JP2007178885A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2007178885A5 JP2007178885A5 JP2005379508A JP2005379508A JP2007178885A5 JP 2007178885 A5 JP2007178885 A5 JP 2007178885A5 JP 2005379508 A JP2005379508 A JP 2005379508A JP 2005379508 A JP2005379508 A JP 2005379508A JP 2007178885 A5 JP2007178885 A5 JP 2007178885A5
- Authority
- JP
- Japan
- Prior art keywords
- photosensitive resin
- resin composition
- surface coating
- coating layer
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011342 resin composition Substances 0.000 claims 18
- 239000010410 layer Substances 0.000 claims 17
- 239000002345 surface coating layer Substances 0.000 claims 14
- 239000004020 conductor Substances 0.000 claims 7
- 239000000203 mixture Substances 0.000 claims 7
- DCAYPVUWAIABOU-UHFFFAOYSA-N hexadecane Chemical compound CCCCCCCCCCCCCCCC DCAYPVUWAIABOU-UHFFFAOYSA-N 0.000 claims 6
- 239000000758 substrate Substances 0.000 claims 5
- 238000004519 manufacturing process Methods 0.000 claims 3
- 229920000642 polymer Polymers 0.000 claims 3
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims 2
- 239000011248 coating agent Substances 0.000 claims 2
- 238000000576 coating method Methods 0.000 claims 2
- 229910052731 fluorine Inorganic materials 0.000 claims 2
- 239000011737 fluorine Substances 0.000 claims 2
- 238000000034 method Methods 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 2
- 239000002904 solvent Substances 0.000 claims 2
- 125000004432 carbon atom Chemical group C* 0.000 claims 1
- 239000003795 chemical substances by application Substances 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 claims 1
- 239000010419 fine particle Substances 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 125000005010 perfluoroalkyl group Chemical group 0.000 claims 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005379508A JP2007178885A (ja) | 2005-12-28 | 2005-12-28 | パターンおよび配線パターンならびにそれらの製造法 |
| TW095143669A TWI420569B (zh) | 2005-12-28 | 2006-11-27 | 圖案及配線圖案與彼等之製法 |
| US11/640,748 US20070148591A1 (en) | 2005-12-28 | 2006-12-18 | Pattern and wiring pattern and processes for producing them |
| KR1020060136637A KR20070070125A (ko) | 2005-12-28 | 2006-12-28 | 패턴 및 배선 패턴과 이들의 제조방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005379508A JP2007178885A (ja) | 2005-12-28 | 2005-12-28 | パターンおよび配線パターンならびにそれらの製造法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007178885A JP2007178885A (ja) | 2007-07-12 |
| JP2007178885A5 true JP2007178885A5 (enExample) | 2008-01-31 |
Family
ID=38194244
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005379508A Pending JP2007178885A (ja) | 2005-12-28 | 2005-12-28 | パターンおよび配線パターンならびにそれらの製造法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20070148591A1 (enExample) |
| JP (1) | JP2007178885A (enExample) |
| KR (1) | KR20070070125A (enExample) |
| TW (1) | TWI420569B (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7846644B2 (en) * | 2007-11-20 | 2010-12-07 | Eastman Kodak Company | Photopatternable deposition inhibitor containing siloxane |
| US20120288697A1 (en) * | 2011-05-13 | 2012-11-15 | Xerox Corporation | Coating methods using silver nanoparticles |
| TWI617629B (zh) * | 2013-05-01 | 2018-03-11 | Jsr股份有限公司 | 具有凹圖案的基材的製造方法、組成物、導電膜的形成方法、電子電路及電子元件 |
| CN113903873B (zh) | 2020-06-22 | 2023-04-07 | 京东方科技集团股份有限公司 | 量子点发光面板、显示装置和制作方法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2574180B1 (fr) * | 1984-12-04 | 1987-02-13 | Centre Nat Rech Scient | Procede et dispositif pour determiner l'angle de contact d'une goutte de liquide posee sur un substrat horizontal solide ou liquide |
