JP2009246348A5 - - Google Patents
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- Publication number
- JP2009246348A5 JP2009246348A5 JP2009051960A JP2009051960A JP2009246348A5 JP 2009246348 A5 JP2009246348 A5 JP 2009246348A5 JP 2009051960 A JP2009051960 A JP 2009051960A JP 2009051960 A JP2009051960 A JP 2009051960A JP 2009246348 A5 JP2009246348 A5 JP 2009246348A5
- Authority
- JP
- Japan
- Prior art keywords
- film
- resist mask
- forming
- etching
- conductive film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010408 film Substances 0.000 claims 84
- 238000005530 etching Methods 0.000 claims 24
- 239000004065 semiconductor Substances 0.000 claims 24
- 239000012535 impurity Substances 0.000 claims 12
- 238000004519 manufacturing process Methods 0.000 claims 8
- 238000000034 method Methods 0.000 claims 8
- 239000010409 thin film Substances 0.000 claims 8
- 230000015572 biosynthetic process Effects 0.000 claims 4
- 230000003796 beauty Effects 0.000 claims 2
- 238000004380 ashing Methods 0.000 claims 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 1
- 238000001312 dry etching Methods 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
- 239000001301 oxygen Substances 0.000 claims 1
- 238000001039 wet etching Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009051960A JP5371487B2 (ja) | 2008-03-10 | 2009-03-05 | 薄膜トランジスタ及びその作製方法、並びに表示装置及びその作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008058906 | 2008-03-10 | ||
| JP2008058906 | 2008-03-10 | ||
| JP2009051960A JP5371487B2 (ja) | 2008-03-10 | 2009-03-05 | 薄膜トランジスタ及びその作製方法、並びに表示装置及びその作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009246348A JP2009246348A (ja) | 2009-10-22 |
| JP2009246348A5 true JP2009246348A5 (OSRAM) | 2012-03-01 |
| JP5371487B2 JP5371487B2 (ja) | 2013-12-18 |
Family
ID=41054032
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009051960A Expired - Fee Related JP5371487B2 (ja) | 2008-03-10 | 2009-03-05 | 薄膜トランジスタ及びその作製方法、並びに表示装置及びその作製方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7989275B2 (OSRAM) |
| JP (1) | JP5371487B2 (OSRAM) |
| KR (1) | KR101521833B1 (OSRAM) |
| CN (1) | CN101533781B (OSRAM) |
| TW (1) | TWI509700B (OSRAM) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8101442B2 (en) * | 2008-03-05 | 2012-01-24 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing EL display device |
| US8207026B2 (en) * | 2009-01-28 | 2012-06-26 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of thin film transistor and manufacturing method of display device |
| US7989234B2 (en) | 2009-02-16 | 2011-08-02 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing thin film transistor and method for manufacturing display device |
| US8202769B2 (en) | 2009-03-11 | 2012-06-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| JP5539765B2 (ja) * | 2009-03-26 | 2014-07-02 | 株式会社半導体エネルギー研究所 | トランジスタの作製方法 |
| CN101964309B (zh) * | 2010-09-01 | 2012-08-01 | 友达光电股份有限公司 | 薄膜晶体管的制造方法 |
| JP5667868B2 (ja) * | 2010-12-24 | 2015-02-12 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| CN103035653A (zh) * | 2012-10-10 | 2013-04-10 | 深圳市华星光电技术有限公司 | 薄膜晶体管像素结构及其制作方法 |
| KR102148486B1 (ko) * | 2013-12-31 | 2020-08-26 | 엘지디스플레이 주식회사 | 표시장치용 박막 트랜지스터 어레이 기판 및 그 제조방법 |
| CN108780823B (zh) | 2016-01-07 | 2022-04-19 | 纽约州立大学研究基金会 | 多井硒器件及其制造方法 |
| JP6973647B2 (ja) * | 2018-06-27 | 2021-12-01 | 三菱電機株式会社 | 半導体装置の製造方法 |
| US11016383B2 (en) * | 2018-08-31 | 2021-05-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Pellicle for an EUV lithography mask and a method of manufacturing thereof |
| KR102795888B1 (ko) | 2019-06-07 | 2025-04-17 | 삼성디스플레이 주식회사 | 표시 장치의 제조 방법 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56122123A (en) | 1980-03-03 | 1981-09-25 | Shunpei Yamazaki | Semiamorphous semiconductor |
