JP2014518112A5 - - Google Patents

Download PDF

Info

Publication number
JP2014518112A5
JP2014518112A5 JP2014517686A JP2014517686A JP2014518112A5 JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5 JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5
Authority
JP
Japan
Prior art keywords
grating
imaging system
ray
detector
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014517686A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014518112A (ja
JP6353361B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2012/062489 external-priority patent/WO2013004574A1/en
Publication of JP2014518112A publication Critical patent/JP2014518112A/ja
Publication of JP2014518112A5 publication Critical patent/JP2014518112A5/ja
Application granted granted Critical
Publication of JP6353361B2 publication Critical patent/JP6353361B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2014517686A 2011-07-04 2012-06-27 位相コントラストイメージング装置 Expired - Fee Related JP6353361B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161504260P 2011-07-04 2011-07-04
SE1150622-7 2011-07-04
US61/504,260 2011-07-04
SE1150622 2011-07-04
PCT/EP2012/062489 WO2013004574A1 (en) 2011-07-04 2012-06-27 Phase contrast imaging apparatus

Publications (3)

Publication Number Publication Date
JP2014518112A JP2014518112A (ja) 2014-07-28
JP2014518112A5 true JP2014518112A5 (enExample) 2015-07-09
JP6353361B2 JP6353361B2 (ja) 2018-07-04

Family

ID=47436543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014517686A Expired - Fee Related JP6353361B2 (ja) 2011-07-04 2012-06-27 位相コントラストイメージング装置

Country Status (6)

Country Link
US (1) US9757082B2 (enExample)
EP (1) EP2729069B1 (enExample)
JP (1) JP6353361B2 (enExample)
CN (1) CN103648388B (enExample)
RU (1) RU2620892C2 (enExample)
WO (1) WO2013004574A1 (enExample)

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
JP6265914B2 (ja) * 2012-01-24 2018-01-24 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 多方向位相コントラストｘ線撮像
US9717470B2 (en) 2012-08-20 2017-08-01 Koninklijke Philips N.V. Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging
EP2965134A1 (en) * 2013-03-05 2016-01-13 Rambus Inc. Phase gratings with odd symmetry for high-resoultion lensless optical sensing
WO2014187885A1 (de) * 2013-05-22 2014-11-27 Siemens Aktiengesellschaft Phasenkontrast-rontgenbildgebungsvorrichtung
WO2014207193A1 (en) 2013-06-28 2014-12-31 Koninklijke Philips N.V. Correction in slit-scanning phase contrast imaging
US9297772B2 (en) 2013-07-30 2016-03-29 Industrial Technology Research Institute Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
WO2015044001A1 (en) 2013-09-30 2015-04-02 Koninklijke Philips N.V. Differential phase contrast imaging device with movable grating(s)
RU2665125C2 (ru) * 2013-10-22 2018-08-28 Конинклейке Филипс Н.В. Рентгеновская система, в частности система томосинтеза, и способ получения изображения объекта
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
CN105828716B (zh) * 2013-12-17 2019-05-10 皇家飞利浦有限公司 用于扫描差分相位衬度系统的相位恢复
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
TWI629474B (zh) 2014-05-23 2018-07-11 財團法人工業技術研究院 Ｘ光光源以及ｘ光成像的方法
JP6369206B2 (ja) * 2014-08-06 2018-08-08 コニカミノルタ株式会社 Ｘ線撮影システム及び画像処理装置
MX2017006619A (es) 2014-11-24 2017-08-10 Koninklijke Philips Nv Sistema de formacion de imagenes y detector para la formacion de imagenes de tomosintesis de contraste de fase de rayos-x.
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
CN106483548B (zh) * 2015-08-28 2019-07-26 北京纳米维景科技有限公司 一种光子计数探测器阵列及其成像方法
US10779776B2 (en) 2015-12-01 2020-09-22 Koninklijke Philips N.V. Apparatus for X-ray imaging an object
JP6613988B2 (ja) * 2016-03-30 2019-12-04 コニカミノルタ株式会社 放射線撮影システム
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
EP3444826A1 (en) * 2017-08-14 2019-02-20 Koninklijke Philips N.V. Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
EP3446630A1 (en) 2017-08-23 2019-02-27 Koninklijke Philips N.V. Device and method for phase stepping in phase contrast image acquisition
EP3447538A1 (en) * 2017-08-23 2019-02-27 Koninklijke Philips N.V. X-ray detection
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
WO2019236384A1 (en) 2018-06-04 2019-12-12 Sigray, Inc. Wavelength dispersive x-ray spectrometer
JP7117452B2 (ja) 2018-07-26 2022-08-12 シグレイ、インコーポレイテッド 高輝度反射型ｘ線源
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
CN113167917B (zh) 2018-11-19 2024-03-12 棱镜传感器公司 使用光子计数事件进行相衬成像的x射线成像系统
WO2021046059A1 (en) 2019-09-03 2021-03-11 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
CN114930162A (zh) * 2020-02-27 2022-08-19 深圳帧观德芯科技有限公司 相位对比成像法
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
US11549895B2 (en) 2020-09-17 2023-01-10 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
WO2022126071A1 (en) 2020-12-07 2022-06-16 Sigray, Inc. High throughput 3d x-ray imaging system using a transmission x-ray source
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
CN119173759A (zh) 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
DE112024000873T5 (de) 2023-02-16 2026-01-15 Sigray, Inc. Röntgen-detektorsystem mit mindestens zwei gestapelten flachen bragg-diffraktoren
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2025101530A1 (en) 2023-11-07 2025-05-15 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
CN120195197A (zh) * 2023-12-21 2025-06-24 清华大学 辐射成像设备和方法
US12429436B2 (en) 2024-01-08 2025-09-30 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5335255A (en) * 1992-03-24 1994-08-02 Seppi Edward J X-ray scanner with a source emitting plurality of fan beams
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
RU2150888C1 (ru) * 1998-06-26 2000-06-20 Технико-медицинское отделение Научно-исследовательского института электромеханики Аппарат рентгеновский
SE528366C2 (sv) 2004-02-13 2006-10-31 Sectra Mamea Ab Metod och anordning avseende röntgenbildtagning
US7412026B2 (en) * 2004-07-02 2008-08-12 The Board Of Regents Of The University Of Oklahoma Phase-contrast x-ray imaging systems and methods
US7583779B2 (en) * 2004-11-24 2009-09-01 General Electric Company System and method for acquisition and reconstruction of contrast-enhanced, artifact-reduced CT images
EP1816965B1 (en) * 2004-11-26 2016-06-29 Hologic, Inc. Integrated multi-mode mammography/tomosynthesis x-ray system
US20070076842A1 (en) * 2005-09-30 2007-04-05 Tkaczyk John E Adaptable energy discriminating computed tomography system
US7302031B2 (en) * 2005-10-27 2007-11-27 Sectra Mamea Ab Method and arrangement relating to X-ray imaging
DE102006015356B4 (de) * 2006-02-01 2016-09-22 Siemens Healthcare Gmbh Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
JP5056842B2 (ja) * 2007-02-21 2012-10-24 コニカミノルタエムジー株式会社 放射線画像撮影装置及び放射線画像撮影システム
JP2008206560A (ja) * 2007-02-23 2008-09-11 Kyushu Univ 骨塩量測定装置
WO2008132988A1 (ja) * 2007-04-12 2008-11-06 Konica Minolta Medical & Graphic, Inc. Ｘ線画像分析システム及びプログラム
ATE524056T1 (de) 2007-11-15 2011-09-15 Suisse Electronique Microtech Interferometervorrichtung und verfahren
JP5461438B2 (ja) * 2008-02-14 2014-04-02 コーニンクレッカ フィリップス エヌ ヴェ 位相コントラストイメージング用のｘ線検出器
WO2009115966A1 (en) * 2008-03-19 2009-09-24 Koninklijke Philips Electronics N.V. Rotational x ray device for phase contrast imaging
EP2168488B1 (de) * 2008-09-30 2013-02-13 Siemens Aktiengesellschaft Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung
US7949095B2 (en) * 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
US8848863B2 (en) 2009-12-10 2014-09-30 Koninklijke Philips N.V. Non-parallel grating arrangement with on-the-fly phase stepping, X-ray system
JP5702586B2 (ja) 2010-02-04 2015-04-15 富士フイルム株式会社 放射線撮影システム
JP2012090945A (ja) 2010-03-30 2012-05-17 Fujifilm Corp 放射線検出装置、放射線撮影装置、放射線撮影システム
CA2803683C (en) * 2010-06-28 2020-03-10 Paul Scherrer Institut A method for x-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry

