JP2010506341A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2010506341A5 JP2010506341A5 JP2009530815A JP2009530815A JP2010506341A5 JP 2010506341 A5 JP2010506341 A5 JP 2010506341A5 JP 2009530815 A JP2009530815 A JP 2009530815A JP 2009530815 A JP2009530815 A JP 2009530815A JP 2010506341 A5 JP2010506341 A5 JP 2010506341A5
- Authority
- JP
- Japan
- Prior art keywords
- tunnel junction
- magnetic layer
- magnetic
- magnetic tunnel
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005415 magnetization Effects 0.000 claims 30
- 238000000034 method Methods 0.000 claims 12
- 238000010438 heat treatment Methods 0.000 claims 6
- 230000003213 activating effect Effects 0.000 claims 3
- 238000001514 detection method Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US82843806P | 2006-10-06 | 2006-10-06 | |
| US60/828,438 | 2006-10-06 | ||
| PCT/EP2007/008702 WO2008040561A2 (en) | 2006-10-06 | 2007-10-08 | System and method for providing content-addressable magnetoresistive random access memory cells |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010506341A JP2010506341A (ja) | 2010-02-25 |
| JP2010506341A5 true JP2010506341A5 (cg-RX-API-DMAC7.html) | 2010-08-12 |
| JP5604107B2 JP5604107B2 (ja) | 2014-10-08 |
Family
ID=39205251
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009530815A Expired - Fee Related JP5604107B2 (ja) | 2006-10-06 | 2007-10-08 | 連想磁気抵抗ランダムアクセスメモリセルを提供するためのシステム及び方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US7518897B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2070089B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP5604107B2 (cg-RX-API-DMAC7.html) |
| TW (1) | TWI449040B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2008040561A2 (cg-RX-API-DMAC7.html) |
Families Citing this family (58)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100949110B1 (ko) * | 2005-12-09 | 2010-03-22 | 후지쯔 가부시끼가이샤 | 자기 메모리 장치 및 그 기입 방법 |
| WO2007069322A1 (ja) * | 2005-12-15 | 2007-06-21 | Spansion Llc | 半導体装置およびその制御方法 |
| TWI449040B (zh) | 2006-10-06 | 2014-08-11 | Crocus Technology Sa | 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 |
| US7911830B2 (en) * | 2007-05-17 | 2011-03-22 | Integrated Magnetoelectronics | Scalable nonvolatile memory |
| US7791941B2 (en) * | 2007-10-26 | 2010-09-07 | Micron Technology, Inc. | Non-volatile SRAM cell |
| EP2109111B1 (en) | 2008-04-07 | 2011-12-21 | Crocus Technology S.A. | System and method for writing data to magnetoresistive random access memory cells |
| EP2124228B1 (en) * | 2008-05-20 | 2014-03-05 | Crocus Technology | Magnetic random access memory with an elliptical junction |
| US8031519B2 (en) | 2008-06-18 | 2011-10-04 | Crocus Technology S.A. | Shared line magnetic random access memory cells |
| US8295082B2 (en) * | 2008-08-15 | 2012-10-23 | Qualcomm Incorporated | Gate level reconfigurable magnetic logic |
| JP5062597B2 (ja) * | 2008-08-29 | 2012-10-31 | 独立行政法人産業技術総合研究所 | トンネル磁気抵抗素子 |
| US8102700B2 (en) | 2008-09-30 | 2012-01-24 | Micron Technology, Inc. | Unidirectional spin torque transfer magnetic memory cell structure |
| US8228703B2 (en) | 2008-11-04 | 2012-07-24 | Crocus Technology Sa | Ternary Content Addressable Magnetoresistive random access memory cell |
| EP2221826A1 (en) * | 2009-02-19 | 2010-08-25 | Crocus Technology S.A. | Active strap magnetic random access memory cells |
| US8023299B1 (en) * | 2009-04-09 | 2011-09-20 | Netlogic Microsystems, Inc. | Content addressable memory device having spin torque transfer memory cells |
| EP2249349B1 (en) * | 2009-05-08 | 2012-02-08 | Crocus Technology | Magnetic memory with a thermally assisted writing procedure and reduced writng field |
