JP2010182958A - 半導体装置および半導体装置の製造方法 - Google Patents
半導体装置および半導体装置の製造方法 Download PDFInfo
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- JP2010182958A JP2010182958A JP2009026509A JP2009026509A JP2010182958A JP 2010182958 A JP2010182958 A JP 2010182958A JP 2009026509 A JP2009026509 A JP 2009026509A JP 2009026509 A JP2009026509 A JP 2009026509A JP 2010182958 A JP2010182958 A JP 2010182958A
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- semiconductor device
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 117
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- 239000011347 resin Substances 0.000 claims abstract description 12
- 229920005989 resin Polymers 0.000 claims abstract description 12
- 239000012298 atmosphere Substances 0.000 claims abstract description 5
- 238000007789 sealing Methods 0.000 claims abstract description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 13
- 229910052710 silicon Inorganic materials 0.000 claims description 13
- 239000010703 silicon Substances 0.000 claims description 13
- 239000000853 adhesive Substances 0.000 claims description 10
- 238000005530 etching Methods 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 8
- 230000001070 adhesive effect Effects 0.000 claims description 7
- 230000017525 heat dissipation Effects 0.000 abstract description 10
- 238000000034 method Methods 0.000 description 6
- 239000004593 Epoxy Substances 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
- H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/1015—Shape
- H01L2924/10155—Shape being other than a cuboid
- H01L2924/10158—Shape being other than a cuboid at the passive surface
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009026509A JP2010182958A (ja) | 2009-02-06 | 2009-02-06 | 半導体装置および半導体装置の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009026509A JP2010182958A (ja) | 2009-02-06 | 2009-02-06 | 半導体装置および半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010182958A true JP2010182958A (ja) | 2010-08-19 |
JP2010182958A5 JP2010182958A5 (enrdf_load_stackoverflow) | 2012-01-26 |
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Application Number | Title | Priority Date | Filing Date |
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JP2009026509A Withdrawn JP2010182958A (ja) | 2009-02-06 | 2009-02-06 | 半導体装置および半導体装置の製造方法 |
Country Status (1)
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JP (1) | JP2010182958A (enrdf_load_stackoverflow) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011187518A (ja) * | 2010-03-05 | 2011-09-22 | Nippon Telegr & Teleph Corp <Ntt> | 半導体装置およびその製造方法 |
JP2013182923A (ja) * | 2012-02-29 | 2013-09-12 | Canon Inc | 光電変換装置、撮像システムおよび光電変換装置の製造方法 |
JP2015122495A (ja) * | 2013-12-20 | 2015-07-02 | タレス | 高周波相互接続素子 |
KR20160006702A (ko) | 2013-05-07 | 2016-01-19 | 피에스4 뤽스코 에스.에이.알.엘. | 반도체 장치 및 반도체 장치의 제조 방법 |
JP2016139654A (ja) * | 2015-01-26 | 2016-08-04 | 株式会社ジェイデバイス | 半導体装置 |
WO2017089107A1 (de) * | 2015-11-24 | 2017-06-01 | Snaptrack, Inc. | Elektrisches bauelement mit waermeableitung |
JP2018014519A (ja) * | 2017-09-12 | 2018-01-25 | キヤノン株式会社 | 光電変換装置、撮像システムおよび光電変換装置の製造方法 |
JP2018078177A (ja) * | 2016-11-09 | 2018-05-17 | Tdk株式会社 | ショットキーバリアダイオード及びこれを備える電子回路 |
CN111554644A (zh) * | 2020-06-12 | 2020-08-18 | 厦门通富微电子有限公司 | 一种芯片、芯片封装体及晶圆 |
CN114093831A (zh) * | 2021-11-12 | 2022-02-25 | 绍兴同芯成集成电路有限公司 | 一种键合鳍状硅板的GaN晶圆加工工艺 |
DE102021130989A1 (de) | 2021-11-25 | 2023-05-25 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Elektronisches bauelement und verfahren zum herstellen eines elektronischen bauelements |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61161745A (ja) * | 1985-01-10 | 1986-07-22 | Matsushita Electronics Corp | 半導体装置 |
JPH06196511A (ja) * | 1992-12-24 | 1994-07-15 | Kawasaki Steel Corp | 半導体デバイス |
JPH06310626A (ja) * | 1993-04-20 | 1994-11-04 | Hitachi Ltd | 半導体チップ及び半導体集積回路装置 |
JP2000012743A (ja) * | 1998-06-22 | 2000-01-14 | Matsushita Electric Ind Co Ltd | 電子回路装置及びその製造方法 |
