TWI449040B - 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 - Google Patents
用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 Download PDFInfo
- Publication number
- TWI449040B TWI449040B TW096137428A TW96137428A TWI449040B TW I449040 B TWI449040 B TW I449040B TW 096137428 A TW096137428 A TW 096137428A TW 96137428 A TW96137428 A TW 96137428A TW I449040 B TWI449040 B TW I449040B
- Authority
- TW
- Taiwan
- Prior art keywords
- magnetic
- tunnel junction
- magnetic layer
- magnetization direction
- line
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 49
- 230000005291 magnetic effect Effects 0.000 claims description 627
- 230000015654 memory Effects 0.000 claims description 223
- 230000005415 magnetization Effects 0.000 claims description 111
- 238000010438 heat treatment Methods 0.000 claims description 31
- 238000004891 communication Methods 0.000 claims description 14
- 230000003213 activating effect Effects 0.000 claims description 4
- 230000010287 polarization Effects 0.000 claims description 4
- 230000003247 decreasing effect Effects 0.000 claims description 2
- 230000001939 inductive effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 20
- 230000005294 ferromagnetic effect Effects 0.000 description 19
- 230000005669 field effect Effects 0.000 description 10
- 229910044991 metal oxide Inorganic materials 0.000 description 10
- 150000004706 metal oxides Chemical class 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 10
- 230000006870 function Effects 0.000 description 9
- 230000003068 static effect Effects 0.000 description 6
- 230000002829 reductive effect Effects 0.000 description 5
- 230000004044 response Effects 0.000 description 5
- 230000009977 dual effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- CPLXHLVBOLITMK-UHFFFAOYSA-N Magnesium oxide Chemical compound [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 3
- 230000002441 reversible effect Effects 0.000 description 3
- 230000005641 tunneling Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 230000005290 antiferromagnetic effect Effects 0.000 description 2
- 239000002885 antiferromagnetic material Substances 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- FQMNUIZEFUVPNU-UHFFFAOYSA-N cobalt iron Chemical compound [Fe].[Co].[Co] FQMNUIZEFUVPNU-UHFFFAOYSA-N 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000007717 exclusion Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000000395 magnesium oxide Substances 0.000 description 2
- IGOJMROYPFZEOR-UHFFFAOYSA-N manganese platinum Chemical compound [Mn].[Pt] IGOJMROYPFZEOR-UHFFFAOYSA-N 0.000 description 2
- 230000005055 memory storage Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- AUFVVJFBLFWLJX-UHFFFAOYSA-N [Mn].[La] Chemical compound [Mn].[La] AUFVVJFBLFWLJX-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000000262 chemical ionisation mass spectrometry Methods 0.000 description 1
- ZGDWHDKHJKZZIQ-UHFFFAOYSA-N cobalt nickel Chemical compound [Co].[Ni].[Ni].[Ni] ZGDWHDKHJKZZIQ-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013144 data compression Methods 0.000 description 1
- 238000013479 data entry Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011572 manganese Substances 0.000 description 1
- BLYYANNQIHKJMU-UHFFFAOYSA-N manganese(2+) nickel(2+) oxygen(2-) Chemical compound [O--].[O--].[Mn++].[Ni++] BLYYANNQIHKJMU-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000003909 pattern recognition Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C15/00—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
- G11C15/04—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using semiconductor elements
