JP2007005803A - 磁気抵抗素子及び装置 - Google Patents
磁気抵抗素子及び装置 Download PDFInfo
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- JP2007005803A JP2007005803A JP2006170279A JP2006170279A JP2007005803A JP 2007005803 A JP2007005803 A JP 2007005803A JP 2006170279 A JP2006170279 A JP 2006170279A JP 2006170279 A JP2006170279 A JP 2006170279A JP 2007005803 A JP2007005803 A JP 2007005803A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
- G11B5/3909—Arrangements using a magnetic tunnel junction
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
- G11B5/3929—Disposition of magnetic thin films not used for directly coupling magnetic flux from the track to the MR film or for shielding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
- H01F10/3272—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn by use of anti-parallel coupled [APC] ferromagnetic layers, e.g. artificial ferrimagnets [AFI], artificial [AAF] or synthetic [SAF] anti-ferromagnets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3286—Spin-exchange coupled multilayers having at least one layer with perpendicular magnetic anisotropy
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
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- Nanotechnology (AREA)
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- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Magnetic Heads (AREA)
- Thin Magnetic Films (AREA)
Abstract
【解決手段】合成自由層を有するスピンバルブとして磁気抵抗素子を提供する。より具体的には、合成自由層は、スペーサによって高垂直異方性層から分離された低垂直異方性層を含む。したがって、高異方性材料は、交換結合による平面外成分を導入する。また、高垂直異方性材料は、低いスピン分極を有する。さらに、ピン層の近くに配置された低異方性材料は、高いスピン分極を有する。その結果、低異方性材料の磁化は、平面内方向から平面外方向に変更される。したがって、低異方性材料と高異方性材料により全体の自由層垂直異方性を小さくすることができる。これらの層の厚さとその間のスペーサを調整することによって、異方性をさらに小さくし、感度をさらに高めることができる。
【選択図】図4
Description
Journal of Magnetism and Magnetic Materials, 272-76: 157 1-72 Part 2, 2004
103 スペーサ
105 ピン層
109 自由副層スペーサ
111 第1の自由副層
113 第2の自由副層
Claims (10)
- 磁気抵抗素子であって、
第1の自由副層と、前記第1の自由副層より低い垂直磁気異方性を有するとともに前記第1の自由副層と前記第2の自由副層が第1のスペーサによって分離された第2の自由副層とを含み、外部磁界に応じて調整可能な磁化方向を有する自由層と、
固定された磁化方向を有し、第2のスペーサによって前記自由層から分離されたピン層と、を含み、
前記第2の自由副層が前記第1のスペーサと前記第2のスペーサの間にある磁気抵抗素子。 - 前記第1の自由副層の分極が、第2の自由副層の分極よりも小さい請求項1に記載の磁気抵抗素子。
- 前記第1の自由副層が、(TM/Pt)、(TM/Pd)、TM−Pt、TM−Pd、およびRE−TMのうちの少なくとも1つを含み、TMが遷移金属(3d元素)であり、REが希土類(4f元素)である請求項1に記載の磁気抵抗素子。
- 前記第2の自由副層が、CoFe、NiFe、CoFeB、およびCoFeNiのうちの少なくとも1つを含む請求項1に記載の磁気抵抗素子。
- 前記第1のスペーサが、Ru、Rh、Ag、およびCuのうちの少なくとも1つを含む請求項1に記載の磁気抵抗素子。
- 前記第2のスペーサが、(a)トンネル磁気抵抗(TMR)型スピンバルブの場合は絶縁体、(b)巨大磁気抵抗(GMR)型スピンバルブの場合は導体、および(c)弾道磁気抵抗(BMR)型スピンバルブの場合は少なくとも1つの導電性ナノコンタクトを有する絶縁体のうちの1つである請求項1に記載の磁気抵抗素子。
- 第1の自由副層と、前記第1の自由副層より低い垂直磁気異方性を有するとともに前記第1の自由副層と前記第2の自由副層が第1のスペーサによって分離された第2の自由副層とを含み、外部磁界または電流に応じてに応じて調整可能な磁化方向を有する自由層と、
固定された磁化方向を有し、第2のスペーサによって前記自由層から分離されたピン層と、を含み、
前記第2の自由副層が前記第1のスペーサと前記第2のスペーサの間にある装置。 - 前記装置が、磁界センサを含む請求項7に記載の装置。
- 前記装置が、メモリを含む請求項7に記載の装置。
- 前記装置が、読み取りヘッドを含む請求項7に記載の装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/157,961 US7602591B2 (en) | 2005-06-22 | 2005-06-22 | Exchange-coupled free layer with out-of-plane magnetization |
