JP4654087B2 - 質量分析計及び質量分析方法 - Google Patents

質量分析計及び質量分析方法 Download PDF

Info

Publication number
JP4654087B2
JP4654087B2 JP2005222327A JP2005222327A JP4654087B2 JP 4654087 B2 JP4654087 B2 JP 4654087B2 JP 2005222327 A JP2005222327 A JP 2005222327A JP 2005222327 A JP2005222327 A JP 2005222327A JP 4654087 B2 JP4654087 B2 JP 4654087B2
Authority
JP
Japan
Prior art keywords
ion
mass
ions
trap
ion trap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2005222327A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006294582A (ja
JP2006294582A5 (enExample
Inventor
雄一郎 橋本
英樹 長谷川
泉 和氣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Priority to JP2005222327A priority Critical patent/JP4654087B2/ja
Priority to US11/325,444 priority patent/US7319222B2/en
Publication of JP2006294582A publication Critical patent/JP2006294582A/ja
Publication of JP2006294582A5 publication Critical patent/JP2006294582A5/ja
Application granted granted Critical
Publication of JP4654087B2 publication Critical patent/JP4654087B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2005222327A 2005-03-18 2005-08-01 質量分析計及び質量分析方法 Expired - Fee Related JP4654087B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2005222327A JP4654087B2 (ja) 2005-03-18 2005-08-01 質量分析計及び質量分析方法
US11/325,444 US7319222B2 (en) 2005-03-18 2006-01-05 Mass spectrometer and mass analysis method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005078367 2005-03-18
JP2005222327A JP4654087B2 (ja) 2005-03-18 2005-08-01 質量分析計及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2006294582A JP2006294582A (ja) 2006-10-26
JP2006294582A5 JP2006294582A5 (enExample) 2008-04-17
JP4654087B2 true JP4654087B2 (ja) 2011-03-16

Family

ID=37069184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005222327A Expired - Fee Related JP4654087B2 (ja) 2005-03-18 2005-08-01 質量分析計及び質量分析方法

Country Status (2)

Country Link
US (1) US7319222B2 (enExample)
JP (1) JP4654087B2 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080210860A1 (en) * 2007-03-02 2008-09-04 Kovtoun Viatcheslav V Segmented ion trap mass spectrometry
JP4862738B2 (ja) * 2007-05-08 2012-01-25 株式会社日立製作所 イオン移動度分析装置およびイオン移動度分離／質量分析複合装置
JP5164621B2 (ja) * 2008-03-18 2013-03-21 株式会社日立ハイテクノロジーズ 質量分析装置、質量分析方法および質量分析用プログラム
GB0806725D0 (en) 2008-04-14 2008-05-14 Micromass Ltd Mass spectrometer
GB0820308D0 (en) 2008-11-06 2008-12-17 Micromass Ltd Mass spectrometer
JP2011003457A (ja) * 2009-06-19 2011-01-06 Tokyo Electron Ltd 荷電粒子選別装置及び荷電粒子照射装置
US8158934B2 (en) * 2009-08-25 2012-04-17 Agilent Technologies, Inc. Electron capture dissociation apparatus and related methods
JP5604165B2 (ja) * 2010-04-19 2014-10-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP5997650B2 (ja) * 2013-04-15 2016-09-28 株式会社日立ハイテクノロジーズ 分析システム
EP3033763B1 (en) * 2013-08-13 2021-05-26 Purdue Research Foundation Sample quantitation with a miniature mass spectrometer
EP3178106B1 (en) * 2014-08-05 2024-02-14 DH Technologies Development PTE. Ltd. Band pass extraction from an ion trapping device and tof mass spectrometer sensitivity enhancement
SG10201906362TA (en) 2015-10-07 2019-08-27 Battelle Memorial Institute Method and Apparatus for Ion Mobility Separations Utilizing Alternating Current Waveforms
US10692710B2 (en) 2017-08-16 2020-06-23 Battelle Memorial Institute Frequency modulated radio frequency electric field for ion manipulation
WO2019070324A1 (en) 2017-10-04 2019-04-11 Battelle Memorial Institute METHODS AND SYSTEMS FOR INTEGRATING ION HANDLING DEVICES
CN115436347B (zh) * 2021-06-02 2025-10-17 布鲁克科学有限公司 用于离子光谱中的结构识别的理化性质评分

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5783824A (en) 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
JP3509267B2 (ja) * 1995-04-03 2004-03-22 株式会社日立製作所 イオントラップ質量分析方法および装置
JP3495512B2 (ja) * 1996-07-02 2004-02-09 株式会社日立製作所 イオントラップ質量分析装置
US6177668B1 (en) 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
US5905258A (en) 1997-06-02 1999-05-18 Advanced Research & Techology Institute Hybrid ion mobility and mass spectrometer
US7041967B2 (en) * 2001-05-25 2006-05-09 Mds Inc. Method of mass spectrometry, to enhance separation of ions with different charges
JP3840417B2 (ja) * 2002-02-20 2006-11-01 株式会社日立ハイテクノロジーズ 質量分析装置
CA2529597A1 (en) * 2003-06-20 2004-12-29 Brigham Young University Single device for ion mobility and ion trap mass spectrometry
JP2005108578A (ja) * 2003-09-30 2005-04-21 Hitachi Ltd 質量分析装置

Also Published As

Publication number Publication date
US20060219896A1 (en) 2006-10-05
JP2006294582A (ja) 2006-10-26
US7319222B2 (en) 2008-01-15

Similar Documents

Publication Publication Date Title
JP5001965B2 (ja) 質量分析装置
US7157698B2 (en) Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
CN103650099B (zh) 串联质谱法的靶向分析
EP1502280B1 (en) Broad ion fragmentation coverage in mass spectrometry by varying the collision energy
US7692143B2 (en) Method for axial ejection and in-trap fragmentation using auxiliary electrodes in a multipole mass spectrometer
JP5623428B2 (ja) Ｍｓ／ｍｓ／ｍｓを行なう質量分析計
JP4654087B2 (ja) 質量分析計及び質量分析方法
JP4918846B2 (ja) 質量分析装置及び質量分析方法
JP4463978B2 (ja) 四重極イオンガイド中でイオンを選択的に衝突誘発解離する方法および装置
JP6541210B2 (ja) イオントラップから低ｍ／ｚ比を有するイオンを抽出する方法
US8637816B1 (en) Systems and methods for MS-MS-analysis
CN103988278A (zh) 高占空比离子光谱仪
JP5481115B2 (ja) 質量分析計及び質量分析方法
CN101802966A (zh) 质谱仪
JP2005528757A (ja) 多極質量分析計における改善された軸方向放出分解能
JP4636943B2 (ja) 質量分析装置
JP5737144B2 (ja) イオントラップ質量分析装置
CN114616647A (zh) 傅立叶变换质谱法的方法和系统
EP3357080B1 (en) Mass-selective axial ejection linear ion trap

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080130

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20080130

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080130

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20100825

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100907

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100924

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100924

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20101102

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101119

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20101214

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20101220

R150 Certificate of patent or registration of utility model

Ref document number: 4654087

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131224

Year of fee payment: 3

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees