JP2008509548A - 半導体スイッチ装置と電子素子 - Google Patents

半導体スイッチ装置と電子素子 Download PDF

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Publication number
JP2008509548A
JP2008509548A JP2007524346A JP2007524346A JP2008509548A JP 2008509548 A JP2008509548 A JP 2008509548A JP 2007524346 A JP2007524346 A JP 2007524346A JP 2007524346 A JP2007524346 A JP 2007524346A JP 2008509548 A JP2008509548 A JP 2008509548A
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Japan
Prior art keywords
semiconductor switch
bipolar transistor
node
switch device
voltage
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Pending
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JP2007524346A
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English (en)
Japanese (ja)
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JP2008509548A5 (enExample
Inventor
ゼクリ，ミシェル
ベルトリーニ，ルカ
ベッセ，パトリス
バフリュー，マリス
ノリエ，ニコラス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP USA Inc
Original Assignee
NXP USA Inc
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Filing date
Publication date
Application filed by NXP USA Inc filed Critical NXP USA Inc
Publication of JP2008509548A publication Critical patent/JP2008509548A/ja
Publication of JP2008509548A5 publication Critical patent/JP2008509548A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Bipolar Transistors (AREA)
  • Electronic Switches (AREA)
JP2007524346A 2004-08-03 2005-08-03 半導体スイッチ装置と電子素子 Pending JP2008509548A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04103726A EP1624570A1 (en) 2004-08-03 2004-08-03 A semiconductor switch arrangement
PCT/EP2005/053819 WO2006013211A1 (en) 2004-08-03 2005-08-03 A semiconductor switch arrangement and an electronic device

Publications (2)

Publication Number Publication Date
JP2008509548A true JP2008509548A (ja) 2008-03-27
JP2008509548A5 JP2008509548A5 (enExample) 2008-09-18

Family

ID=34929408

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007524346A Pending JP2008509548A (ja) 2004-08-03 2005-08-03 半導体スイッチ装置と電子素子

Country Status (6)

Country Link
US (1) US7916439B2 (enExample)
EP (1) EP1624570A1 (enExample)
JP (1) JP2008509548A (enExample)
KR (1) KR20070056053A (enExample)
CN (1) CN101019319A (enExample)
WO (1) WO2006013211A1 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006047243A1 (de) * 2006-05-15 2007-11-22 Infineon Technologies Ag Bordnetz mit mindestens einem Leistungstransistor und Verfahren zum Schutz eines Bordnetzes
US7994747B2 (en) * 2007-07-13 2011-08-09 Seagate Technology Llc Suppressing phased motor voltage transients on disconnect
US7911750B2 (en) * 2008-02-27 2011-03-22 Freescale Semiconductor, Inc. Resistor triggered electrostatic discharge protection
WO2009128942A1 (en) * 2008-04-16 2009-10-22 Bourns, Inc. Current limiting surge protection device
WO2009153627A1 (en) * 2008-06-20 2009-12-23 Freescale Semiconductor, Inc. Semiconductor device and method of electrostatic discharge protection therefor
US8334575B2 (en) 2008-10-03 2012-12-18 Freescale Semiconductor, Inc. Semiconductor device and electronic device
JP5595751B2 (ja) * 2009-03-11 2014-09-24 ルネサスエレクトロニクス株式会社 Ｅｓｄ保護素子
US8344472B2 (en) 2010-03-30 2013-01-01 Freescale Semiconductor, Inc. Semiconductor device and method
WO2012032476A1 (en) * 2010-09-09 2012-03-15 Koninklijke Philips Electronics N.V. A method and a device for attracting magnetic particles to a surface
US8354879B2 (en) 2011-01-11 2013-01-15 Freescale Semiconductor, Inc. Power switch for decreased ramp rate
KR101710599B1 (ko) * 2011-01-12 2017-02-27 삼성전자 주식회사 반도체 장치 및 그 제조 방법
WO2014041388A1 (en) 2012-09-12 2014-03-20 Freescale Semiconductor, Inc. A semiconductor device and an integrated circuit comprising an esd protection device, esd protection devices and a method of manufacturing the semiconductor device
KR101926607B1 (ko) * 2012-09-28 2018-12-07 삼성전자 주식회사 클램핑 회로, 이를 포함하는 반도체 장치 및 반도체 장치의 클램핑 방법
JP6052068B2 (ja) * 2013-06-07 2016-12-27 株式会社デンソー 半導体装置の保護回路
CN105097795B (zh) * 2014-05-04 2018-03-16 无锡华润上华科技有限公司 具esd保护结构的半导体器件
US9893724B2 (en) * 2015-07-31 2018-02-13 Texas Instruments Incorporated Isolated output switching circuit
CN107369683B (zh) * 2017-06-27 2020-06-23 苏州美天网络科技有限公司 抗电磁干扰的功率器件
CN107393923B (zh) * 2017-06-27 2020-06-23 苏州美天网络科技有限公司 开关性能稳定的功率器件
CN107256865B (zh) * 2017-06-27 2020-06-19 苏州美天网络科技有限公司 低损耗半导体功率器件
DE102019210566B4 (de) * 2019-07-17 2022-03-17 Conti Temic Microelectronic Gmbh Vorrichtung und Verfahren zum Messen eines durch eine PWM-angesteuerte induktive Last fließenden Stromes
CN113035937A (zh) * 2021-03-12 2021-06-25 电子科技大学 一种高侧功率管的esd保护结构
CN113658949B (zh) * 2021-08-12 2022-06-14 深圳市芯电元科技有限公司 一种改善关断特性的mosfet芯片制造工艺
CN114172498A (zh) * 2021-11-11 2022-03-11 深圳先进技术研究院 开关电路、集成电路和电子设备