- G11C15/046—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using semiconductor elements using non-volatile storage elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C15/00—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
- G11C15/02—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using magnetic elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Hall/Mr Elements (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US82843806P | 2006-10-06 | 2006-10-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200844997A TW200844997A (en) | 2008-11-16 |
| TWI449040B true TWI449040B (zh) | 2014-08-11 |
Family
ID=39205251
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096137428A TWI449040B (zh) | 2006-10-06 | 2007-10-05 | 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US7518897B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2070089B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP5604107B2 (cg-RX-API-DMAC7.html) |
| TW (1) | TWI449040B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2008040561A2 (cg-RX-API-DMAC7.html) |
Families Citing this family (58)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100949110B1 (ko) * | 2005-12-09 | 2010-03-22 | 후지쯔 가부시끼가이샤 | 자기 메모리 장치 및 그 기입 방법 |
| WO2007069322A1 (ja) * | 2005-12-15 | 2007-06-21 | Spansion Llc | 半導体装置およびその制御方法 |
| TWI449040B (zh) | 2006-10-06 | 2014-08-11 | Crocus Technology Sa | 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 |
| US7911830B2 (en) * | 2007-05-17 | 2011-03-22 | Integrated Magnetoelectronics | Scalable nonvolatile memory |
| US7791941B2 (en) * | 2007-10-26 | 2010-09-07 | Micron Technology, Inc. | Non-volatile SRAM cell |
| EP2109111B1 (en) | 2008-04-07 | 2011-12-21 | Crocus Technology S.A. | System and method for writing data to magnetoresistive random access memory cells |
| EP2124228B1 (en) * | 2008-05-20 | 2014-03-05 | Crocus Technology | Magnetic random access memory with an elliptical junction |
| US8031519B2 (en) | 2008-06-18 | 2011-10-04 | Crocus Technology S.A. | Shared line magnetic random access memory cells |
| US8295082B2 (en) * | 2008-08-15 | 2012-10-23 | Qualcomm Incorporated | Gate level reconfigurable magnetic logic |
| JP5062597B2 (ja) * | 2008-08-29 | 2012-10-31 | 独立行政法人産業技術総合研究所 | トンネル磁気抵抗素子 |
| US8102700B2 (en) | 2008-09-30 | 2012-01-24 | Micron Technology, Inc. | Unidirectional spin torque transfer magnetic memory cell structure |
| US8228703B2 (en) | 2008-11-04 | 2012-07-24 | Crocus Technology Sa | Ternary Content Addressable Magnetoresistive random access memory cell |
| EP2221826A1 (en) * | 2009-02-19 | 2010-08-25 | Crocus Technology S.A. | Active strap magnetic random access memory cells |
| US8023299B1 (en) * | 2009-04-09 | 2011-09-20 | Netlogic Microsystems, Inc. | Content addressable memory device having spin torque transfer memory cells |
| EP2249349B1 (en) * | 2009-05-08 | 2012-02-08 | Crocus Technology | Magnetic memory with a thermally assisted writing procedure and reduced writng field |
| ATE544153T1 (de) * | 2009-05-08 | 2012-02-15 | Crocus Technology | Magnetischer speicher mit wärmeunterstütztem schreibverfahren und niedrigem schreibstrom |
| US20100302838A1 (en) * | 2009-05-26 | 2010-12-02 | Magic Technologies, Inc. | Read disturb-free SMT reference cell scheme |
| US8218349B2 (en) * | 2009-05-26 | 2012-07-10 | Crocus Technology Sa | Non-volatile logic devices using magnetic tunnel junctions |
| EP2270812B1 (en) * | 2009-07-02 | 2017-01-18 | CROCUS Technology | Ultimate magnetic random access memory-based ternay CAM |
| EP2276034B1 (en) * | 2009-07-13 | 2016-04-27 | Crocus Technology S.A. | Self-referenced magnetic random access memory cell |
