JP2004214077A5 - - Google Patents

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Publication number
JP2004214077A5
JP2004214077A5 JP2003001003A JP2003001003A JP2004214077A5 JP 2004214077 A5 JP2004214077 A5 JP 2004214077A5 JP 2003001003 A JP2003001003 A JP 2003001003A JP 2003001003 A JP2003001003 A JP 2003001003A JP 2004214077 A5 JP2004214077 A5 JP 2004214077A5
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JP
Japan
Prior art keywords
ions
ion
ion trap
voltage
frequency voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003001003A
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English (en)
Japanese (ja)
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JP3800178B2 (ja
JP2004214077A (ja
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Application filed filed Critical
Priority to JP2003001003A priority Critical patent/JP3800178B2/ja
Priority claimed from JP2003001003A external-priority patent/JP3800178B2/ja
Priority to US10/740,750 priority patent/US7256397B2/en
Publication of JP2004214077A publication Critical patent/JP2004214077A/ja
Publication of JP2004214077A5 publication Critical patent/JP2004214077A5/ja
Application granted granted Critical
Publication of JP3800178B2 publication Critical patent/JP3800178B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2003001003A 2003-01-07 2003-01-07 質量分析装置及び質量分析方法 Expired - Lifetime JP3800178B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2003001003A JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法
US10/740,750 US7256397B2 (en) 2003-01-07 2003-12-22 Mass analyzer and mass analyzing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003001003A JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2004214077A JP2004214077A (ja) 2004-07-29
JP2004214077A5 true JP2004214077A5 (enExample) 2005-09-02
JP3800178B2 JP3800178B2 (ja) 2006-07-26

Family

ID=32677480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003001003A Expired - Lifetime JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法

Country Status (2)

Country Link
US (1) US7256397B2 (enExample)
JP (1) JP3800178B2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3960306B2 (ja) * 2003-12-22 2007-08-15 株式会社島津製作所 イオントラップ装置
CA2565455C (en) * 2004-05-05 2013-11-19 Mds Inc. Doing Business Through Its Mds Sciex Division Ion guide for mass spectrometer
JP4701720B2 (ja) * 2005-01-11 2011-06-15 株式会社島津製作所 Ｍａｌｄｉイオントラップ型質量分析装置及び分析方法
EP1971998B1 (en) * 2006-01-11 2019-05-08 DH Technologies Development Pte. Ltd. Fragmenting ions in mass spectrometry
JP4735490B2 (ja) * 2006-09-20 2011-07-27 株式会社島津製作所 質量分析装置
JP4844633B2 (ja) * 2006-12-14 2011-12-28 株式会社島津製作所 イオントラップ飛行時間型質量分析装置
WO2008072326A1 (ja) 2006-12-14 2008-06-19 Shimadzu Corporation イオントラップ飛行時間型質量分析装置
WO2009153841A1 (ja) 2008-06-20 2009-12-23 株式会社島津製作所 質量分析装置
JP5293562B2 (ja) * 2009-10-30 2013-09-18 株式会社島津製作所 イオントラップ質量分析装置
DE102012013038B4 (de) 2012-06-29 2014-06-26 Bruker Daltonik Gmbh Auswerfen einer lonenwolke aus 3D-HF-lonenfallen
GB201409074D0 (en) 2014-05-21 2014-07-02 Thermo Fisher Scient Bremen Ion ejection from a quadrupole ion trap
EP3525231A4 (en) * 2016-10-04 2020-05-20 Shimadzu Corporation HIGH VOLTAGE POWER SOURCE DEVICE
JP6725080B2 (ja) 2017-09-04 2020-07-15 株式会社島津製作所 質量分析装置
DE102018121942B3 (de) 2018-09-07 2020-01-16 Quantum Factory GmbH Ionenfalle, Verfahren zum Regeln der Ionenfalle und Verwendungen als Antrieb einer Ionenfalle

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9802111D0 (en) 1998-01-30 1998-04-01 Shimadzu Res Lab Europe Ltd Time-of-flight mass spectrometer
CA2355193C (en) 1998-12-21 2006-10-17 Shimadzu Research Laboratory (Europe) Ltd. Method of fast start and/or fast termination of a radio frequency resonator
WO2001015201A2 (en) * 1999-08-26 2001-03-01 University Of New Hampshire Multiple stage mass spectrometer
JP2005166369A (ja) * 2003-12-01 2005-06-23 Shimadzu Corp イオン蓄積装置

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