JP2009135448A - 半導体基板の作製方法及び半導体装置の作製方法 - Google Patents
半導体基板の作製方法及び半導体装置の作製方法 Download PDFInfo
- Publication number
- JP2009135448A JP2009135448A JP2008270681A JP2008270681A JP2009135448A JP 2009135448 A JP2009135448 A JP 2009135448A JP 2008270681 A JP2008270681 A JP 2008270681A JP 2008270681 A JP2008270681 A JP 2008270681A JP 2009135448 A JP2009135448 A JP 2009135448A
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- layer
- crystal semiconductor
- substrate
- semiconductor substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
-
- H10P90/1916—
-
- H10W10/181—
-
- H10P14/3411—
-
- H10P14/3816—
Landscapes
- Recrystallisation Techniques (AREA)
- Thin Film Transistor (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electroluminescent Light Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008270681A JP2009135448A (ja) | 2007-11-01 | 2008-10-21 | 半導体基板の作製方法及び半導体装置の作製方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007285180 | 2007-11-01 | ||
| JP2008270681A JP2009135448A (ja) | 2007-11-01 | 2008-10-21 | 半導体基板の作製方法及び半導体装置の作製方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2009135448A true JP2009135448A (ja) | 2009-06-18 |
| JP2009135448A5 JP2009135448A5 (enExample) | 2011-11-10 |
Family
ID=40588499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008270681A Withdrawn JP2009135448A (ja) | 2007-11-01 | 2008-10-21 | 半導体基板の作製方法及び半導体装置の作製方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20090117707A1 (enExample) |
| JP (1) | JP2009135448A (enExample) |
| KR (1) | KR20090045123A (enExample) |
| CN (1) | CN101425456A (enExample) |
| TW (1) | TW200943478A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8476147B2 (en) | 2010-02-03 | 2013-07-02 | Semiconductor Energy Laboratory Co., Ltd. | SOI substrate and manufacturing method thereof |
| KR20200105971A (ko) * | 2009-12-04 | 2020-09-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| KR20230003661A (ko) * | 2009-09-16 | 2023-01-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 이의 제조 방법 |
| WO2024190116A1 (ja) * | 2023-03-16 | 2024-09-19 | 株式会社ジャパンディスプレイ | 半導体装置及びその製造方法 |
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| EP2009687B1 (en) * | 2007-06-29 | 2016-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing an SOI substrate and method of manufacturing a semiconductor device |
| US20090004764A1 (en) * | 2007-06-29 | 2009-01-01 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing SOI substrate and method for manufacturing semiconductor device |
| JP2010114431A (ja) | 2008-10-10 | 2010-05-20 | Semiconductor Energy Lab Co Ltd | Soi基板の作製方法 |
| SG163481A1 (en) | 2009-01-21 | 2010-08-30 | Semiconductor Energy Lab | Method for manufacturing soi substrate and semiconductor device |
| US8436362B2 (en) * | 2009-08-24 | 2013-05-07 | Micron Technology, Inc. | Solid state lighting devices with selected thermal expansion and/or surface characteristics, and associated methods |
| CN105739209B (zh) * | 2009-11-30 | 2022-05-27 | 株式会社半导体能源研究所 | 液晶显示设备、用于驱动该液晶显示设备的方法 |
