|
JP5587985B2
(ja)
|
2009-05-19 |
2014-09-10 |
コーニンクレッカ フィリップス エヌ ヴェ |
位相コントラストイメージング用格子
|
|
JP5459659B2
(ja)
*
|
2009-10-09 |
2014-04-02 |
キヤノン株式会社 |
Ｘ線位相コントラスト像の撮像に用いられる位相格子、該位相格子を用いた撮像装置、ｘ線コンピューター断層撮影システム
|
|
CN102651994A
(zh)
*
|
2009-12-10 |
2012-08-29 |
皇家飞利浦电子股份有限公司 |
微分相位对比成像系统的校准
|
|
JP5578868B2
(ja)
*
|
2010-01-26 |
2014-08-27 |
キヤノン株式会社 |
光源格子、該光源格子を備えたｘ線位相コントラスト像の撮像装置、ｘ線コンピューター断層撮影システム
|
|
US8532252B2
(en)
*
|
2010-01-27 |
2013-09-10 |
Canon Kabushiki Kaisha |
X-ray shield grating, manufacturing method therefor, and X-ray imaging apparatus
|
|
JP2012068225A
(ja)
*
|
2010-08-25 |
2012-04-05 |
Fujifilm Corp |
放射線画像撮影用グリッド及びその製造方法
|
|
JP5504104B2
(ja)
*
|
2010-08-31 |
2014-05-28 |
株式会社東芝 |
Ｍｏコリメータおよびそれを用いたＸ線検出器並びにＣＴ装置
|
|
WO2012032950A1
(en)
*
|
2010-09-08 |
2012-03-15 |
Canon Kabushiki Kaisha |
X-ray differential phase contrast imaging using a two-dimensional source grating with pinhole apertures and two-dimensional phase and absorption gratings
|
|
JP2012103237A
(ja)
*
|
2010-10-14 |
2012-05-31 |
Canon Inc |
撮像装置
|
|
RU2573114C2
(ru)
*
|
2010-10-19 |
2016-01-20 |
Конинклейке Филипс Электроникс Н.В. |
Формирование изображений методом дифференциального фазового контраста
|
|
US9861330B2
(en)
*
|
2010-10-19 |
2018-01-09 |
Koninklijke Philips N.V. |
Differential phase-contrast imaging
|
|
JP2012095865A
(ja)
*
|
2010-11-02 |
2012-05-24 |
Fujifilm Corp |
放射線撮影装置、放射線撮影システム
|
|
WO2012063169A1
(en)
*
|
2010-11-08 |
2012-05-18 |
Koninklijke Philips Electronics N.V. |
Grating for phase contrast imaging
|
|
EP2671230B1
(en)
*
|
2011-02-01 |
2018-05-16 |
Koninklijke Philips N.V. |
Differential phase-contrast imaging with focussing deflection structure plates
|
|
CN103348415B
(zh)
*
|
2011-02-07 |
2016-05-25 |
皇家飞利浦有限公司 |
具有增大的动态范围的微分相衬成像
|
|
JP5930614B2
(ja)
*
|
2011-06-02 |
2016-06-08 |
キヤノン株式会社 |
Ｘ線撮像装置
|
|
US20150117599A1
(en)
|
2013-10-31 |
2015-04-30 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
EP2822468B1
(en)
*
|
2012-03-05 |
2017-11-01 |
University Of Rochester |
Methods and apparatus for differential phase-contrast cone-beam ct and hybrid cone-beam ct
|
|
US20130259194A1
(en)
*
|
2012-03-30 |
2013-10-03 |
Kwok L. Yip |
Hybrid slot-scanning grating-based differential phase contrast imaging system for medical radiographic imaging
|
|
WO2013187970A2
(en)
*
|
2012-05-14 |
2013-12-19 |
The General Hospital Corporation |
Method for coded-source phase contrast x-ray imaging
|
|
FI20126119L
(fi)
|
2012-10-29 |
2014-04-30 |
Teknologian Tutkimuskeskus Vtt Oy |
Interferometrinen dynaamihila-kuvannusmenetelmä, diffraktiohila ja kuvannuslaitteisto
|
|
US8989347B2
(en)
|
2012-12-19 |
2015-03-24 |
General Electric Company |
Image reconstruction method for differential phase contrast X-ray imaging
|
|
US9357975B2
(en)
|
2013-12-30 |
2016-06-07 |
Carestream Health, Inc. |
Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
|
|
US10578563B2
(en)
|
2012-12-21 |
2020-03-03 |
Carestream Health, Inc. |
Phase contrast imaging computed tomography scanner
|
|
US9907524B2
(en)
|
2012-12-21 |
2018-03-06 |
Carestream Health, Inc. |
Material decomposition technique using x-ray phase contrast imaging system
|
|
US9700267B2
(en)
|
2012-12-21 |
2017-07-11 |
Carestream Health, Inc. |