| US8102703B2 (en) * | 2009-07-14 | 2012-01-24 | Crocus Technology | Magnetic element with a fast spin transfer torque writing procedure |
| US20130054886A1 (en) * | 2010-01-25 | 2013-02-28 | Idatamap Pty. Ltd. | Content addressable memory (cam) |
| JP2011243716A (ja) * | 2010-05-18 | 2011-12-01 | Toshiba Corp | スピントランジスタ及び集積回路 |
| US8400066B1 (en) | 2010-08-01 | 2013-03-19 | Lawrence T. Pileggi | Magnetic logic circuits and systems incorporating same |
| JP2012089205A (ja) * | 2010-10-20 | 2012-05-10 | Renesas Electronics Corp | 連想記憶装置 |
| WO2012075330A2 (en) | 2010-12-01 | 2012-06-07 | Crocus Technology, Inc. | Apparatus, system, and method for matching patterns with an ultra fast check engine |
| JP5712681B2 (ja) * | 2011-03-04 | 2015-05-07 | 富士通セミコンダクター株式会社 | 半導体記憶装置 |
| US8908407B1 (en) * | 2011-07-30 | 2014-12-09 | Rambus Inc. | Content addressable memory (“CAM”) |
| US8638582B1 (en) | 2011-08-23 | 2014-01-28 | Netlogic Microsystems, Inc. | Content addressable memory with base-three numeral system |
| US8902643B2 (en) | 2011-10-10 | 2014-12-02 | Crocus Technology Inc. | Apparatus, system, and method for writing multiple magnetic random access memory cells with a single field line |
| EP2626861B1 (en) | 2012-02-13 | 2015-01-07 | Crocus Technology S.A. | High speed magnetic random access memory-based ternary CAM |
| JP6004465B2 (ja) * | 2012-03-26 | 2016-10-05 | 国立大学法人東北大学 | 不揮発機能メモリ装置 |
| CN103456356A (zh) | 2012-05-31 | 2013-12-18 | 三星电子株式会社 | 半导体存储器装置和相关的操作方法 |
| US9047950B2 (en) * | 2012-09-11 | 2015-06-02 | The Regents Of The University Of California | Read-disturbance-free nonvolatile content addressable memory (CAM) |
| EP2712078B1 (en) * | 2012-09-25 | 2015-06-03 | Crocus Technology S.A. | Magnetic logic unit (MLU) cell and amplifier having a linear magnetic signal |
| US8913422B2 (en) * | 2012-09-28 | 2014-12-16 | Intel Corporation | Decreased switching current in spin-transfer torque memory |
| US9313131B2 (en) * | 2013-09-06 | 2016-04-12 | Stmicroelectronics, Inc. | Hardware implemented ethernet multiple tuple filter system and method |
| EP2851903B1 (en) * | 2013-09-19 | 2017-03-01 | Crocus Technology S.A. | Self-referenced memory device and method for operating the memory device |
| US9331123B2 (en) | 2014-05-09 | 2016-05-03 | Tower Semiconductor Ltd. | Logic unit including magnetic tunnel junction elements having two different anti-ferromagnetic layers |
| US9330748B2 (en) | 2014-05-09 | 2016-05-03 | Tower Semiconductor Ltd. | High-speed compare operation using magnetic tunnel junction elements including two different anti-ferromagnetic layers |
| US9524765B2 (en) * | 2014-08-15 | 2016-12-20 | Qualcomm Incorporated | Differential magnetic tunnel junction pair including a sense layer with a high coercivity portion |
| US9548095B2 (en) * | 2014-08-20 | 2017-01-17 | Everspin Technologies, Inc. | Redundant magnetic tunnel junctions in magnetoresistive memory |
| CN104332175B (zh) * | 2014-10-10 | 2017-02-01 | 北京航空航天大学 | 一种字块划分的低功耗磁存储器缓存架构设计方法 |
| USRE48570E1 (en) | 2014-10-17 | 2021-05-25 | Lattice Semiconductor Corporation | Memory circuit having non-volatile memory cell and methods of using |
| US9672935B2 (en) | 2014-10-17 | 2017-06-06 | Lattice Semiconductor Corporation | Memory circuit having non-volatile memory cell and methods of using |
| FR3031622B1 (fr) * | 2015-01-14 | 2018-02-16 | Centre National De La Recherche Scientifique | Point memoire magnetique |
| EP3284093B1 (en) | 2015-04-14 | 2021-08-04 | Cambou, Bertrand, F. | Memory circuits using a blocking state |
