JP2013541397A5 - - Google Patents

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Publication number
JP2013541397A5
JP2013541397A5 JP2013537243A JP2013537243A JP2013541397A5 JP 2013541397 A5 JP2013541397 A5 JP 2013541397A5 JP 2013537243 A JP2013537243 A JP 2013537243A JP 2013537243 A JP2013537243 A JP 2013537243A JP 2013541397 A5 JP2013541397 A5 JP 2013541397A5
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Japan
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JP2013537243A
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Japanese (ja)
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JP2013541397A (ja
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Priority claimed from PCT/IB2011/054890 external-priority patent/WO2012063169A1/en
Publication of JP2013541397A publication Critical patent/JP2013541397A/ja
Publication of JP2013541397A5 publication Critical patent/JP2013541397A5/ja
Ceased legal-status Critical Current

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JP2013537243A 2010-11-08 2011-11-03 位相コントラスト撮像に関する格子 Ceased JP2013541397A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP10190351 2010-11-08
EP10190351.6 2010-11-08
PCT/IB2011/054890 WO2012063169A1 (en) 2010-11-08 2011-11-03 Grating for phase contrast imaging

Publications (2)

Publication Number Publication Date
JP2013541397A JP2013541397A (ja) 2013-11-14
JP2013541397A5 true JP2013541397A5 (enExample) 2014-12-18

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ID=45370530

Family Applications (1)

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JP2013537243A Ceased JP2013541397A (ja) 2010-11-08 2011-11-03 位相コントラスト撮像に関する格子

Country Status (7)

Country Link
US (1) US20130223595A1 (enExample)
EP (1) EP2637565A1 (enExample)
JP (1) JP2013541397A (enExample)
CN (1) CN103200874B (enExample)
BR (1) BR112013011028A2 (enExample)
RU (1) RU2013126110A (enExample)
WO (1) WO2012063169A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201119257D0 (en) * 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
GB201308818D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-ray detector apparatus
GB201308876D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-Ray imaging apparatus and methods
GB201308851D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd Multi-spectral x-ray detection apparatus
CN106033133B (zh) * 2015-03-11 2019-09-17 同方威视技术股份有限公司 一种光栅、制造方法和辐射成像装置
WO2016181715A1 (ja) * 2015-05-12 2016-11-17 株式会社島津製作所 放射線源およびそれを備えた放射線位相差撮影装置
JP6430636B2 (ja) 2015-08-26 2018-11-28 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． デュアルエネルギー微分位相コントラスト撮像
CN109478440A (zh) * 2016-06-08 2019-03-15 皇家飞利浦有限公司 用于相位衬度成像和/或暗场成像的分析格栅
WO2018108853A1 (en) * 2016-12-15 2018-06-21 Koninklijke Philips N.V. Grating structure for x-ray imaging

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5606589A (en) * 1995-05-09 1997-02-25 Thermo Trex Corporation Air cross grids for mammography and methods for their manufacture and use
US7141812B2 (en) * 2002-06-05 2006-11-28 Mikro Systems, Inc. Devices, methods, and systems involving castings
JP4445397B2 (ja) * 2002-12-26 2010-04-07 敦 百生 Ｘ線撮像装置および撮像方法
DE10322531B4 (de) * 2003-05-19 2010-09-16 Siemens Ag Streustrahlenraster oder Kollimator
DE10354808A1 (de) * 2003-11-21 2005-06-30 Siemens Ag Verfahren zur Abschattung von Streustrahlung vor einem Detektorarray
DE102006015358B4 (de) * 2006-02-01 2019-08-22 Paul Scherer Institut Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, zugehöriges Röntgen-System sowie Speichermedium und Verfahren zur Erzeugung tomographischer Aufnahmen
DE102006037254B4 (de) * 2006-02-01 2017-08-03 Paul Scherer Institut Fokus-Detektor-Anordnung zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen mit röntgenoptischen Gittern, sowie Röntgen-System, Röntgen-C-Bogen-System und Röntgen-Computer-Tomographie-System
DE102006063048B3 (de) * 2006-02-01 2018-03-29 Siemens Healthcare Gmbh Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen
DE102006037281A1 (de) * 2006-02-01 2007-08-09 Siemens Ag Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt
JP5493852B2 (ja) * 2007-02-21 2014-05-14 コニカミノルタ株式会社 放射線画像撮影装置
DE102007024156B3 (de) * 2007-05-24 2008-12-11 Siemens Ag Röntgenabsorptionsgitter
JP5339975B2 (ja) * 2008-03-13 2013-11-13 キヤノン株式会社 Ｘ線位相イメージングに用いられる位相格子、該位相格子を用いたｘ線位相コントラスト像の撮像装置、ｘ線コンピューター断層撮影システム
EP2257793B1 (en) * 2008-03-19 2015-05-13 Koninklijke Philips N.V. Rotational x-ray device for phase contrast imaging comprising a ring-shaped grating
JP5451150B2 (ja) * 2008-04-15 2014-03-26 キヤノン株式会社 Ｘ線用線源格子、ｘ線位相コントラスト像の撮像装置
DE102008048683A1 (de) * 2008-09-24 2010-04-08 Siemens Aktiengesellschaft Verfahren zur Bestimmung von Phase und/oder Amplitude zwischen interferierenden benachbarten Röntgenstrahlen in einem Detektorpixel bei einem Talbot-Interferometer
EP2168488B1 (de) * 2008-09-30 2013-02-13 Siemens Aktiengesellschaft Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung
US7949095B2 (en) * 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
JP5587985B2 (ja) * 2009-05-19 2014-09-10 コーニンクレッカ フィリップス エヌ ヴェ 位相コントラストイメージング用格子

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