| ATE544153T1 (de) * | 2009-05-08 | 2012-02-15 | Crocus Technology | Magnetischer speicher mit wärmeunterstütztem schreibverfahren und niedrigem schreibstrom |
| US20100302838A1 (en) * | 2009-05-26 | 2010-12-02 | Magic Technologies, Inc. | Read disturb-free SMT reference cell scheme |
| US8218349B2 (en) * | 2009-05-26 | 2012-07-10 | Crocus Technology Sa | Non-volatile logic devices using magnetic tunnel junctions |
| EP2270812B1 (en) * | 2009-07-02 | 2017-01-18 | CROCUS Technology | Ultimate magnetic random access memory-based ternay CAM |
| EP2276034B1 (en) * | 2009-07-13 | 2016-04-27 | Crocus Technology S.A. | Self-referenced magnetic random access memory cell |
| US8102703B2 (en) * | 2009-07-14 | 2012-01-24 | Crocus Technology | Magnetic element with a fast spin transfer torque writing procedure |
| US20130054886A1 (en) * | 2010-01-25 | 2013-02-28 | Idatamap Pty. Ltd. | Content addressable memory (cam) |
| JP2011243716A (ja) * | 2010-05-18 | 2011-12-01 | Toshiba Corp | スピントランジスタ及び集積回路 |
| US8400066B1 (en) | 2010-08-01 | 2013-03-19 | Lawrence T. Pileggi | Magnetic logic circuits and systems incorporating same |
| JP2012089205A (ja) * | 2010-10-20 | 2012-05-10 | Renesas Electronics Corp | 連想記憶装置 |
| WO2012075330A2 (en) | 2010-12-01 | 2012-06-07 | Crocus Technology, Inc. | Apparatus, system, and method for matching patterns with an ultra fast check engine |
| JP5712681B2 (ja) * | 2011-03-04 | 2015-05-07 | 富士通セミコンダクター株式会社 | 半導体記憶装置 |
| US8908407B1 (en) * | 2011-07-30 | 2014-12-09 | Rambus Inc. | Content addressable memory (“CAM”) |
| US8638582B1 (en) | 2011-08-23 | 2014-01-28 | Netlogic Microsystems, Inc. | Content addressable memory with base-three numeral system |
| US8902643B2 (en) | 2011-10-10 | 2014-12-02 | Crocus Technology Inc. | Apparatus, system, and method for writing multiple magnetic random access memory cells with a single field line |
| EP2626861B1 (en) | 2012-02-13 | 2015-01-07 | Crocus Technology S.A. | High speed magnetic random access memory-based ternary CAM |
| JP6004465B2 (ja) * | 2012-03-26 | 2016-10-05 | 国立大学法人東北大学 | 不揮発機能メモリ装置 |
| CN103456356A (zh) | 2012-05-31 | 2013-12-18 | 三星电子株式会社 | 半导体存储器装置和相关的操作方法 |
| US9047950B2 (en) * | 2012-09-11 | 2015-06-02 | The Regents Of The University Of California | Read-disturbance-free nonvolatile content addressable memory (CAM) |
| EP2712078B1 (en) * | 2012-09-25 | 2015-06-03 | Crocus Technology S.A. | Magnetic logic unit (MLU) cell and amplifier having a linear magnetic signal |
| US8913422B2 (en) * | 2012-09-28 | 2014-12-16 | Intel Corporation | Decreased switching current in spin-transfer torque memory |
| US9313131B2 (en) * | 2013-09-06 | 2016-04-12 | Stmicroelectronics, Inc. | Hardware implemented ethernet multiple tuple filter system and method |
| EP2851903B1 (en) * | 2013-09-19 | 2017-03-01 | Crocus Technology S.A. | Self-referenced memory device and method for operating the memory device |
| US9331123B2 (en) | 2014-05-09 | 2016-05-03 | Tower Semiconductor Ltd. | Logic unit including magnetic tunnel junction elements having two different anti-ferromagnetic layers |
| US9330748B2 (en) | 2014-05-09 | 2016-05-03 | Tower Semiconductor Ltd. | High-speed compare operation using magnetic tunnel junction elements including two different anti-ferromagnetic layers |
| US9524765B2 (en) * | 2014-08-15 | 2016-12-20 | Qualcomm Incorporated | Differential magnetic tunnel junction pair including a sense layer with a high coercivity portion |
| US9548095B2 (en) * | 2014-08-20 | 2017-01-17 | Everspin Technologies, Inc. | Redundant magnetic tunnel junctions in magnetoresistive memory |
