の領域が所定方向に配列された板状体であり、前記熱伝導異方性材料層は、前記板状体を厚さ方向に貫通していることを特徴とする請求項1乃至5のいずれか1項に記載の複数温度領域分割制御構造体。
- 前記2つ以上の領域には、それぞれ温度調整手段が設けられており、前記熱伝導異方性材料層は、隣接する温度調整手段相互間に配置されていることを特徴とする請求項1乃至6のいずれか1項に記載の複数温度領域分割制御構造体。
- 前記温度調整手段は、熱交換媒体が流通する媒体流路又はペルチェ素子もしくは抵抗加熱体であることを特徴とする請求項7記載の複数温度領域分割制御構造体。
- 前記複数温度領域分割制御構造体は、基板処理装置の載置台、上部電極板及びデポジットシールドのうちのいずれか1つであることを特徴とする請求項1乃至8のいずれか1項に記載の複数温度領域分割制御構造体。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010069083A JP5675138B2 (ja) | 2010-03-25 | 2010-03-25 | プラズマ処理装置 |
CN201180015563.2A CN102822948B (zh) | 2010-03-25 | 2011-03-24 | 区域温度控制结构体 |
KR1020127027654A KR101790103B1 (ko) | 2010-03-25 | 2011-03-24 | 플라즈마 처리 장치 |
US13/070,929 US9484232B2 (en) | 2010-03-25 | 2011-03-24 | Zone temperature control structure |
EP11759647.8A EP2551894B1 (en) | 2010-03-25 | 2011-03-24 | Region temperature-controlled structure |
TW100110120A TWI509685B (zh) | 2010-03-25 | 2011-03-24 | Regional temperature control constructs |
PCT/JP2011/058155 WO2011118847A1 (ja) | 2010-03-25 | 2011-03-24 | 領域温度制御構造体 |
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JP2010069083A JP5675138B2 (ja) | 2010-03-25 | 2010-03-25 | プラズマ処理装置 |
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JP2011204812A true JP2011204812A (ja) | 2011-10-13 |
JP5675138B2 JP5675138B2 (ja) | 2015-02-25 |
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US (1) | US9484232B2 (ja) |
EP (1) | EP2551894B1 (ja) |
JP (1) | JP5675138B2 (ja) |
KR (1) | KR101790103B1 (ja) |
CN (1) | CN102822948B (ja) |
TW (1) | TWI509685B (ja) |
WO (1) | WO2011118847A1 (ja) |
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2010
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2011
- 2011-03-24 EP EP11759647.8A patent/EP2551894B1/en active Active
- 2011-03-24 CN CN201180015563.2A patent/CN102822948B/zh active Active
- 2011-03-24 TW TW100110120A patent/TWI509685B/zh active
- 2011-03-24 WO PCT/JP2011/058155 patent/WO2011118847A1/ja active Application Filing
- 2011-03-24 KR KR1020127027654A patent/KR101790103B1/ko active IP Right Grant
- 2011-03-24 US US13/070,929 patent/US9484232B2/en active Active
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CN102822948B (zh) | 2016-03-09 |
CN102822948A (zh) | 2012-12-12 |
KR20130016313A (ko) | 2013-02-14 |
TW201205668A (en) | 2012-02-01 |
US20110232888A1 (en) | 2011-09-29 |
TWI509685B (zh) | 2015-11-21 |
EP2551894B1 (en) | 2018-09-26 |
EP2551894A4 (en) | 2016-12-07 |
KR101790103B1 (ko) | 2017-10-25 |
EP2551894A1 (en) | 2013-01-30 |
US9484232B2 (en) | 2016-11-01 |
WO2011118847A1 (ja) | 2011-09-29 |
JP5675138B2 (ja) | 2015-02-25 |
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