JP2006294582A5 - - Google Patents

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Publication number
JP2006294582A5
JP2006294582A5 JP2005222327A JP2005222327A JP2006294582A5 JP 2006294582 A5 JP2006294582 A5 JP 2006294582A5 JP 2005222327 A JP2005222327 A JP 2005222327A JP 2005222327 A JP2005222327 A JP 2005222327A JP 2006294582 A5 JP2006294582 A5 JP 2006294582A5
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JP
Japan
Prior art keywords
ion trap
ion
mass spectrometer
trap
voltage
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Application number
JP2005222327A
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English (en)
Japanese (ja)
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JP2006294582A (ja
JP4654087B2 (ja
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Application filed filed Critical
Priority to JP2005222327A priority Critical patent/JP4654087B2/ja
Priority claimed from JP2005222327A external-priority patent/JP4654087B2/ja
Priority to US11/325,444 priority patent/US7319222B2/en
Publication of JP2006294582A publication Critical patent/JP2006294582A/ja
Publication of JP2006294582A5 publication Critical patent/JP2006294582A5/ja
Application granted granted Critical
Publication of JP4654087B2 publication Critical patent/JP4654087B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005222327A 2005-03-18 2005-08-01 質量分析計及び質量分析方法 Expired - Fee Related JP4654087B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2005222327A JP4654087B2 (ja) 2005-03-18 2005-08-01 質量分析計及び質量分析方法
US11/325,444 US7319222B2 (en) 2005-03-18 2006-01-05 Mass spectrometer and mass analysis method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005078367 2005-03-18
JP2005222327A JP4654087B2 (ja) 2005-03-18 2005-08-01 質量分析計及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2006294582A JP2006294582A (ja) 2006-10-26
JP2006294582A5 true JP2006294582A5 (enExample) 2008-04-17
JP4654087B2 JP4654087B2 (ja) 2011-03-16

Family

ID=37069184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005222327A Expired - Fee Related JP4654087B2 (ja) 2005-03-18 2005-08-01 質量分析計及び質量分析方法

Country Status (2)

Country Link
US (1) US7319222B2 (enExample)
JP (1) JP4654087B2 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080210860A1 (en) * 2007-03-02 2008-09-04 Kovtoun Viatcheslav V Segmented ion trap mass spectrometry
JP4862738B2 (ja) * 2007-05-08 2012-01-25 株式会社日立製作所 イオン移動度分析装置およびイオン移動度分離／質量分析複合装置
JP5164621B2 (ja) * 2008-03-18 2013-03-21 株式会社日立ハイテクノロジーズ 質量分析装置、質量分析方法および質量分析用プログラム
GB0806725D0 (en) 2008-04-14 2008-05-14 Micromass Ltd Mass spectrometer
GB0820308D0 (en) 2008-11-06 2008-12-17 Micromass Ltd Mass spectrometer
JP2011003457A (ja) * 2009-06-19 2011-01-06 Tokyo Electron Ltd 荷電粒子選別装置及び荷電粒子照射装置
US8158934B2 (en) * 2009-08-25 2012-04-17 Agilent Technologies, Inc. Electron capture dissociation apparatus and related methods
JP5604165B2 (ja) * 2010-04-19 2014-10-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP5997650B2 (ja) * 2013-04-15 2016-09-28 株式会社日立ハイテクノロジーズ 分析システム
EP3033763B1 (en) * 2013-08-13 2021-05-26 Purdue Research Foundation Sample quantitation with a miniature mass spectrometer
EP3178106B1 (en) * 2014-08-05 2024-02-14 DH Technologies Development PTE. Ltd. Band pass extraction from an ion trapping device and tof mass spectrometer sensitivity enhancement
SG10201906362TA (en) 2015-10-07 2019-08-27 Battelle Memorial Institute Method and Apparatus for Ion Mobility Separations Utilizing Alternating Current Waveforms
US10692710B2 (en) 2017-08-16 2020-06-23 Battelle Memorial Institute Frequency modulated radio frequency electric field for ion manipulation
WO2019070324A1 (en) 2017-10-04 2019-04-11 Battelle Memorial Institute METHODS AND SYSTEMS FOR INTEGRATING ION HANDLING DEVICES
CN115436347B (zh) * 2021-06-02 2025-10-17 布鲁克科学有限公司 用于离子光谱中的结构识别的理化性质评分

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5783824A (en) 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
JP3509267B2 (ja) * 1995-04-03 2004-03-22 株式会社日立製作所 イオントラップ質量分析方法および装置
JP3495512B2 (ja) * 1996-07-02 2004-02-09 株式会社日立製作所 イオントラップ質量分析装置
US6177668B1 (en) 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
US5905258A (en) 1997-06-02 1999-05-18 Advanced Research & Techology Institute Hybrid ion mobility and mass spectrometer
US7041967B2 (en) * 2001-05-25 2006-05-09 Mds Inc. Method of mass spectrometry, to enhance separation of ions with different charges
JP3840417B2 (ja) * 2002-02-20 2006-11-01 株式会社日立ハイテクノロジーズ 質量分析装置
CA2529597A1 (en) * 2003-06-20 2004-12-29 Brigham Young University Single device for ion mobility and ion trap mass spectrometry
JP2005108578A (ja) * 2003-09-30 2005-04-21 Hitachi Ltd 質量分析装置

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