JP2014518112A5 - - Google Patents
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- JP2014518112A5 JP2014518112A5 JP2014517686A JP2014517686A JP2014518112A5 JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5 JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5
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- JP
- Japan
- Prior art keywords
- grating
- imaging system
- ray
- detector
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000003384 imaging method Methods 0.000 claims 19
- 238000006073 displacement reaction Methods 0.000 claims 5
- 230000006835 compression Effects 0.000 claims 3
- 238000007906 compression Methods 0.000 claims 3
- 230000000694 effects Effects 0.000 claims 3
- 210000000481 breast Anatomy 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 230000009897 systematic effect Effects 0.000 claims 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161504260P | 2011-07-04 | 2011-07-04 | |
| SE1150622-7 | 2011-07-04 | ||
| US61/504,260 | 2011-07-04 | ||
| SE1150622 | 2011-07-04 | ||
| PCT/EP2012/062489 WO2013004574A1 (en) | 2011-07-04 | 2012-06-27 | Phase contrast imaging apparatus |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014518112A JP2014518112A (ja) | 2014-07-28 |
| JP2014518112A5 true JP2014518112A5 (enExample) | 2015-07-09 |
| JP6353361B2 JP6353361B2 (ja) | 2018-07-04 |
Family
ID=47436543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014517686A Expired - Fee Related JP6353361B2 (ja) | 2011-07-04 | 2012-06-27 | 位相コントラストイメージング装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9757082B2 (enExample) |
| EP (1) | EP2729069B1 (enExample) |
| JP (1) | JP6353361B2 (enExample) |
| CN (1) | CN103648388B (enExample) |
| RU (1) | RU2620892C2 (enExample) |
| WO (1) | WO2013004574A1 (enExample) |
Families Citing this family (52)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US9597050B2 (en) | 2012-01-24 | 2017-03-21 | Koninklijke Philips N.V. | Multi-directional phase contrast X-ray imaging |
| WO2014030115A1 (en) | 2012-08-20 | 2014-02-27 | Koninklijke Philips N.V. | Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging |
| US9971078B2 (en) * | 2013-03-05 | 2018-05-15 | Rambus Inc. | Phase gratings with odd symmetry for high-resolution lensless optical sensing |
| CN105228524A (zh) * | 2013-05-22 | 2016-01-06 | 西门子股份公司 | 相位对比x射线成像设备 |
| EP3013233B1 (en) | 2013-06-28 | 2017-11-15 | Koninklijke Philips N.V. | Correction in slit-scanning phase contrast imaging |
| US9297772B2 (en) | 2013-07-30 | 2016-03-29 | Industrial Technology Research Institute | Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| US10416099B2 (en) | 2013-09-19 | 2019-09-17 | Sigray, Inc. | Method of performing X-ray spectroscopy and X-ray absorption spectrometer system |
| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| JP6106809B2 (ja) | 2013-09-30 | 2017-04-05 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 可動式格子を含む微分位相コントラスト撮像装置 |
| CN105682553A (zh) * | 2013-10-22 | 2016-06-15 | 皇家飞利浦有限公司 | 用于采集对象的图像的x射线系统特别是断层摄影组合系统和方法 |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| RU2677763C1 (ru) * | 2013-12-17 | 2019-01-21 | Конинклейке Филипс Н.В. | Получение фазы для систем сканирования с дифференциальным фазовым контрастом |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| TWI629474B (zh) | 2014-05-23 | 2018-07-11 | 財團法人工業技術研究院 | X光光源以及x光成像的方法 |
| JP6369206B2 (ja) * | 2014-08-06 | 2018-08-08 | コニカミノルタ株式会社 | X線撮影システム及び画像処理装置 |
| WO2016083182A1 (en) | 2014-11-24 | 2016-06-02 | Koninklijke Philips N.V. | Detector and imaging system for x-ray phase contrast tomo-synthesis imaging |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| CN106483548B (zh) * | 2015-08-28 | 2019-07-26 | 北京纳米维景科技有限公司 | 一种光子计数探测器阵列及其成像方法 |
| WO2017093055A1 (en) | 2015-12-01 | 2017-06-08 | Koninklijke Philips N.V. | Apparatus for x-ray imaging an object |
| JP6613988B2 (ja) * | 2016-03-30 | 2019-12-04 | コニカミノルタ株式会社 | 放射線撮影システム |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| EP3444826A1 (en) * | 2017-08-14 | 2019-02-20 | Koninklijke Philips N.V. | Low profile anti scatter and anti charge sharing grid for photon counting computed tomography |
| EP3446630A1 (en) | 2017-08-23 | 2019-02-27 | Koninklijke Philips N.V. | Device and method for phase stepping in phase contrast image acquisition |
| EP3447538A1 (en) * | 2017-08-23 | 2019-02-27 | Koninklijke Philips N.V. | X-ray detection |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| WO2019236384A1 (en) | 2018-06-04 | 2019-12-12 | Sigray, Inc. | Wavelength dispersive x-ray spectrometer |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| WO2020051061A1 (en) | 2018-09-04 | 2020-03-12 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| CN113167917B (zh) | 2018-11-19 | 2024-03-12 | 棱镜传感器公司 | 使用光子计数事件进行相衬成像的x射线成像系统 |