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04280670A (ja) * 1991-03-08 1992-10-06 Nec Kansai Ltd スイッチ回路およびゲート電圧クランプ型半導体装置
JPH05235346A (ja) * 1992-02-20 1993-09-10 Mitsubishi Electric Corp 半導体装置及びその製造方法
US5812006A (en) * 1996-10-29 1998-09-22 Texas Instruments Incorporated Optimized power output clamping structure
JPH11345941A (ja) * 1998-05-01 1999-12-14 Motorola Inc 基板トリガ静電破壊保護を行う半導体デバイス
JP2001044291A (ja) * 1999-07-26 2001-02-16 Denso Corp 半導体装置のための保護装置
JP2001196583A (ja) * 1999-10-29 2001-07-19 Sanyo Electric Co Ltd 半導体装置とその製造方法
JP2004055999A (ja) * 2002-07-23 2004-02-19 Seiko Epson Corp 半導体装置及びその製造方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19719919A1 (de) * 1997-05-13 1998-11-26 Daimler Benz Ag Anordnung zum Schutz von elektrischen Einrichtungen
US6172383B1 (en) * 1997-12-31 2001-01-09 Siliconix Incorporated Power MOSFET having voltage-clamped gate
US6614633B1 (en) * 1999-03-19 2003-09-02 Denso Corporation Semiconductor device including a surge protecting circuit
DE19922924A1 (de) * 1999-05-19 2000-11-30 Siemens Ag Überspannungsschutzvorrichtung für einen Halbleiterschalter
US6365932B1 (en) * 1999-08-20 2002-04-02 Denso Corporation Power MOS transistor
JP4590888B2 (ja) * 2004-03-15 2010-12-01 株式会社デンソー 半導体出力回路
US7626243B2 (en) * 2006-08-04 2009-12-01 Advanced Analogic Technologies, Inc. ESD protection for bipolar-CMOS-DMOS integrated circuit devices

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04280670A (ja) * 1991-03-08 1992-10-06 Nec Kansai Ltd スイッチ回路およびゲート電圧クランプ型半導体装置
JPH05235346A (ja) * 1992-02-20 1993-09-10 Mitsubishi Electric Corp 半導体装置及びその製造方法
US5812006A (en) * 1996-10-29 1998-09-22 Texas Instruments Incorporated Optimized power output clamping structure
JPH11345941A (ja) * 1998-05-01 1999-12-14 Motorola Inc 基板トリガ静電破壊保護を行う半導体デバイス
JP2001044291A (ja) * 1999-07-26 2001-02-16 Denso Corp 半導体装置のための保護装置
JP2001196583A (ja) * 1999-10-29 2001-07-19 Sanyo Electric Co Ltd 半導体装置とその製造方法
JP2004055999A (ja) * 2002-07-23 2004-02-19 Seiko Epson Corp 半導体装置及びその製造方法

Also Published As

Publication number Publication date
CN101019319A (zh) 2007-08-15
KR20070056053A (ko) 2007-05-31
EP1624570A1 (en) 2006-02-08
US7916439B2 (en) 2011-03-29
WO2006013211A1 (en) 2006-02-09
US20080246345A1 (en) 2008-10-09

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