JP2014518112A5 - - Google Patents

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Publication number
JP2014518112A5
JP2014518112A5 JP2014517686A JP2014517686A JP2014518112A5 JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5 JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5
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Japan
Prior art keywords
grating
imaging system
ray
detector
analyzer
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JP2014517686A
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Japanese (ja)
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JP6353361B2 (ja
JP2014518112A (ja
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Priority claimed from PCT/EP2012/062489 external-priority patent/WO2013004574A1/en
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Publication of JP2014518112A5 publication Critical patent/JP2014518112A5/ja
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Publication of JP6353361B2 publication Critical patent/JP6353361B2/ja
Expired - Fee Related legal-status Critical Current
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JP2014517686A 2011-07-04 2012-06-27 位相コントラストイメージング装置 Expired - Fee Related JP6353361B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161504260P 2011-07-04 2011-07-04
SE1150622 2011-07-04
US61/504,260 2011-07-04
SE1150622-7 2011-07-04
PCT/EP2012/062489 WO2013004574A1 (en) 2011-07-04 2012-06-27 Phase contrast imaging apparatus

Publications (3)

Publication Number Publication Date
JP2014518112A JP2014518112A (ja) 2014-07-28
JP2014518112A5 true JP2014518112A5 (enExample) 2015-07-09
JP6353361B2 JP6353361B2 (ja) 2018-07-04

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JP2014517686A Expired - Fee Related JP6353361B2 (ja) 2011-07-04 2012-06-27 位相コントラストイメージング装置

Country Status (6)

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US (1) US9757082B2 (enExample)
EP (1) EP2729069B1 (enExample)
JP (1) JP6353361B2 (enExample)
CN (1) CN103648388B (enExample)
RU (1) RU2620892C2 (enExample)
WO (1) WO2013004574A1 (enExample)

