JP2008288579A5 - - Google Patents
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- Publication number
- JP2008288579A5 JP2008288579A5 JP2008109391A JP2008109391A JP2008288579A5 JP 2008288579 A5 JP2008288579 A5 JP 2008288579A5 JP 2008109391 A JP2008109391 A JP 2008109391A JP 2008109391 A JP2008109391 A JP 2008109391A JP 2008288579 A5 JP2008288579 A5 JP 2008288579A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- layer
- manufacturing
- heat treatment
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000000758 substrate Substances 0.000 claims 33
- 239000004065 semiconductor Substances 0.000 claims 17
- 238000000034 method Methods 0.000 claims 14
- 238000004519 manufacturing process Methods 0.000 claims 12
- 238000010438 heat treatment Methods 0.000 claims 11
- 150000002500 ions Chemical class 0.000 claims 11
- 238000000926 separation method Methods 0.000 claims 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 7
- 229910052814 silicon oxide Inorganic materials 0.000 claims 7
- 239000007789 gas Substances 0.000 claims 4
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 claims 3
- 230000004888 barrier function Effects 0.000 claims 3
- 238000005229 chemical vapour deposition Methods 0.000 claims 3
- 239000001257 hydrogen Substances 0.000 claims 3
- 229910052739 hydrogen Inorganic materials 0.000 claims 3
- -1 hydrogen ions Chemical class 0.000 claims 3
- 229910000077 silane Inorganic materials 0.000 claims 3
- WZJUBBHODHNQPW-UHFFFAOYSA-N 2,4,6,8-tetramethyl-1,3,5,7,2$l^{3},4$l^{3},6$l^{3},8$l^{3}-tetraoxatetrasilocane Chemical compound C[Si]1O[Si](C)O[Si](C)O[Si](C)O1 WZJUBBHODHNQPW-UHFFFAOYSA-N 0.000 claims 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 claims 2
- HMMGMWAXVFQUOA-UHFFFAOYSA-N octamethylcyclotetrasiloxane Chemical compound C[Si]1(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O1 HMMGMWAXVFQUOA-UHFFFAOYSA-N 0.000 claims 2
- 230000035515 penetration Effects 0.000 claims 2
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical compound C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 claims 2
- 230000032798 delamination Effects 0.000 claims 1
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 claims 1
- 150000001282 organosilanes Chemical class 0.000 claims 1
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008109391A JP5661990B2 (ja) | 2007-04-20 | 2008-04-18 | Soi基板の製造方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007112432 | 2007-04-20 | ||
| JP2007112432 | 2007-04-20 | ||
| JP2008109391A JP5661990B2 (ja) | 2007-04-20 | 2008-04-18 | Soi基板の製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008288579A JP2008288579A (ja) | 2008-11-27 |
| JP2008288579A5 true JP2008288579A5 (enExample) | 2011-05-19 |
| JP5661990B2 JP5661990B2 (ja) | 2015-01-28 |
Family
ID=40132736
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008109391A Expired - Fee Related JP5661990B2 (ja) | 2007-04-20 | 2008-04-18 | Soi基板の製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US7767542B2 (enExample) |
| JP (1) | JP5661990B2 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5459899B2 (ja) * | 2007-06-01 | 2014-04-02 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| FR2926674B1 (fr) | 2008-01-21 | 2010-03-26 | Soitec Silicon On Insulator | Procede de fabrication d'une structure composite avec couche d'oxyde de collage stable |
| US7939389B2 (en) | 2008-04-18 | 2011-05-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| JP5391599B2 (ja) * | 2008-07-14 | 2014-01-15 | オムロン株式会社 | 基板接合方法及び電子部品 |
| US8815657B2 (en) * | 2008-09-05 | 2014-08-26 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
| JP2010239123A (ja) * | 2009-03-12 | 2010-10-21 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
| JP5658916B2 (ja) * | 2009-06-26 | 2015-01-28 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2011029610A (ja) * | 2009-06-26 | 2011-02-10 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
| JP5866088B2 (ja) * | 2009-11-24 | 2016-02-17 | 株式会社半導体エネルギー研究所 | Soi基板の作製方法 |
| US8288249B2 (en) * | 2010-01-26 | 2012-10-16 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing SOI substrate |
| US8735263B2 (en) | 2011-01-21 | 2014-05-27 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing SOI substrate |
| JP6056516B2 (ja) * | 2013-02-01 | 2017-01-11 | 信越半導体株式会社 | Soiウェーハの製造方法及びsoiウェーハ |
| FR3007891B1 (fr) * | 2013-06-28 | 2016-11-25 | Soitec Silicon On Insulator | Procede de fabrication d'une structure composite |
| US9768109B2 (en) | 2015-09-22 | 2017-09-19 | Qualcomm Incorporated | Integrated circuits (ICS) on a glass substrate |
| US9725312B1 (en) * | 2016-02-05 | 2017-08-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Preconditioning to enhance hydrophilic fusion bonding |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2753955B2 (ja) * | 1993-07-31 | 1998-05-20 | 株式会社半導体エネルギー研究所 | ガラス基板処理方法 |
| JPH11163363A (ja) * | 1997-11-22 | 1999-06-18 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
| JP3697106B2 (ja) * | 1998-05-15 | 2005-09-21 | キヤノン株式会社 | 半導体基板の作製方法及び半導体薄膜の作製方法 |
| JP2000077287A (ja) * | 1998-08-26 | 2000-03-14 | Nissin Electric Co Ltd | 結晶薄膜基板の製造方法 |
| JP2000124092A (ja) | 1998-10-16 | 2000-04-28 | Shin Etsu Handotai Co Ltd | 水素イオン注入剥離法によってsoiウエーハを製造する方法およびこの方法で製造されたsoiウエーハ |
| JP4653374B2 (ja) * | 2001-08-23 | 2011-03-16 | セイコーエプソン株式会社 | 電気光学装置の製造方法 |
| US7119365B2 (en) | 2002-03-26 | 2006-10-10 | Sharp Kabushiki Kaisha | Semiconductor device and manufacturing method thereof, SOI substrate and display device using the same, and manufacturing method of the SOI substrate |
| JP4772258B2 (ja) | 2002-08-23 | 2011-09-14 | シャープ株式会社 | Soi基板の製造方法 |
| JP2004134675A (ja) | 2002-10-11 | 2004-04-30 | Sharp Corp | Soi基板、表示装置およびsoi基板の製造方法 |
| US7508034B2 (en) | 2002-09-25 | 2009-03-24 | Sharp Kabushiki Kaisha | Single-crystal silicon substrate, SOI substrate, semiconductor device, display device, and manufacturing method of semiconductor device |
| JP2004335642A (ja) * | 2003-05-06 | 2004-11-25 | Canon Inc | 基板およびその製造方法 |
| JP5110772B2 (ja) | 2004-02-03 | 2012-12-26 | 株式会社半導体エネルギー研究所 | 半導体薄膜層を有する基板の製造方法 |
| JP2006210899A (ja) * | 2004-12-28 | 2006-08-10 | Shin Etsu Chem Co Ltd | Soiウエーハの製造方法及びsoiウェーハ |
| KR101436116B1 (ko) * | 2007-04-27 | 2014-09-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Soi 기판 및 그 제조 방법, 및 반도체 장치 |
-
2008
- 2008-03-27 US US12/078,091 patent/US7767542B2/en not_active Expired - Fee Related
- 2008-04-18 JP JP2008109391A patent/JP5661990B2/ja not_active Expired - Fee Related
-
2010
- 2010-07-02 US US12/829,409 patent/US7955949B2/en not_active Expired - Fee Related
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