JP2008547227A5 - - Google Patents
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- Publication number
- JP2008547227A5 JP2008547227A5 JP2008518322A JP2008518322A JP2008547227A5 JP 2008547227 A5 JP2008547227 A5 JP 2008547227A5 JP 2008518322 A JP2008518322 A JP 2008518322A JP 2008518322 A JP2008518322 A JP 2008518322A JP 2008547227 A5 JP2008547227 A5 JP 2008547227A5
- Authority
- JP
- Japan
- Prior art keywords
- dielectric
- thin film
- film composition
- capacitor
- barium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000203 mixture Substances 0.000 claims 12
- 239000010409 thin film Substances 0.000 claims 8
- 239000003990 capacitor Substances 0.000 claims 7
- 229910052751 metal Inorganic materials 0.000 claims 5
- 239000002184 metal Substances 0.000 claims 5
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims 4
- 239000000654 additive Substances 0.000 claims 4
- 238000000137 annealing Methods 0.000 claims 4
- 229910052788 barium Inorganic materials 0.000 claims 4
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims 4
- 239000011888 foil Substances 0.000 claims 4
- 238000000034 method Methods 0.000 claims 4
- 229910052719 titanium Inorganic materials 0.000 claims 4
- 239000010936 titanium Substances 0.000 claims 4
- 230000000996 additive effect Effects 0.000 claims 3
- 229910002113 barium titanate Inorganic materials 0.000 claims 3
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 claims 3
- 150000001768 cations Chemical class 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 claims 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 claims 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 1
- 229910052454 barium strontium titanate Inorganic materials 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 229910052791 calcium Inorganic materials 0.000 claims 1
- 239000011575 calcium Substances 0.000 claims 1
- 238000010304 firing Methods 0.000 claims 1
- 229910052735 hafnium Inorganic materials 0.000 claims 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 claims 1
- 229910052748 manganese Inorganic materials 0.000 claims 1
- 239000011572 manganese Substances 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
- 239000001301 oxygen Substances 0.000 claims 1
- 238000010405 reoxidation reaction Methods 0.000 claims 1
- 229910052712 strontium Inorganic materials 0.000 claims 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 claims 1
- 229910052726 zirconium Inorganic materials 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/157,621 US20060287188A1 (en) | 2005-06-21 | 2005-06-21 | Manganese doped barium titanate thin film compositions, capacitors, and methods of making thereof |
| PCT/US2006/024008 WO2007002107A1 (en) | 2005-06-21 | 2006-06-21 | Manganese doped barium titanate thin film compositions, capacitors, and methods of making thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008547227A JP2008547227A (ja) | 2008-12-25 |
| JP2008547227A5 true JP2008547227A5 (https=) | 2009-08-06 |
Family
ID=37110237
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008518322A Withdrawn JP2008547227A (ja) | 2005-06-21 | 2006-06-21 | マンガンドープトチタン酸バリウム薄膜組成物、キャパシタ、およびその製造方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US20060287188A1 (https=) |
| EP (1) | EP1897103A1 (https=) |
| JP (1) | JP2008547227A (https=) |
| KR (1) | KR100949254B1 (https=) |
| CN (1) | CN101199033A (https=) |
| TW (1) | TW200715324A (https=) |
| WO (1) | WO2007002107A1 (https=) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7795663B2 (en) * | 2005-06-21 | 2010-09-14 | E. I. Du Pont De Nemours And Company | Acceptor doped barium titanate based thin film capacitors on metal foils and methods of making thereof |
| JP4908244B2 (ja) * | 2007-01-26 | 2012-04-04 | 昭和電工株式会社 | 複合酸化物膜形成用塗布剤 |
| US7635634B2 (en) * | 2007-04-16 | 2009-12-22 | Infineon Technologies Ag | Dielectric apparatus and associated methods |
| US8211496B2 (en) * | 2007-06-29 | 2012-07-03 | Johnson Ip Holding, Llc | Amorphous lithium lanthanum titanate thin films manufacturing method |
| US9034525B2 (en) * | 2008-06-27 | 2015-05-19 | Johnson Ip Holding, Llc | Ionically-conductive amorphous lithium lanthanum zirconium oxide |