| US9669613B2 (en) | 2010-12-07 | 2017-06-06 | Ipg Photonics Corporation | Laser lift off systems and methods that overlap irradiation zones to provide multiple pulses of laser irradiation per location at an interface between layers to be separated |
| CN102714150B (zh) | 2009-12-07 | 2016-01-20 | Ipg微系统有限公司 | 激光剥离系统及方法 |
| JP5542543B2 (ja) * | 2010-06-28 | 2014-07-09 | 株式会社東芝 | 半導体装置の製造方法 |
| KR101762823B1 (ko) * | 2010-10-29 | 2017-07-31 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 그것의 제조 방법 |
| US8486791B2 (en) | 2011-01-19 | 2013-07-16 | Macronix International Co., Ltd. | Mufti-layer single crystal 3D stackable memory |
| US8735263B2 (en) | 2011-01-21 | 2014-05-27 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing SOI substrate |
| CN102650051A (zh) * | 2011-02-25 | 2012-08-29 | 鸿富锦精密工业(深圳)有限公司 | 铝或铝合金的壳体及其制造方法 |
| CN102650039A (zh) * | 2011-02-28 | 2012-08-29 | 鸿富锦精密工业(深圳)有限公司 | 铝或铝合金的壳体及其制造方法 |
| CN102677007A (zh) * | 2011-03-14 | 2012-09-19 | 鸿富锦精密工业(深圳)有限公司 | 铝或铝合金的壳体及其制造方法 |
| FR2993095B1 (fr) * | 2012-07-03 | 2014-08-08 | Commissariat Energie Atomique | Detachement d’une couche autoportee de silicium <100> |
| US9406551B2 (en) * | 2012-09-27 | 2016-08-02 | Infineon Technologies Austria Ag | Method for manufacturing a semiconductor substrate, and method for manufacturing semiconductor devices integrated in a semiconductor substrate |
| US9636782B2 (en) | 2012-11-28 | 2017-05-02 | International Business Machines Corporation | Wafer debonding using mid-wavelength infrared radiation ablation |
| US20140144593A1 (en) * | 2012-11-28 | 2014-05-29 | International Business Machiness Corporation | Wafer debonding using long-wavelength infrared radiation ablation |
| US9214351B2 (en) | 2013-03-12 | 2015-12-15 | Macronix International Co., Ltd. | Memory architecture of thin film 3D array |
| TWI610374B (zh) | 2013-08-01 | 2018-01-01 | 格芯公司 | 用於將搬運器晶圓接合至元件晶圓以及能以中段波長紅外光雷射燒蝕釋出之接著劑 |
| EP2884498A1 (en) | 2013-11-29 | 2015-06-17 | Canon Kabushiki Kaisha | Structural body and x-ray talbot interferometer including the structural body |
| US9559113B2 (en) | 2014-05-01 | 2017-01-31 | Macronix International Co., Ltd. | SSL/GSL gate oxide in 3D vertical channel NAND |
| US10439057B2 (en) | 2014-09-09 | 2019-10-08 | Intel Corporation | Multi-gate high electron mobility transistors and methods of fabrication |
| JP6456228B2 (ja) * | 2015-04-15 | 2019-01-23 | 株式会社ディスコ | 薄板の分離方法 |
| JP6396854B2 (ja) * | 2015-06-02 | 2018-09-26 | 信越化学工業株式会社 | 酸化物単結晶薄膜を備えた複合ウェーハの製造方法 |
| EP3314633A4 (en) * | 2015-06-29 | 2019-04-10 | IPG Photonics Corporation | METHOD BASED ON FIBERLASER FOR THE EQUIVALENT CRYSTALLIZATION OF AN AMORPHIC SILICON SUBSTRATE |
| US9870940B2 (en) | 2015-08-03 | 2018-01-16 | Samsung Electronics Co., Ltd. | Methods of forming nanosheets on lattice mismatched substrates |
| US20170037534A1 (en) * | 2015-08-07 | 2017-02-09 | North Carolina State University | Direct conversion of h-bn into c-bn and structures for a variety of applications |
| EP3252800A1 (en) * | 2016-05-31 | 2017-12-06 | Laser Systems & Solutions of Europe | Deep junction electronic device and process for manufacturing thereof |
