JP2010517017A - 光周波数領域イメージングにおける測定深度を制御するための装置及び方法 - Google Patents
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Abstract
【選択図】図3
Description
本願は、その全開示事項が参照することで本明細書に組み入れられる2007年1月19日出願の米国特許出願第60/885,652号の優先権の利益に基づくものであり、それを主張するものである。
本発明は、1若しくは2個以上の深度及び周波数エンコーディング(「DFE」)技術を用いて、光周波数領域イメージング(optical frequency domain imaging)における測定深度(ranging depth)を制御する(例:伸長する)ための装置及び方法全般に関する。
光コヒーレンストモグラフィ(「OCT」)技術は、生物学的サンプルの典型的な断面イメージを、数ミクロンから数十ミクロンのスケールの分解能で提供する。従来のOCTのコントラストは、種々の組織の光学散乱特性の違いによるものであり、組織の微細構造のイメージングが可能である。フーリエ領域OCT(「FD‐OCT」)によって感度が大きく向上し、高速イメージングが可能となることが実証された。FD‐OCTは、スペクトル領域OCT(「SD‐OCT」)及び光周波数領域イメージング(「OFDI」)という2種類の構成で実施されてきた。図1(a)に示す典型的なSD‐OCTの機構では、分光計を用いて、レファレンスビームとサンプルからの反射光との干渉によるスペクトルフリンジ(spectral fringe)を記録することができる。図1(b)に示す典型的なOFDIの機構では、狭帯域波長掃引光源(narrowband wavelength‐swept source)及び単一の検出器を用いて同じインターフェログラムが記録される。
本発明の特定の典型的な実施形態によれば、典型的なOFDIシステムにおいて、深度及び周波数エンコーディング(「DFE」)を用いることによって高測定深度での測定を行うための方法並びに装置を提供することができる。
従来のODFIシステムは、深度に対する関数としての反射率の振幅及び位相に基づいてイメージを形成することができる。このOFDIシステムでは、最大測定深度は、通常、レーザー光源の瞬間的なライン幅(コヒーレンス長)によって制限され、それは、ゼロ深度をサンプル表面に合わせることにより、コヒーレンス範囲の片側を用いて正の深度と負の深度との間の不明瞭さを回避するからである。正の深度と負の深度との間の不明瞭さを回避し、測定深度を伸長させるためのその他の方法が議論されており:I)図1(c)に示す直交干渉シグナルの測定、又はII)図1(d)に示すコヒーレンス範囲の両側の使用である。一つ目の手法は、重なり合ってしまうはずの正の深度及び負の深度に関連するイメージを展開(unfold)するが、安定した直交シグナルを作り出すことが難しいことから、残留アーチファクト(residual artifact)を残す傾向にある。二つ目の手法は、有効測定深度を2倍に伸長することができる。
典型的なフーリエ領域OCTシステム及び方法は、一般に、干渉計の二つのアーム間の干渉を用いて、混濁、半混濁、又は透明媒体中の深度に依存する反射を測定する。入力光源は、レファレンスアーム及びサンプルアームに分割される。サンプルアーム中の光は、イメージ化すべきサンプルへ向けられ、サンプルからの反射は出力カップラーの第一のポートに誘導される。レファレンスアーム光は、同じ出力カップラーの第二のポートに誘導される。ビーム間のスペクトル干渉は、干渉計の出力パワーを波数(又は時間)の関数として記録することによって測定される。検出される平衡電流は:
SD‐OCT及びOFDIのシステム並びに方法の典型的なFD‐OCT技術は、別々のスペクトル干渉i(k)を測定することができるが、この測定の実施方法が異なる。OFDIは、波長掃引光源及び単素子受光器(single‐element photoreceiver)(又は、一式の単素子受光器)を用いて、時間の関数としてi(k)を記録する。図3は、高速OFDIイメージングシステムの典型的な実施形態を示す。この典型的なシステムは、例えば、三つのモジュール:波長掃引光源85、干渉計90、及び取得用電子回路95、を含むことができる。波長掃引光源(以降、掃引光源と称する)は、利得素子としての半導体光増幅器(SOA)125、並びに多角形ミラー100、テレスコープ105、回折格子110、及びファイバーコリメーター113を含む多角形ミラーフィルター101を有するリングキャビティレーザー(ring‐cavity laser)として構築される。偏光制御器120を挿入して、レーザー偏光を最適化することができ、出力カップラー130がレーザー出力を提供する。出力カップラーは、公称上、出力ポート132とレーザーポート131の間で光を均等に分割することができる。光サーキュレータ115は、光をレーザーポート131から多角形ミラーフィルター101へ誘導し、及び多角形ミラーフィルター101からの戻り光を偏光制御器120へ誘導することができる。多角形ミラーが回転するため、多角形ミラーフィルター101からの反射波長は波長を掃引し、レーザー出力に同様な波長の掃引を引き起こす。