| WO2016182596A1 (en) | 2015-05-11 | 2016-11-17 | Cambou Bertrand F | Memory circuit using dynamic random access memory arrays |
| EP3304561B1 (en) | 2015-06-02 | 2020-08-26 | Cambou, Bertrand, F. | Memory circuit using resistive random access memory arrays in a secure element |
| EP3115994B1 (en) | 2015-07-07 | 2022-06-08 | Crocus Technology S.A. | Magnetic memory device that is protected against reading using an external magnetic field and method for operating such magnetic memory device |
| JP2017033616A (ja) * | 2015-07-31 | 2017-02-09 | 株式会社東芝 | 集積回路 |
| US9813049B2 (en) * | 2015-08-12 | 2017-11-07 | Qualcomm Incorporated | Comparator including a magnetic tunnel junction (MTJ) device and a transistor |
| US9728259B1 (en) * | 2016-03-15 | 2017-08-08 | Qualcomm Technologies, Inc. | Non-volatile (NV)-content addressable memory (CAM) (NV-CAM) cells employing differential magnetic tunnel junction (MTJ) sensing for increased sense margin |
| CN106328184B (zh) * | 2016-08-17 | 2019-01-29 | 国网技术学院 | Mlc stt-mram数据写入方法及装置、数据读取方法及装置 |
| US10706923B2 (en) | 2017-09-08 | 2020-07-07 | Arizona Board Of Regents On Behalf Of Arizona State University | Resistive random-access memory for exclusive NOR (XNOR) neural networks |
| US10559357B1 (en) * | 2018-08-06 | 2020-02-11 | Lattice Semiconductor Corporation | Memory circuit having non-volatile memory cell and methods of using |
| US10483457B1 (en) * | 2018-08-14 | 2019-11-19 | Qualcomm Incorporated | Differential spin orbit torque magnetic random access memory (SOT-MRAM) cell structure and array |
| US11551750B2 (en) * | 2020-12-11 | 2023-01-10 | International Business Machines Corporation | Enhanced state dual memory cell |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW480489B (en) * | 1999-09-28 | 2002-03-21 | Infineon Technologies Ag | Magnetoresistive write/read-memory as well as method to write and read such a memory |
| US6778445B2 (en) * | 2002-08-09 | 2004-08-17 | Renesas Technology Corp. | Pipeline nonvolatile memory device with multi-bit parallel read and write suitable for cache memory. |
| US20050002228A1 (en) * | 2001-11-16 | 2005-01-06 | Bernard Dieny | Magnetic device with magnetic tunnel junction, memory array and read/write methods using same |
| US20050117391A1 (en) * | 2003-03-11 | 2005-06-02 | Hiroaki Yoda | Magnetic random access memory |
| US20050152179A1 (en) * | 2004-01-10 | 2005-07-14 | Honeywell International Inc. | Bias-adjusted magnetoresistive devices for magnetic random access memory (MRAM) applications |
| US6992910B1 (en) * | 2004-11-18 | 2006-01-31 | Maglabs, Inc. | Magnetic random access memory with three or more stacked toggle memory cells and method for writing a selected cell |
| US20060039188A1 (en) * | 2004-08-23 | 2006-02-23 | Kochan Ju | Magnetic random access memory with stacked memory layers having access lines for writing and reading |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4078696B2 (ja) | 1997-11-28 | 2008-04-23 | 松下電器産業株式会社 | 記録許可判定装置及び情報記録装置 |
| US6317349B1 (en) * | 1999-04-16 | 2001-11-13 | Sandisk Corporation | Non-volatile content addressable memory |
| EP1196925B1 (en) | 1999-06-18 | 2015-10-28 | NVE Corporation | Magnetic memory coincident thermal pulse data storage |
| US6191973B1 (en) * | 1999-09-27 | 2001-02-20 | Motorola Inc. | Mram cam |
| US6312349B1 (en) * | 1999-10-29 | 2001-11-06 | T. Sanford Roberts | Sports training device |
| YU68102A (sh) * | 2000-03-16 | 2006-01-16 | F. Hoffmann-La Roche Ag. | Derivati karboksilne kiseline kao ip antagonisti |
| US6269016B1 (en) | 2000-06-19 | 2001-07-31 | Motorola Inc. | MRAM cam |