| US10240251B2 (en) | 2016-06-28 | 2019-03-26 | North Carolina State University | Synthesis and processing of pure and NV nanodiamonds and other nanostructures for quantum computing and magnetic sensing applications |
| CN108109592B (zh) | 2016-11-25 | 2022-01-25 | 株式会社半导体能源研究所 | 显示装置及其工作方法 |
| CN110800379B (zh) | 2017-06-27 | 2022-01-18 | 佳能安内华股份有限公司 | 等离子体处理装置 |
| CN110800377B (zh) | 2017-06-27 | 2022-04-29 | 佳能安内华股份有限公司 | 等离子体处理装置 |
| CN110800375B (zh) | 2017-06-27 | 2021-12-28 | 佳能安内华股份有限公司 | 等离子体处理装置 |
| PL3648551T3 (pl) | 2017-06-27 | 2021-12-06 | Canon Anelva Corporation | Urządzenie do obróbki plazmowej |
| US10679886B2 (en) * | 2017-11-17 | 2020-06-09 | Jsr Corporation | Workpiece treating method, semiconductor device, process for manufacturing the same, and temporary fixing composition for shear peeling |
| KR102439024B1 (ko) * | 2018-06-26 | 2022-09-02 | 캐논 아네르바 가부시키가이샤 | 플라스마 처리 장치, 플라스마 처리 방법, 프로그램, 및 메모리 매체 |
| CN109001179B (zh) * | 2018-08-07 | 2020-10-27 | 东南大学 | 尖端间距可调节的金属V型光栅Fano共振结构 |
| US11426818B2 (en) | 2018-08-10 | 2022-08-30 | The Research Foundation for the State University | Additive manufacturing processes and additively manufactured products |
| TWI743539B (zh) * | 2019-08-22 | 2021-10-21 | 友達光電股份有限公司 | 背光模組及其適用的顯示裝置 |
| CN111106029B (zh) * | 2019-12-31 | 2023-02-10 | 深圳市锐骏半导体股份有限公司 | 一种晶圆快速热处理机台的监控方法 |
| JP7607678B2 (ja) * | 2021-01-15 | 2024-12-27 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及び基板製造方法 |
| CN115346892A (zh) * | 2021-05-14 | 2022-11-15 | 日扬科技股份有限公司 | 固体结构的加工装置及加工方法 |
| CN116646822B (zh) * | 2023-06-29 | 2025-10-24 | 安徽格恩半导体有限公司 | 一种具有费米面拓扑层的半导体激光元件 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000505241A (ja) * | 1996-05-28 | 2000-04-25 | ザ トラスティース オブ コロンビア ユニヴァーシティ イン ザ シティ オブ ニューヨーク | 基板上の半導体膜領域の結晶化処理及びこの方法により製造されたデバイス |
| JP2002170942A (ja) * | 2000-11-30 | 2002-06-14 | Seiko Epson Corp | Soi基板、素子基板、電気光学装置及び電子機器、並びにsoi基板の製造方法、素子基板の製造方法 |
| JP2003045803A (ja) * | 2001-06-07 | 2003-02-14 | Lg Philips Lcd Co Ltd | シリコン結晶化方法 |
| JP2003197523A (ja) * | 2001-12-26 | 2003-07-11 | Sharp Corp | 結晶性半導体膜の製造方法および半導体装置 |
| JP2003309080A (ja) * | 2002-04-17 | 2003-10-31 | Sharp Corp | アニール処理された基板表面を平滑化する方法及びレーザーアニール処理用マスク |
| JP2003347208A (ja) * | 2002-05-27 | 2003-12-05 | Sumitomo Heavy Ind Ltd | アモルファス材料の結晶化方法 |
| JP2005005722A (ja) * | 2003-06-12 | 2005-01-06 | Lg Phillips Lcd Co Ltd | シリコン結晶化方法 |
| JP2005203596A (ja) * | 2004-01-16 | 2005-07-28 | Seiko Epson Corp | 電気光学装置の製造方法、電気光学装置および電子機器 |
| JP2005252244A (ja) * | 2004-02-03 | 2005-09-15 | Ishikawajima Harima Heavy Ind Co Ltd | 半導体基板の製造方法 |
| JP2007266593A (ja) * | 2006-03-03 | 2007-10-11 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
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| US4390392A (en) * | 1980-09-16 | 1983-06-28 | Texas Instruments Incorporated | Method for removal of minute physical damage to silicon wafers by employing laser annealing |
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| US7176528B2 (en) * | 2003-02-18 | 2007-02-13 | Corning Incorporated | Glass-based SOI structures |