| JPS60242674A (ja) * | 1984-05-17 | 1985-12-02 | Oki Electric Ind Co Ltd | 薄膜トランジスタ及びその製造方法 |
| JPS6490560A (en) * | 1987-10-01 | 1989-04-07 | Casio Computer Co Ltd | Thin-film transistor |
| JPH0311744A (ja) | 1989-06-09 | 1991-01-21 | Citizen Watch Co Ltd | 薄膜トランジスタの製造方法 |
| JPH0519297A (ja) * | 1991-07-15 | 1993-01-29 | Nec Corp | 液晶表示パネル,液晶表示装置及びそれらの製造方法 |
| JPH06194687A (ja) * | 1992-10-30 | 1994-07-15 | Nec Corp | 透過型アクティブマトリクス型液晶素子 |
| JPH0682831A (ja) * | 1992-08-31 | 1994-03-25 | Dainippon Printing Co Ltd | アクティブマトリックス液晶表示装置およびその製造方法 |
| JPH07307477A (ja) | 1994-03-15 | 1995-11-21 | Sanyo Electric Co Ltd | 半導体装置の製造方法 |
| JP3270674B2 (ja) * | 1995-01-17 | 2002-04-02 | 株式会社半導体エネルギー研究所 | 半導体集積回路の作製方法 |
| JPH0992838A (ja) * | 1995-09-26 | 1997-04-04 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタおよびその製造方法 |
| DE69635239T2 (de) | 1995-11-21 | 2006-07-06 | Samsung Electronics Co., Ltd., Suwon | Verfahren zur Herstellung einer Flüssigkristall-Anzeige |
| US6493048B1 (en) | 1998-10-21 | 2002-12-10 | Samsung Electronics Co., Ltd. | Thin film transistor array panel for a liquid crystal display and a method for manufacturing the same |
| JP2000307118A (ja) | 1999-04-21 | 2000-11-02 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタおよびその製造方法 |
| KR100669093B1 (ko) * | 1999-11-05 | 2007-01-16 | 엘지.필립스 엘시디 주식회사 | 액정표시소자의 제조방법 |
| KR100325079B1 (ko) | 1999-12-22 | 2002-03-02 | 주식회사 현대 디스플레이 테크놀로지 | 고개구율 및 고투과율 액정표시장치의 제조방법 |
| US7223643B2 (en) | 2000-08-11 | 2007-05-29 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
| TW488080B (en) | 2001-06-08 | 2002-05-21 | Au Optronics Corp | Method for producing thin film transistor |
| JP2003179069A (ja) | 2001-12-12 | 2003-06-27 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタ、液晶表示装置、有機エレクトロルミネッセンス素子、ならびに表示装置用基板およびその製造方法 |
| TWI239651B (en) * | 2004-04-30 | 2005-09-11 | Quanta Display Inc | Manufacturing method of a thin film transistor-liquid crystal display |
| KR101201017B1 (ko) | 2005-06-27 | 2012-11-13 | 엘지디스플레이 주식회사 | 액정 표시 장치 및 그 제조 방법 |
| KR101225440B1 (ko) | 2005-06-30 | 2013-01-25 | 엘지디스플레이 주식회사 | 액정 표시 장치 및 그 제조 방법 |
| JP5105811B2 (ja) | 2005-10-14 | 2012-12-26 | 株式会社半導体エネルギー研究所 | 表示装置 |
| US8149346B2 (en) | 2005-10-14 | 2012-04-03 | Semiconductor Energy Laboratory Co., Ltd. | Display device and manufacturing method thereof |
| EP1958019B1 (en) | 2005-12-05 | 2017-04-12 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device |
| EP3229066A1 (en) | 2005-12-05 | 2017-10-11 | Semiconductor Energy Laboratory Co., Ltd. | Transflective liquid crystal display with a horizontal electric field configuration |
| TWI322288B (en) | 2006-03-07 | 2010-03-21 | Au Optronics Corp | Manufacture method of pixel array substrate |
| KR20080001181A (ko) * | 2006-06-29 | 2008-01-03 | 엘지.필립스 엘시디 주식회사 | 액정표시장치용 어레이 기판과 그 제조방법 |
| CN100463193C (zh) * | 2006-11-03 | 2009-02-18 | 北京京东方光电科技有限公司 | 一种tft阵列结构及其制造方法 |
| US7749820B2 (en) * | 2008-03-07 | 2010-07-06 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor, manufacturing method thereof, display device, and manufacturing method thereof |
-
2009
- 2009-03-03 US US12/396,998 patent/US7989275B2/en not_active Expired - Fee Related
- 2009-03-05 TW TW098107144A patent/TWI509700B/zh not_active IP Right Cessation
- 2009-03-05 JP JP2009051960A patent/JP5371487B2/ja not_active Expired - Fee Related
- 2009-03-10 CN CN2009101287135A patent/CN101533781B/zh not_active Expired - Fee Related
- 2009-03-10 KR KR1020090020213A patent/KR101521833B1/ko not_active Expired - Fee Related
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