| US6385082B1 (en) | 2000-11-08 | 2002-05-07 | International Business Machines Corp. | Thermally-assisted magnetic random access memory (MRAM) |
| US6724674B2 (en) | 2000-11-08 | 2004-04-20 | International Business Machines Corporation | Memory storage device with heating element |
| JP4726292B2 (ja) | 2000-11-14 | 2011-07-20 | ルネサスエレクトロニクス株式会社 | 薄膜磁性体記憶装置 |
| FR2817998B1 (fr) | 2000-12-07 | 2003-01-10 | Commissariat Energie Atomique | Dispositif magnetique a polarisation de spin et a rotation d'aimantation, memoire et procede d'ecriture utilisant ce dispositif |
| FR2817999B1 (fr) | 2000-12-07 | 2003-01-10 | Commissariat Energie Atomique | Dispositif magnetique a polarisation de spin et a empilement(s) tri-couche(s) et memoire utilisant ce dispositif |
| JP3920564B2 (ja) | 2000-12-25 | 2007-05-30 | 株式会社東芝 | 磁気ランダムアクセスメモリ |
| US6304477B1 (en) * | 2001-01-31 | 2001-10-16 | Motorola, Inc. | Content addressable magnetic random access memory |
| US6760249B2 (en) | 2001-06-21 | 2004-07-06 | Pien Chien | Content addressable memory device capable of comparing data bit with storage data bit |
| FR2829867B1 (fr) | 2001-09-20 | 2003-12-19 | Centre Nat Rech Scient | Memoire magnetique a selection a l'ecriture par inhibition et procede pour son ecriture |
| FR2829868A1 (fr) | 2001-09-20 | 2003-03-21 | Centre Nat Rech Scient | Memoire magnetique a ecriture par courant polarise en spin, mettant en oeuvre des alliages amorphes ferrimagnetiques et procede pour son ecriture |
| US6750491B2 (en) | 2001-12-20 | 2004-06-15 | Hewlett-Packard Development Company, L.P. | Magnetic memory device having soft reference layer |
| US6771534B2 (en) | 2002-11-15 | 2004-08-03 | International Business Machines Corporation | Thermally-assisted magnetic writing using an oxide layer and current-induced heating |
| JP4182728B2 (ja) | 2002-11-15 | 2008-11-19 | ソニー株式会社 | 磁気記憶素子の記録方法、磁気記憶装置 |
| US7173846B2 (en) | 2003-02-13 | 2007-02-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Magnetic RAM and array architecture using a two transistor, one MTJ cell |
| EP1639656B1 (en) | 2003-06-23 | 2019-06-12 | NVE Corporation | Thermally operated ferromagnetic memory cell |
| JP2005064050A (ja) | 2003-08-14 | 2005-03-10 | Toshiba Corp | 半導体記憶装置及びそのデータ書き込み方法 |
| FR2860910B1 (fr) | 2003-10-10 | 2006-02-10 | Commissariat Energie Atomique | Dispositif a jonction tunnel magnetique et procede d'ecriture/lecture d'un tel dispositif |
| WO2005036558A1 (en) | 2003-10-14 | 2005-04-21 | Agency For Science, Technology And Research | Magnetic memory device |
| US7012832B1 (en) * | 2003-10-31 | 2006-03-14 | Western Digital (Fremont), Inc. | Magnetic memory cell with plural read transistors |
| FR2866750B1 (fr) | 2004-02-23 | 2006-04-21 | Centre Nat Rech Scient | Memoire magnetique a jonction tunnel magnetique et procede pour son ecriture |
| FR2867300B1 (fr) | 2004-03-05 | 2006-04-28 | Commissariat Energie Atomique | Memoire vive magnetoresistive a haute densite de courant |
| JP4426876B2 (ja) * | 2004-03-09 | 2010-03-03 | 公秀 松山 | 磁気連想メモリ及び磁気連想メモリからの情報読み出し方法 |
| US7102920B2 (en) * | 2004-03-23 | 2006-09-05 | Hewlett-Packard Development Company, L.P. | Soft-reference three conductor magnetic memory storage device |
| US7130206B2 (en) * | 2004-09-30 | 2006-10-31 | Infineon Technologies Ag | Content addressable memory cell including resistive memory elements |
| US7532505B1 (en) | 2006-07-17 | 2009-05-12 | Grandis, Inc. | Method and system for using a pulsed field to assist spin transfer induced switching of magnetic memory elements |
| TWI449040B (zh) | 2006-10-06 | 2014-08-11 | Crocus Technology Sa | 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 |