エンコードされた二つの隣接するイメージ間のクロストークは、感度及び測定深度の劣化を引き起こす。しかし、周波数偏移間の適切な間隔によってクロストークを回避することができる。図2(b)に示すように、同じ周波数範囲へマッピングされた二つの深度がクロストークを引き起こし得る。二つの周波数偏移に対して、図3に示す理論上の結果は、必要なSIRに対する適切な周波数間隔は、Aラインレートに依存することを示す(クロストークがノイズの存在下での支配的な条件であると仮定)。図4(a)、(b)、(c)、及び(d)は、種々の周波数間隔及びAラインレートに対する深度によるSIRの変化を示す。SIR1及びSIR2は、対応するゼロ深度近辺(zr1、zr2)の二つのセクションのシグナル対干渉比である。Aラインレートが上昇すると、SIRは低下する。例えば、周波数間隔50MHzにおいて、同調速度が75KHzから50KHzに低下すると、SIR1は、ゼロ深度において約30dB上昇する。さらに、所定のAラインレートに対して周波数間隔が増加すると、各深度でのSIRは上昇する。
光源の同調周波数の非線形性により、一定深度でのシグナルのチャーピングが発生し、距離分解能(axial resolution)の劣化を引き起こす。周波数偏移及びゼロパディングに基づく典型的な補間法の改良を行って、トランスフォームリミットに近い(nearly transform limited)距離分解能を全測定深度にわたって達成することが可能である。そのような典型的な機能を実行するための手順の典型的な実施形態を図9に示す。
さらなる典型的な実施形態では、DFE‐OFDIシステムを用いて、血管内をイメージ化することができる。測定深度を伸長させたイメージングが可能なデバイスを図7に示す。光学プローブ310がアレイ320内部に配置され、イメージングビーム330がプローブの側面から発光される。プローブを動脈内へ移動させると、イメージングビーム330は、二つの異なる点A及びBで動脈320に衝突する。DFE‐OFDIは、A及びBで動脈をイメージ化することができ、一方、そのイメージは、異なる周波数でエンコードされる。端面図は、DFE‐OFDIが測定深度を伸長させることができる様子を示す。
Claims (7)
- 少なくとも一つの第一の電磁放射線をサンプルに提供し、少なくとも一つの第二の電磁放射線を第一のレファレンスに提供し、少なくとも一つの第三の電磁放射線を第二のレファレンスに提供する、少なくとも一つの第一の機構であって、ここで、該少なくとも一つの第一の機構によって提供される放射線の周波数は、時間と共に変化する、少なくとも一つの第一の機構と;
(i)少なくとも一つの第一の電磁放射線に付随する少なくとも一つの第四の電磁放射線と少なくとも一つの第二の放射線に付随する少なくとも一つの第五の電磁放射線との間の第一の干渉、及び、
(ii)少なくとも一つの第一の電磁放射線に付随する少なくとも一つの第六の電磁放射線と少なくとも一つの第三の放射線に付随する少なくとも一つの第七の電磁放射線との間の第二の干渉、
を検出する少なくとも一つの第二の機構と、
を含む装置。 - 前記の第一のレファレンスの光路長が、前記の第二のレファレンスの光路長と実質的に異なる、請求項1に記載の装置。
- 前記の第一のレファレンスの光路長と前記の第二のレファレンスの光路長との差が、500μm超である、請求項2に記載の装置。
- 前記の第一のレファレンスが、前記の少なくとも一つの第二の電磁放射線の周波数を偏移させる機構をさらに有する、請求項1に記載の装置。
- 前記の第一のレファレンスが、前記の少なくとも一つの第三の電磁放射線の周波数を偏移させる追加的な機構を有する、請求項4に記載の装置。
- 前記の少なくとも一つの第二の電磁放射線の周波数の偏移の大きさが、前記の少なくとも一つの第三の電磁放射線の周波数の偏移の大きさと異なる、請求項4に記載の装置。
- 前記の少なくとも一つの第一の電磁放射線が、中心周波数が時間と共に実質的に連続的に、ミリ秒あたり100テラヘルツを超える同調速度で変化するスペクトルを有する、請求項1に記載の装置。
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PCT/US2008/051432 WO2008089406A2 (en) | 2007-01-19 | 2008-01-18 | Apparatus and method for simultaneous inspection at different depths based on the principle of frequency domain optical coherence tomography |
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JP2012250041A (ja) * | 2011-05-31 | 2012-12-20 | Lightlab Imaging Inc | 多モード撮像システム、装置、および方法 |
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JP2016077667A (ja) * | 2014-10-20 | 2016-05-16 | 株式会社トプコン | データ処理方法及びoct装置 |
Also Published As
Publication number | Publication date |
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WO2008089406A2 (en) | 2008-07-24 |
WO2008089406A3 (en) | 2008-09-18 |
EP2102583A2 (en) | 2009-09-23 |
JP5507258B2 (ja) | 2014-05-28 |
US7911621B2 (en) | 2011-03-22 |
US20080297806A1 (en) | 2008-12-04 |
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