| US20120196189A1 (en) | 2007-06-29 | 2012-08-02 | Johnson Ip Holding, Llc | Amorphous ionically conductive metal oxides and sol gel method of preparation |
| US20090092903A1 (en) * | 2007-08-29 | 2009-04-09 | Johnson Lonnie G | Low Cost Solid State Rechargeable Battery and Method of Manufacturing Same |
| US8446706B1 (en) * | 2007-10-10 | 2013-05-21 | Kovio, Inc. | High precision capacitors |
| US20090238954A1 (en) * | 2008-03-20 | 2009-09-24 | Seigi Suh | Large area thin film capacitors on metal foils and methods of manufacturing same |
| US20090238955A1 (en) * | 2008-03-20 | 2009-09-24 | E. I. Du Pont De Nemours And Company | Processes for the manufacture of barium titanate capacitors on nickel foils |
| US20100202099A1 (en) * | 2009-02-12 | 2010-08-12 | Lite-On Capital Inc. | Thin film capacitor |
| US7987566B2 (en) * | 2009-07-15 | 2011-08-02 | Sturzebecher Richard J | Capacitor forming method |
| EP2426684A1 (en) | 2010-09-02 | 2012-03-07 | Mitsubishi Materials Corporation | Dielectric-thin-film forming composition, method of forming dielectric thin film, and dielectric thin film formed by the method |
| TWI465485B (zh) | 2011-09-13 | 2014-12-21 | Ind Tech Res Inst | 含氧化石墨之樹脂配方、組成物及其複合材料與無機粉體的分散方法 |
| EP2608219B1 (en) * | 2011-12-20 | 2015-03-04 | Mitsubishi Materials Corporation | Dielectric thin film-forming composition, method of forming dielectric thin film and dielectric thin film formed by the method |
| US10333123B2 (en) | 2012-03-01 | 2019-06-25 | Johnson Ip Holding, Llc | High capacity solid state composite cathode, solid state composite separator, solid-state rechargeable lithium battery and methods of making same |
| US10084168B2 (en) | 2012-10-09 | 2018-09-25 | Johnson Battery Technologies, Inc. | Solid-state battery separators and methods of fabrication |
| JP6547435B2 (ja) * | 2014-09-12 | 2019-07-24 | Tdk株式会社 | 誘電体膜および誘電体素子 |
| JP6763965B2 (ja) | 2015-12-21 | 2020-09-30 | ジョンソン・アイピー・ホールディング・エルエルシー | 固体電池、セパレータ、電極および製造方法 |
| US10218044B2 (en) | 2016-01-22 | 2019-02-26 | Johnson Ip Holding, Llc | Johnson lithium oxygen electrochemical engine |
| KR20230147659A (ko) * | 2021-02-17 | 2023-10-23 | 어플라이드 머티어리얼스, 인코포레이티드 | 더 짧은 커패시터 높이 및 양자 메모리 dram을 위한 커패시터 유전체 |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3920781A (en) * | 1971-04-02 | 1975-11-18 | Sprague Electric Co | Method of forming a ceramic dielectric body |
| DE3260379D1 (en) | 1981-01-27 | 1984-08-23 | Marcel Ramond | Universal, transformable and adaptable work-bench allowing specific, multiple and functional applications |
| JPS57187905A (en) | 1981-05-13 | 1982-11-18 | Matsushita Electric Industrial Co Ltd | Method of producing positive temperature coefficient thermistor |
| US4988468A (en) * | 1987-01-08 | 1991-01-29 | Murata Manufacturing Co., Ltd. | Method for producing non-reducible dielectric ceramic composition |
| US4855266A (en) * | 1987-01-13 | 1989-08-08 | E. I. Du Pont De Nemours And Company | High K dielectric composition for use in multilayer ceramic capacitors having copper internal electrodes |
| JPS6469514A (en) | 1987-09-11 | 1989-03-15 | Ube Industries | Preparation of starting powder for condenser material |
| US5198269A (en) * | 1989-04-24 | 1993-03-30 | Battelle Memorial Institute | Process for making sol-gel deposited ferroelectric thin films insensitive to their substrates |
| US5155072A (en) * | 1990-06-29 | 1992-10-13 | E. I. Du Pont De Nemours And Company | High K dielectric compositions with fine grain size |
| US5130281A (en) * | 1990-07-10 | 1992-07-14 | Murata Manufacturing Co., Ltd. | Dielectric ceramic compositions and manufacturing method of dielectric ceramics |
| WO1992019564A1 (en) * | 1991-05-01 | 1992-11-12 | The Regents Of The University Of California | Amorphous ferroelectric materials |
| US5296646A (en) * | 1992-04-03 | 1994-03-22 | The Whitaker Corporation | Protector module for telephone line junction box |
| US5271955A (en) * | 1992-04-06 | 1993-12-21 | Motorola, Inc. | Method for making a semiconductor device having an anhydrous ferroelectric thin film |
| EP0581251A3 (en) * | 1992-07-31 | 1995-02-08 | Taiyo Yuden Kk | Ceramic materials with a high dielectric constant and capacitors made from them. |