JP2001338932A (ja) * | 2000-05-29 | 2001-12-07 | Canon Inc | 半導体装置及び半導体装置の製造方法 |
JP2003282817A (ja) * | 2002-03-27 | 2003-10-03 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
JP2003347488A (ja) * | 2002-05-27 | 2003-12-05 | Denso Corp | 半導体装置およびその製造方法 |
JP2005223580A (ja) * | 2004-02-05 | 2005-08-18 | Matsushita Electric Ind Co Ltd | 弾性表面波素子、弾性表面波デバイス及びその製造方法 |
JP2005328073A (ja) * | 2005-06-21 | 2005-11-24 | Toshiba Corp | 半導体発光素子の製造方法 |
JP2006086192A (ja) * | 2004-09-14 | 2006-03-30 | Sumitomo Electric Ind Ltd | 発光装置 |
JP2006186173A (ja) * | 2004-12-28 | 2006-07-13 | Shin Etsu Handotai Co Ltd | レーザーマーク付き半導体ウェーハの製造方法、及びその半導体ウェーハ |
JP2007134454A (ja) * | 2005-11-09 | 2007-05-31 | Toshiba Corp | 半導体装置の製造方法 |
-
2009
- 2009-02-06 JP JP2009026509A patent/JP2010182958A/ja not_active Withdrawn
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS61161745A (ja) * | 1985-01-10 | 1986-07-22 | Matsushita Electronics Corp | 半導体装置 |
JPH06196511A (ja) * | 1992-12-24 | 1994-07-15 | Kawasaki Steel Corp | 半導体デバイス |
JPH06310626A (ja) * | 1993-04-20 | 1994-11-04 | Hitachi Ltd | 半導体チップ及び半導体集積回路装置 |
JP2000012743A (ja) * | 1998-06-22 | 2000-01-14 | Matsushita Electric Ind Co Ltd | 電子回路装置及びその製造方法 |
JP2001338932A (ja) * | 2000-05-29 | 2001-12-07 | Canon Inc | 半導体装置及び半導体装置の製造方法 |
JP2003282817A (ja) * | 2002-03-27 | 2003-10-03 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
JP2003347488A (ja) * | 2002-05-27 | 2003-12-05 | Denso Corp | 半導体装置およびその製造方法 |
JP2005223580A (ja) * | 2004-02-05 | 2005-08-18 | Matsushita Electric Ind Co Ltd | 弾性表面波素子、弾性表面波デバイス及びその製造方法 |
JP2006086192A (ja) * | 2004-09-14 | 2006-03-30 | Sumitomo Electric Ind Ltd | 発光装置 |
JP2006186173A (ja) * | 2004-12-28 | 2006-07-13 | Shin Etsu Handotai Co Ltd | レーザーマーク付き半導体ウェーハの製造方法、及びその半導体ウェーハ |
JP2005328073A (ja) * | 2005-06-21 | 2005-11-24 | Toshiba Corp | 半導体発光素子の製造方法 |
JP2007134454A (ja) * | 2005-11-09 | 2007-05-31 | Toshiba Corp | 半導体装置の製造方法 |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011187518A (ja) * | 2010-03-05 | 2011-09-22 | Nippon Telegr & Teleph Corp <Ntt> | 半導体装置およびその製造方法 |
US9881957B2 (en) | 2012-02-29 | 2018-01-30 | Canon Kabushiki Kaisha | Photoelectric conversion device, image pickup system and method of manufacturing photoelectric conversion device |
JP2013182923A (ja) * | 2012-02-29 | 2013-09-12 | Canon Inc | 光電変換装置、撮像システムおよび光電変換装置の製造方法 |
US9368544B2 (en) | 2012-02-29 | 2016-06-14 | Canon Kabushiki Kaisha | Photoelectric conversion device, image pickup system and method of manufacturing photoelectric conversion device |
US10546891B2 (en) | 2012-02-29 | 2020-01-28 | Canon Kabushiki Kaisha | Photoelectric conversion device, image pickup system and method of manufacturing photoelectric conversion device |
KR20160006702A (ko) | 2013-05-07 | 2016-01-19 | 피에스4 뤽스코 에스.에이.알.엘. | 반도체 장치 및 반도체 장치의 제조 방법 |
JP2015122495A (ja) * | 2013-12-20 | 2015-07-02 | タレス | 高周波相互接続素子 |
JP2016139654A (ja) * | 2015-01-26 | 2016-08-04 | 株式会社ジェイデバイス | 半導体装置 |
US11101784B2 (en) | 2015-11-24 | 2021-08-24 | Snaptrack, Inc. | Electrical component with heat dissipation |
WO2017089107A1 (de) * | 2015-11-24 | 2017-06-01 | Snaptrack, Inc. | Elektrisches bauelement mit waermeableitung |
CN108604892A (zh) * | 2015-11-24 | 2018-09-28 | 追踪有限公司 | 具有散热的电气元器件 |
WO2018088018A1 (ja) * | 2016-11-09 | 2018-05-17 | Tdk株式会社 | ショットキーバリアダイオード及びこれを備える電子回路 |
JP2018078177A (ja) * | 2016-11-09 | 2018-05-17 | Tdk株式会社 | ショットキーバリアダイオード及びこれを備える電子回路 |
JP2018014519A (ja) * | 2017-09-12 | 2018-01-25 | キヤノン株式会社 | 光電変換装置、撮像システムおよび光電変換装置の製造方法 |
CN111554644A (zh) * | 2020-06-12 | 2020-08-18 | 厦门通富微电子有限公司 | 一种芯片、芯片封装体及晶圆 |
CN114093831A (zh) * | 2021-11-12 | 2022-02-25 | 绍兴同芯成集成电路有限公司 | 一种键合鳍状硅板的GaN晶圆加工工艺 |
DE102021130989A1 (de) | 2021-11-25 | 2023-05-25 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Elektronisches bauelement und verfahren zum herstellen eines elektronischen bauelements |
JP2024540770A (ja) * | 2021-11-25 | 2024-11-01 | エイエムエス-オスラム インターナショナル ゲーエムベーハー | 電子部品及び電子部品を製造するための方法 |
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