JP2010164490A5 - - Google Patents

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Publication number
JP2010164490A5
JP2010164490A5 JP2009008181A JP2009008181A JP2010164490A5 JP 2010164490 A5 JP2010164490 A5 JP 2010164490A5 JP 2009008181 A JP2009008181 A JP 2009008181A JP 2009008181 A JP2009008181 A JP 2009008181A JP 2010164490 A5 JP2010164490 A5 JP 2010164490A5
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JP
Japan
Prior art keywords
disposed
wiring
test apparatus
wiring board
electrically connected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009008181A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010164490A (ja
JP5258590B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2009008181A priority Critical patent/JP5258590B2/ja
Priority claimed from JP2009008181A external-priority patent/JP5258590B2/ja
Publication of JP2010164490A publication Critical patent/JP2010164490A/ja
Publication of JP2010164490A5 publication Critical patent/JP2010164490A5/ja
Application granted granted Critical
Publication of JP5258590B2 publication Critical patent/JP5258590B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009008181A 2009-01-16 2009-01-16 集積回路の試験装置 Active JP5258590B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009008181A JP5258590B2 (ja) 2009-01-16 2009-01-16 集積回路の試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009008181A JP5258590B2 (ja) 2009-01-16 2009-01-16 集積回路の試験装置

Publications (3)

Publication Number Publication Date
JP2010164490A JP2010164490A (ja) 2010-07-29
JP2010164490A5 true JP2010164490A5 (enExample) 2012-01-26
JP5258590B2 JP5258590B2 (ja) 2013-08-07

Family

ID=42580768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009008181A Active JP5258590B2 (ja) 2009-01-16 2009-01-16 集積回路の試験装置

Country Status (1)

Country Link
JP (1) JP5258590B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5928203B2 (ja) 2012-07-10 2016-06-01 三菱電機株式会社 検査装置
CN103795340A (zh) * 2014-02-14 2014-05-14 苏州众显电子科技有限公司 一种聚光型便携光源的功率表测试高倍聚光电池片装置
CN105353253B (zh) * 2015-11-28 2018-04-10 南通华夏飞机工程技术股份有限公司 航空风扇测试电路
JP7157410B2 (ja) * 2018-02-21 2022-10-20 国立大学法人大阪大学 半導体検査装置及び半導体検査方法
KR102840197B1 (ko) 2021-04-23 2025-07-31 삼성전자주식회사 전원변환부를 갖는 프로브 카드 및 이를 포함하는 테스트 시스템

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1243302B (it) * 1990-06-19 1994-05-26 St Microelectronics Srl Connessione universale multicontatto tra scheda portasonde ews e scheda di prova per una stazione di collaudo su fetta di dispositivi a semiconduttore.
JP4794777B2 (ja) * 2001-09-13 2011-10-19 オリンパス株式会社 内視鏡用光源装置の回転フィルタ
JP4439360B2 (ja) * 2004-09-14 2010-03-24 株式会社日本マイクロニクス 電気的接続装置
WO2007142204A1 (ja) * 2006-06-08 2007-12-13 Nhk Spring Co., Ltd. プローブカード
JP2008128838A (ja) * 2006-11-21 2008-06-05 Shinko Electric Ind Co Ltd プローブ装置
JP4981525B2 (ja) * 2007-06-04 2012-07-25 日本電子材料株式会社 半導体検査装置

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