Method and apparatus for fabrication and tuning of grating-based differential phase contrast imaging system
|
|
US9724063B2
(en)
|
2012-12-21 |
2017-08-08 |
Carestream Health, Inc. |
Surrogate phantom for differential phase contrast imaging
|
|
US10096098B2
(en)
|
2013-12-30 |
2018-10-09 |
Carestream Health, Inc. |
Phase retrieval from differential phase contrast imaging
|
|
US9494534B2
(en)
|
2012-12-21 |
2016-11-15 |
Carestream Health, Inc. |
Material differentiation with phase contrast imaging
|
|
US9014333B2
(en)
|
2012-12-31 |
2015-04-21 |
General Electric Company |
Image reconstruction methods for differential phase contrast X-ray imaging
|
|
DE102013205406A1
(de)
*
|
2013-03-27 |
2014-10-16 |
Siemens Aktiengesellschaft |
Röntgenaufnahmesystem zur Röntgenbildgebung bei hohen Bildfrequenzen eines Untersuchungsobjekts mittels direkter Messung des Interferenzmusters
|
|
EP2827339A1
(en)
*
|
2013-07-16 |
2015-01-21 |
Canon Kabushiki Kaisha |
Source grating, interferometer, and object information acquisition system
|
|
JP6362103B2
(ja)
*
|
2013-09-04 |
2018-07-25 |
キヤノン株式会社 |
遮蔽格子及びトールボット干渉計
|
|
US10297359B2
(en)
|
2013-09-19 |
2019-05-21 |
Sigray, Inc. |
X-ray illumination system with multiple target microstructures
|
|
US10295485B2
(en)
|
2013-12-05 |
2019-05-21 |
Sigray, Inc. |
X-ray transmission spectrometer system
|
|
US10269528B2
(en)
|
2013-09-19 |
2019-04-23 |
Sigray, Inc. |
Diverging X-ray sources using linear accumulation
|
|
CN105612584B
(zh)
*
|
2013-10-07 |
2018-12-04 |
西门子医疗有限公司 |
相衬x射线成像设备及其相位光栅
|
|
US10304580B2
(en)
|
2013-10-31 |
2019-05-28 |
Sigray, Inc. |
Talbot X-ray microscope
|
|
USRE48612E1
(en)
|
2013-10-31 |
2021-06-29 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
US20150325322A1
(en)
*
|
2014-05-08 |
2015-11-12 |
General Electric Company |
X-ray anti-scatter grid
|
|
US10401309B2
(en)
|
2014-05-15 |
2019-09-03 |
Sigray, Inc. |
X-ray techniques using structured illumination
|
|
DE102014221599A1
(de)
*
|
2014-10-23 |
2016-04-28 |
Siemens Aktiengesellschaft |
Vorrichtung und Verfahren zur Röntgen-Phasenkontrast-Bildgebung
|
|
CN105628718A
(zh)
*
|
2014-11-04 |
2016-06-01 |
同方威视技术股份有限公司 |
多能谱x射线光栅成像系统与成像方法
|
|
CN107209393B
(zh)
*
|
2015-01-28 |
2022-02-08 |
镭亚股份有限公司 |
三维（3d）电子显示器
|
|
CN106033133B
(zh)
*
|
2015-03-11 |
2019-09-17 |
同方威视技术股份有限公司 |
一种光栅、制造方法和辐射成像装置
|
|
US10352880B2
(en)
|
2015-04-29 |
2019-07-16 |
Sigray, Inc. |
Method and apparatus for x-ray microscopy
|
|
WO2017001256A1
(en)
*
|
2015-06-29 |
2017-01-05 |
Koninklijke Philips N.V. |
A system for generating and collimating an x-ray beam
|
|
US10295486B2
(en)
|
2015-08-18 |
2019-05-21 |
Sigray, Inc. |
Detector for X-rays with high spatial and high spectral resolution
|
|
US20180001111A1
(en)
*
|
2016-06-30 |
2018-01-04 |
The Johns Hopkins University |
Method for optimizing radiation beam intensity profile shape using dual multiple aperture devices
|
|
CN109788928B
(zh)
*
|
2016-09-27 |
2022-03-25 |
株式会社岛津制作所 |
放射线相位差摄影装置
|
|
US10247683B2
(en)
|
2016-12-03 |
2019-04-02 |
Sigray, Inc. |
Material measurement techniques using multiple X-ray micro-beams
|
|
JP6753342B2
(ja)
*
|
2017-03-15 |
2020-09-09 |
株式会社島津製作所 |
放射線格子検出器およびｘ線検査装置
|
|
WO2018175570A1
(en)
|
2017-03-22 |
2018-09-27 |
Sigray, Inc. |
Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
|
|