Similar Documents

Publication Publication Date Title
JP2014518112A5 (enExample)
RU2014103625A (ru) Устройство формирования изображений методом фазового контраста
JP2015516278A5 (enExample)
EP2509504B1 (en) Scanning system for differential phase contrast imaging
RU2012128794A (ru) Устройство для фазоконтрастного формирования изображений, содержащее перемещаемый элемент детектора рентгеновского излучения, и соответствующий способ
JP2012005820A5 (enExample)
JP2013034864A5 (enExample)
JP7053650B2 (ja) 放射線検出器における使用のための画素設計
RU2014134452A (ru) Мультинаправленная фазоконтрастная рентгеновская визуализация
JP2015519091A5 (enExample)
JP2014521370A5 (enExample)
JP2016501630A5 (enExample)
RU2018103191A (ru) Сканирующее рентгеновское устройство с полноформатным детектором
WO2014107675A3 (en) X-ray scanner with energy discriminating detector array
JP2009219708A5 (enExample)
RU2015144476A (ru) Устройство получения дифференциального фазоконтрастного изображения с подвижной решеткой(-ами)
RU2010138907A (ru) Квазистатическая установка с распределенными источниками для рентгеновской визуализации с высокой разрешающей способностью
MX2014005910A (es) Sistemas de escaner de rayos x multilineales y metodos de escáner de rayos x.
JP2013039363A5 (ja) 計算機式断層写真法（ｃｔ）撮像用の低分解能シンチレート式アレイ
JP6488292B2 (ja) トモシンセシスシステムのようなｘ線システム及び対象の画像を取得する方法
JP2014147739A5 (enExample)
JP2012110472A5 (enExample)
JP2015104664A (ja) Ｘ線ｃｔ装置、モジュール型ｘ線検出装置およびｘ線ｃｔ撮像方法
JP2014508618A5 (enExample)
RU2014125267A (ru) Система офэкт всего тела