JP2007088464A5 - - Google Patents

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Publication number
JP2007088464A5
JP2007088464A5 JP2006252243A JP2006252243A JP2007088464A5 JP 2007088464 A5 JP2007088464 A5 JP 2007088464A5 JP 2006252243 A JP2006252243 A JP 2006252243A JP 2006252243 A JP2006252243 A JP 2006252243A JP 2007088464 A5 JP2007088464 A5 JP 2007088464A5
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JP
Japan
Prior art keywords
polishing pad
permeable substrate
microspheres
polymer composition
polymer matrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006252243A
Other languages
English (en)
Japanese (ja)
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JP2007088464A (ja
Filing date
Publication date
Application filed filed Critical
Publication of JP2007088464A publication Critical patent/JP2007088464A/ja
Publication of JP2007088464A5 publication Critical patent/JP2007088464A5/ja
Pending legal-status Critical Current

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JP2006252243A 2005-09-19 2006-09-19 改善された付着性を有する水性研磨パッド及びその製造方法 Pending JP2007088464A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US71848905P 2005-09-19 2005-09-19

Publications (2)

Publication Number Publication Date
JP2007088464A JP2007088464A (ja) 2007-04-05
JP2007088464A5 true JP2007088464A5 (enExample) 2009-09-17

Family

ID=37776011

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006252243A Pending JP2007088464A (ja) 2005-09-19 2006-09-19 改善された付着性を有する水性研磨パッド及びその製造方法

Country Status (7)

Country Link
US (2) US20070066195A1 (enExample)
JP (1) JP2007088464A (enExample)
KR (1) KR20070032609A (enExample)
CN (1) CN1935461A (enExample)
DE (1) DE102006042674A1 (enExample)
FR (1) FR2890882A1 (enExample)
TW (1) TW200720017A (enExample)

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US7655117B2 (en) 2005-04-06 2010-02-02 Leviton Manufacturing Co., Inc. Continuous plating system and method with mask registration
US7744732B2 (en) * 2005-04-06 2010-06-29 Leviton Manufacturing Company, Inc. Continuous plating system and method with mask registration
CN102672630B (zh) 2006-04-19 2015-03-18 东洋橡胶工业株式会社 抛光垫的制造方法
US7311590B1 (en) * 2007-01-31 2007-12-25 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad with grooves to retain slurry on the pad texture
JP4943233B2 (ja) * 2007-05-31 2012-05-30 東洋ゴム工業株式会社 研磨パッドの製造方法
US7635290B2 (en) * 2007-08-15 2009-12-22 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Interpenetrating network for chemical mechanical polishing
US8182655B2 (en) * 2007-09-05 2012-05-22 Leviton Manufacturing Co., Inc. Plating systems and methods
TW200927896A (en) * 2007-12-28 2009-07-01 Iv Technologies Co Ltd Polishing pad and polishing method
TWI360459B (en) * 2008-04-11 2012-03-21 Bestac Advanced Material Co Ltd A polishing pad having groove structure for avoidi
US8177603B2 (en) * 2008-04-29 2012-05-15 Semiquest, Inc. Polishing pad composition
US8303375B2 (en) 2009-01-12 2012-11-06 Novaplanar Technology, Inc. Polishing pads for chemical mechanical planarization and/or other polishing methods
KR20100096459A (ko) * 2009-02-24 2010-09-02 삼성전자주식회사 화학적 기계적 연마장치
US10022842B2 (en) 2012-04-02 2018-07-17 Thomas West, Inc. Method and systems to control optical transmissivity of a polish pad material
US11090778B2 (en) 2012-04-02 2021-08-17 Thomas West, Inc. Methods and systems for centrifugal casting of polymer polish pads and polishing pads made by the methods
US10722997B2 (en) * 2012-04-02 2020-07-28 Thomas West, Inc. Multilayer polishing pads made by the methods for centrifugal casting of polymer polish pads
US9073172B2 (en) * 2012-05-11 2015-07-07 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Alkaline-earth metal oxide-polymeric polishing pad
US8888877B2 (en) * 2012-05-11 2014-11-18 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Forming alkaline-earth metal oxide polishing pad
US9108293B2 (en) * 2012-07-30 2015-08-18 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method for chemical mechanical polishing layer pretexturing
US9522454B2 (en) * 2012-12-17 2016-12-20 Seagate Technology Llc Method of patterning a lapping plate, and patterned lapping plates
TWI518176B (zh) * 2015-01-12 2016-01-21 三芳化學工業股份有限公司 拋光墊及其製造方法
CN107717762A (zh) * 2017-10-26 2018-02-23 东莞金太阳研磨股份有限公司 一种磨具用的聚酯薄膜基材的处理工艺
CN112423935B (zh) * 2018-06-29 2023-07-21 圣戈班磨料磨具有限公司 磨料制品及其形成方法
TWI850338B (zh) * 2019-02-28 2024-08-01 美商應用材料股份有限公司 拋光墊、化學機械拋光系統、及控制拋光墊的背襯層的剛度的方法
US11667061B2 (en) * 2020-04-18 2023-06-06 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of forming leveraged poromeric polishing pad
CN112318363B (zh) * 2020-11-06 2022-03-11 万华化学集团电子材料有限公司 一种化学机械抛光垫的抛光层及其制备方法
CN113442056B (zh) * 2021-07-15 2022-12-02 湖北鼎汇微电子材料有限公司 一种抛光垫及其制备方法、半导体器件的制造方法

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US3862074A (en) * 1971-11-30 1975-01-21 Environmental Enterprises Inc Aqueous polymeric compositions of nonionic urethane polymer and acrylic polymer
JPH0726080B2 (ja) * 1987-11-30 1995-03-22 サンスター技研株式会社 高防錆性付与構造用接着剤
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US20020098784A1 (en) * 2001-01-19 2002-07-25 Saket Chadda Abrasive free polishing in copper damascene applications
US20030104770A1 (en) * 2001-04-30 2003-06-05 Arch Specialty Chemicals, Inc. Chemical mechanical polishing slurry composition for polishing conductive and non-conductive layers on semiconductor wafers
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US20080063856A1 (en) 2006-09-11 2008-03-13 Duong Chau H Water-based polishing pads having improved contact area

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