JP2008053394A5 - - Google Patents

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Publication number
JP2008053394A5
JP2008053394A5 JP2006227265A JP2006227265A JP2008053394A5 JP 2008053394 A5 JP2008053394 A5 JP 2008053394A5 JP 2006227265 A JP2006227265 A JP 2006227265A JP 2006227265 A JP2006227265 A JP 2006227265A JP 2008053394 A5 JP2008053394 A5 JP 2008053394A5
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JP
Japan
Prior art keywords
wave laser
continuous wave
region
substrate
manufacturing
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Application number
JP2006227265A
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English (en)
Japanese (ja)
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JP2008053394A (ja
JP5085902B2 (ja
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Priority to JP2006227265A priority Critical patent/JP5085902B2/ja
Priority claimed from JP2006227265A external-priority patent/JP5085902B2/ja
Priority to US11/882,828 priority patent/US7732268B2/en
Publication of JP2008053394A publication Critical patent/JP2008053394A/ja
Publication of JP2008053394A5 publication Critical patent/JP2008053394A5/ja
Application granted granted Critical
Publication of JP5085902B2 publication Critical patent/JP5085902B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006227265A 2006-08-24 2006-08-24 表示装置の製造方法 Expired - Fee Related JP5085902B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2006227265A JP5085902B2 (ja) 2006-08-24 2006-08-24 表示装置の製造方法
US11/882,828 US7732268B2 (en) 2006-08-24 2007-08-06 Manufacturing method of display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006227265A JP5085902B2 (ja) 2006-08-24 2006-08-24 表示装置の製造方法

Publications (3)

Publication Number Publication Date
JP2008053394A JP2008053394A (ja) 2008-03-06
JP2008053394A5 true JP2008053394A5 (enExample) 2009-07-09
JP5085902B2 JP5085902B2 (ja) 2012-11-28

Family

ID=39197202

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006227265A Expired - Fee Related JP5085902B2 (ja) 2006-08-24 2006-08-24 表示装置の製造方法

Country Status (2)

Country Link
US (1) US7732268B2 (enExample)
JP (1) JP5085902B2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5068972B2 (ja) * 2006-09-12 2012-11-07 富士フイルム株式会社 レーザアニール装置、半導体膜基板、素子基板、及び電気光学装置
EP2328169A1 (en) * 2008-09-18 2011-06-01 Sharp Kabushiki Kaisha Motherboard, motherboard manufacturing method and device board
JP2010108957A (ja) * 2008-10-28 2010-05-13 Hitachi Displays Ltd 表示装置およびその製造方法
US9111803B2 (en) * 2011-10-03 2015-08-18 Joled Inc. Thin-film device, thin-film device array, and method of manufacturing thin-film device
KR102014167B1 (ko) * 2012-12-06 2019-10-22 삼성디스플레이 주식회사 다결정 실리콘층의 제조 방법, 상기 다결정 실리콘층의 제조 방법을 포함하는 유기 발광 표시 장치의 제조 방법, 및 그 제조 방법에 의해 제조된 유기 발광 표시 장치
WO2016068713A1 (en) * 2014-10-30 2016-05-06 Technische Universiteit Delft Low-temperature formation of thin-film structures
NL2013715B1 (en) * 2014-10-30 2016-10-04 Univ Delft Tech Low-temperature formation of thin-film structures.
JP7203417B2 (ja) 2019-01-31 2023-01-13 株式会社ブイ・テクノロジー レーザアニール方法、レーザアニール装置、およびtft基板
JP7632873B2 (ja) * 2021-02-26 2025-02-19 株式会社ブイ・テクノロジー レーザアニール装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62160781A (ja) * 1986-01-09 1987-07-16 Agency Of Ind Science & Technol レ−ザ光照射装置
JP3026520B2 (ja) * 1991-08-23 2000-03-27 東京エレクトロン株式会社 液晶表示装置の製造装置
JPH0661172A (ja) * 1992-08-07 1994-03-04 Fuji Xerox Co Ltd エキシマレ−ザアニ−ル装置
SG46344A1 (en) 1992-11-16 1998-02-20 Tokyo Electron Ltd Method and apparatus for manufacturing a liquid crystal display substrate and apparatus and method for evaluating semiconductor crystals
JP3196132B2 (ja) * 1992-11-16 2001-08-06 東京エレクトロン株式会社 液晶ディスプレイ基板の製造方法、半導体結晶の評価方法、半導体結晶薄膜の製造方法及び半導体結晶薄膜の製造装置
JPH0883765A (ja) * 1994-07-14 1996-03-26 Sanyo Electric Co Ltd 多結晶半導体膜の製造方法
TW457553B (en) * 1999-01-08 2001-10-01 Sony Corp Process for producing thin film semiconductor device and laser irradiation apparatus
WO2001061734A1 (en) * 2000-02-15 2001-08-23 Matsushita Electric Industrial Co., Ltd. Non-single crystal film, substrate with non-single crystal film, method and apparatus for producing the same, method and apparatus for inspecting the same, thin film transistor, thin film transistor array and image display using it
JP2002064060A (ja) * 2000-08-22 2002-02-28 Matsushita Electric Ind Co Ltd 非結晶薄膜のレーザーアニール方法とその装置
US6737672B2 (en) * 2000-08-25 2004-05-18 Fujitsu Limited Semiconductor device, manufacturing method thereof, and semiconductor manufacturing apparatus
JP2002158173A (ja) 2000-09-05 2002-05-31 Sony Corp 薄膜の製造方法、半導体薄膜、半導体装置、半導体薄膜の製造方法、及び半導体薄膜製造装置
KR20020019419A (ko) 2000-09-05 2002-03-12 이데이 노부유끼 박막 제조 방법, 반도체 박막, 반도체 디바이스, 반도체박막 제조 방법, 및 반도체 박막 제조 장치

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