CN102047344B - 用于x射线的源光栅、用于x射线相衬图像的成像装置和x射线计算层析成像系统 - Google Patents

用于x射线的源光栅、用于x射线相衬图像的成像装置和x射线计算层析成像系统 Download PDF

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CN102047344B
CN102047344B CN2009801128512A CN200980112851A CN102047344B CN 102047344 B CN102047344 B CN 102047344B CN 2009801128512 A CN2009801128512 A CN 2009801128512A CN 200980112851 A CN200980112851 A CN 200980112851A CN 102047344 B CN102047344 B CN 102047344B
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gratings
grating
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rays
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CN102047344A (zh
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伊藤英之助
市村好克
中村高士
今田彩
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Canon Inc
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN2009801128512A 2008-04-15 2009-04-13 用于x射线的源光栅、用于x射线相衬图像的成像装置和x射线计算层析成像系统 Expired - Fee Related CN102047344B (zh)

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JP2008-105355 2008-04-15
JP2008105355 2008-04-15
PCT/JP2009/057807 WO2009128550A1 (en) 2008-04-15 2009-04-13 Source grating for x-rays, imaging apparatus for x-ray phase contrast image and x-ray computed tomography system

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Publication number Publication date
CN102047344A (zh) 2011-05-04
EP2248135A1 (en) 2010-11-10
WO2009128550A9 (en) 2011-01-27
US8243879B2 (en) 2012-08-14
JP2009276342A (ja) 2009-11-26
US20100246764A1 (en) 2010-09-30
JP5451150B2 (ja) 2014-03-26
WO2009128550A1 (en) 2009-10-22

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