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| US7084045B2 (en) * | 2003-12-12 | 2006-08-01 | Seminconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| KR100595455B1 (ko) * | 2003-12-24 | 2006-06-30 | 엘지.필립스 엘시디 주식회사 | 레이저 마스크 및 이를 이용한 결정화방법 |
| KR101016510B1 (ko) * | 2004-06-30 | 2011-02-24 | 엘지디스플레이 주식회사 | 레이저 결정화방법 및 결정화 장치 |
| US7645337B2 (en) * | 2004-11-18 | 2010-01-12 | The Trustees Of Columbia University In The City Of New York | Systems and methods for creating crystallographic-orientation controlled poly-silicon films |
-
2008
- 2008-10-21 JP JP2008270681A patent/JP2009135448A/ja not_active Withdrawn
- 2008-10-27 CN CNA2008101747469A patent/CN101425456A/zh active Pending
- 2008-10-29 US US12/260,712 patent/US20090117707A1/en not_active Abandoned
- 2008-10-29 TW TW097141664A patent/TW200943478A/zh unknown
- 2008-10-31 KR KR1020080107887A patent/KR20090045123A/ko not_active Withdrawn
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000505241A (ja) * | 1996-05-28 | 2000-04-25 | ザ トラスティース オブ コロンビア ユニヴァーシティ イン ザ シティ オブ ニューヨーク | 基板上の半導体膜領域の結晶化処理及びこの方法により製造されたデバイス |
| JP2002170942A (ja) * | 2000-11-30 | 2002-06-14 | Seiko Epson Corp | Soi基板、素子基板、電気光学装置及び電子機器、並びにsoi基板の製造方法、素子基板の製造方法 |
| JP2003045803A (ja) * | 2001-06-07 | 2003-02-14 | Lg Philips Lcd Co Ltd | シリコン結晶化方法 |
| JP2003197523A (ja) * | 2001-12-26 | 2003-07-11 | Sharp Corp | 結晶性半導体膜の製造方法および半導体装置 |
| JP2003309080A (ja) * | 2002-04-17 | 2003-10-31 | Sharp Corp | アニール処理された基板表面を平滑化する方法及びレーザーアニール処理用マスク |
| JP2003347208A (ja) * | 2002-05-27 | 2003-12-05 | Sumitomo Heavy Ind Ltd | アモルファス材料の結晶化方法 |
| JP2005005722A (ja) * | 2003-06-12 | 2005-01-06 | Lg Phillips Lcd Co Ltd | シリコン結晶化方法 |
| JP2005203596A (ja) * | 2004-01-16 | 2005-07-28 | Seiko Epson Corp | 電気光学装置の製造方法、電気光学装置および電子機器 |
| JP2005252244A (ja) * | 2004-02-03 | 2005-09-15 | Ishikawajima Harima Heavy Ind Co Ltd | 半導体基板の製造方法 |
| JP2007266593A (ja) * | 2006-03-03 | 2007-10-11 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20230003661A (ko) * | 2009-09-16 | 2023-01-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 이의 제조 방법 |
| KR102618171B1 (ko) * | 2009-09-16 | 2023-12-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 이의 제조 방법 |
| US11997859B2 (en) | 2009-09-16 | 2024-05-28 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device and manufacturing method thereof |
| KR20200105971A (ko) * | 2009-12-04 | 2020-09-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| KR102333270B1 (ko) | 2009-12-04 | 2021-12-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| US11728349B2 (en) | 2009-12-04 | 2023-08-15 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device including the same |
| US8476147B2 (en) | 2010-02-03 | 2013-07-02 | Semiconductor Energy Laboratory Co., Ltd. | SOI substrate and manufacturing method thereof |
| WO2024190116A1 (ja) * | 2023-03-16 | 2024-09-19 | 株式会社ジャパンディスプレイ | 半導体装置及びその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20090045123A (ko) | 2009-05-07 |
| US20090117707A1 (en) | 2009-05-07 |
| TW200943478A (en) | 2009-10-16 |
| CN101425456A (zh) | 2009-05-06 |
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