| CN104332175B (zh) * | 2014-10-10 | 2017-02-01 | 北京航空航天大学 | 一种字块划分的低功耗磁存储器缓存架构设计方法 |
| USRE48570E1 (en) | 2014-10-17 | 2021-05-25 | Lattice Semiconductor Corporation | Memory circuit having non-volatile memory cell and methods of using |
| US9672935B2 (en) | 2014-10-17 | 2017-06-06 | Lattice Semiconductor Corporation | Memory circuit having non-volatile memory cell and methods of using |
| FR3031622B1 (fr) * | 2015-01-14 | 2018-02-16 | Centre National De La Recherche Scientifique | Point memoire magnetique |
| EP3284093B1 (en) | 2015-04-14 | 2021-08-04 | Cambou, Bertrand, F. | Memory circuits using a blocking state |
| WO2016182596A1 (en) | 2015-05-11 | 2016-11-17 | Cambou Bertrand F | Memory circuit using dynamic random access memory arrays |
| EP3304561B1 (en) | 2015-06-02 | 2020-08-26 | Cambou, Bertrand, F. | Memory circuit using resistive random access memory arrays in a secure element |
| EP3115994B1 (en) | 2015-07-07 | 2022-06-08 | Crocus Technology S.A. | Magnetic memory device that is protected against reading using an external magnetic field and method for operating such magnetic memory device |
| JP2017033616A (ja) * | 2015-07-31 | 2017-02-09 | 株式会社東芝 | 集積回路 |
| US9813049B2 (en) * | 2015-08-12 | 2017-11-07 | Qualcomm Incorporated | Comparator including a magnetic tunnel junction (MTJ) device and a transistor |
| US9728259B1 (en) * | 2016-03-15 | 2017-08-08 | Qualcomm Technologies, Inc. | Non-volatile (NV)-content addressable memory (CAM) (NV-CAM) cells employing differential magnetic tunnel junction (MTJ) sensing for increased sense margin |
| CN106328184B (zh) * | 2016-08-17 | 2019-01-29 | 国网技术学院 | Mlc stt-mram数据写入方法及装置、数据读取方法及装置 |
| US10706923B2 (en) | 2017-09-08 | 2020-07-07 | Arizona Board Of Regents On Behalf Of Arizona State University | Resistive random-access memory for exclusive NOR (XNOR) neural networks |
| US10559357B1 (en) * | 2018-08-06 | 2020-02-11 | Lattice Semiconductor Corporation | Memory circuit having non-volatile memory cell and methods of using |
| US10483457B1 (en) * | 2018-08-14 | 2019-11-19 | Qualcomm Incorporated | Differential spin orbit torque magnetic random access memory (SOT-MRAM) cell structure and array |
| US11551750B2 (en) * | 2020-12-11 | 2023-01-10 | International Business Machines Corporation | Enhanced state dual memory cell |
Family Cites Families (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4078696B2 (ja) | 1997-11-28 | 2008-04-23 | 松下電器産業株式会社 | 記録許可判定装置及び情報記録装置 |
| US6317349B1 (en) * | 1999-04-16 | 2001-11-13 | Sandisk Corporation | Non-volatile content addressable memory |
| EP1196925B1 (en) | 1999-06-18 | 2015-10-28 | NVE Corporation | Magnetic memory coincident thermal pulse data storage |
| US6191973B1 (en) * | 1999-09-27 | 2001-02-20 | Motorola Inc. | Mram cam |
| DE19946490A1 (de) * | 1999-09-28 | 2001-04-19 | Infineon Technologies Ag | Magnetoresistiver Schreib/Lese-Speicher sowie Verfahren zum Beschreiben und Auslesen eines solchen Speichers |
| US6312349B1 (en) * | 1999-10-29 | 2001-11-06 | T. Sanford Roberts | Sports training device |
| YU68102A (sh) * | 2000-03-16 | 2006-01-16 | F. Hoffmann-La Roche Ag. | Derivati karboksilne kiseline kao ip antagonisti |
| US6269016B1 (en) | 2000-06-19 | 2001-07-31 | Motorola Inc. | MRAM cam |
| US6385082B1 (en) | 2000-11-08 | 2002-05-07 | International Business Machines Corp. | Thermally-assisted magnetic random access memory (MRAM) |
| US6724674B2 (en) | 2000-11-08 | 2004-04-20 | International Business Machines Corporation | Memory storage device with heating element |