CN110832309B
(zh)
*
|
2017-10-31 |
2022-08-23 |
株式会社岛津制作所 |
X射线相位差摄像系统
|
|
US10578566B2
(en)
|
2018-04-03 |
2020-03-03 |
Sigray, Inc. |
X-ray emission spectrometer system
|
|
WO2019236384A1
(en)
|
2018-06-04 |
2019-12-12 |
Sigray, Inc. |
Wavelength dispersive x-ray spectrometer
|
|
JP7117452B2
(ja)
|
2018-07-26 |
2022-08-12 |
シグレイ、インコーポレイテッド |
高輝度反射型ｘ線源
|
|
US10656105B2
(en)
|
2018-08-06 |
2020-05-19 |
Sigray, Inc. |
Talbot-lau x-ray source and interferometric system
|
|
CN112638261B
(zh)
|
2018-09-04 |
2025-06-27 |
斯格瑞公司 |
利用滤波的x射线荧光的系统和方法
|
|
US11056308B2
(en)
|
2018-09-07 |
2021-07-06 |
Sigray, Inc. |
System and method for depth-selectable x-ray analysis
|
|
WO2021046059A1
(en)
|
2019-09-03 |
2021-03-11 |
Sigray, Inc. |
System and method for computed laminography x-ray fluorescence imaging
|
|
CN110833427B
(zh)
*
|
2019-11-29 |
2021-01-29 |
清华大学 |
光栅成像系统及其扫描方法
|
|
US11175243B1
(en)
|
2020-02-06 |
2021-11-16 |
Sigray, Inc. |
X-ray dark-field in-line inspection for semiconductor samples
|
|
WO2021162947A1
(en)
|
2020-02-10 |
2021-08-19 |
Sigray, Inc. |
X-ray mirror optics with multiple hyperboloidal / hyperbolic surface profiles
|
|
WO2021237237A1
(en)
|
2020-05-18 |
2021-11-25 |
Sigray, Inc. |
System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
|
|
DE112021004828T5
(de)
|
2020-09-17 |
2023-08-03 |
Sigray, Inc. |
System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse
|
|
US11686692B2
(en)
|
2020-12-07 |
2023-06-27 |
Sigray, Inc. |
High throughput 3D x-ray imaging system using a transmission x-ray source
|
|
US12480892B2
(en)
|
2020-12-07 |
2025-11-25 |
Sigray, Inc. |
High throughput 3D x-ray imaging system using a transmission x-ray source
|
|
CN113205899B
(zh)
*
|
2021-04-25 |
2023-02-28 |
中国工程物理研究院激光聚变研究中心 |
一种x射线折射闪耀光栅及制备方法
|
|
CN114371529B
(zh)
*
|
2022-01-30 |
2024-01-09 |
珠海莫界科技有限公司 |
一种堆叠光栅及ar显示装置
|
|
US12360067B2
(en)
|
2022-03-02 |
2025-07-15 |
Sigray, Inc. |
X-ray fluorescence system and x-ray source with electrically insulative target material
|
|
WO2023177981A1
(en)
|
2022-03-15 |
2023-09-21 |
Sigray, Inc. |
System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
|
|
DE112023002079T5
(de)
|
2022-05-02 |
2025-02-27 |
Sigray, Inc. |
Sequenzielles wellenlängendispersives röntgenspektrometer
|
|
US12055737B2
(en)
|
2022-05-18 |
2024-08-06 |
GE Precision Healthcare LLC |
Aligned and stacked high-aspect ratio metallized structures
|
|
DE112024000873T5
(de)
|
2023-02-16 |
2026-01-15 |
Sigray, Inc. |
Röntgen-detektorsystem mit mindestens zwei gestapelten flachen bragg-diffraktoren
|
|
US12181423B1
(en)
|
2023-09-07 |
2024-12-31 |
Sigray, Inc. |
Secondary image removal using high resolution x-ray transmission sources
|
|
US12429437B2
(en)
|
2023-11-07 |
2025-09-30 |
Sigray, Inc. |
System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
|
|
WO2025151383A1
(en)
|
2024-01-08 |
2025-07-17 |
Sigray, Inc. |
X-ray analysis system with focused x-ray beam and non-x-ray microscope
|
|
WO2025155719A1
(en)
|
2024-01-18 |
2025-07-24 |
Sigray, Inc. |
Sequential array of x-ray imaging detectors
|
|
WO2025174966A1
(en)
|
2024-02-15 |
2025-08-21 |
Sigray, Inc. |
System and method for generating a focused x‑ray beam
|
|
CN118131380A
(zh)
*
|
2024-04-03 |
2024-06-04 |
清华大学 |
高深宽比x射线光栅的制造方法及高深宽比x射线光栅
|