| US4770974A (en) * | 1986-09-18 | 1988-09-13 | International Business Machines Corporation | Microlithographic resist containing poly(1,1-dialkylsilazane) |
| JPH02254449A (ja) * | 1989-03-29 | 1990-10-15 | Konica Corp | 湿し水不要の平版印刷版材料 |
| JP3238369B2 (ja) * | 1998-04-10 | 2001-12-10 | ソニーケミカル株式会社 | フォトレジスト用組成物、及びフレキシブルプリント配線板の製造方法 |
| TW495494B (en) * | 1998-10-05 | 2002-07-21 | Tonengeneral Sekiyu Kk | Photosensitive polysilazane composition and method of forming patterned polysilazane film |
| US6790587B1 (en) * | 1999-05-04 | 2004-09-14 | E. I. Du Pont De Nemours And Company | Fluorinated polymers, photoresists and processes for microlithography |
| JP3742861B2 (ja) * | 2000-08-29 | 2006-02-08 | ダイキン工業株式会社 | 硬化性含フッ素ポリマー、それを用いた硬化性樹脂組成物および反射防止膜 |
| JP2002243931A (ja) * | 2001-02-19 | 2002-08-28 | Canon Inc | ブラックマトリクス基板、カラーフィルタ及びその製造方法、液晶素子 |
| DE60315824T2 (de) * | 2002-03-22 | 2008-05-15 | Mitsubishi Heavy Industries, Ltd. | Verfahren zur regenerierung einer lithographischen druckplatte |
| EP1560070B1 (en) * | 2002-10-09 | 2009-12-30 | Nissan Chemical Industries, Ltd. | Composition for forming antireflection film for lithography |
| TWI258635B (en) * | 2002-11-27 | 2006-07-21 | Tokyo Ohka Kogyo Co Ltd | Undercoating material for wiring, embedded material, and wiring formation method |
| JP4192737B2 (ja) * | 2003-07-15 | 2008-12-10 | セイコーエプソン株式会社 | 層パターン製造方法、配線製造方法、電子機器の製造方法 |
| JP4697406B2 (ja) * | 2004-08-05 | 2011-06-08 | 信越化学工業株式会社 | 高分子化合物,レジスト保護膜材料及びパターン形成方法 |
-
2005
- 2005-12-28 JP JP2005379508A patent/JP2007178885A/ja active Pending
-
2006
- 2006-11-27 TW TW095143669A patent/TWI420569B/zh not_active IP Right Cessation
- 2006-12-18 US US11/640,748 patent/US20070148591A1/en not_active Abandoned
- 2006-12-28 KR KR1020060136637A patent/KR20070070125A/ko not_active Ceased
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103176354B (zh) | 一种绝缘衬底上的电子束曝光图形化方法 | |
| TWI412081B (zh) | 用以允許於基體上進行選擇性區域鍍敷之方法 | |
| JP6394691B2 (ja) | 配線パターンの製造方法およびトランジスタの製造方法 | |
| JP2009010188A5 (enExample) | ||
| TWI524565B (zh) | Production method of transistor and transistor | |
| JP2023159163A5 (enExample) | ||
| JPWO2015129799A6 (ja) | 配線パターンの製造方法およびトランジスタの製造方法 | |
| CN112320752A (zh) | 负性光刻胶图形化膜层的制备方法 | |
| JPWO2015076334A1 (ja) | トランジスタの製造方法およびトランジスタ | |
| CN104483812A (zh) | 利用热显影增强电子束光刻胶对比度的制备高密度平整图形的方法 | |
| JP5818252B2 (ja) | 金属膜パターン付き基体の製造方法 | |
| TW200712773A (en) | Negative photosensitive resin composite, method of forming pattern and electronic component | |
| TW200801801A (en) | Process for producing patterned film and photosensitive resin composition | |
| CN105807557B (zh) | 一种用于光学曝光的高分辨率柔性复合掩模板及其制备方法 | |
| JP4658997B2 (ja) | パターン形成用レジン組成物及びこれを利用するインプレーンプリンティング工程方法 | |
| JP2007178885A5 (enExample) | ||
| JPH0210362A (ja) | 微細パターン形成方法 | |
| CN101562129B (zh) | 利用s18系列正性光刻胶制作倒梯形剖面结构的方法 | |
| CN105023848A (zh) | 基板结构的制造方法及基板结构 | |
| CN103135367B (zh) | 电子束曝光方法 | |
| CN110908240A (zh) | 芯片用光刻胶及光刻工艺 | |
| JP4889316B2 (ja) | 3次元構造物の製造方法、3次元構造物、光学素子、ステンシルマスク、微細加工物の製造方法、及び微細パターン成形品の製造方法。 | |
| US9383647B2 (en) | Resist film and method of forming pattern | |
| US9410261B2 (en) | Two mask process for electroplating metal employing a negative electrophoretic photoresist | |
| JP6634721B2 (ja) | インプリント用モールド、および、その離型処理方法 |