| JP4726292B2 (ja) | 2000-11-14 | 2011-07-20 | ルネサスエレクトロニクス株式会社 | 薄膜磁性体記憶装置 |
| FR2817998B1 (fr) | 2000-12-07 | 2003-01-10 | Commissariat Energie Atomique | Dispositif magnetique a polarisation de spin et a rotation d'aimantation, memoire et procede d'ecriture utilisant ce dispositif |
| FR2817999B1 (fr) | 2000-12-07 | 2003-01-10 | Commissariat Energie Atomique | Dispositif magnetique a polarisation de spin et a empilement(s) tri-couche(s) et memoire utilisant ce dispositif |
| JP3920564B2 (ja) | 2000-12-25 | 2007-05-30 | 株式会社東芝 | 磁気ランダムアクセスメモリ |
| US6304477B1 (en) * | 2001-01-31 | 2001-10-16 | Motorola, Inc. | Content addressable magnetic random access memory |
| US6760249B2 (en) | 2001-06-21 | 2004-07-06 | Pien Chien | Content addressable memory device capable of comparing data bit with storage data bit |
| FR2829867B1 (fr) | 2001-09-20 | 2003-12-19 | Centre Nat Rech Scient | Memoire magnetique a selection a l'ecriture par inhibition et procede pour son ecriture |
| FR2829868A1 (fr) | 2001-09-20 | 2003-03-21 | Centre Nat Rech Scient | Memoire magnetique a ecriture par courant polarise en spin, mettant en oeuvre des alliages amorphes ferrimagnetiques et procede pour son ecriture |
| FR2832542B1 (fr) | 2001-11-16 | 2005-05-06 | Commissariat Energie Atomique | Dispositif magnetique a jonction tunnel magnetique, memoire et procedes d'ecriture et de lecture utilisant ce dispositif |
| US6750491B2 (en) | 2001-12-20 | 2004-06-15 | Hewlett-Packard Development Company, L.P. | Magnetic memory device having soft reference layer |
| JP2004079002A (ja) * | 2002-08-09 | 2004-03-11 | Renesas Technology Corp | 不揮発性記憶装置 |
| US6771534B2 (en) | 2002-11-15 | 2004-08-03 | International Business Machines Corporation | Thermally-assisted magnetic writing using an oxide layer and current-induced heating |
| JP4182728B2 (ja) | 2002-11-15 | 2008-11-19 | ソニー株式会社 | 磁気記憶素子の記録方法、磁気記憶装置 |
| US7173846B2 (en) | 2003-02-13 | 2007-02-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Magnetic RAM and array architecture using a two transistor, one MTJ cell |
| JP3906212B2 (ja) * | 2003-03-11 | 2007-04-18 | 株式会社東芝 | 磁気ランダムアクセスメモリ |
| EP1639656B1 (en) | 2003-06-23 | 2019-06-12 | NVE Corporation | Thermally operated ferromagnetic memory cell |
| JP2005064050A (ja) | 2003-08-14 | 2005-03-10 | Toshiba Corp | 半導体記憶装置及びそのデータ書き込み方法 |
| FR2860910B1 (fr) | 2003-10-10 | 2006-02-10 | Commissariat Energie Atomique | Dispositif a jonction tunnel magnetique et procede d'ecriture/lecture d'un tel dispositif |
| WO2005036558A1 (en) | 2003-10-14 | 2005-04-21 | Agency For Science, Technology And Research | Magnetic memory device |
| US7012832B1 (en) * | 2003-10-31 | 2006-03-14 | Western Digital (Fremont), Inc. | Magnetic memory cell with plural read transistors |
| US7068531B2 (en) * | 2004-01-10 | 2006-06-27 | Honeywell International Inc. | Bias-adjusted magnetoresistive devices for magnetic random access memory (MRAM) applications |
| FR2866750B1 (fr) | 2004-02-23 | 2006-04-21 | Centre Nat Rech Scient | Memoire magnetique a jonction tunnel magnetique et procede pour son ecriture |
| FR2867300B1 (fr) | 2004-03-05 | 2006-04-28 | Commissariat Energie Atomique | Memoire vive magnetoresistive a haute densite de courant |
| JP4426876B2 (ja) * | 2004-03-09 | 2010-03-03 | 公秀 松山 | 磁気連想メモリ及び磁気連想メモリからの情報読み出し方法 |
| US7102920B2 (en) * | 2004-03-23 | 2006-09-05 | Hewlett-Packard Development Company, L.P. | Soft-reference three conductor magnetic memory storage device |
| US7075818B2 (en) * | 2004-08-23 | 2006-07-11 | Maglabs, Inc. | Magnetic random access memory with stacked memory layers having access lines for writing and reading |