| US6025619A (en) * | 1992-10-23 | 2000-02-15 | Azuma; Masamichi | Thin films of ABO3 with excess A-site and B-site modifiers and method of fabricating integrated circuits with same |
| US5384294A (en) * | 1993-11-30 | 1995-01-24 | The United States Of America As Represented By The Secretary Of The Air Force | Sol-gel derived lead oxide containing ceramics |
| US5456908A (en) * | 1994-03-01 | 1995-10-10 | The University Of Kentucky Research Foundation | Polyamine-polyamine and polyamine-protein transport inhibitor conjugates and their use as pharmaceuticals and in research relating to polyamine transport |
| US5453908A (en) * | 1994-09-30 | 1995-09-26 | Texas Instruments Incorporated | Barium strontium titanate (BST) thin films by holmium donor doping |
| US5563762A (en) * | 1994-11-28 | 1996-10-08 | Northern Telecom Limited | Capacitor for an integrated circuit and method of formation thereof, and a method of adding on-chip capacitors to an integrated circuit |
| US6066581A (en) * | 1995-07-27 | 2000-05-23 | Nortel Networks Corporation | Sol-gel precursor and method for formation of ferroelectric materials for integrated circuits |
| US5853500A (en) * | 1997-07-18 | 1998-12-29 | Symetrix Corporation | Method for fabricating thin films of barium strontium titanate without exposure to oxygen at high temperatures |
| JP2001506425A (ja) * | 1997-10-08 | 2001-05-15 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | セラミック多層キャパシタ |
| US5962654A (en) * | 1998-01-30 | 1999-10-05 | International Business Machines Operation | Alkoxyalkoxides and use to form films |
| US6631551B1 (en) * | 1998-06-26 | 2003-10-14 | Delphi Technologies, Inc. | Method of forming integral passive electrical components on organic circuit board substrates |
| US6207522B1 (en) * | 1998-11-23 | 2001-03-27 | Microcoating Technologies | Formation of thin film capacitors |
| US6623865B1 (en) | 2000-03-04 | 2003-09-23 | Energenius, Inc. | Lead zirconate titanate dielectric thin film composites on metallic foils |
| US6649930B2 (en) * | 2000-06-27 | 2003-11-18 | Energenius, Inc. | Thin film composite containing a nickel-coated copper substrate and energy storage device containing the same |
| US6541137B1 (en) * | 2000-07-31 | 2003-04-01 | Motorola, Inc. | Multi-layer conductor-dielectric oxide structure |
| WO2002054420A1 (en) * | 2000-12-28 | 2002-07-11 | Tdk Corporation | Laminated circuit board and production method for electronic part, and laminated electronic part |
| US6477034B1 (en) * | 2001-10-03 | 2002-11-05 | Intel Corporation | Interposer substrate with low inductance capacitive paths |
| US6693793B2 (en) * | 2001-10-15 | 2004-02-17 | Mitsui Mining & Smelting Co., Ltd. | Double-sided copper clad laminate for capacitor layer formation and its manufacturing method |
| US6936301B2 (en) * | 2002-05-06 | 2005-08-30 | North Carolina State University | Methods of controlling oxygen partial pressure during annealing of a perovskite dielectric layer |
| US7029971B2 (en) * | 2003-07-17 | 2006-04-18 | E. I. Du Pont De Nemours And Company | Thin film dielectrics for capacitors and methods of making thereof |
| US7290315B2 (en) * | 2004-10-21 | 2007-11-06 | Intel Corporation | Method for making a passive device structure |
| KR100631894B1 (ko) * | 2004-12-07 | 2006-10-09 | 삼성전기주식회사 | 유전체 세라믹용 졸 조성물, 이를 이용한 유전체 세라믹과적층세라믹 커패시터 |
| US7795663B2 (en) * | 2005-06-21 | 2010-09-14 | E. I. Du Pont De Nemours And Company | Acceptor doped barium titanate based thin film capacitors on metal foils and methods of making thereof |
-
2005
- 2005-06-21 US US11/157,621 patent/US20060287188A1/en not_active Abandoned
-
2006
- 2006-06-21 WO PCT/US2006/024008 patent/WO2007002107A1/en not_active Ceased
- 2006-06-21 KR KR1020087001432A patent/KR100949254B1/ko active Active
- 2006-06-21 TW TW095122297A patent/TW200715324A/zh unknown
- 2006-06-21 EP EP20060785199 patent/EP1897103A1/en not_active Withdrawn
- 2006-06-21 JP JP2008518322A patent/JP2008547227A/ja not_active Withdrawn
- 2006-06-21 CN CNA200680021826XA patent/CN101199033A/zh active Pending
-
2007
- 2007-10-24 US US11/923,594 patent/US7572518B2/en not_active Expired - Lifetime
- 2007-10-25 US US11/923,974 patent/US7601181B2/en not_active Expired - Lifetime
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