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
CN104066375B (zh) 2012-01-24 2017-08-11 皇家飞利浦有限公司 多方向相衬x射线成像
JP6173457B2 (ja) 2012-08-20 2017-08-02 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 微分位相コントラスト撮像における複数オーダの位相調整のためのソース格子対位相格子距離の位置合わせ
US9971078B2 (en) * 2013-03-05 2018-05-15 Rambus Inc. Phase gratings with odd symmetry for high-resolution lensless optical sensing
WO2014187885A1 (de) * 2013-05-22 2014-11-27 Siemens Aktiengesellschaft Phasenkontrast-rontgenbildgebungsvorrichtung
WO2014207193A1 (en) 2013-06-28 2014-12-31 Koninklijke Philips N.V. Correction in slit-scanning phase contrast imaging
US9297772B2 (en) 2013-07-30 2016-03-29 Industrial Technology Research Institute Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
CN104837409B (zh) * 2013-09-30 2019-08-13 皇家飞利浦有限公司 具有可移动光栅的微分相位衬度成像装置
US10045749B2 (en) 2013-10-22 2018-08-14 Koninklijke Philips N.V. X-ray system, in particular a tomosynthesis system and a method for acquiring an image of an object
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
WO2015090949A1 (en) * 2013-12-17 2015-06-25 Koninklijke Philips N.V. Phase retrieval for scanning differential phase contrast systems
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
TWI629474B (zh) 2014-05-23 2018-07-11 財團法人工業技術研究院 X光光源以及x光成像的方法
JP6369206B2 (ja) * 2014-08-06 2018-08-08 コニカミノルタ株式会社 X線撮影システム及び画像処理装置
BR112017010593B1 (pt) 2014-11-24 2022-11-08 Koninklijke Philips N.V. Disposição de detector de raios x, sistema de imageamento, método para o imageamento por tomossíntese com contraste de fase de raios x e mídia legível por computador não transitório
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
CN106483548B (zh) * 2015-08-28 2019-07-26 北京纳米维景科技有限公司 一种光子计数探测器阵列及其成像方法
JP6816144B2 (ja) * 2015-12-01 2021-01-20 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 被検体をx線撮像する装置
JP6613988B2 (ja) * 2016-03-30 2019-12-04 コニカミノルタ株式会社 放射線撮影システム
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
EP3444826A1 (en) * 2017-08-14 2019-02-20 Koninklijke Philips N.V. Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
EP3447538A1 (en) * 2017-08-23 2019-02-27 Koninklijke Philips N.V. X-ray detection
EP3446630A1 (en) * 2017-08-23 2019-02-27 Koninklijke Philips N.V. Device and method for phase stepping in phase contrast image acquisition
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
CN112424591B (zh) 2018-06-04 2024-05-24 斯格瑞公司 波长色散x射线光谱仪
DE112019003777B4 (de) 2018-07-26 2025-09-11 Sigray, Inc. Röntgenreflexionsquelle mit hoher helligkeit
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
CN112638261B (zh) 2018-09-04 2025-06-27 斯格瑞公司 利用滤波的x射线荧光的系统和方法
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
WO2020106197A1 (en) 2018-11-19 2020-05-28 Prismatic Sensors Ab X-ray imaging system for phase contrast imaging using photon-counting events
JP7182749B2 (ja) 2019-09-03 2022-12-02 シグレイ、インコーポレイテッド コンピュータ断層撮影蛍光x線撮像のためのシステムおよび方法
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
WO2021168724A1 (en) 2020-02-27 2021-09-02 Shenzhen Xpectvision Technology Co., Ltd. Method of phase contrast imaging
WO2021237237A1 (en) 2020-05-18 2021-11-25 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
KR20260030946A (ko) 2020-12-07 2026-03-06 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
WO2023215204A1 (en) 2022-05-02 2023-11-09 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer
DE112024000873T5 (de) 2023-02-16 2026-01-15 Sigray, Inc. Röntgen-detektorsystem mit mindestens zwei gestapelten flachen bragg-diffraktoren
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
CN120195197A (zh) * 2023-12-21 2025-06-24 清华大学 辐射成像设备和方法
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5335255A (en) * 1992-03-24 1994-08-02 Seppi Edward J X-ray scanner with a source emitting plurality of fan beams
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
RU2150888C1 (ru) * 1998-06-26 2000-06-20 Технико-медицинское отделение Научно-исследовательского института электромеханики Аппарат рентгеновский
SE528366C2 (sv) 2004-02-13 2006-10-31 Sectra Mamea Ab Metod och anordning avseende röntgenbildtagning
US7412026B2 (en) * 2004-07-02 2008-08-12 The Board Of Regents Of The University Of Oklahoma Phase-contrast x-ray imaging systems and methods
US7583779B2 (en) * 2004-11-24 2009-09-01 General Electric Company System and method for acquisition and reconstruction of contrast-enhanced, artifact-reduced CT images
EP3106094B1 (en) * 2004-11-26 2021-09-08 Hologic, Inc. Integrated multi-mode mammography/tomosynthesis x-ray system
US20070076842A1 (en) * 2005-09-30 2007-04-05 Tkaczyk John E Adaptable energy discriminating computed tomography system
US7302031B2 (en) * 2005-10-27 2007-11-27 Sectra Mamea Ab Method and arrangement relating to X-ray imaging
DE102006015356B4 (de) 2006-02-01 2016-09-22 Siemens Healthcare Gmbh Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
JP5056842B2 (ja) * 2007-02-21 2012-10-24 コニカミノルタエムジー株式会社 放射線画像撮影装置及び放射線画像撮影システム
JP2008206560A (ja) * 2007-02-23 2008-09-11 Kyushu Univ 骨塩量測定装置
JPWO2008132988A1 (ja) * 2007-04-12 2010-07-22 コニカミノルタエムジー株式会社 X線画像分析システム及びプログラム
EP2060909B1 (en) * 2007-11-15 2011-09-07 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Interferometer device and method
EP2245636A2 (en) * 2008-02-14 2010-11-03 Koninklijke Philips Electronics N.V. X-ray detector for phase contrast imaging
CN101978257B (zh) * 2008-03-19 2014-12-17 皇家飞利浦电子股份有限公司 用于相位衬度成像的旋转x射线装置
EP2168488B1 (de) * 2008-09-30 2013-02-13 Siemens Aktiengesellschaft Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung
US7949095B2 (en) * 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
JP5789613B2 (ja) * 2009-12-10 2015-10-07 コーニンクレッカ フィリップス エヌ ヴェ オンザフライ位相ステッピングを備えた非平行な格子装置、x線システム及び使用方法
JP5702586B2 (ja) 2010-02-04 2015-04-15 富士フイルム株式会社 放射線撮影システム
JP2012090945A (ja) 2010-03-30 2012-05-17 Fujifilm Corp 放射線検出装置、放射線撮影装置、放射線撮影システム
WO2012000694A1 (en) * 2010-06-28 2012-01-05 Paul Scherrer Institut A method for x-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry

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