JP2006526265A5 - - Google Patents

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Publication number
JP2006526265A5
JP2006526265A5 JP2006508377A JP2006508377A JP2006526265A5 JP 2006526265 A5 JP2006526265 A5 JP 2006526265A5 JP 2006508377 A JP2006508377 A JP 2006508377A JP 2006508377 A JP2006508377 A JP 2006508377A JP 2006526265 A5 JP2006526265 A5 JP 2006526265A5
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JP
Japan
Prior art keywords
ions
mass
trap
ion
charge ratio
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JP2006508377A
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English (en)
Japanese (ja)
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JP2006526265A (ja
JP4824545B2 (ja
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Priority claimed from GB0312447A external-priority patent/GB2402260B/en
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Publication of JP2006526265A publication Critical patent/JP2006526265A/ja
Publication of JP2006526265A5 publication Critical patent/JP2006526265A5/ja
Application granted granted Critical
Publication of JP4824545B2 publication Critical patent/JP4824545B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2006508377A 2003-05-30 2004-05-28 質量分析方法、及び質量分析計 Expired - Fee Related JP4824545B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0312447.6 2003-05-30
GB0312447A GB2402260B (en) 2003-05-30 2003-05-30 All mass MS/MS method and apparatus
PCT/GB2004/002289 WO2004107388A2 (en) 2003-05-30 2004-05-28 All-mass ms/ms method and apparatus

Publications (3)

Publication Number Publication Date
JP2006526265A JP2006526265A (ja) 2006-11-16
JP2006526265A5 true JP2006526265A5 (enExample) 2007-07-26
JP4824545B2 JP4824545B2 (ja) 2011-11-30

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ID=9959050

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Application Number Title Priority Date Filing Date
JP2006508377A Expired - Fee Related JP4824545B2 (ja) 2003-05-30 2004-05-28 質量分析方法、及び質量分析計

Country Status (9)

Country Link
US (2) US7399962B2 (enExample)
EP (1) EP1629519B1 (enExample)
JP (1) JP4824545B2 (enExample)
CN (1) CN100555554C (enExample)
AT (1) ATE366992T1 (enExample)
CA (1) CA2527081C (enExample)
DE (1) DE602004007514T2 (enExample)
GB (1) GB2402260B (enExample)
WO (1) WO2004107388A2 (enExample)

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CN107026068A (zh) * 2016-01-29 2017-08-08 北京普析通用仪器有限责任公司 电感耦合等离子体质谱仪及碰撞反应池
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CN113748487B (zh) * 2019-04-25 2024-09-03 萨默费尼根有限公司 利用谐波振荡和共振离子选择性时间概览（stori）图的电荷检测质谱法
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