JP3800178B2 - 質量分析装置及び質量分析方法 - Google Patents

質量分析装置及び質量分析方法 Download PDF

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Publication number
JP3800178B2
JP3800178B2 JP2003001003A JP2003001003A JP3800178B2 JP 3800178 B2 JP3800178 B2 JP 3800178B2 JP 2003001003 A JP2003001003 A JP 2003001003A JP 2003001003 A JP2003001003 A JP 2003001003A JP 3800178 B2 JP3800178 B2 JP 3800178B2
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Japan
Prior art keywords
voltage
ions
frequency voltage
ion
ion trap
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Expired - Lifetime
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JP2003001003A
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English (en)
Japanese (ja)
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JP2004214077A (ja
JP2004214077A5 (enExample
Inventor
栄三 河藤
真一 山口
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2003001003A priority Critical patent/JP3800178B2/ja
Priority to US10/740,750 priority patent/US7256397B2/en
Publication of JP2004214077A publication Critical patent/JP2004214077A/ja
Publication of JP2004214077A5 publication Critical patent/JP2004214077A5/ja
Application granted granted Critical
Publication of JP3800178B2 publication Critical patent/JP3800178B2/ja
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Expired - Lifetime legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2003001003A 2003-01-07 2003-01-07 質量分析装置及び質量分析方法 Expired - Lifetime JP3800178B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2003001003A JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法
US10/740,750 US7256397B2 (en) 2003-01-07 2003-12-22 Mass analyzer and mass analyzing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003001003A JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2004214077A JP2004214077A (ja) 2004-07-29
JP2004214077A5 JP2004214077A5 (enExample) 2005-09-02
JP3800178B2 true JP3800178B2 (ja) 2006-07-26

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ID=32677480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003001003A Expired - Lifetime JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法

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US (1) US7256397B2 (enExample)
JP (1) JP3800178B2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3960306B2 (ja) * 2003-12-22 2007-08-15 株式会社島津製作所 イオントラップ装置
WO2005106921A1 (en) * 2004-05-05 2005-11-10 Mds Inc. Doing Business Through Its Mds Sciex Division Ion guide for mass spectrometer
JP4701720B2 (ja) * 2005-01-11 2011-06-15 株式会社島津製作所 Ｍａｌｄｉイオントラップ型質量分析装置及び分析方法
JP5107263B2 (ja) * 2006-01-11 2012-12-26 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 質量分析計におけるイオンの断片化
JP4735490B2 (ja) * 2006-09-20 2011-07-27 株式会社島津製作所 質量分析装置
JP4844633B2 (ja) * 2006-12-14 2011-12-28 株式会社島津製作所 イオントラップ飛行時間型質量分析装置
WO2008072326A1 (ja) * 2006-12-14 2008-06-19 Shimadzu Corporation イオントラップ飛行時間型質量分析装置
CN102067275B (zh) 2008-06-20 2014-03-12 株式会社岛津制作所 质量分析装置
JP5293562B2 (ja) * 2009-10-30 2013-09-18 株式会社島津製作所 イオントラップ質量分析装置
DE102012013038B4 (de) 2012-06-29 2014-06-26 Bruker Daltonik Gmbh Auswerfen einer lonenwolke aus 3D-HF-lonenfallen
GB201409074D0 (en) 2014-05-21 2014-07-02 Thermo Fisher Scient Bremen Ion ejection from a quadrupole ion trap
US10984997B2 (en) 2016-10-04 2021-04-20 Shimadzu Corporation Mass spectrometer with main voltage generating unit and auxiliary power supply
WO2019043943A1 (ja) 2017-09-04 2019-03-07 株式会社島津製作所 高電圧電源装置
DE102018121942B3 (de) 2018-09-07 2020-01-16 Quantum Factory GmbH Ionenfalle, Verfahren zum Regeln der Ionenfalle und Verwendungen als Antrieb einer Ionenfalle

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9802111D0 (en) 1998-01-30 1998-04-01 Shimadzu Res Lab Europe Ltd Time-of-flight mass spectrometer
JP3785042B2 (ja) 1998-12-21 2006-06-14 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 無線周波共振器の高速起動及び／高速終了の方法
JP2003507874A (ja) * 1999-08-26 2003-02-25 ユニバーシティ オブ ニュー ハンプシャー 多段型の質量分析計
JP2005166369A (ja) * 2003-12-01 2005-06-23 Shimadzu Corp イオン蓄積装置

Also Published As

Publication number Publication date
US20040132083A1 (en) 2004-07-08
JP2004214077A (ja) 2004-07-29
US7256397B2 (en) 2007-08-14

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