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JP2007005803A true JP2007005803A (ja) | 2007-01-11 |
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JP2006170279A Pending JP2007005803A (ja) | 2005-06-22 | 2006-06-20 | 磁気抵抗素子及び装置 |
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JP (1) | JP2007005803A (ja) |
Cited By (4)
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JP2011023096A (ja) * | 2009-07-13 | 2011-02-03 | Seagate Technology Llc | トンネル磁気抵抗再生素子 |
JP2011238342A (ja) * | 2010-05-05 | 2011-11-24 | Headway Technologies Inc | 磁気抵抗効果センサおよびその製造方法 |
JP2012142578A (ja) * | 2010-12-31 | 2012-07-26 | Apalkov Dmytro | スピントランスファトルクメモリ用の挿入層を有する磁性層を提供するための方法及びシステム |
US10573802B2 (en) | 2018-03-19 | 2020-02-25 | Toshiba Memory Corporation | Magnetic memory device |
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US7356909B1 (en) * | 2004-09-29 | 2008-04-15 | Headway Technologies, Inc. | Method of forming a CPP magnetic recording head with a self-stabilizing vortex configuration |
US20070297220A1 (en) | 2006-06-22 | 2007-12-27 | Masatoshi Yoshikawa | Magnetoresistive element and magnetic memory |
JP2008112841A (ja) * | 2006-10-30 | 2008-05-15 | Tdk Corp | 磁気抵抗効果素子、薄膜磁気ヘッド、基体、ウェハ、ヘッドジンバルアセンブリ、ハードディスク装置 |
US20090121710A1 (en) * | 2007-11-09 | 2009-05-14 | Headway Technologies, Inc. | Novel free layer design for TMR/CPP device |
US7929258B2 (en) * | 2008-01-22 | 2011-04-19 | Seagate Technology Llc | Magnetic sensor including a free layer having perpendicular to the plane anisotropy |
US7920416B2 (en) * | 2008-03-12 | 2011-04-05 | International Business Machines Corporation | Increased magnetic damping for toggle MRAM |
US7977937B2 (en) * | 2008-11-03 | 2011-07-12 | Magic Technologies, Inc. | GMR biosensor with aligned magnetic field |
US8653615B2 (en) | 2008-11-19 | 2014-02-18 | Headway Technologies, Inc. | MR device with synthetic free layer structure |
US8334147B2 (en) * | 2009-05-26 | 2012-12-18 | Magic Technologies, Inc. | Bio-sensor with hard-direction field |
US20110007426A1 (en) * | 2009-07-13 | 2011-01-13 | Seagate Technology Llc | Trapezoidal back bias and trilayer reader geometry to enhance device performance |
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US8531802B2 (en) * | 2010-12-17 | 2013-09-10 | Seagate Technology Llc | Magnetic structure free layer stabilization |
US8704319B2 (en) * | 2010-12-31 | 2014-04-22 | Samsung Electronics Co., Ltd. | Method and system for providing magnetic layers having insertion layers for use in spin transfer torque memories |
US9478730B2 (en) * | 2010-12-31 | 2016-10-25 | Samsung Electronics Co., Ltd. | Method and system for providing magnetic layers having insertion layers for use in spin transfer torque memories |
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US20060291108A1 (en) | 2006-12-28 |
US7602591B2 (en) | 2009-10-13 |
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