| DE112020004169T5 (de) | 2019-09-03 | 2022-05-25 | Sigray, Inc. | System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| CN114930162A (zh) * | 2020-02-27 | 2022-08-19 | 深圳帧观德芯科技有限公司 | 相位对比成像法 |
| CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
| US11549895B2 (en) | 2020-09-17 | 2023-01-10 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| WO2022126071A1 (en) | 2020-12-07 | 2022-06-16 | Sigray, Inc. | High throughput 3d x-ray imaging system using a transmission x-ray source |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| WO2023177981A1 (en) | 2022-03-15 | 2023-09-21 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| WO2023215204A1 (en) | 2022-05-02 | 2023-11-09 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
| US12209977B2 (en) | 2023-02-16 | 2025-01-28 | Sigray, Inc. | X-ray detector system with at least two stacked flat Bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| CN120195197A (zh) * | 2023-12-21 | 2025-06-24 | 清华大学 | 辐射成像设备和方法 |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| US12431256B2 (en) | 2024-02-15 | 2025-09-30 | Sigray, Inc. | System and method for generating a focused x-ray beam |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5335255A (en) * | 1992-03-24 | 1994-08-02 | Seppi Edward J | X-ray scanner with a source emitting plurality of fan beams |
| US5812629A (en) * | 1997-04-30 | 1998-09-22 | Clauser; John F. | Ultrahigh resolution interferometric x-ray imaging |
| RU2150888C1 (ru) * | 1998-06-26 | 2000-06-20 | Технико-медицинское отделение Научно-исследовательского института электромеханики | Аппарат рентгеновский |
| SE528366C2 (sv) | 2004-02-13 | 2006-10-31 | Sectra Mamea Ab | Metod och anordning avseende röntgenbildtagning |
| US7412026B2 (en) * | 2004-07-02 | 2008-08-12 | The Board Of Regents Of The University Of Oklahoma | Phase-contrast x-ray imaging systems and methods |
| US7583779B2 (en) * | 2004-11-24 | 2009-09-01 | General Electric Company | System and method for acquisition and reconstruction of contrast-enhanced, artifact-reduced CT images |
| US7869563B2 (en) * | 2004-11-26 | 2011-01-11 | Hologic, Inc. | Integrated multi-mode mammography/tomosynthesis x-ray system and method |
| US20070076842A1 (en) * | 2005-09-30 | 2007-04-05 | Tkaczyk John E | Adaptable energy discriminating computed tomography system |
| US7302031B2 (en) * | 2005-10-27 | 2007-11-27 | Sectra Mamea Ab | Method and arrangement relating to X-ray imaging |
| DE102006015356B4 (de) * | 2006-02-01 | 2016-09-22 | Siemens Healthcare Gmbh | Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System |
| EP1879020A1 (en) * | 2006-07-12 | 2008-01-16 | Paul Scherrer Institut | X-ray interferometer for phase contrast imaging |
| US20100080436A1 (en) * | 2007-02-21 | 2010-04-01 | Konica Minolta Medical & Graphic, Inc. | Radiographic imaging device and radiographic imaging system |
| JP2008206560A (ja) * | 2007-02-23 | 2008-09-11 | Kyushu Univ | 骨塩量測定装置 |
| WO2008132988A1 (ja) * | 2007-04-12 | 2008-11-06 | Konica Minolta Medical & Graphic, Inc. | X線画像分析システム及びプログラム |
| EP2060909B1 (en) * | 2007-11-15 | 2011-09-07 | CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement | Interferometer device and method |
| CN101952900B (zh) * | 2008-02-14 | 2013-10-23 | 皇家飞利浦电子股份有限公司 | 用于相位对比成像的x射线探测器 |
| EP2257793B1 (en) * | 2008-03-19 | 2015-05-13 | Koninklijke Philips N.V. | Rotational x-ray device for phase contrast imaging comprising a ring-shaped grating |
| EP2168488B1 (de) * | 2008-09-30 | 2013-02-13 | Siemens Aktiengesellschaft | Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung |
| US7949095B2 (en) * | 2009-03-02 | 2011-05-24 | University Of Rochester | Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT |
| WO2011070489A1 (en) * | 2009-12-10 | 2011-06-16 | Koninklijke Philips Electronics N.V. | Non- parallel grating arrangement with on-the-fly phase stepping, x-ray system and use |
| JP5702586B2 (ja) | 2010-02-04 | 2015-04-15 | 富士フイルム株式会社 | 放射線撮影システム |
| JP2012090945A (ja) | 2010-03-30 | 2012-05-17 | Fujifilm Corp | 放射線検出装置、放射線撮影装置、放射線撮影システム |
| JP5896999B2 (ja) | 2010-06-28 | 2016-03-30 | パウル・シェラー・インスティトゥート | X線装置 |
-
2012
- 2012-06-27 JP JP2014517686A patent/JP6353361B2/ja not_active Expired - Fee Related
- 2012-06-27 EP EP12731408.6A patent/EP2729069B1/en active Active
- 2012-06-27 WO PCT/EP2012/062489 patent/WO2013004574A1/en not_active Ceased
- 2012-06-27 CN CN201280033300.9A patent/CN103648388B/zh not_active Expired - Fee Related
- 2012-06-27 RU RU2014103625A patent/RU2620892C2/ru active
-
2016
- 2016-07-15 US US15/211,228 patent/US9757082B2/en not_active Expired - Fee Related
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