| US7130206B2 (en) * | 2004-09-30 | 2006-10-31 | Infineon Technologies Ag | Content addressable memory cell including resistive memory elements |
| US6992910B1 (en) * | 2004-11-18 | 2006-01-31 | Maglabs, Inc. | Magnetic random access memory with three or more stacked toggle memory cells and method for writing a selected cell |
| US7532505B1 (en) | 2006-07-17 | 2009-05-12 | Grandis, Inc. | Method and system for using a pulsed field to assist spin transfer induced switching of magnetic memory elements |
| TWI449040B (zh) | 2006-10-06 | 2014-08-11 | Crocus Technology Sa | 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 |
| EP2109111B1 (en) | 2008-04-07 | 2011-12-21 | Crocus Technology S.A. | System and method for writing data to magnetoresistive random access memory cells |
-
2007
- 2007-10-05 TW TW096137428A patent/TWI449040B/zh not_active IP Right Cessation
- 2007-10-08 WO PCT/EP2007/008702 patent/WO2008040561A2/en not_active Ceased
- 2007-10-08 EP EP07818777A patent/EP2070089B1/en active Active
- 2007-10-08 JP JP2009530815A patent/JP5604107B2/ja not_active Expired - Fee Related
- 2007-10-09 US US11/869,632 patent/US7518897B2/en active Active
-
2009
- 2009-01-05 US US12/348,830 patent/US7791917B2/en active Active
- 2009-04-13 US US12/422,752 patent/US7894228B2/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2010506341A5 (cg-RX-API-DMAC7.html) | ||
| US8310866B2 (en) | MRAM device structure employing thermally-assisted write operations and thermally-unassisted self-referencing operations | |
| JP5612385B2 (ja) | 自己参照磁気ランダムアクセスメモリセル | |
| Dorrance et al. | Scalability and design-space analysis of a 1T-1MTJ memory cell for STT-RAMs | |
| Grezes et al. | Write error rate and read disturbance in electric-field-controlled magnetic random-access memory | |
| Wang et al. | Compact thermal modeling of spin transfer torque magnetic tunnel junction | |
| US8183654B2 (en) | Static magnetic field assisted resistive sense element | |
| US9331123B2 (en) | Logic unit including magnetic tunnel junction elements having two different anti-ferromagnetic layers | |
| TWI555018B (zh) | 寫入自我參照磁性隨機存取記憶體單元的方法 | |
| CN103890854B (zh) | 磁振子磁随机存取存储器器件 | |
| EP2766906B1 (en) | Apparatus, system, and method for writing multiple magnetic random access memory cells with a single field line | |
| EP2297737A1 (en) | Spin-transfer torque memory non-destructive self-reference read method | |
| TW201037703A (en) | Data integrity preservation in spin transfer torque magnetoresistive random access memory | |
| JP2012518867A5 (cg-RX-API-DMAC7.html) | ||
| EP1376602A3 (en) | Magnetic ram using thermo-magnetic spontaneous hall effect and method of writing and reading data using the magnetic ram | |
| US20150303373A1 (en) | Spin-transfer switching magnetic element formed from ferrimagnetic rare-earth-transition-metal (re-tm) alloys | |
| TWI529986B (zh) | 具最佳化可靠度之自我參照磁性隨機存取記憶體單元 | |
| WO2009044644A1 (ja) | 磁気抵抗効果素子、及び磁気ランダムアクセスメモリ、及びその初期化方法 | |
| KR20200102909A (ko) | 수직 스핀 전달 토크 mram 메모리 셀 | |
| TW201346900A (zh) | 具有線性感測信號之自我參照磁性隨機存取記憶體元件 | |
| US8958240B2 (en) | Magnetic device with thermally-assisted switching | |
| JP2018504782A (ja) | 改善されたプログラミング性及び低い読取り消費電力で磁場を検出するマグネティック・ロジック・ユニット(mlu)セル | |
| TW201246207A (en) | Magnetic random access memory cell with a dual junction for ternary content addressable memory applications | |
| Teso et al. | Temperature dependence of magnetic properties on switching energy in magnetic tunnel junction devices with tilted magnetization | |
| JP2017537457A (ja) | 磁気装置に書き込むための方法 |