| EP2109111B1 (en) | 2008-04-07 | 2011-12-21 | Crocus Technology S.A. | System and method for writing data to magnetoresistive random access memory cells |
-
2007
- 2007-10-05 TW TW096137428A patent/TWI449040B/zh not_active IP Right Cessation
- 2007-10-08 WO PCT/EP2007/008702 patent/WO2008040561A2/en not_active Ceased
- 2007-10-08 EP EP07818777A patent/EP2070089B1/en active Active
- 2007-10-08 JP JP2009530815A patent/JP5604107B2/ja not_active Expired - Fee Related
- 2007-10-09 US US11/869,632 patent/US7518897B2/en active Active
-
2009
- 2009-01-05 US US12/348,830 patent/US7791917B2/en active Active
- 2009-04-13 US US12/422,752 patent/US7894228B2/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW480489B (en) * | 1999-09-28 | 2002-03-21 | Infineon Technologies Ag | Magnetoresistive write/read-memory as well as method to write and read such a memory |
| US20050002228A1 (en) * | 2001-11-16 | 2005-01-06 | Bernard Dieny | Magnetic device with magnetic tunnel junction, memory array and read/write methods using same |
| US6778445B2 (en) * | 2002-08-09 | 2004-08-17 | Renesas Technology Corp. | Pipeline nonvolatile memory device with multi-bit parallel read and write suitable for cache memory. |
| US20050117391A1 (en) * | 2003-03-11 | 2005-06-02 | Hiroaki Yoda | Magnetic random access memory |
| US20050152179A1 (en) * | 2004-01-10 | 2005-07-14 | Honeywell International Inc. | Bias-adjusted magnetoresistive devices for magnetic random access memory (MRAM) applications |
| US20060039188A1 (en) * | 2004-08-23 | 2006-02-23 | Kochan Ju | Magnetic random access memory with stacked memory layers having access lines for writing and reading |
| US6992910B1 (en) * | 2004-11-18 | 2006-01-31 | Maglabs, Inc. | Magnetic random access memory with three or more stacked toggle memory cells and method for writing a selected cell |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200844997A (en) | 2008-11-16 |
| US7894228B2 (en) | 2011-02-22 |
| EP2070089B1 (en) | 2012-09-12 |
| WO2008040561A3 (en) | 2008-05-22 |
| US7791917B2 (en) | 2010-09-07 |
| WO2008040561A2 (en) | 2008-04-10 |
| US20080084724A1 (en) | 2008-04-10 |
| EP2070089A2 (en) | 2009-06-17 |
| US7518897B2 (en) | 2009-04-14 |
| JP2010506341A (ja) | 2010-02-25 |
| US20090109719A1 (en) | 2009-04-30 |
| JP5604107B2 (ja) | 2014-10-08 |
| US20090213632A1 (en) | 2009-08-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI449040B (zh) | 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 | |
| JP5674302B2 (ja) | 三値連想磁気抵抗ランダムアクセスメモリセル | |
| US7742329B2 (en) | Word line transistor strength control for read and write in spin transfer torque magnetoresistive random access memory | |
| US7508042B2 (en) | Spin transfer MRAM device with magnetic biasing | |
| JP5543287B2 (ja) | 究極の磁気ランダムアクセスメモリベース3値cam | |
| KR101086911B1 (ko) | 자기저항 효과 소자와 자기 랜덤 액세스 메모리 | |
| JP5172014B2 (ja) | スピントランスファトルクメモリ非破壊自己参照読取方法 | |
| US8159864B2 (en) | Data integrity preservation in spin transfer torque magnetoresistive random access memory | |
| JP2003151260A (ja) | 薄膜磁性体記憶装置 | |
| US20060013039A1 (en) | Read out scheme for several bits in a single MRAM soft layer | |
| TW201220310A (en) | Storage apparatus | |
| JP5653649B2 (ja) | 熱支援書き込み手順および低減された書き込み磁界を備えた磁気メモリ | |
| JP3788964B2 (ja) | 磁気ランダムアクセスメモリ | |
| US20130268795A1 (en) | Cache system and information-processing device | |
| Jaiswal et al. | Energy-efficient memory using magneto-electric switching of ferromagnets | |
| Xu et al. | Spin-transfer torque magnetoresistive content addressable memory (CAM) cell structure design with enhanced search noise margin |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |